Quarterly FIT Rate Reliability Monitor- Test Report ... - PLX Technology
Quarterly FIT Rate Reliability Monitor- Test Report ... - PLX Technology
Quarterly FIT Rate Reliability Monitor- Test Report ... - PLX Technology
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RELIABILITY HTOL DATA @125 °C for 0.15µmFOUNDRY: Renesas Japan, Process: 0.15 µm CMOSEFR (Early Fail <strong>Rate</strong>,=< 168 Hours)<strong>FIT</strong>s @ 60% CL, 55C, Ea = 0.7eVYEAR Sample # Failure PPM Sample Cum Dev # Failure <strong>FIT</strong>s2000-2007 1366 0 0 1366 1,366,000 0 9Q1'08 120 0 0 120 1,486,000 0 8Q2'08 120 0 0 120 1,606,000 0 7Q3'08 96 0 0 96 1,654,000 0 7Q4'08 96 0 0 96 1,702,000 0 7Q1'09 72 0 0 72 1,774,000 0 7Q3'09 72 0 0 72 1,846,000 0 6Q1'10 44 0 0 44 1,890,000 0* 6Q2/Q3'10 45 0 0 45 1,935,000 0* 6Q4'10 120 0 0 120 2,055,000 0* 6Q1/Q2'11 48 0 0 48 2,151,000 0* 5Q3'11 72 0 0 72 2,199,000 0* 5Q4'11 72 0 0 72 2,199,000 0* 5Q1'12 48 0 0 48 2,151,000 0* 5Q2'12 48 0 0 48 2,247,000 0* 5Q3'12 48 0 0 48 2,295,000 0* 5Q4'12 45 0 0 45 2,289,000 0* 5Note:*= RenesasProcess HTOL <strong>Reliability</strong> Data.PPM Goal = 200ppm <strong>FIT</strong> Goal ≤ 20PPM1086420EFR(Early Fail <strong>Rate</strong>, =168 Hours)Cumulative6 5 5 5 5 5YearYear
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