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L. Shen et al. / Composites Science <strong>and</strong> Technology 67 (2007) 2513–2520 2519Table 2Comparison between <strong>the</strong> voltage <strong>and</strong> <strong>resistance</strong> percentage changes <strong>and</strong> <strong>the</strong> dependence <strong>of</strong> voltage percentage changes on different current contactsFour-probe voltage V 1 (mV) V 2 (mV) (V 2 V 1 )/V 1 (%) Two-probe <strong>resistance</strong> R 1 (X) R 2 (X) (R 2 R 1 )/R 1 (%)A 1 –A 5 [A 0 –A 6 ] 54.33 54.44 0.2025 A 1 –A 5 1.135 1.145 0.8811A 2 –A 4 [A 0 –A 6 ] 23.47 23.54 0.2983 A 2 –A 4 0.9005 0.9100 1.055A 2 –A 4 [A 1 –A 5 ] 29.83 29.88 0.1676 A 2 –A 4A 1 –B 5 [A 0 –B 6 ] 61.00 61.53 0.8689 A 1 –B 5 1.218 1.234 1.316A 2 –B 4 [A 0 –B 6 ] 33.49 34.08 1.762 A 2 –B 4 1.093 1.111 1.647A 2 –B 4 [A 1 –B 5 ] 42.42 43.10 1.603 A 2 –B 4A 3 –B 3 [A 2 –B 2 ] 34.25 35.14 2.599 A 3 –B 3 1.052 1.068 1.521A 3 –B 3 [A 2 –B 4 ] 34.25 35.14 2.599 A 3 –B 3V ¼ V 2 V 1 100 ð2ÞV 1where V 1 , V 2 are voltages <strong>of</strong> specimen 1 <strong>and</strong> 2, respectively.The <strong>resistance</strong> percentage changes are calculated using <strong>the</strong>two-probe method for specimens 1 <strong>and</strong> 2, <strong>and</strong> are denotedas R A1 A 5, R A2 A 4, R A1 B 5, R A2 B 4<strong>and</strong> R A3 B 3, respectively. Note that<strong>the</strong> difference between V A 0A 6A 2 A 4<strong>and</strong> V A 1A 5A 2 A 4will show <strong>the</strong> dependence<strong>of</strong> <strong>the</strong> voltage percentage change on <strong>the</strong> current contacts.The same is also valid for <strong>the</strong> differences betweenV A 0B 6A 2 B 4<strong>and</strong> V A 1B 5A 2 B 4, <strong>and</strong> between V A 2B 2A 3 B 3<strong>and</strong> V A 2B 4A 3 A 3. But <strong>the</strong> <strong>resistance</strong>percentage change is not affected by <strong>the</strong> current contactsbecause it only depends on <strong>the</strong> material properties<strong>and</strong> structural change such as delamination <strong>of</strong> <strong>the</strong> compositepanel.The FEM results for <strong>the</strong> voltages, <strong>resistance</strong>s <strong>and</strong> <strong>the</strong>irpercentage change are listed in Table 2, where <strong>the</strong> column<strong>and</strong> row values correspond to voltage/<strong>resistance</strong> <strong>and</strong> contacts,respectively. For example, V A 0A 6A 1 A 5<strong>and</strong> R A1 A 5correspondto <strong>the</strong> values <strong>of</strong> 0.2025 <strong>and</strong> 0.8811 in Table 2, respectively.It can be seen from Table 2 that <strong>the</strong> voltage <strong>and</strong> <strong>resistance</strong>percentage changes are significantly different. Also,<strong>the</strong> voltage percentage changes depend on <strong>the</strong> current contactsused. For example, <strong>the</strong> surface voltage percent changebetween <strong>the</strong> electrodes A 2 <strong>and</strong> A 4 under <strong>the</strong> current contactsA 0 <strong>and</strong> A 6 <strong>and</strong> A 1 <strong>and</strong> A 5 , i.e., V A 0A 6A 2 A 4<strong>and</strong> V A 1A 5A 2 A 4are0.2983 <strong>and</strong> 0.1676, respectively. On <strong>the</strong> o<strong>the</strong>r h<strong>and</strong>, <strong>the</strong>oblique voltage percent changes are not severely affectedby <strong>the</strong> different current contacts, as shown by <strong>the</strong> values<strong>of</strong> V A 0B 6A 2 B 4¼ 1:762 <strong>and</strong> V A 1B 5A 2 B 4¼ 1:603, <strong>and</strong> by those <strong>of</strong> V A 2B 2A 3 B 3<strong>and</strong> V A 2B 4A 3 A 3. Therefore, it is not reliable to use <strong>the</strong> voltagepercentage changes to inversely predict damage inside compositepanels because <strong>the</strong>re are no consistent changes dueto <strong>the</strong> different current contacts.5. ConclusionStrip type specimens with <strong>and</strong> without delaminationdamage are used to carry out numerical analyses <strong>of</strong> <strong>the</strong><strong>electrical</strong> <strong>resistance</strong> <strong>and</strong> voltage in a carbon fiber-reinforcedcomposite panel. The purpose <strong>of</strong> <strong>the</strong> study is to determine<strong>the</strong> validity range <strong>of</strong> <strong>the</strong> four-probe method for <strong>resistance</strong><strong>measurement</strong>, <strong>and</strong> <strong>the</strong> applicability <strong>of</strong> <strong>the</strong> voltage changemethod based on <strong>the</strong> four-probe method. The presentstudy shows that <strong>the</strong> method is only valid when <strong>the</strong>through-thickness conductivity is comparable to or largerthan <strong>the</strong> longitudinal conductivity. For example, if <strong>the</strong> longitudinalconductivity is 15 X 1 mm 1 , <strong>the</strong> through-thicknessconductivity should be larger than 1 X 1 mm 1 . Thepresent results show that <strong>the</strong> damage induced voltagechange between a pair <strong>of</strong> voltage contacts is not consistentwith <strong>the</strong> <strong>resistance</strong> change due to <strong>the</strong> same damage. Theunderlying reason for this is that <strong>the</strong> damage induced voltagechange depends on <strong>the</strong> current contacts used, while <strong>the</strong><strong>resistance</strong> change does not.AcknowledgementsThis work was supported by Global Contour Ltd.through NSF SBIR Phase IIA grant. The authors wouldlike to thank Pr<strong>of</strong>. Deborah Chung <strong>of</strong> <strong>the</strong> State University<strong>of</strong> New York/Buffalo for her valuable suggestions during<strong>the</strong> course <strong>of</strong> this project.References[1] Liang D. Fibre optic silicon impact sensor for application to smartskins. Electron Lett 1993;29(6):529–30.[2] Kuang KSC, Kenny R, Whelan MP, Cantwell WJ, Chalker PR.Residual strain <strong>measurement</strong> <strong>and</strong> impact response <strong>of</strong> optical fibreBragg grating sensors in fibre metal laminates. Smart Mater Struct2001;10(2):338–46.[3] Porfilio M, Graziani. ISIS: An in situ impact sensor for space debrismonitoring. Adv Space Res 2004;34(5):929–34.[4] Imai S, Tokuyama M, Hirose S, Burger GJ, Lammerink TSJ,Fluitman JHJ. Thin-film piezoelectric impact sensor array fabricatedon a Si slider for measuring head-disk interaction. IEEE Trans Magn1995;31(6.1):3009–11.[5] Haywood J, Coverley PT, Staszewski WI, Worden K. An automaticimpact monitor for a composite panel employing smart sensortechnology. Smart Mater Struct 2005;14(1):265–71.[6] Wang X, Chung DDL. Real-time monitoring <strong>of</strong> fatigue damage <strong>and</strong>dynamic strain in carbon fiber polymer–matrix composite by <strong>electrical</strong><strong>resistance</strong> <strong>measurement</strong>. Smart Mater Struct 1997;6:504–8.[7] Wang X, Wang S, Chung DDL. Sensing damage in carbon fiber <strong>and</strong>its polymer–matrix <strong>and</strong> carbon-matrix composites by <strong>electrical</strong><strong>resistance</strong> <strong>measurement</strong>. J Mater Sci 1999;34(11):2703–14.[8] Wang S, Chung DDL. Mechanical damage in carbon fiber polymer–matrix composites, studied by <strong>electrical</strong> <strong>resistance</strong> <strong>measurement</strong>.Compos Interf 2002;9(1):51–60.[9] Wang S, Mei Z, Chung DDL. Interlaminar damage in carbon fiberpolymer–matrix composites, studied by <strong>electrical</strong> <strong>resistance</strong> <strong>measurement</strong>.Int J Adhes Adhes 2001;21(ER6):465–71.[10] Wang S, Wang D, Chung DDL. Method <strong>of</strong> sensing impact damage incarbon fiber polymer–matrix composite by <strong>electrical</strong> <strong>resistance</strong><strong>measurement</strong>. J Mater Sci 2006;41(8):2281–9.

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