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Antiferroelectric liquid crystal displays - ResearchGate

Antiferroelectric liquid crystal displays - ResearchGate

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<strong>Antiferroelectric</strong> <strong>liquid</strong> <strong>crystal</strong> <strong>displays</strong>Fig. 1. Technologies and applications of <strong>displays</strong>. A trend for increasing size and resolution is highlighted.At the same time as AM-TFT LCDs were developed, analternative way to prepare high resolution LCDs arose froma different approach. Bistability was demonstrated insmectic LC phases, associated with ferroelectricity. BistableLCs are able to hold pixel information in the absenceof power supply. Therefore, they can be driven, in principle,by passive matrices. Since then, new ferroelectric families– antiferroelectrics, V-shape smectics, orthoconic materials– have widen the number of possible applications forthese materials. In the last few years, ferroelectric-baseddisplay prototypes ranging from micro<strong>displays</strong> to large direct-view<strong>displays</strong> have been created [8], demonstrating thefeasibility of such technology. Development of these <strong>displays</strong>has been precluded by the lack of suitable materialsTable 1. Display capabilities of different LCD technologies.Material/technologyMultiplexabilityGreyscaleOpticalstabilityColourditheringSwitchingtypeViewingangleDynamicresponsePassive twistednematicVerylimitedAnalogue Monostable Spatial Out-of-plane Poor 10’s msPassive supertwistednematicActive matrix twistednematicActive matrixhomogeneousnematicLimited Analogue Monostable Spatial Out-of-plane Very poor 10’s msUnlimited Analogue Monostable Spatial Out-of-plane Good 10’s msUnlimited Analogue Monostable Spatial In-plane Excellent 10’s msPassive ferroelectricUnlimitedSpatial/temporalditheringBistable Temporal In-plane Excellent 10’s µsPassiveantiferroelectricUnlimited Analogue MultistableSpatial/temporalIn-plane Excellent 10’s µsActive matrixV-shape smecticUnlimited Analogue MonostableSpatial/temporalIn-plane Excellent 10’s µs264 Opto-Electron. Rev., 12, no. 3, 2004 © 2004 COSiW SEP, Warsaw

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