(PoF) and Environmental Stress Screening - DfR Solutions

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Knowledge and Education (Onsite)• 4 hours to 5 days• Highly qualified instructors PhD, CRE, yrs of experience• Wide variety of topics Physics of Failure Design for Excellence Performing FMEA Pb-Free Reliability Capacitors Qualifying PCBs Opto-Electronics Component Packaging Root-Cause Analysis5110 Roanoke Place, Suite 101, College Park, Maryland 20740Phone (301) 474-0607 Fax (240) 757-0053© 2004 - 2007 2009 www.DfRSolutions.com18
Interested?• Could your next product benefit from DfR‟s extensiveexpertise and PoF knowledge base?Bring us in as an independent party during critical design reviews• Are your concerned with new technologies?DfR‟s scientists and engineers can provide comprehensive analysis toensure risk-minimization during these difficult transitions• Take advantage of our unique Open-Door policy!See how much we already know about your current issuesChances are we have already solved your problem at least once beforeWe work around the clock and around the worldContact us by phone (301-474-0607) or email (askdfr@dfrsolutions.com)5110 Roanoke Place, Suite 101, College Park, Maryland 20740Phone (301) 474-0607 Fax (240) 757-0053© 2004 - 2007 2009 www.DfRSolutions.com19
Page 1 and 2: DfR Solutions works with companies
Page 3 and 4: Who Uses DfR?Military / Avionics /
Page 5 and 6: How is NASA using DfR?• Current f
Page 7 and 8: DfR Locations (North America)Seattl
Page 9 and 10: IC Wearout - Value Proposition• T
Page 11 and 12: Design: Design for Excellence (DfX)
Page 13 and 14: Supply Chain: Component Qualificati
Page 15 and 16: Root Cause Capability -- Personnel
Page 17: Knowledge and Education (Website)
Page 21 and 22: PoF and ESS• Can Physics of Failu
Page 23 and 24: Physics of Failure (PoF) ModelingT
Page 25 and 26: Examples: Desired Lifetime• Low-E
Page 27 and 28: Environments: Transportation / Stor
Page 29 and 30: What is Screening?• The purpose o
Page 31 and 32: Failure RateStress Screening• Str
Page 33 and 34: Burn-In• A screen consisting of a
Page 35 and 36: HASS• HASS requires a prior, prop
Page 37 and 38: ESS• In industry, typically not d
Page 39 and 40: Failure RateCan PoF improve ESS?Tim
Page 41 and 42: How to use PoF in ESS?• Calculati
Page 43 and 44: • “I am very interested in the
Page 45 and 46: Desired Lifetime (Capacitor Wearout
Page 47 and 48: Solder Wearout (cont.)• Eliminati
Page 49 and 50: Characteristic Life (Cycles to Fail
Page 51 and 52: JESD22-B110A, Subassembly Mechanica
Page 53 and 54: 5110 Roanoke Place, Suite 101, Coll
Page 55 and 56: Vibration (cont.)• Vibration load
Page 57 and 58: Field Environment (Best Practice)
Page 59 and 60: DfR (Electrolytic Capacitors)• Ho
Page 61 and 62: Physics of Failure• Based on how
Page 63 and 64: Life Predictions of Integrated Circ
Page 65 and 66: IPC TR-579• Determine stress appl
Page 67 and 68: Assessment of IPC-TR-579• Based o
Page 69 and 70:
DfR - Solder Joints• Failure of s
Page 71 and 72:
Solder Joints (cont.)• How do nom
Page 73 and 74:
Stress Relief600 hrs• Axial diode
Page 75 and 76:
Thermal Cycle Life Model (Engelmaie
Page 77 and 78:
Engelmaier (Discussion)• Most pop
Page 79 and 80:
Vibration (MIL-STD-810, Section 514
Page 81 and 82:
Vibration (Steinberg)• Step 2: Ca
Page 83 and 84:
TemperatureTemperature Cycling + Po
Page 85 and 86:
Mechanical Shock / Drop Testing•
Page 87:
Product Qualification (other)• Mi
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