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In Situ Spectroscopic Investigation of Molecular Structures of Highly ...

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<strong>Molecular</strong> <strong>Structures</strong> <strong>of</strong> Dispersed V 2 O 5 /SiO 2 J. Phys. Chem. B, Vol. 102, No. 52, 1998 10847Figure 7. UV-vis DRS spectra <strong>of</strong> the hydrated V 2O 5/SiO 2 samples.7315 cm -1 band due to the surface isolated Si-OH groupsdecreases substantially with increasing vanadia loading anddisappears at loadings <strong>of</strong> 12% V 2 O 5 and above. A band at 7245cm -1 , which may previously be overlapped by the strong 7315cm -1 band, shows up and does not change noticeably up to the15% V 2 O 5 loading. The amount <strong>of</strong> the isolated Si-OHhydroxyls relative to the pure SiO 2 support is plotted as afunction <strong>of</strong> the V surface density in Figure 6B. As the vanadialoading increases from 1% to 12% V 2 O 5 , the sharp decrease inthe relative amount <strong>of</strong> the isolated Si-OH hydroxyls demonstratesthat deposition <strong>of</strong> the surface vanadium oxide speciessignificantly consumes the surface Si-OH hydroxyls and themaximum surface coverage <strong>of</strong> vanadium oxide is achieved ataround 12% V 2 O 5 , which is consistent with Raman results. Thehydroxyls contributing to the absorption at 7245 cm -1 mightbe the remaining inaccessible Si-OH hydroxyls. Among thesehydroxyls, only a small percentage can be exchanged bydeuterium through D 2 O adsorption experiments (

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