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Modeling and analysis of the electrical resistance measurement of ...

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L. Shen et al. / Composites Science <strong>and</strong> Technology 67 (2007) 2513–2520 2517Fig. 4. Finite element mesh for (a) specimen 1 (no delamination), <strong>and</strong> (b)specimen 2 (with delamination).A 6 or A 1 –B 5 is used as <strong>the</strong> current contacts <strong>and</strong> <strong>the</strong> voltagebetween <strong>the</strong> electrode pair A 1 –A 5 or A 2 –B 4 needs to beobtained numerically. The <strong>resistance</strong> change for each casedue to delamination is obtained by comparing it with <strong>the</strong>corresponding value <strong>of</strong> <strong>the</strong> specimen without delamination.For <strong>the</strong> case <strong>of</strong> <strong>the</strong> through thickness <strong>resistance</strong> R A3 B 3, twopairs <strong>of</strong> current contacts are used, i.e., A 2 –B 2 <strong>and</strong> A 2 –B 4 .As voltage percentage change was used in <strong>the</strong> literature,ano<strong>the</strong>r purpose <strong>of</strong> <strong>the</strong> numerical <strong>analysis</strong> is to check if <strong>the</strong>voltage <strong>and</strong> <strong>resistance</strong> percentage changes due to <strong>the</strong>delamination using <strong>the</strong> four-probe method are close to<strong>the</strong> accurate <strong>resistance</strong> percentage change.3.3. FEM simulationsThe commercially available FEM code, ABAQUS, waschosen for this study. To ensure convergence, very finemeshes (9310 <strong>and</strong> 9598 linear quadrilateral elements) wereused for specimens 1 <strong>and</strong> 2, respectively. The meshesaround <strong>the</strong> electrodes A 3 <strong>and</strong> B 3 are shown in Fig. 4a<strong>and</strong> b for specimens 1 <strong>and</strong> 2.4. Results <strong>and</strong> discussion4.1. The validity range <strong>of</strong> <strong>the</strong> four-probe methodSince <strong>the</strong> finite element method is used in this study, for<strong>the</strong> two-probe method, <strong>the</strong> numerical calculations do notinvolve any <strong>resistance</strong>s caused by electrodes with wiresR 1 , <strong>the</strong> meter R 2 , <strong>and</strong> <strong>the</strong> contacts R 3 in <strong>the</strong> calculation.Thus it can be used to represent <strong>the</strong> exact solution R 0 for<strong>the</strong> system. In reality, <strong>the</strong> measured <strong>resistance</strong> through<strong>the</strong> two-probe method in general involves <strong>the</strong> contact <strong>resistance</strong>R 3 <strong>and</strong> o<strong>the</strong>r <strong>resistance</strong>s; it can not be used as accurate<strong>resistance</strong> <strong>of</strong> <strong>the</strong> sample, which is also <strong>the</strong> reason that<strong>the</strong> four-probe method was introduced. To be able to check<strong>the</strong> validity <strong>of</strong> <strong>the</strong> four-probe method, <strong>the</strong> <strong>resistance</strong>obtained from <strong>the</strong> definition, which is <strong>the</strong> same as <strong>the</strong> <strong>resistance</strong>from <strong>the</strong> two-probe method without contact, wire,<strong>and</strong> meter’s <strong>resistance</strong>s involved, is used as reference(two-probe), <strong>the</strong>n <strong>the</strong> <strong>resistance</strong> from <strong>the</strong> four-probemethod is calculated through <strong>the</strong> ratio <strong>of</strong> <strong>the</strong> measuredvoltage to <strong>the</strong> input current. The comparison <strong>of</strong> <strong>the</strong> <strong>resistance</strong>sbetween <strong>the</strong> two is demonstrated below.The first specimen without delamination shown inFig. 3a is designed to check <strong>the</strong> validity <strong>of</strong> <strong>the</strong> four-probemethod numerically. Based on <strong>the</strong> accurate <strong>the</strong>oreticalresults, <strong>the</strong> <strong>resistance</strong>s at various locations are calculatedusing <strong>the</strong> four-probe method. The surface <strong>and</strong> oblique<strong>resistance</strong>s for various through-thickness conductivitiesare listed in Table 1, <strong>and</strong> also plotted in Figs. 5 <strong>and</strong> 6.From <strong>the</strong>se comparisons, it is clearly seen that when <strong>the</strong>through-thickness conductivity is not too small comparedto <strong>the</strong> longitudinal conductivity, <strong>the</strong> four-probe methodcan work well. For <strong>the</strong> present case, if <strong>the</strong> longitudinalconductivity is 15 X 1 mm 1 , <strong>the</strong>n <strong>the</strong> through-thicknessconductivity should be larger than 1 X 1 mm 1 for <strong>the</strong>four-probe method to be applicable. However, for commonlyused composite panels, <strong>the</strong> through-thickness conductivityis much smaller than <strong>the</strong> longitudinal one, sayaround 0.005 X 1 mm 1 . Thus, <strong>the</strong> four-probe methodcannot be effectively used to measure <strong>the</strong> surface <strong>and</strong> oblique<strong>resistance</strong>s for real composite panels. The underlyingreason for this is that when <strong>the</strong> through-thickness conductivityis small, <strong>the</strong> voltage in <strong>the</strong> through-thickness directionexists due to <strong>the</strong> dominant <strong>electrical</strong> conduction in<strong>the</strong> longitudinal direction. Fig. 7 shows <strong>the</strong> contour plot<strong>of</strong> <strong>the</strong> current density vector, where <strong>the</strong> current density0.005 A/mm is applied between electrodes A 0 <strong>and</strong> A 6 . Also,<strong>the</strong> potential at each electrode <strong>and</strong> <strong>the</strong> magnitude <strong>of</strong> <strong>the</strong>current density at <strong>the</strong> middle <strong>of</strong> two adjacent electrodesare displayed in Fig. 7. Voltage drop in <strong>the</strong> through-thicknessdirection was also reported based on <strong>measurement</strong>sTable 1Comparison <strong>of</strong> <strong>the</strong> <strong>electrical</strong> <strong>resistance</strong>s between <strong>the</strong> accurate <strong>and</strong> four-probe methods (r L =15X 1 mm 1 )r T (X 1 mm 1 ) R (X) A1A5 R (X) A2A4 R (X) A1B5 R (X) A2B4Two-probe Four-probe Two-probe Four-probe Two-probe Four-probe Two-probe Four-probe0.001 2.123 1.2157 1.693 0.6712 3.211 2.1597 2.992 1.7970.005 1.135 0.5433 0.9005 0.2983 1.218 0.6100 1.093 0.42420.01 0.8156 0.4011 0.6762 0.2186 0.8717 0.4143 0.7537 0.25800.1 0.4002 0.2548 0.2753 0.1293 0.4002 0.2547 0.2761 0.12941 0.2798 0.2474 0.1561 0.1237 0.2798 0.2474 0.1561 0.12375 0.2543 0.2450 0.1318 0.1225 0.2543 0.2450 0.1318 0.122510 0.2486 0.2434 0.1269 0.1217 0.2486 0.2434 0.1269 0.121715 0.2459 0.2424 0.1247 0.1212 0.2459 0.2424 0.1247 0.121220 0.2443 0.2415 0.1235 0.1208 0.2443 0.2415 0.1235 0.1208

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