Trends from Ten Years of Soft Error Experimentation
Trends from Ten Years of Soft Error Experimentation
Trends from Ten Years of Soft Error Experimentation
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Introduction<br />
●<br />
Reliability and Availability – key selling points<br />
– S<strong>of</strong>t errors<br />
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●<br />
Experimental results : 250nm to 65nm<br />
SER trends<br />
– SER ↓ as technology has scaled<br />
– Flops overtake SRAM (on per cell basis)<br />
– Multi-cell upsets gaining importance<br />
●<br />
Changes in test setups over the years<br />
March 24, 2009<br />
Sun Microsystems<br />
3
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