TJA1054 Fault-tolerant CAN transceiver

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Philips SemiconductorsProduct specificationFault-tolerant CAN transceiverTJA1054TIMING CHARACTERISTICSV CC = 4.75 to 5.25 V; V BAT = 5 to 27 V; V STB =V CC ; T vj = −40 to +150 °C; all voltages are defined with respect toground; unless otherwise specified; notes 1 and 2t t(r-d)t t(d-r)t PD(L)t PD(H)SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNITt react(sleep)t dis(TxD)t CANHt CANLt WAKECANL and CANH output transitiontime for recessive to dominantCANL and CANH output transitiontime for dominant to recessivepropagation delay TXD (LOW) toRXD (LOW)propagation delay TXD (HIGH) toRXD (HIGH)reaction time of goto-sleepcommanddisable time of TxD permanentdominant timerdominant time for remote wake-upon pin CANHdominant time for remote wake-upon pin CANLrequired time on pin WAKE forlocal wake-upbetween 10% and 90%;R1 = 100 Ω; C1 = 10 nF;C2 not present; see Fig.5between 10% and 90%;R1 = 100 Ω; C1 = 1 nF;C2 not present; see Fig.50.35 0.60 − µs0.2 0.3 − µsno failures andfailures 1, 2, 5 and 6a;R1 = 100 Ω; see Figs 4 and 5C1 = 1 nF; C2 not present − 0.75 1.5 µsC1 = C2 = 3.3 nF − 1 1.75 µsfailures 3, 3a, 4, 6 and 7;R1 = 100 Ω; see Figs 4 and 5C1 = 1 nF; C2 not present − 0.85 1.4 µsC1 = C2 = 3.3 nF − 1.1 1.7 µsno failures andfailures 1, 2, 5 and 6a;R1 = 100 Ω; see Figs 4 and 5C1 = 1 nF; C2 not present − 1.2 1.9 µsC1 = C2 = 3.3 nF − 2.5 3.3 µsfailures 3, 3a, 4, 6 and 7;R1 = 100 Ω; see Figs 4 and 5C1 = 1 nF; C2 not present − 1.1 1.7 µsC1 = C2 = 3.3 nF − 1.5 2.2 µsnote 3 5 − 50 µsnormal operating mode;V TXD =0Vlow power modes; V BAT =12V;note 3low power modes; V BAT =12V;note 3low power modes; V BAT =12V;for wake-up after receiving afalling or rising edge; note 30.75 − 4 ms7 − 38 µs7 − 38 µs7 − 38 µst det failure detection time normal operating modefailures 3 and 3a 1.6 − 8.0 msfailures 4, 6 and 7 0.3 − 1.6 mslow power modes; V BAT =12Vfailures 3 and 3a 1.6 − 8.0 msfailures 4 and 7 0.1 − 1.6 ms2001 Nov 20 14
Philips SemiconductorsProduct specificationFault-tolerant CAN transceiverTJA1054t rec failure recovery time normal operating modefailures 3 and 3a 0.3 − 1.6 msfailures 4 and 7 7 − 38 µsfailure 6 125 − 750 µslow power modes; V BAT =12Vfailures 3, 3a, 4 and 7 0.3 − 1.6 msN detN recSYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNITpulse-count difference betweenCANH and CANL for failuredetectionnumber of consecutive pulses onCANH and CANL simultaneouslyfor failure recoverynormal operating mode andfailures 1, 2, 5 and 6a;pin ERR becomes LOW− 4 −failures 1, 2, 5 and 6a − 4 −Notes1. All parameters are guaranteed over the virtual junction temperature range by design, but only 100% tested atT amb = 125 °C for dies on wafer level, and in addition to this 100% tested at T amb =25°C for cased products, unlessotherwise specified.2. For bare die, all parameters are only guaranteed if the back side of the die is connected to ground.3. To guarantee a successful mode transition under all conditions, the maximum specified time must be applied.handbook, full pagewidthV TXDV CC0 VV CANLV CANH5 V3.6 V1.4 V0 V2.2 VV diff−3.2 V−5 VV RXDt PD(L) t PD(H)0.7V CC0.3V CCMGL424V diff =V CANH − V CANL .Fig.4 Timing diagram.2001 Nov 20 15
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TJA1054 Fault-tolerant CAN transceiver

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