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III-V epitaxy MOCVD MBE substrate & equipment market - I-Micronews

III-V epitaxy MOCVD MBE substrate & equipment market - I-Micronews

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Aixtron<br />

<strong>III</strong>-V Epitaxy Equipment<br />

& Applications Market<br />

<strong>MOCVD</strong> & <strong>MBE</strong> for LED, RF, Power and HCPV Devices<br />

Veeco<br />

Growing<br />

Chemical-mechanical<br />

→<br />

→<br />

© 2012• 1 Copyrights © Yole Développement SA. All rights reserved.<br />

Core Fabrication<br />

Geometry inspection<br />

Monocrystal<br />

Riber Spot Image<br />

→<br />

→<br />

Wafer Slicing<br />

Optical inspection<br />

→<br />

→<br />

Apple<br />

Lapping<br />

Final cleaning<br />

→<br />

→<br />

D<br />

E


© 2012• 2 Copyrights © Yole Développement SA. All rights reserved.<br />

Report Scope<br />

This report covers the following <strong>III</strong>-V semiconductor applications:<br />

Applications Components Materials Main Substrates<br />

High Brightness LEDs<br />

High Brightness LEDs<br />

RF Electronic<br />

High Concentrated Photo-Voltaic<br />

Power GaN<br />

Blue, Green and white<br />

(with phosphor) LEDs<br />

GaN, InGaN,<br />

InAlGaN<br />

Red-Yellow-Orange LEDs InGaAlP • GaAs<br />

Power amplifiers<br />

Antenna switches<br />

(Technologies: HBT, HEMT,<br />

FET)<br />

AlGaAs,<br />

InGaAs,<br />

InGaP,<br />

GaAsInN<br />

Photovoltaic cells GaAs, AlGaAs,<br />

GaInAs, GaInP<br />

AlGaInP,<br />

AlInAs,<br />

GaInNAsSb<br />

Inverters, converters (DC-<br />

DC, AC-DC, DC-AC), RF<br />

Transistors.<br />

(Technologies: HEMT,<br />

HBT)<br />

Report Scope<br />

GaN, InGaN,<br />

AlGaN<br />

• Sapphire<br />

• SiC<br />

• Silicon (emerging)<br />

• GaN (Emerging)<br />

• GaAs<br />

• Germanium<br />

• GaAs (Emerging)<br />

• Silicon<br />

(mainstream)<br />

• Sapphire<br />

• SiC


© 2012• 3 Copyrights © Yole Développement SA. All rights reserved.<br />

<strong>MBE</strong> (2)<br />

• <strong>MBE</strong> <strong>market</strong> is driven by the steady growth in cell phone and wireless devices.<br />

However, the opportunity will be somehow be limited by advances in <strong>MOCVD</strong> that<br />

will be used to manufacture an increasing number of GaAs HBT and HEMT.<br />

• HCPV will provide a small potential upside for <strong>MBE</strong> as well.<br />

March 2012<br />

Executive Summary


H 2<br />

N 2<br />

Purifier<br />

Purifier<br />

V-hydride<br />

precursor V-hydride<br />

precursor<br />

Dopant<br />

© 2012• 4 Copyrights © Yole Développement SA. All rights reserved.<br />

System Overview<br />

<strong>III</strong>- alkyl MO<br />

precursor<br />

<strong>III</strong>- alkyl MO<br />

dopant<br />

precursor<br />

<strong>III</strong>-Bubblers<br />

Injection Manifold – Run/Vent<br />

Assembly<br />

Reactor Chamber<br />

Aixtron<br />

<strong>MOCVD</strong><br />

Pump<br />

Valve<br />

Wafer tray<br />

transfer<br />

system<br />

Exhaust<br />

Pump<br />

Load Lock*<br />

*can also include<br />

baking/cooling chamber<br />

Effluent<br />

processing<br />

“Scrubbers”<br />

Exhaust


© 2012• 5 Copyrights © Yole Développement SA. All rights reserved.<br />

Cost of Ownership Drivers<br />

Overview<br />

The cost of ownership of a <strong>MOCVD</strong> system is driven by multiple factors:<br />

Equipment uptime<br />

(maintenance,<br />

cleaning…)<br />

Layer deposition<br />

speed<br />

Loading,<br />

unloading time,<br />

Automation<br />

Reactor and wafer<br />

temperature ramp<br />

up and cooling<br />

Labor cost<br />

Upfront<br />

<strong>equipment</strong><br />

cost<br />

THROUGHPUT<br />

Number and<br />

size of wafer<br />

per batch<br />

Operating and<br />

depreciation<br />

costs<br />

Energy Costs<br />

<strong>MOCVD</strong><br />

YIELDS<br />

Uniform gas flow: �<br />

binning yields<br />

Precursor<br />

utilization<br />

efficiency<br />

System Footprint<br />

Uniform <strong>substrate</strong><br />

temperature: �<br />

binning yields<br />

Process control, in<br />

situ metrology


© 2012• 6 Copyrights © Yole Développement SA. All rights reserved.<br />

Main Players<br />

Other / emerging players (2)<br />

Company Country Overview Status<br />

Company A FR<br />

Company B CN<br />

Company C US<br />

Company D KR<br />

Company E TW<br />

Semiconductor, PV, LED <strong>equipment</strong> manufacturer<br />

offering inspection and CVD tools.<br />

Micro fabrication (RIE) tool supplier to the<br />

semiconductor industry.<br />

Leading semiconductor <strong>equipment</strong> manufacturer (IC,<br />

PV). Obtained a DOE grant to develop clustered<br />

layer-specific <strong>MOCVD</strong> reactors and HVPE/<strong>MOCVD</strong><br />

hybrid reactors.<br />

Integrated Process system (IPS) acquired by ATTO in<br />

late 2010. Leading <strong>equipment</strong> and gas delivery<br />

systems provider to the semiconductor, PV, and FPD<br />

industries<br />

Manufacturer of photoelectric & thin film process<br />

<strong>equipment</strong> in TAIWAN<br />

<strong>MOCVD</strong> tool currently in development. The<br />

company was acquired by Soitec in Jan 2012.<br />

Collaboration with GCL to develop <strong>MOCVD</strong><br />

tools. Shipped some prototypes.<br />

Small number of systems currently being<br />

tested at the following customers: TSMC,<br />

IMEC, Samsung, Silan, Toshiba, Micron.<br />

Developed first reactor in late 2009. Would be<br />

collaborating with Samsung.<br />

Planning to enter the <strong>MOCVD</strong> <strong>market</strong> in 2012.<br />

AltaCVD reactor Concept of a hybrid - cluster <strong>MOCVD</strong> Tool<br />

<strong>MOCVD</strong>


© 2012• 7 Copyrights © Yole Développement SA. All rights reserved.<br />

GaN Epitaxy with <strong>MBE</strong> (1)<br />

• <strong>MBE</strong> growth of As/P compound are well established and routinely used for the<br />

mass production of various devices (Lasers, HEMT, HBT, MESFET…). However,<br />

the growth of nitride compounds poses significant challenges:<br />

Challenge Description Solutions<br />

Growth<br />

temperature<br />

Narrow<br />

process<br />

window<br />

Nitrogen<br />

sources<br />

Ga-face<br />

growth*<br />

• Nitride growth by <strong>MBE</strong> require temperatures in the 750-800˚C<br />

range, significantly higher than for As/P materials (450-500˚C).<br />

• Obtaining homogenous temperature at the surface of the wafer is<br />

difficult at such temperatures due to the UHV conditions that limit<br />

thermal exchanges to conductive and radioactive mechanisms. The<br />

problem is complicated by the use of sapphire or SiC <strong>substrate</strong> that<br />

are mostly transparent.<br />

• The ratio of Ga/N flux must be precisely controlled within a very<br />

small range in order to achieve good layer quality and homogeneity<br />

without Ga droplets.<br />

• Unlike <strong>MOCVD</strong>, <strong>MBE</strong> process temperature does not allow the<br />

pyrolysis of NH 3.<br />

• <strong>MBE</strong> layers tend to grow on the N-face which exhibit rough<br />

surfaces due to the formation of columnar poly-crystals with<br />

pyramidal tops. The better quality Ga-face (c-axis) that is obtained<br />

by <strong>MOCVD</strong> is difficult to obtain at <strong>MBE</strong> lower temperature.<br />

• Specially designed susceptors.<br />

• Absorbing coating (eg: Ti) at the back of the<br />

wafers.<br />

• Precise source control, homogeneity and<br />

temperature control of the wafers.<br />

• NH 3 (ammonia) gas injectors with high<br />

operating temperature (1000°C) for molecule<br />

cracking.<br />

• RF plasma sources to crack molecular<br />

nitrogen (N 2): difficult ensure stable flux.<br />

• Increasing temperature allows to switch to the<br />

Ga-face with smoother morphology<br />

• Start from A face GaN templates grown by<br />

<strong>MOCVD</strong>.<br />

* for certain type for devices like HEMT, the N-face offers improved electrical performance. Research is therefore active to improve the quality of Nface<br />

grown GaN.<br />

Molecular Beam Epitaxy


© 2012• 8 Copyrights © Yole Développement SA. All rights reserved.<br />

<strong>MBE</strong> Main Players<br />

Overview<br />

Name Country Systems Sources Crucibles<br />

Company A CN X<br />

Company B GE X X<br />

Company C GE X<br />

Company D FI X X X<br />

Company E JP X X<br />

Company F UK X<br />

Company G GE X X X<br />

Company H GE X X<br />

Ribber / Addon / VG Semicon FR X X X<br />

Company I GE X<br />

Company J US X X<br />

Company K GE X X<br />

Veeco US X X<br />

Various other instrumentation and UHV company design and offer custom <strong>MBE</strong> systems: Henniger Scientific, AJA International…<br />

Molecular Beam Epitaxy


© 2012• 9 Copyrights © Yole Développement SA. All rights reserved.<br />

Plasma Assisted <strong>MOCVD</strong><br />

Key Players<br />

Company A Company B Company C Company D<br />

Country US AU CA US - FR<br />

Technology NA<br />

Comments<br />

•Patent application<br />

WO 2011/XXX46A2<br />

Describes a cluster<br />

tool in which a plasma<br />

source can be used<br />

either for cleaning<br />

purpose or to<br />

generate the nitrogen<br />

active species for<br />

deposition.<br />

“Remote Plasma CVD”<br />

(RPCVD)<br />

•Bluglass was the first proponent of<br />

Plasma Assisted <strong>MOCVD</strong>. It initially<br />

promoted the use of alternative<br />

<strong>substrate</strong>s (glass) but now focuses on<br />

demonstrating the benefit of low T p-<br />

GaN growth for LEDs and the ability to<br />

tune the indium content over a wide<br />

range of composition for CPV.<br />

•In 2010, the company created EpiBlu, a<br />

JV with plasma source and cluster tools<br />

expert SPTS to develop RPCVD LED<br />

process and <strong>equipment</strong>. Initially, the<br />

RPCVD is to be used as a complement<br />

to standard <strong>MOCVD</strong> to grow the p-GaN<br />

layer. Ultimately, the goal is to move to a<br />

100% RPCVD process.<br />

•Bluglass solar subsidiary BluSolar” is<br />

developing InGaN CPV cells.<br />

Other Epitaxy Techniques<br />

“Migration Enhanced<br />

Afterglow Epitaxy”<br />

(Meaglow)<br />

Founded by Scott Butcher,<br />

previously co-founder of<br />

Bluglass.<br />

The company is targeting the<br />

LED and CPV industries.<br />

The company offers a<br />

research reactor in which the<br />

precursors are pulsed in order<br />

to improve crystal quality.<br />

“Plasma Assisted<br />

<strong>MOCVD</strong>”<br />

(PA-<strong>MOCVD</strong>)<br />

Table top system:<br />

NMC-4000: 1x 6”<br />

or 5x 4” for R&D<br />

purpose. Can be<br />

clustered for<br />

production.


© 2012• 10<br />

Copyrights © Yole Développement SA. All rights reserved.<br />

LED Wafer Starts<br />

• The type of <strong>III</strong>-V alloy (GaN or InGaAlP) used in the active layers dictates the type of<br />

<strong>MOCVD</strong> reactors to be used for manufacturing.<br />

• The growth of the LED <strong>market</strong> translates into significant increase in term of wafer<br />

starts. However as LED applications mature and <strong>epitaxy</strong> yields improve, the growth<br />

is expected to slow down significantly toward the end of the decade.<br />

March 2012<br />

HB LED: Market


© 2012• 11<br />

Copyrights © Yole Développement SA. All rights reserved.<br />

LED Epitaxy Cycle Time<br />

Overview<br />

• Due to the thickness of the structure and requirements to adjust temperature multiple<br />

times, LED manufacturing <strong>MOCVD</strong> cycles vary from X to X hours depending on the<br />

structure (number of QW, thickness of the n-type layer and undoped GaN layers).<br />

• In order to reduce the total cycle time, <strong>MOCVD</strong> vendors are exploring the concept of<br />

using cluster reactors in which each chamber would be dedicated to a specific type of<br />

layer. In the example below, the use of a 3 chamber cluster tool could reduce cycle time<br />

from X to Xhrs:<br />

~ X h<br />

~ X h<br />

Reactor Cleaning:<br />

X hour<br />

MQW ~ X h<br />

MQW<br />

Cycle Time: X hrs<br />

Typical GaN LED cycle time in a standard reactor (Yole)<br />

HB LED: Epitaxy<br />

~ X h Idle<br />

~ X h<br />

~ X h<br />

Reactor<br />

Cleaning:<br />

X hour<br />

Cycle Time: x hrs<br />

Concept of a cluster reactor with layer specific chambers<br />

(source: AMAT, Yole)<br />

Idle<br />

<strong>MOCVD</strong>3<br />

<strong>MOCVD</strong>2<br />

<strong>MOCVD</strong>1


Example of HEMT Epitaxial Structure<br />

• HEMTs are usually much thinner (< 1 um) than HBT. However they remain complex<br />

structures with up to 50 individual layers.<br />

• HEMT are often grown by <strong>MBE</strong> with a typical cycle time of about an hour. However,<br />

we estimate than more than XX% of pHEMT are now produced by <strong>MOCVD</strong>. More<br />

recently encouraging results indicate that mHEMTs could also be produced by<br />

<strong>MOCVD</strong> (next slide).<br />

© 2012• 12<br />

Copyrights © Yole Développement SA. All rights reserved.<br />

n doped GaAs cap<br />

AlGaAs etch Stop / Schottky<br />

Si doped AlGaAs<br />

Undoped AlGaAs Spacer<br />

InGaAs channel<br />

Undoped AlGaAs Spacer<br />

Si doped AlGaAs<br />

GaAs/AlGaAs superlattice<br />

GaAs Buffer<br />

Semi Insulating GaAs<br />

<strong>substrate</strong><br />

Example of HEMT structure<br />

RF GaAs: Epitaxy<br />

400-500 Å<br />

50-200 Å<br />

< 50 Å<br />

< 50 Å<br />

120 Å<br />

< 50 Å<br />

< 50 Å<br />

0.1 µm<br />

0.5 - 1 µm<br />

Typically:<br />

< 1 µm


Captive and Merchant Capacity<br />

• <strong>MOCVD</strong> capacity is essentially merchant while <strong>MBE</strong> capacity is split almost<br />

equally between merchant and captive:<br />

XX%<br />

Total <strong>MBE</strong>: XXX k TIE per month<br />

© 2012• 13<br />

Copyrights © Yole Développement SA. All rights reserved.<br />

Total: XXXk TIE per month<br />

RF GaAs: Epitaxy<br />

XX%<br />

Total <strong>MOCVD</strong>: XXXk TIE per month


Power GaN Epitaxial Structures (2)<br />

• No standard has emerged yet and each manufacturer and<br />

research team is developing its own structure. All include<br />

a thick buffer layer (XX to XX um) in order to reduce the<br />

dislocation density arising from the lattice mismatch as<br />

well as various strain management layers in order to<br />

compensate for the TEC mismatch.<br />

• All commercial Power GaN devices are grown by <strong>MOCVD</strong>.<br />

• While the process is similar to the growth of LED<br />

structures, surface contaminations by particles is much<br />

more critical: LED die are typically less than 1 mm 2 in size<br />

while transistors are several mm 2 and often > 10 mm 2 . As<br />

a result, special care must be taken in order to reduce the<br />

formation of particles stemming from parasitic reactions<br />

near the wafer surface as well as reducing the impact of<br />

contamination stemming from the deposits on the reactor<br />

wall. Growth conditions (e.g.: pressure) and cleaning<br />

procedures therefore differ from LED manufacturing.<br />

• As a result, GaN power device manufacturing yields are<br />

still fairly low and must be increased to at least >XX% in<br />

order to enable mass commercialization.<br />

© 2012• 14<br />

Copyrights © Yole Développement SA. All rights reserved.<br />

Power GaN: Epitaxy<br />

Double HBT structures<br />

(Georgia Institute of Technology)<br />

Cross section SEM image of 0.5/m NRF1 field<br />

plated AlGaN/GaN HEMT technology (Nitronex)


Number of reactors<br />

LED Reactors<br />

2009-2020 Volume Forecast GaN vs. InGaAlP<br />

Large LCD Display +<br />

China Subsidies<br />

© 2012• 15<br />

Copyrights © Yole Développement SA. All rights reserved.<br />

March 2012<br />

Capacity<br />

Digestion<br />

Excess capacity to<br />

be used for lighting<br />

applications<br />

General Lighting Investment<br />

Cycle<br />

Reactor Forecast<br />

Replacement driven


TMG and TMI 2011 Volume Breakdown<br />

per Application<br />

• LED represent more than XX% of TMG and TMI use for the applications surveyed<br />

in this report.<br />

• We estimate that other applications (GaN lasers, Other GaAs based<br />

optoelectronic devices) represent about X tons of TMG and X tons of TMI)<br />

Over a total of XX tons Over a total of XX tons<br />

© 2012• 16<br />

Copyrights © Yole Développement SA. All rights reserved.<br />

<strong>MOCVD</strong> Precursors


Media business<br />

Website / Magazines / Webcasts<br />

© 2012 © 2012• 17<br />

17<br />

Copyrights © Yole Développement SA. All rights reserved.<br />

Yole Activities<br />

Technology & Market<br />

Reports<br />

Report/Database/Reverse Costing/Tools<br />

Custom Studies<br />

Market Research<br />

Technology & Strategy<br />

www.yole.fr<br />

Yole Finance<br />

M&A / Due Diligence /<br />

Fund raising services<br />

www.yolefinance.com


UV LED MARKET<br />

New!<br />

LED Packaging<br />

2011<br />

LED CoSim+<br />

© 2012 © 2012• 18 18<br />

Copyrights © Yole Développement SA. All rights reserved.<br />

LED reports from YOLE<br />

<strong>III</strong>-V Epitaxy Substrates<br />

& Equipment Market<br />

New!<br />

Status of the LED<br />

Industry<br />

SiC Market SAPPHIRE MARKET<br />

LED Manufacturing<br />

Technologies 2011<br />

LED Fab Database

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