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Modeling and analysis of the electrical resistance measurement of ...

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2520 L. Shen et al. / Composites Science <strong>and</strong> Technology 67 (2007) 2513–2520[11] Wang S, Chung DDL. Self-sensing <strong>of</strong> damage in carbon fiberpolymer–matrix composite by <strong>measurement</strong> <strong>of</strong> <strong>the</strong> <strong>electrical</strong> <strong>resistance</strong>or potential away from <strong>the</strong> damage region. J Mater Sci2005;40(24):6463–72.[12] Wang S, Chung DDL, Chung J. Self-sensing <strong>of</strong> damage in carbonfiber polymer–matrix composite cylinder by <strong>electrical</strong> <strong>resistance</strong><strong>measurement</strong>. J Intell Mater Syst Struct 2006;17(1):57–62.[13] Anderson TA, Lemoine GI, Ambur DR. An artificial neural networkbased damage detection scheme for <strong>electrical</strong>ly conductive compositestructures. In: Proc <strong>of</strong> 44th AIAA/ASME/ASCE/AHS Structures,Structural Dynamics, <strong>and</strong> Materials Conf 2003; 1997, p. 1–9.[14] Todoroki A, Tanaka Y, Shimamura Y. Measurement <strong>of</strong> orthotropicelectric conductance <strong>of</strong> CFRP laminates <strong>and</strong> <strong>analysis</strong> <strong>of</strong> <strong>the</strong> effect ondelamination monitoring with an electric <strong>resistance</strong> change method.Comput Sci Technol 2002;62:619–28.[15] Todoroki A, Tanaka Y. Delamination identification <strong>of</strong> cross-plygraphite/epoxy composite beams using electric <strong>resistance</strong> changemethod. Comput Sci Technol 2002;62:629–39.[16] Todoroki A, Tanaka Y, Shimamura Y. Multi-probe electric potentialchange for delamination monitoring <strong>of</strong> graphite/epoxy compositeplates using normalized response surfaces. Comput Sci Technol2004;64:749–58.[17] Todoroki A, Tanaka Y, Shimamura Y. Electrical <strong>resistance</strong> changemethod for monitoring delaminations <strong>of</strong> CFRP laminates: effect <strong>of</strong>spacing between electrodes. Comput Sci Technol 2005;65:37–46.[18] Chung DDL. E-mail discussions.

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