Modular-Instruments-Seminar - National Instruments Germany GmbH

National Instruments 

Modular-Instruments-Seminar 

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1 

National Instruments – CER Region Modular-Instruments-Seminar

Ihr National Instruments Team in Deutschland, Österreich und der Schweiz 

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2 


Index 

Section 1 5 

Section 2 10 

Section 3 – The PXI Plattform 24 

Section 4 – Designing PXI Systems for Semiconductor Characterization 37 

Exampel 1: Transistor Testing 39 

Example 2: Voltage Reference Testing 43 

Example 3: DC Parametric Measurements 48 

Types of Semiconductor Tests 

Example 1: Memory Test 58 

Example 2: Serializer / Deserializer (SerDes) 65 

Example 3: Analog to Digital Converters (ADCs) 71 

Example 4: Digital to Analog Converter (DAC) 78 

Example 5: AC Parametric Testing 83 

Example 6: Amplifier /Attenuator (LNA) 87 

Example 7: Direct Quadrature Modulator 91 

Section 5 – Unique Implementations for System Test 102 

3 


4 


Before we we get get into what tools and and techniques techniques NI can offer, let’s let’s first first address address some challenges that most 

everyone in in the industry industry is is facing. facing. Since Since our our audience audience today today may may contain a a diverse diverse crowd crowd from very 

different areas areas of of the the industry, it’s important to to realize that we continue continue to see see some some pervasive 

pervasive 

challenges and needs to which NI can offer unique sol solutions, utions, and this applies to applications from design 

and validation, all the way through manufacturing and production test. 

National Instruments – CER Region 

5 

Modular- -Instruments-Seminar

The single single largest largest trend that we continue to to see see is is that the cost of of test test is is simply simply too too high. high. Although the 

cost of manufacturing semiconductor components and ICs ICs has been driven down by technological 

advancements (most notably in manufacturing and fabrication), the cost of of test equipment equipment and test 

test 

systems has remained relatively constant, so as a percentage of total cost, the cost of test is 

skyrocketing. This This trend is affecting everyone everyone from from design to manufacturing manufacturing as teams teams are having to work 

work 

together to solve this complex issue. 

There are are actually actually quite quite a a few few new new techniques techniques that that people are using using such as Design for Test (DFT) (DFT) and 

and 

Design ign for for Manufacturability Manufacturability which are helping to reduce costs costs through innovations innovations in in design. Today, 

Today, 

we’ll be focusing more more on on the test systems themselves (as opposed to techniques techniques used throughout the 

design cycle) in order to find solutions to this pervasive problem from a test-focused focused approach. 

I’m sure most of of you you have have already already heard heard of PXI PXI (PCI (PCI Extensions for for Instrumentation) Instrumentation) as NI’s NI’s primary 

primary 

platform for test equipment, and indeed PXI is is going going to to hold a lot of answers to reducing test costs in 

terms of instruments ruments as as well well as ownership costs, flexibility, future development and and reuse. Lowering Lowering the 

the 

cost of test will be a theme throughout today’s presentation. 

National Instruments – CER Region 6 


Another trend trend that is gaining more attention is the increase in in global global design and and manufacturing. There Th 

are many complex issues surrounding this topic. From a product development standpoint standpoint it is is important 

important 

for design design engineers, test test engineers, engineers, and managers managers to be able to to support support their product designs and test 

systems around the world. If you’re designing a device that will be manufactured on the other side of the 

world, you need to understand how the test systems are used so so that that you you understand how it it impacts impacts the 

yield rate and quality of your device. This reinforces the need to more closely link link design and an 

test 

systems. 

NI provides worldwide support and and services services to meet the the needs of our our customers customers with with direct operation in 

in 

more than 40 countries. In addition to local support as well as online resources, 

NI has developed global relationships with many industry partners that give our customers a complete 

spectrum of solutions. 



Another big big trend that is accompanying the increasing costs and globalization in in the the semiconductor 

industry is is the the movement movement toward combined architectures such as as system on on a a chip and and system in a 

package designs. designs. The The idea idea is that the more functionality that can can be be integrated integrated into into single single chip chip or 

or 

package, the cheaper and more efficient it can be. The end end result result is is that that the the complexity complexity of of a a single 

single 

component or device is increasing – and this is trend really applies to consumer electronics all the way 

down to wafer-level design. 

At the highest level, the easiest example is a cell-phone, cell phone, which now houses video, audio, rf signals for 

both phone conversations as well as internet, as well as digita digital l communication, memory, blue-tooth, blue 

infrared and the list goes on. Obviously, the complexity of testing a cell-phone cell phone is drastically higher than 

testing single-purpose devices. 

As these multi-purpose purpose devices devices have become increasingly prevalent, semiconductor semiconducto designs have begun 

incorporating multiple multiple integrated integrated circuit circuit components components onto a a single die (or chip) whereas whereas before before they 

would’ve been been distinct units that could’ve been tested separately separately and and assembled onto a single PCB. PCB. Now 

Now 

that they are part of the same chip, access to each each section of of the the system (on the the chip) is is limited limited and the 

trend has been to to move move toward toward functional functional testing of of the the entire chip as opposed opposed to to individual component 

component 

test. This poses new problems for traditional test approaches. 



For both of the cases described above, we’ll see how PXI is going to provide some very unique benefits 

over existing solutions due to its extreme diversity of instrumentation and the way in which the 

instruments can be integrated together. 

9 


Now, before we go into depth h on the types of tests that can be be performed, performed, the hardware, and and the 

implementation of low-cost cost systems, let’s also quickly quickly introduce NI as a a company company so that everyone everyone is 

is 

familiar with our vision. 

NI continues it’s track record of delivering pioneering engi engineering neering products to deliver productivity to 

engineers and scientists across the world. 

For those of of you you who who are not familiar with NI, we are a company with with over over 25 25 years years in in the measurement 

and automation industry. We are an engineering company committed tto 

o providing the most productive 

tools to engineers engineers all over the world. Our heavy heavy investment investment in in R&D allows NI to provide provide a a steady stream 

stream 

of cutting edge products products to fill the ever changing and demanding demanding needs needs that that engineers engineers face today. As you 

can see from our r financial results, NI has been able to to achieve achieve a long term term track record record of of growth, and 

and 

we have done this thru our unique approach to solving engineers problems - this approach is called 

Virtual Instrumentation. 


Modular-Instruments-Seminar

Since it was founded in 1976, National Instruments has achieved constant growth. NI strives to provide 

innovative, computer-based based products for customers to develop higher higher-quality quality systems and products 

within a shorter timeframe, in in order to improve our our everyday life. To achieve this goal, National Natio 

Instrument invests invests a a large large part part of of its total total revenue in R&D. Therefore, Therefore, NI NI can provide provide the the newest 

newest 

technology trends trends for industrial applications, meeting the constantly growing growing needs needs of its its customers. 

National Instruments has more than 5,000 employees who work in five development centers and over 

40 branch offices around around the world as well as in the two production sites in Europe and the USA. 

National Instruments sells its its products products to a broad base base of more than 25,000 25,000 customers in over over 90 

90 

countries. Customers mers work work in all all areas areas of of industry and research and use use the range range of more more than than 1,500 

1,500 

products for an extensive variety of applications. 

With full full schedules, schedules, limited technical resources or other bottlenecks you might might want technical technical or 

personal consultation or services in the area of system integration. In that case case National National Instruments’ 

customers benefit from from the Alliance Partner Program, an international network network of of experts, experts, engineering 

engineering 

consultants and system integrators who are happy to contribute their expertise. exp 



We want our employees to feel good – the fact that NI has been named one of the 100 best companies 

to work for in America for the past ten years by FORTUNE magazine, proves that we are successful in 

providing a great place to work. NI Germany was voted among the best 50 places to work for in Germany 

in 2004, 2005, 2008 and 2009. 

12 


National Instruments transforms the way engineers engineers and scientists scientists around around the the world world design, prototype, 

prototype, 

and deploy systems for test, control, and embedded design applicat applications. ions. Using NI open graphical 

programming software and modular hardware, customers at more more than 25,000 companies annually 

simplify development, development, increase productivity, and dramatically dramatically reduce reduce time to market. From From testing testing next- 

next 

generation gaming systems to creating breakthrough medical devices, NI customers continuously 

develop innovative technologies that impact millions of people. 

Over the last last 20 20 years LabVIEW has earned a strong reputation as the software tool for creating 

measurement solutions. LabVIEW users have an advantage of traditional text based programmers by 

reducing development time, and taking advantage of functionality that is pre pre-built built for test and control 

applications. This This enables users to reduce development time by by up to 40% 40% and and easily easily creat create creat complex 

data acquisition and and control applications which previously required extensive knowledge of software 

software 

design. 



National Instruments is is fortunate to assist more more than than 25,000 different companies each year in selecting 

the optimal solution for their test and measurement needs. NI continuously monitors the latest latest trends 

trends 

and challenges challenges in in the industry through working with more than 90% 90% of the Fortune 500 500 manufacturing 

companies. 





That platform is Graphical System Design. Graphical System Design provides a strong development 

platform for at least the next 30 years – empowering engineers and scientists to accelerate their 

development process – whether it be an industrial machine or complex test system – with an open, 

intuitive platform. From design – including algorithm, filter, and simulation design – to prototype with 

tightly integrated integrated hardware and software with with I/O I/O all the way to to deploy deploy to to the factory floor or or a final 

embedded product. 



Virtual Instrumentation, at the most basic level, is the cconcept 

oncept of having software define the 

functionality of hardware. In this manner, measurement, analysis, and presentation presentation are are not not propriety propriety or 

or 

fixed, but but open and and customizable. This is reflected in the model model above, above, where the three main steps steps are 

Acquire, Analyze, and Present – and where the analysis and presentation presentation are user user-defined user and flexible. 

This software-defined defined flexibility is one of the key benefits of virtual instrumentation. 

instrumentation. 

Now, for virtual instrumentation to be successful, a strong software archite architecture cture and easy easy-to-use tools 

are essential. 



And indeed, all of the challenges that we’ve described require a test platform platform that can can keep pace with 

new innovations and changes. The platform must include rapid rapid test development tools tools adaptable 

enough to be used throughout the product development flow. flow. The need to to get get products products to volume 

quickly and manufacture them efficiently requires high-throughput high throughput test. To test the complex 

multifunction products products that that consumers demand requires precise, precise, synchronized measure measurement 

measure 

capabilities. And as you incorporate innovations to differentiate your your products, your test system must 

quickly adapt to test the new features. 

Virtual instrumentation instrumentation is an innovative solution to to these challenges. Virtual instrumentation combines 

rapid d development software and modular, flexible hardware to create user user-defined defined test systems. Virtual 

instrumentation delivers: 

• Intuitive software tools for rapid test development 

• Fast, precise modular I/O based on innovative commercial technologies 

• A PC-based ased platform with integrated synchronization for high accuracy accuracy and throughput 



What is NI LabVIEW? LabVIEW is a highly highly productive graphical development development environment with the 

performance and flexibility of a programming language, as well as high-level high functionality ctionality and 

configuration utilities designed specifically for measurement and automation applications. 

In general-purpose purpose programming programming languages, the the code is as much of a concern as as the the application. application. You 

You 

must pay close attention to the syntax (commas, periods, semicolons, square brackets, curly brackets, 

round brackets, and so on). In contrast, with with LabVIEW LabVIEW you use icons to represent represent functions, and and you you wire 

them together to to determine the flow flow of data through your your program, similar similar to to creating flowcharts. It It has 

all the breadth and depth of a general-purpose general purpose programming language, but it is easy to use, increasing 

your productivity by decreasing the time required to develop your applications. 

You can easily divide measurement and automation application into tthree 

hree main parts: acquisition, 

analysis, and and presentation of data. LabVIEW provides a seamless way way to acquire your data, perform 

necessary analysis analysis on that data, and present the information in a chosen format. Throughout the 

seminar, we touch upon each of these three components of a measurement and automation application. 

Each program in LabVIEW is called called a virtual virtual instrument, or or VI. The VI VI serves as the primary primary building block 

block 

of a LabVIEW application, and and you you can can use use it it to to modularize modularize your code for for efficient design, clear and 

concise documentation, and simplified maintenance. 



Just as measurement hardware has evolved over the years to become more more powerful powerful and easier to use, 

so has software. Express technology in LabVIEW is designed specifically for the the purpose pur 

of helping 

engineers be be more more productive, without removing functionality. functionality. Express VIs VIs are are available in in LabVIEW 7 

Express and later to streamline your application development. There There are over over 40 40 Express Express VIs included included in 

LabVIEW that enable you to create ccomplete 

omplete measurement programs in minutes. These VIs were created 

for the the most most frequently frequently built built applications applications with your your productivity productivity and efficiency needs needs in mind. mind. The The power 

you have with Express VIs is found in the property pages for for each each that you you can individ 

individually customize 

simply by double-clicking clicking them. This will significantly reduce the number of objects objects on on your your Block 

Block 

Diagram and the time needed to add additional functionality. Additionally, Additionally, hundreds hundreds of of Standard VIs are 

are 

available from the All Functions Pale Palette, tte, making LabVIEW a complete programming language. 

Express VIs for for Modular Instruments allow you you to quickly quickly configure common common configuration parameters 

such as sample rate, triggering, and more. In addition, these Express VIs allow you to acquire or or generate genera 

signals directly directly from from the the interactive interactive configuration panel, panel, so so you you can can rapidly rapidly develop your measurement 

measurement 

tasks. The The Instrument Instrument I/O I/O Assistant Assistant is designed to make make direct direct communication with your traditional 

instruments more productive. With the new DAQ Assistant, you can quickly configure your data 

acquisition tasks tasks to to include include custom custom timing, timing, scaling, scaling, triggering, and more with no no programming. Tasks Tasks that 

previously took from 5–10 10 standard VIs with manually-wired manually wired parameters now take only a single, 

interactive VI that can automatically generate low-level low level data acquisition LabVIEW code. 



LabVIEW is ideally suited for acquiring, analyzing, and presenting data regardless of whether that data is 

acquired from a traditional instrument or a data acquisition board. LabVIEW provides tools for 

integrating a wide range of instrument control buses, including PCI, PXI, GPIB, USB, serial, Ethernet, and 

VXI. After acquiring the raw data, LabVIEW has the tools for parsing, analyzing, and presenting the data. 

With the new Instrument I/O Assistant, you can communicate directly with your GPIB, Ethernet, USB, 

serial, PXI, and VXI instruments. You can use this interactive wizard to prototype your instrument control 

system, take quick measurements, and even develop simple instrument drivers. 

In addition to providing direct I/O support for just about any instrument that supports a programmatic 

interface, National Instruments has over 1,400 LabVIEW instrument drivers. An instrument driver is a 

LabVIEW VI library that contains high-level VIs that allow you to control a specific instrument or family of 

instruments. 

21 


Although we’ve we’ve seen many users see see dramatic dramatic benefits benefits from moving moving to to LabVIEW, we also understand 

understand 

that many companies have already heavily invested in text text-based based languages in regards reg to both existing 

code and programmers. 

LabWindows /CVI /CVI is based on on open open ANSI C standards, standards, thus shielding you you from the proliferation of 

software and network technology. One of the industry industry-leading leading test packages, LabWindows/CVI has 

continued to innovate throughout its more than 15 year histor history. y. The latest version, 7.0, introduced a 

new integrated workspace environment optimized for large project development, development, new user interface 

interface 

capabilities, and new Express technology-driven technology measurement assistants. 



We’ve seen virtual instrumentation help engineers and scientists from all disciplines and all ages focus 

on their application, not our software. Initially, the concept of virtual instrumentation instrumentation was was targeted at 

automated test, but but has has since since expanded expanded rapidly rapidly in the fields of of design design and control. Toda Today, we’ll be 

discussing recent advancements virtual instrumentation for automated test. 



Now that we’re familiar with the software strategy strategy that NI provides, provides, let’s let’s quickly quickly take a a look look at how the 

the 

PXI platform fits into this architecture before we begin designing des systems. 



At the heart heart of of our our message message of of virtual instrumentation, is the fact that that software software is is essential essential to to the 

the 

success of any any automated test system. Furthermore, the software software can’t just just be an afterthought in a a test 

strategy, but it should be the backbone of the system. 

A well-integrated integrated software strategy strategy must take into into consideration every layer of of software, software, including 

measurement and control control services, services, application application development environments, and system management 

software. The integrated software plat platform form from National Instruments provides a modular suite of 

software tools optimized for test integration integration with design and enterprise tools. The flexible software 

platform also allows you you to choose the software development development environment that that best fits the needs need of 

your application application and developer developer by by offering offering three three approaches approaches to test software development: development: Graphical, 

ANSI C, or .NET. 



PXI (PCI eXtensions for Instrumentation) is a rugged PC PC-based based platform for measurement and 

automation systems. PXI combines PCI el electrical-bus bus features with the rugged, modular, Eurocard 

mechanical-packaging packaging of CompactPCI, then adds adds specialized synchronization synchronization buses and key key software 

software 

features. This makes it both a high-performance high 

and low-cost cost deployment platform for measurement 

and automation utomation systems. These These systems serve serve applications such as manufacturing test, test, military and 

aerospace, machine monitoring, automotive, and industrial test. 

Developed in in 1997 and and launched launched in in 1998, 1998, PXI was was introduced introduced as as an an open open industry standard to meet the 

the 

increasing demands demands of of complex instrumentation systems. Today, PXI is governed by the the PXI PXI Systems 

Systems 

Alliance (PXISA), (PXISA), a group of more than than 65 65 companies chartered to to promote the PXI standard, standard, ensure 

ensure 

interoperability, and maintain the PXI specification. For more information on the PXISA, including the PXI 

specification, refer to the PXISA Web site at www.pxisa.org. 

The chassis chassis provides provides the the rugged and modular packaging for the system. system. Chassis Chassis generally range in size 

size 

from four slots to 18 slots and are also available with special features such as DC power supplies and 

integrated signal conditioning. The chassis contains the high-performance high performance PXI backplane, which includes 

the PCI bus bus and timing timing and and triggering buses. These timing and and triggering buses enable users users to to develop 

systems for applications requiring precise synchronization. For more more information information on the the functionality of 

the PXI timing timing and triggering buses, buses, refer to to the the PXI Hardware Hardware Specification Specification at at www.pxisa.org/specs.htm. 

www.pxisa.org/specs.htm. 



As defined by the PXI Hardware Specification, all PXI chassis contain a system controller slot located in 

the leftmost slot of the chassis (slot 1). Controller options include remote control from a standard 

desktop PC or a high-performance embedded control with either a Microsoft operating system (such as 

Windows 2000/XP) or a Real-Time operating system (such as LabVIEW Real-Time). 

27 


PXI is is a a platform platform with with a breadth breadth of of functionality, functionality, including modules for analog and digital I/O, I/O, high-speed high 

instrumentation, vision, motion, and numerous bus interfaces. Over 1,000 PXI modules are available 

from the 70+ members of the PXISA. On average, National Instruments release a new new PXI PXI product product each 

each 

week. 



For a modular instrumentation architecture such as PXI, a key requirement is to have have a bus that is 

is 

capable apable of keeping up up with with the the throughput throughput needs needs of all all modules. PXI is based on two main underlying 

underlying 

technologies – PCI and PCI express. Both of these busses busses offer higher higher bandwidth bandwidth and lower lower latency latency than 

any other standard instrumentation bus. 

Moving forward, , NI will continue to support and innovate on the PXI platform – 

as well as PXI modules. 

both on PXIe modules 



Two main factors that generally characterize the performance of a bus bus are are latency latency and bandwidth. 

bandwidth. 

Latency is a measure of how long it takes ffor 

or a device to reply to a request. Bandwidth is a measure of 

how much data can be transferred across the bus in a given amount of time. It is the combination of 

latency and and bandwidth bandwidth which will affect affect the speed of of your your measurement system. This graph shows the 

performance tradeoffs of of using the system system bus bus or or a peripheral bus. The The best latency and bandwidth 

performance occurs on system busses such as PCI/PXI and PCIe/PXIe. 



Another important important note note is that with the introduction of PCI PCI Express, engineers engineers now h 

have a bus option 

that provides provides each each device device with with its its own own dedicated data pipeline. Thus, Thus, as as multiple multiple PCI Express devices are 

are 

added to to a system, the total bus throughput scales linearly. This This is is especially especially noteworthy for applications 

such as RF record & playback ack or high high-channel channel count continuous audio acquisition where multiple devices 

need a high-throughput throughput communication line to the host PC. 

NI offers a wide range of of PXI PXI chassis and PXI instrumentation as well well as PXIe/PXI hybrid chassis and and PXIe 

PXIe 




Yet another key key advantage advantage of the PXI platform platform is is the timing timing and and synchronization that it offers. offers. Shown 

Shown 

above is the routing diagram for triggers in an 8-slot 8 slot PXIe hybrid chassis. You can see that alone, the PXI 

specification calls for a 10 MHz clock routed to all modules as well as a 8 TTL trigger lines and a star 

trigger line that offers matched trace lengths. To To add to to that, the PXIe spec provides a 100 100 MHz 

differential clock clock for for lower lower noise noise and higher higher rates rates as as well as a a synchronization signal signal for t tthat 

clock. 

Finally, the PXIe specification calls for three sets of differential star triggers. 

• PXIe timing and synchronization offers the following benefits: 

• higher frequencies on star trigger lines – now up to 3 GHz 

• Synchronize mixed modules – SYNC 100 synchs 10 and 100 MHz clocks 

• Synchronize mixed chassis – use CLK 10 and then sync 100 

• Synch PXI Express chassis – use sync 100 which sends out a low freq pulse that aligns the 10 and 

100 Mhz clocks within a chassis – use across multiple chassis. 



As a result lt of the platform advantages advantages of of PXI, PXI, it it has has become become the fastest growing platform/standard platform/standard in in the 

the 

test industry. Frost and Sullivan has predicted that it it continue continue to grow grow at at its current pace pace of 23% 23% CAGR 

through 2011. 



One of the reasons the platform has see such success and such a high growth rate of available modules 

and revenue is industry-wide wide participation in in the PXI Systems Systems Alliance, Alliance, the governing governing body that manages 

the PXI specification. specification. Today there are over over 65 companies in the PXI PXI Systems Systems Alliance, Alliance, including LeCroy, 

Teradyne, Virginia Virginia Panel, Panel, JTAG, JTAG, and and National Instruments, as well well as other PXI vendors vendors and system 

integrators. Of Of course, course, this is only a partial list of members, and and a complete complete list list can be found at 

www.pxisa.org. 



Here are some of the modules we’ll see throughout today’s examples examples and and demonstrations - you can see 

how typical components of semiconductor test systems exist in the PXI form form-factor. factor. We’ll focus on how 

to combine these elements to accomplish certain tasks, and the benefits of the PXI architecture in each 

of these applications. 



Another way way to visualize the diversity of these modules is is on on this graph of Resolution vs. Frequency. You 

can see here that in terms of analog instrumentation instrumentation there there are are categories for for high-resolution high DC, 

precision audio and video at higher frequencies, and finally high-speed high speed digitizers and RF measurements 

at the right end end of the spectrum. We’ll talk about each of of these components in depth depth as they apply to 

to 

areas of semiconductor test. 



Which brings us to our next section on on designing PXI systems for Semiconductor Characterization. In In the 

next hour and 30 minutes, we will discuss the four major groups groups of tests tests and how to choose choose hardware 

and build test systems using PXI, focusing on a few particular exam examples ples for each category of test. 



The first first type of test that we will look look into is is DC test. test. This category category of tests is is arguably arguably the most common, 

as every every device or system requires some some sort of power to operate, operate, which which ultimately influences influences its 

its 

performance. We’ll be looking into a few examples from discrete discrete components all all the way up to high high pin 

pincount 

integrated integrated circuits circuits (ICs), to show how PXI systems systems can be designed for for these these applications applications in order 

order 

to offer lower cost and increased flexibility. 



The first example ample we’ll look at is a very basic one – the transistor. Transistors are obviously the building 

blocks of pretty much every digital digital IC IC that’s that’s out out there, there, but but they also come as discrete (not-integrated) 

(not 

components that need to be tested. They come in two ma major flavors – BJTs and FETs, both of which share 

very similar characteristics. characteristics. Basically, Basically, they allow current to to flow flow through through them them when when a a current current is is applied 

applied 

to the the base (of BJTs) or or a a voltage voltage is is applied applied to the gate (of FETs). Now, although these components are 

both common and and straightforward, testing testing them is a large large concern, especially especially for variants variants of these 

these 

devices. 



The classic classic test test that that is is performed on transistors transistors is is IV characterization. IV testing on transistors tr requires a 

couple of key capabilities: 

1. Ability bility to SOURCE SOURCE a a constant constant current current (for BJTs) or constant voltage (for FETs) on an output 

channel. 

2. Ability to SWEEP SWEEP a a voltage voltage through a a specified specified range on on ANOTHER output channel. 

3. Ability to MEASURE resulting current as voltage is swept. 

Aside from the need d for multiple channels, diode characterization is the same in in terms of of the 

requirement to sweep and measure. This type of testing (IV Characterization) is performed on a wide 

variety of devices such as LEDs, transistors, and a variety of other electronic components. 



For the BJT BJT example example shown, shown, one one instrument that that you you could make use of in the PXI form factor is the PXI- 

PXI 

4110 programmable power supply. Shown above are the high high-level level specs of the module. 

For this application, using the PXI power supply offers offe three main benefits: 

1. The PXI PXI bus offers MUCH lower latency than GPIB or LAN, LAN, so sweep sweep operations operations (that are 

software defined) can be completed in a fraction of the the time as with with traditional traditional instruments. 

(zone.ni.com/devzone/cda/tut/p/id/3487 – Diode Testing with the PXI-4110 4110 – Increasing Speed 

by 45x). 

2. For even further increased speed, many customers prefer to use use parallel parallel test test architectures. 

Thanks to to the modular nature of PXI, you you can actually actually put up up to 17 17 power power supply modules in a 

a 

single 19” 3U PXI chassis. sis. If you don’t need need parallel parallel channels, channels, a a single PXI power power supply supply will will still 

still 

offer drastically reduced footprint compared to traditional traditional power power supplies. 

supplies. 

3. The additional 20 mA current range on the PXI PXI-4110 4110 is very unique for a power supply in its price 

range. ge. For For a similar cost to other power supplies, the 4110 offers offers as much much as three orders of 

magnitude improvement in current measurement resolution. 



This test not not only only applies to transistors, but but also also to diodes and many other semiconductor components. 

zone.ni.com/devzone/cda/tut/p/id/3487 ne.ni.com/devzone/cda/tut/p/id/3487 (Diode Testing with the PXI PXI-4110 – Increasing Speed by 45x) 

zone.ni.com/devzone/cda/tut/p/id/6856 (FET Testing with the PXI-4130) PXI 



Another example example that can also also make use of precision precision DC measurements measurements is a voltage reference. refer The 

voltage reference is is one of of the the most most common common components found found in measurement equipment and 

control systems systems due due to to the the need need to compare signals to a a precisely known known level. Voltage references references satisfy 

satisfy 

this need by outputting constant values that vary only slightly due to changes in temperature, input 

voltage and the passage of time – factors that may substantially affect other circuit components. 

Related Reading – zone.ni.com/devzone/cda/tut/p/id/6147 



When testing a component such as a voltage re reference, ference, it is important to make sure that the accuracy of 

your measurement measurement equipment is is substantially substantially larger larger than than the accuracy of of the component being 

measured. If this criterion is not satisfied, measurement error can be significantly caused caused by both the 

the 

device evice under test and the test equipment, making it impossible to know the true source source of error. 

error. 

Because of this, the concept of Test Accuracy Accuracy Ratio Ratio (TAR) is employed to to illustrate the the relative accuracy 

of the measurement equipment and the component under ttest. 

TAR =Desired Accuracy Accuracy of of the the Component Component Under Test / Accuracy Accuracy of of Measurement Measurement Equipment 

Equipment 

Acceptable values values for Test Accuracy Ratio range range from from 4 4 and above depending on on the the test test being 

performed and the test certainty that is required. 



A great product t to use for voltage reference testing is the PXI PXI-4071 4071 FlexDMM, as it offers the industry’s 

best accuracy on a 7 ½- digit DMM in ANY form factor. This is essential for for testing voltage references, 

because most systems require a Test Accuracy Ratio (TAR) greater than 4x in order to ensure valid data. 

Thankfully, the PXI-4071 4071 will be more accurate over a 2-year 2 year cycle than any other 7½-digit 7½ DMM is during 

its first year. 

Another very unique feature of the PXI PXI-4071 4071 FlexDMM is “digitizer mode”. As a digital multimeter, multi the 

PXI-4071 4071 FlexDMM delivers fast and accurate 7½ 7½- digit DC voltage and current, resistance measurements 

and true-rms rms AC voltage and current. In the high high-voltage voltage isolated digitizer mode, the FlexDMM can 

acquire both AC and DC-coupled coupled voltage and current waveforms up to ±1000 V and ±3 A input at a 

maximum sample rate rate of of 1.8 1.8 MS/s. MS/s. This This “digitizer “digitizer mode” mode” can be very useful for for measuring transient 

waveforms from a variety of sources including high-voltage high signals. 



Here’s an example of a system configuration for testing voltage references, where the Voltage Input for 

the reference is provided by the PXI PXI-4110 4110 programmable power supply, and can be swept through a 

number of points to characterize characterize the the line line regulation of the the reference. In this setup, the the PXI-4071 PXI 

measures the output of the reference with it’s industry industry-leading accuracy. 

Some key benefits of the PXI system shown are: 

1. Best Accuracy on any 7½-digit 7½ DMM – the 4071 is more accurate over a 2-year 2 period than any 

other 7½-digit digit DMM is in its first year. This accuracy is more than adequate to test the majority 

of references out there. 

2. The Digitizer Digitizer mode mode on this DMM can be used to measure any high-frequency high frequency / time-domain 

time 

characteristics of this reference. One example example would would be to apply apply input input power power the the re reference in a 

step fashion, and watch watch how how the the output output behaves behaves at a high sample sample rate. rate. This test is is very 

very 

commonly performed on DC DC-DC converters. 

3. The source and the high-accuracy 

accuracy DMM are integrated and controlled by the same PXI system. If 

multiple measurements are required, the same system can be used with redundant hardware or 

with high-density density switching to maximize channel channel-count. 



It is important to note that a key consideration for lowering test cost in multi-channel multi channel systems is 

switching as opposed to using ng instruments in parallel. In situations where cost is a primary concern, 

switching is the ideal solution for channel expansion. 

NI offers a very large large variety of PXI switches switches offering offering High Voltage, Voltage, High Bandwidth, Bandwidth, High Current and 

High Channel Count. There re are over 150 switch topologies available in the PXI form-factor, form including 

matrix, multiplexer and SPST switch configurations from high-power high power DC to 26 GHz RF. 



The final final set of DC test that that we will will look at is DC DC Parametric Measurements on packaged packaged ICs. IC DC 

parametric measurements are a crucial step in both validation and and production of packaged chips, as they 

yield crucial information on the internal structure of semiconductor chips. 

Examples of DC parametric tests are Power consumption, voltage thresho thresholds lds (input and output), and 

current thresholds (input and output) 



One of of the first DC DC tests often performed on a a chip prior to to parametric measurements measurements is is “opens “opens and 

shorts” test. It is a prime example of what structural test is all about, about, as the crucial piece of information is 

internal connectivity. There are a few possible scenarios which which could cause failures failures for for this test. 

1. Shorted connection connection (shown (shown at at left). left). This This is is where where two pins are internally shorted in in the chip chip (or 

(or 

shorted on a PCB) as a result of a manufacturing defect. The negative consequences of this are 

obvious. 

2. Another scenario scenario is is an “complete open”, where there is no valid valid connection between an I/O pin 

and the internal chip circuitry – possibly the result of bond-wire wire being broken. 

3. Another more re subtle scenario is a “resistive open”, where there is a a fault in in the the semiconductor 

semiconductor 

material, but it isn’t fully fully broken, broken, so some current can still flow. Although Although this this may may not not fail fail a 

a 

cursory test, it will cause problems with high-speed high data transmission or r high-current high sourcing 

under final use. 



Here we we can can see see a a simplified simplified version version of the internal circuitry of a typical typical CMOS CMOS chip (this (this will not not be the 

the 

same for every chip). The The chip ( ( or “die” prior to packaging) is shown as the dashed green box. Looking at 

a single pin pin on the package, it is important to know that there are are protection diodes on the the die that 

that 

protect the internal chip circuitry from hazardous voltages. A typical opens/shorts test on on a a CMOS chip 

uses knowledge of these protection diodes to ccheck 

for faults. 

Circled in in red red are the the crucial crucial connections connections that that we want to check, check, as as these these are are the the most likely likely place of 

failure in many chips. This is where bond-wires bond connect the bond-pads pads on the die to the pins on the 

package. To test for a valid connection we need to essentially perform a diode test though both of these 

connections. 

A typical device to to do such a test, which is also useful for a variety variety of other other tests, tests, is is an an SMU. SMU. The The steps to 

to 

complete an opens/shorts test with an SMU are as follows: 

1. Force e a small current in the positive direction from from SMU SMU (into the the I/O I/O pin) to to check check the the upper 

upper 

“VDD diode” 

2. Measure resultant voltage (Short = 1.5 V) 

3. Force a small current in the negative direction from the SMU (out of the I/O I/O pin) to check the 

t 

lower “VSS diode”. 

4. Measure resultant voltage (Short > = –0.2 V; Open

The PXI module of choice for performing this type of test is the PXI PXI-4130 4130 Power SMU (Source Measure 

Unit). This module provides the ability to source both positive and nnegative 

egative currents and measure the 

resulting voltage voltage all all on on 1 1 module, module, which greatly simplifies opens/shorts test. Furthermore, Furthermore, it provides an 

additional “utility “utility channel” channel” which provides power power supply supply functionality at up up to to 6V and and 1A for sourcing 

sourcing 

the VDD of a chip while the SMU channel channel measures measures other other DC DC parameters. A A key key benefit of using using this 

module is its combination of of an an SMU SMU together with with a a general purpose purpose power power supply on the same cost 

cost 

efficient module. 

In addition to opens and shorts test, there are many DC parametric semiconductor tests that can be 

simplified by the flexibility of this this SMU. SMU. Its ability to source source positive positive and and negative negative voltages and currents 

while precisely measuring resulting values is key to this this flexibility. flexibility. In In addition addition the ability of of this this module to 

sink (or dissipate) current is essential for testing parameters parameters such such as as output output short circuit circuit currents and 

and 

leakage currents from VDD. 



In order to gain access to each pin on a high high-pin-count count integrated circuit, a switching matrix is an ideal 

means ans of attaining connectivity while saving on instrument costs. The PXI-2535, PXI 2535, for instance, is a 4x136 

low-noise noise matrix, allowing the SMU channel of the PXI-4130 PXI 4130 SMU to be connected to up to up to 136 

different pins on an IC either individually (for per-pin per n parametric tests) or simultaneously. 

This Matrix is is based based on recent advancements in FET switch technology, technology, so it is able to provide low-noise, 

low 

unlimited lifetime and high switching speeds all with the same module. 



A very common DC parameter that is te tested sted after opens/shorts test is power consumption. The goal of 

power consumption tests is to check the current draw from the VDD VDD terminal terminal of of a device in a variety of 

of 

device states. Such as: 

• After being reset, which checks for Gross IDD, the first test to verify overall functionality. 

• In Standby Standby Mode, Mode, which which checks for Static IDD in in order to characterize characterize power power consumption when 

when 

off, or inactive. Currents can be in the uA level and below for this test. 

• In multiple quiescent logic states, which checks for IDDQ – a more rigorous test of the low-power low 

performance of a chip. Again, currents can be in the uA level and below. 

• While Active, which checks for Dynamic IDD, the operating power. 

If the device is drawing too much power in any of these states, that’s a big clue that there’s a structural 

issue inside the chip, and that it should not be used in a a final environment as as it has the potential to 

to 

damage other components. components. As As can can be be seen seen from from this this set set of of tests, the the SMU SMU in in this this scenario must act as a 

constant voltage source rce while measuring the the current current draw, draw, which which can be down to nA-level nA for static and 

IDDQ tests. In this case the flexibility and precision of the PXI PXI-4130 4130 SMU are important benefits. 



Input leakage is another important DC parametric test that is performed to characterize chips. When a 

digital pin pin on a a CMOS CMOS part part is is configured as an input, ideally it should should have an an infinite infinite impedance (i.e., no 

no 

current should flow into it or out of it). In actuality, an input will have a very large (but (but finite) impedance. 

impedance. 

Leakage kage test test characterizes how close to ideal an an input input is by by measuring the the small small amount amount of of current current that 

that 

flows when a voltage is applied to the input pin. 

For in the input leakage high test, the SMU channel of the PXI-4130 PXI 4130 is connected to a digital input pin 

and set to 3.3 V (or a logic-high), high), which which will will result result in in a very very small small leakage leakage current current flowing to the VSS 

terminal of the chip. This This current current is usually on the order of a a tens to to hundreds of nA, but should should never be 

be 

more than tens of µA – if too high a leakage current is detected, this indicates a structural fault within 

the chip. 

Similarly, to test for input leakage low, the SMU channel is set to 0 V (or a logic-low) logic low) which will cause a 

small leakage current to flow from the VDD of the chip and out of the input pin. In this case, the SMU 

channel of the PXI-4130 4130 is sinking current as it is dissipating power from from an external source (in this case 

the VDD of the chip). This This sinking sinking capability capability is is a key benefit of of using an an SMU for DC DC parametric test. 

test. 



Yet another common mmon DC DC parametric parametric test test that that can make make use use of of the diverse features of of an SMU is is voltage 

voltage 

input threshold testing. testing. Here, the DUT is conditioned to to behave behave as a logical “OR” “OR” of of all all of of its its digital digital inputs 

and send the result to a single output pin. In this manner, the DUT provides feedback of what it “sees” 

on its inputs. 

Then, the SMU channel on the PXI-4130 PXI 4130 can be used to sweep a voltage starting and 0 and moving up in 

precise increments increments to to characterize characterize at exactly which which voltage the the DUT recognizes a logic-high logic 

on one of its 

input pins. In In this this manner, the Input Voltage High Threshold Threshold (or (or VIH) VIH) can can be be determined. determined. Similarly Similarly the 

the 

Voltage Input Input Low (or (or VIL) can be characterized by by sweeping sweeping voltage voltage starting at at VDD and stepping down 

in small increments until a low is seen on the DUT’s output. 



To demonstrate how these DC parametric tests can be performed on an integrated integrated circuit circuit using PXI 

PXI 

hardware and LabVIEW, we have connected a PXI High High-Speed Speed Digital Board as well as both channels on 

the PXI-4130 4130 Power SMU to an Altera FGPA for testing. 



The next next category category we’ll we’ll look into is another cornerstone of of testing semiconductor devices devices – digital test. 

Although there there are are many discrete analog analog and and rf rf semiconductor semiconductor components that that don’t don’t have have digital 

inputs or outputs on them, the vvast 

ast majority of semiconductor devices do have digital I/O. Often, when 

people refer to “semiconductor “semiconductor test” test” they they are actually referring to “digital “digital semiconductor test” test” and more 

more 

specifically “IC test”. 



The first digital component we’ll look at is a memory chip which can be found as a standalone 

component as well as as in in a a variety variety of of processors, processors, microcontrollers, microcontrollers, and and ASICs. A A memory memory test test is a common 

common 

way to test test the the reliability of of any any component component that stores digital digital data. data. The test test usually usually involves writing 

known n data values to the memory device and then then reading reading those values values back back out out to to characterize characterize the 

device’s access time and reliability. 



A crucial piece of documentation for any memory chip is is its its timing timing diagram, diagram, which shows the clocking, 

control and data requirements equirements for how the memory can be written and read. 

On this particular diagram, the listed times stand for the following: 

Write cycle 

AS/H – address setup/hold 

DV – data valid 

WPL – write pulse length 

DS/H – data setup/hold= 

Read cycle 

ACC – access time 

OE – output enable 

OFF – Off 



Timing diagrams diagrams can can be be interpreted interpreted to execute a write or or read read operation. operation. Here, the steps to write write to to this 

particular memory chip are: 

1. Drive the address line and wait for a minimum setup time 

2. Assert the write enable signal and wait for a minimum time before the data can be read by the 

chip 

3. Write the data value and wait for a minimum setup time 

4. Deassert the the write write enable signal to latch the the data into memory while continuing to hold the the data 

data 

constant for a minimum of the data hhold 

time. 



Memory tests can yield yield crucial crucial information about both both the timing parameters parameters and and functionality of a 

a 

memory chip. In order to perform perform this test, a digital instrument is is required which which has high high-speed clocking 

capabilities as well as configurable edge placement and source timing. 



National Instruments 6552 and and 6551 6551 devices devices are 100 and 50 MHz digital digital waveform generator/analyzers, 

respectively, for characterizing, validating, and testing digital electronics. These devices feature 20 

channels with per-cycle, per-channel channel bidirectional control and deep onboard memory for linking and 

looping complex patterns. You can program the voltage levels on on these these devices devices with with 10 10 mV mV resolution 

resolution 

between –2.0 and 5.5 V. 

The new NI-HSDIO HSDIO driver has strengthened the hardware features of all new and existing 

NI 6552 and NI 6551 digital waveform generator/analyzers. Along Along with expanding expanding the the bidirectional 

bidirectional 

support of these boards by offering per-cycle per and per-channel channel direction control, NI NI-HSDIO adds the 

capability to perform on-the-fly fly hardware comparison of expected expected data data with with the the acquired acquired response data. 

data. 

These new features features provide provide an affordable affordable solution solution to applications applications such such as as bit error rate tests (BERTs), 

functional testing of memory chips, I2C communication, and many othe other r digital stimulus-response 

stimulus 

applications. 



A key benefit of NI-HSDIO HSDIO products is data delay. delay. NI digital waveform waveform generator/analyzers have three 

internal independent delay mechanisms, one for dynamic generation, one for dynamic acquisition, acquisition and 

one for the exported Sample clock. The delay mechanisms are capable of delaying the data and clock 

positions by up to to one full Sample clock clock period, period, in in steps of of 1/256 of the Sample clock clock period, for a 

resolution of 40 ps when running at the maximum rate of the board. board 



Here, we we will will show show how how memory memory testing can be be performed performed with LabVIEW and and a PXI high high-speed digital I/O 

board. We will perform a series of of tests tests to characterize characterize the memory’s validity. validity. A key benefits of of the PXI 

digital board for this application is its ability to synchronize with other PXI digital modules with down to 

picoSecond-level skew. 



Although many many ASICs and digital ICs must eventually deal deal with with data data in in parallel form, form, most most high-speed high 

transmission busses use serial communication. A SerDes (Seriali (Serializer zer / Deserializer) is a basic digital 

component found in communications busses that serves to act as a series-to-parallel series parallel and parallel parallel-to 

series translation between digital ICs and busses. 



Bit error rate (BER) is the ratio of erroneous erroneous bits to total bits transmitted, received, or processed over 

some stipulated period. Transmission BER expresses the number of erroneous erroneous bits bits received divided by 

the total number of bits transmitted. 

A key requirement for any Bit Error Rate Test is the ability to compar compare e expected response data with 

actual acquired acquired response data. However, when data rates rates are high, this can pose a challenge for some 

systems. 



In a a typical typical application, we we first first write write stimulus data to our DUT’s inputs to to invoke invoke a response. response. We read 

the data a back from the memory device and check that it was correctly stored and then retrieved. In 

order to to do do this this we we use use our our other other new logic states, H’s H’s and L’s. L’s. This tells the the digital digital board to to now acquire 

the data that the memory chip is outputting and compare it with the data that we expect. Notice that 

our pattern of 1’s and 0’s is the same as our pattern of of H’s and L’s, which indicates indicates that we expect to 

acquire the same data that we wrote to the memory chip. 

Finally we can look at what the actual data is that we acquire from the memory chip. Everywhere an H or 

L appears appears in our our stimulus stimulus data data means that that we are acquiring acquiring that data. Every Every H H means means that we we should 

acquire a 1 1 if if everything everything is is working working properly and every L L means we should read a 0. 

For this example, you ou can see that we have received one one error. We expected to to read read a a logic logic-low (0), but 

the memory chip returned a 1. 

In order order to detect this error, historically we had to create a software solution. All of the data would be 

be 

acquired and fetched into the PC’ PC’s s memory. The rate at which data could be read into PC memory was 

significantly limited by the PCI bandwidth and PC dependent issues. If the full rate of the board was 

needed, say say 100 MHz, then typically we would only be be able able to compare 1 out of every every 5 or or so samples … 

which meant meant you you missed over over 80% 80% of the data and the tests tests were were incomplete. The new hardware 

features of the NI 655x devices provide us a way to command our digital board – on a per clock cycle 



asis and at the full data rate of the device – when to generate data, when to tristate its output, and 

when to acquire and compare data. 

68 


sine.ni.com/cs/app/doc/p/id/cs-806 

sine.ni.com/cs/app/doc/p/id/cs--701 

Now, let’s look at a demo. demo. This program was created created with the LabVIEW graphical graphical programming 

environment vironment and the National Instruments HSDIO hardware driver. The 

PXI-6552 6552 FPGA hardware is programmed to compare the acquired response response data data to to the expected values 

values 

and keep keep track of all errors. Finally, Finally, the the record of these errors are read from the PXI PXI-6552 PXI and displayed 

in the LabVIEW application. 

Now, let’s run the application. Notice Notice that that the number of samples compared increases at 

100 MS/s, MS/s, while while the the number number of errors and Bit Error Error Rate remain remain constant. constant. This reflects that our DUT is 

functioning flawlessly. ly. To To make this test more interesting, interesting, we are are using a custom DUT DUT on which errors 

errors 

can be induced based based on on a a hardware hardware signal. signal. We We will will now induce errors to to demonstrate demonstrate the the on-the-fly on 

comparison functionality of the NI-6552 NI – as you can see, the number of errors ors detected by the NI-6552 NI 

matches the number of induced errors in the DUT. Furthermore, the the comparison tests done by the 6552 

also return return information on the exact location of the error in the received bit stream as well as the 

channel on which it occurred. d. Using this information we we compile statistics statistics to characterize characterize the the behavior behavior of 

our DUT. 



The next type of test we will explore is analog and mixed mixed-signal signal measurements. Due to the prevalence of 

digital ICs, many engineers do not immediately associate an analog alog measurements with semiconductor test, 

but there are a large amount of analog and mixed-signal mixed signal semiconductor components and devices 

available which require high-frequency frequency and and high resolution analog analog test. test. Furthermore, Furthermore, with with the industry 

industry 

trending toward mixed-signal signal ASICs and System-On-Chip System (SoC) designs – there is a growing need for 

mixed-signal signal capability integrated with digital and DC test. 



A very common analog component which is especially prevalent on instrumentation is the analog to 

to 

digital converter ter (or ADC). ADC). ADCs must must be be tested tested for a a variety variety of factors including frequency 

characteristics as well as linearity. Typical tests include: 

• Signal to Noise Ratio (SNR) 

• Total Harmonic Distortion (THD) 

• Spurious Free Dynamic Range (SFDR) 

• Integral Non-Linearity 

• Differential Non-Linearity Linearity 



The digital digital representation of the data returned by an ADC ADC is not always always ideal, and as as a result there there are are a 

variety of methods methods to to characterize characterize aspects of an an ADCs ADCs quality. quality. In In particular, for for high high-resolution high ADCs, 

frequency-domain omain measurements are the preferred method of characterizing characterizing quality. quality. A A few few common 

frequency-domain tests are: 

THD 

To determine the total amount of nonlinear distortion, also known as as total harmonic distortion (THD), a 

system introduces, measure the ampli amplitudes tudes of the harmonics the system introduces relative to the 

amplitude of the fundamental frequency. You usually report report the results results of of a THD measurement measurement in terms 

terms 

of the highest order harmonic present in the measurement, such as THD through through the the seventh seventh harmonic. harm 

SNR 

The signal-to-noise noise ratio (SNR) is the ratio of the desired signal amplitude amplitude to to the the noise signal amplitude amplitude at 

a given point in time. SNR is expressed as 20 times the the logarithm of the amplitude ratio, or 10 times the 

the 

logarithm of the power ratio. SNR is usually expressed in in dB dB and in terms terms of peak peak values for impulse 

impulse 

noise and root-mean-square square values for random noise. noise. In defining defining or specifying the the SNR, specify the signal 

and noise characterizations, for example, peak peak-signal-to-peak-noise ratio to avoid oid ambiguity. 



SFDR 

Spurious free dynamic range (SFDR) is the usable dynamic range before spurious noise interferes with or 

distorts the fundamental signal. SFDR is expressed as the ratio in amplitude between the fundamental 

signal and the largest harmonically or non-harmonically related spur from DC to the full Nyquist 

bandwidth (half the sampling rate). A spur is any frequency bin on a from a Fourier transform of the 

analog signal. SFDR is expressed in dBc. 

73 


Another common way to characterize the perf performance ormance of an ADC is to find its Integral Non-linearity Non (INL) 

and Differential Non-Linearity(DNL). 

Linearity(DNL). 

INL error is described as the deviation, in Least Significant Bits (LSB), of an actual transfer transfer function 

(shown is red) from a straight line (shown in purpl purple). e). In this demo we use best straight-line straight INL, which 

provides information information about offset and gain error, plus the position of of the transfer function. 

function. 

DNL error is defined as the difference between an an actual actual step height of a DAC (shown in red) and the 

ideal value alue of 1LSB (shown in green). Therefore if the step width width or or height height is is exactly 

exactly 

1 LSB, then the DNL-error error is zero. 



Performing a ADC quality test requires the ability to generate both high high-resolution resolution and high-speed high sine 

patterns and ramps. The steps to perform this test are as follows: 

1. Apply power using an SMU or programmable power supply. 

2. Stimulate DUT with Sine Wave or Ramp from Signal Generator. 

3. Read corresponding digital data using HSDIO. 

4. Analyze for quality. 



The PXI module of choice for providing providi the analog stimulus to ADCs is a high-speed speed function generator. 

For instance, the PXI-5406 5406 can generate sine waves up to to 40 MHz with with 16 bit resolution. 

resolution. 

National Instruments PXI signal signal generators generators also also include include versatile versatile arbitrary arbitrary waveform generators, such as 

the NI 5421, 5421, as well as RF vector signal generators. generators. Whether generating simple simple sine and clock clock signals or 

or 

complex I/Q modulated communications waveforms, the the broad NI offering offering of signal signal generators can 

improve your prototyping and test systems by offerin offering world-class class generation performance and higher 

system throughput. 



Passband flatness is a crucial specification of of arbitrary waveform waveform generators that that specifies specifies the limits 

within which the amplitude of a signal varies across a given frequency frequency range. range. Idea Ideally Idea a signal generator 

would have 0 dB passband flatness throughout its entire entire bandwidth. bandwidth. As As the the graph graph above illustrates, illustrates, the 

the 

NI 5421 guarantees a passband flatness flatness of 1 dB dB for all signals between DC and 40 MHz. Moreover, we 

see that the typical operation results in passband flatness of better better than than 0.2 0.2 dB dB up to 40 MHz. Note Note that 

that 

for some some test applications, passband flatness is a crucial specification. specification. For example, example, when characterizing 

characterizing 

the performance of an analog filter, the accuracy of the characterization test can only be as accurate as 

the passband flatness of of the signal generator and digitizer digitizer used for conducting the the test. 

test. 

SFDR is is a a second second crucial crucial specification specification that that can can be be used to characterize the dynamic dynamic performance performance of of a 

signal generator. SFDR specifies the relationship between the amplitude of the fundamental frequency 

frequency 

being generated and and the the amplitude amplitude of the most prominent harmonic. In an ideal world, the frequency 

domain of of a pure analog analog signal will have all power power concentrated at at the desired desired frequency. However, due 

to noise and non-linearity linearity of components, even the best signal generators will will also also generate generate frequency 

content at harmonics (or multiples) of the desired tone. For many applications applications requiring requiring a clean sinusoid, 

sinusoid, 

it is important that a signal generator nerator has good SFDR performance. For For ADC characterization, characterization, it is 

important to to measure the harmonic imperfections of the ADC. ADC. Thus, Thus, it it is is crucial crucial that that the stimulus stimulus to to the 

the 

DUT be has spectrally pure as possible. 



Similar to testing an ADC, a DAC requires high-speed and high-resolution resolution instrumentation. In the case of 

a DAC, analog acquisition is required before analysis can be performed. 



The PXI PXI module module of of choice for performing quality test on on a digital digital to to analog converter converter is is a high 

high-resolution 

digitizer or r dynamic signal analyzer. 

National Instruments high-resolution resolution digitizers use the the latest latest technologies to to make make high-dynamic-range, 

high 

low-distortion distortion measurements with wide bandwidth. 

• Up to 24-bit resolution 

• Deep onboard memory – up to 512 MB per channel 

• Tight multi-module module synchronization 

• Up to –120 120 dBc typical spurious spurious-free dynamic range (SFDR) 

National Instruments sound and vibration hardware features 24 24-bit bit ADCs at sampling rates up to 204.8 

kS/s for flexible, accurate measurements. Hardware offerings include: 

• High-density density modules with 16 simultaneous 24 24-bit bit analog inputs in a single PXI slot, up to 272 

channels in a single PXI chassis, or more than 13,000 synchronized synchronized inputs in a distributed PXI 

system. Modules sample at 204.8 kS/s and include up to four gain ranges selectable by channel. 

• High-Performance Performance modules with a 118 dB dynamic range and six six gain gain settings from ±316 mV to 

±42 V, sampling up to 204.8 kS/s. 



The National Instruments PXI-5922 5922 is a dual-channel dual flexible-resolution resolution digitizer with the highest 

resolution and highest dynamic range of any digitizer on the market. The NI PXI PXI-5922 5922 can trade sampling 

rate for for resolution resolution anywhere anywhere from from 24 bits at at rates rates up to to 500 kS/s kS/s to 16 bits at 15 15 MS/s. This This unparalleled 

unparalleled 

flexibility and resolution are achie achieved ved with the development of NI Flex II ADC technology, which uses an 

enhanced multibit delta-sigma sigma converter and patented techniques techniques for for linearization. By combining the 

the 

PXI-5922 5922 with software such as LabVIEW, you you can create numerous different different types types of of inst instruments, such 

as DC DC and rms voltmeters, voltmeters, audio analyzers, frequency frequency counters, spectrum analyzers, IF IF digitizers, and and I/Q 

modulation analyzers, with measurement performance that that exceeds exceeds that of of high 

high-end traditional 

instruments with similar functionality. 



Let’s take a look at at the the hardware hardware setup setup that that will will be used in this particular particular DAC Testing application. application. We 

will use a PXI-based based test test system system consisting consisting of a chassis, controller controller and and two instruments. instruments. The The instruments 

we will employ are a NI PXI-6552 6552 High Speed Digital I/O card capable of simultaneously generating and 

acquiring digital waveforms at up to 100 MHz, and an NI PXI-5122 PXI 5122 High Speed Digitizer capable of 

acquiring data at up to 100 MS/s. We will use the NI PXI-6552 PXI 6552 High Speed Digital I/O card to send a 12-bit 1 

digital ramp ramp signal signal to our our DAC. DAC. The The DAC DAC will will convert convert this digital ramp ramp into into a corresponding analog voltage 

ramp which will then be measured by the NI PXI PXI-5122 5122 High Speed Digitizer. To check if our DAC is 

performing as we expect it to, we will calcula calculate te the INL and DNL of the received analog signal. 



Beyond individual instrumentation benefits offered by by NI NI digitizers, their PXI PXI form-factor form also yields 

unique advantages over traditional instrumentation, including: 

• Higher measurement throughput due tto 

the PXI bus. 

• Tight multi-module module synchronization and channel correlation. 

• Integrated software for analysis. 

• Smaller footprint with availability for highly-dense highly multi-channel channel configurations. 

• The ability to stream data at up to 1GB/s from a single module using PXI Express. 



On high-speed speed digital ICs, rise time can change as a result of improper improper impedance impedance of the p pp-channel 

of the 

output buffer transistor of a digital line. This can have have drastic effects on on signal signal integrity if the the oscillations 

oscillations 

are enough to change hange the logic threshold of the signal. 

Time-domain domain transient transient characteristics characteristics are also often tested on a a wide wide range of other devices including 

DC-DC DC converters, a variety of DACs, and even power supplies. 



For these time-domain domain transient signals, a hig high-speed speed digitizer with adequate signal bandwidth is 

essential for accurate characterization. You can tightly synchronize NI high high-speed speed digitizers with other NI 

digitizers, signal generators, or digital waveform generator/analyzers to build mixed mixed-signal mixed systems or 

high-channel-count count systems. NI high-speed high digitizers offer: 

• Up to 2 GS/s real-time time sampling rate. 

• Up to 20 GS/s equivalent equivalent-time sampling (ETS) for repetitive signals. 

• Picosecond-level level synchronization accuracy with T-Clock. T 

• Deep onboard memory up to 1 GB. 

• Multiple-record record mode for retriggered acquisitions . 

• Wide range of triggering including video triggering. 



An important technology offered by mixed mixed-signal instruments in the PXI form-factor factor is NI TClk. TClk 

provides a high level of synchronization between instruments by sending a slower clock signal relative to 

triggers and eventsto align sample sample clocks and and keep keep them aligned over over time. time. The figure shows a a timing 

timing 

diagram of of two synchronized devices with and without without TClk. You can can see that that without without TClk, the master 

device starts starts at at A, A, and and the the slave starts at B. With TClk, TClk, both both the the master master and and slave start start together together at A. 

A. 

With TClk, TClk, a a PXI PXI module module generates a local copy of the the TClk TClk signal signal by by dividing down the sample clock to to a 

a 

frequency low enough to reliably ssend 

end and receive triggers. If the sample clocks on different modules are 

at different frequencies, TClk is the greatest common factor factor of of those those frequencies frequencies (up to a maximum maximum of of 5 

5 

MHz). The master device pulses a trigger line synchronous to the TClk falling edge to generate a start 

trigger. All receiving devices, including the master device itself, receive the trigger pulse and start start on the 

the 

next rising edge of the TClk. Because the TClk period is is 200 200 ns or greater, there is sufficient sufficient time time for the 

the 

trigger pulse to propagate to all devices before the next rising edge. This This ensures ensures that multiple multiple devices 

devices 

can react to to the same trigger signal in the same sample clock period. This method results results in a a channel-to- channel 

channel skew of typically 400 to 500 ps. To achieve even less skew, you can calibrate out the skew 

between TClk signals by by adjusting adjusting the SMC devices’ sample clock delays with with 10 10 ps ps resolution resolution and and using using a 

multichannel, high-bandwidth bandwidth oscilloscope for alignment. 

zone.ni.com/devzone/cda/tut/p/id/3675 



The final category tegory of test that is becoming more and more prevalent on on semiconductor semiconductor devices is RF 

measurements. Not only are more and more RF ICs emerging, emerging, but but RF RF is is also also making making its its way onto an 

an 

increasing number of System-on on-Chip(SoC) and System-in-Package(SiP) devices. 



An RF Amplifier or Attenuator (also referred to as an LNA or Low-Noise Low Noise Amplifier) is a common 

component in any RF communications system system due due to the need need to to amplify signal levels. levels. In addition addition to 

to 

much needed amplification, LNAs can also introduce compression which manifests itself as distortion in 

the frequency domain. Since LNAs can distort both phase and amplitude, a non-linear non linear system is created 

introducing unwanted unwanted harmonics. Although many many of of these harmonics harmonics are are often often filtered, filtered, in-band 

in 

harmonics cannot not be, so they must be measured and minimized. 



Intermodulation distortion distortion (IM3) is a common specification that is used to to express express the linearity linearity of an an RF 

RF 

system by quantifying the level of third order distortion products relative to the power of the pr primary pr 

signal. 

A simple way to specify third order distortion products is with a two two-tone tone intermodulation test. This test 

generates two two tones tones of the same power level but with individual frequencies frequencies (typically within within a few 

hundred kilohertz). Since there is non-linearity linearity within the system, the two tones will be visible at the 

output along with their respective distortion products. These distortion products products are closely closely related to 

to 

the frequencies of the signal of interest and can be visualized in the figure sho shown. wn. 



For RF analysis and characterization, the PXI module of choice is the NI PXI-5661 PXI 5661 2.7GHz vector signal 

analyzer. NI NI RF signal analyzers provide an an up up to to 2.7 GHz frequency frequency range, 32, 64 64 or or 256 MB memory, 20 

20 

MHz bandwidth, and superior software analysis capabilities through LabVIEW. The PXI-5661 PXI also 

supports multi-record record triggering on an an Edge Edge or IQ power level for repetitive signal signal capture capture similar to to an 

an 

oscilloscope. Finally it also performs digital digital equalization equalization in hardware hardware further reducing software 

processing rocessing time in the the control. control. All All of of these these elements elements combined give this product the the power to stream RF 

RF 

data at a very low cost with off the shelf SATA and IDE drives. 



The National Instruments Instruments Spectral Spectral Measurements Measurements Toolkit Toolkit provides provides a set set of of flexible spe spectral spe 

measurements in LabVIEW and LabWindows/CVI, including power spectrum, peak peak power power and and frequency, 

frequency, 

in-band power, adjacent-channel channel power, and occupied bandwidth, as well well as as 3D spectrogram 

capabilities. In addition, the Spectral Measurements Toolkit contains VIs and functions for performing 

modulation-domain domain operations such as passband (IF) to baseband 

(I-Q) conversion, I-Q Q to IF conversion, and generation/analysis generation/analysis of of analog modulated signals. The 

combination of these optimized algorithms and the GHz pro processing cessing of your PC delivers unmatched 

measurement throughput. 

The Spectral Spectral Measurements Toolkit can can be be used used with with a variety of of NI NI hardware including the the PXI-5660 PXI RF 

vector signal analyzer, digitizers, and other modular hardware, as well as third-party third party stand stand-alone 

instruments. 



Another RF RF semiconductor component component that that is is important important in in many test systems is a direct direct quadrature 

modulator which takes a high-frequency frequency oscillator, and baseband I and Q signals as as inputs and returns an 

upconverted RF signal. 



In a QM-modulated modulated system, quadrature error, also also referred referred to to as quadrature skew, describes a complex 

complex 

signal impairment impairment such that the I and Q components are not not perfectly perfectly orthogonal. Quadrature error can 

be either positive or negative, with the sign indicating the orientation of the error. 

Quadrature skew is typically observed in the LO splitter, which divides divides the LO into an an in-phase in and a 

quadrature-phase phase signals. While an ideal system would would result in each of of these these being exactly 90 90 degrees 

degrees 

out of phase, some systems ystems specify up to 3 degrees degrees or or more of skew. For For lower order modulation 

schemes, quadrature quadrature skew has relatively little affect affect on system throughput. However, However, like like other sources 

sources 

of error, higher order modulation schemes such as 

64-QAM are significantly impaired. mpaired. 



IQ gain gain imbalance refers to a difference in scaling between between the the I and Q components components of of IQ data. When 

When 

expressed in in dB, dB, I/Q I/Q gain gain imbalance can be either either positive or negative, with with the the sign sign indicating which 

which 

component has been impaired. 

IQ gain imbalance alance is caused by amplitude errors in in the the DAC’s or because because of inconsistencies between each 

of the analog mixers. Again, for higher order modulation schemes such as 64 64-QAM QAM IQ gain imbalance of 

even a few dB can prevent proper demodulation of the signal. This is illustrated in the figure above. 



Testing a component such as a Direct Quadrature Modulator requires requires Instrumentation Instrumentation hardware to 

Generate the Local Oscillator as well as the Baseband I I and Baseband Q signals. signals. For For this application, application, the 

the 

instrument of choice for the LO would be the 5650/1/2 which can provide CW signals up to 6.6GHz. 

For a complete listing of of NI’s NI’s hardware hardware for for RF RF and and wireless test, please visit ni.com/modularinstruments. 





Emerging technologies require a flexible and easily exp expandable andable platform to keep pace with changing RF 

standards and and requirements. requirements. Through the power of National Instruments Instruments RF RF software 

software - the Modulation 

and Spectral Spectral Measurements Measurements toolkits for for National National Instruments Instruments LabVIEW and LabWindows/CVI 

LabWindows/CVI – the PXI 

RF platform provides rovides you with access access to to customizable functionality not available in traditional 

traditional 


The National Instruments Modulation Toolkit extends the built-in built in analysis capability of LabVIEW with 

functions and tools for signal generation, analysis, vi visualization, sualization, and processing of standard and custom 

digital and and analog modulation modulation formats. The National Instruments Digital Filter Design Design Toolkit extends 

extends 

LabVIEW with functions and interactive tools for design, analysis, and implementation of digital filters. filter 

The National Instruments Instruments LabVIEW LabVIEW Signal Processing Toolkit is a a suite suite of software software tools, tools, example 

example 

programs, and utilities for time-frequency frequency analysis, time-series time series analysis, and wavelets. 







Supported Signal Characteristics 

• Customizable frame, sub sub-frame, burst, and gap spacing 

• Channel bandwidth: 1.25 to 28 MHz 

• Modulation schemes: BPSK, QPSK, 16-QAM, 16 and 64-QAM 

• Supported coding rates: ½, 2/3, 3/4 

• Cyclic prefix ratios: 1/32, 1/16, 1/8, and ¼ 

Fixed WiMAX generation signal types 

• Time Division Duplex (TDD): Downlink and Uplink 

• Frequency Division Duplex Downlink (FDD-DL) (FDD 

• Frequency Division Duplex Uplink (FDD-UL) (FDD 

• Configurable preamble and base station ID 



A real-world world communication link contains a physical channel over over which which the the transmission transmissi will occur. 

Examples of of physical physical channel channel include, include, but are not limited to, to, air air (wireless), (wireless), fiber optic, optic, copper. copper. Source 

coding block block typically typically involves involves data compression. For example, example, the ATSC standard for digital video 

broadcast (DVB) specifies MPEGII encoding enc for the image to be transmitted. A-law, law, Mu-law, Mu JPEG, 

A-87.6 87.6 are are examples examples of of other other types of compression algorithms commonly commonly used used in source coding. Channel 

coding block block typically typically involves involves adding redundant bits to the the data stream to to increase the receiver’s recei 

susceptibility to noise and interference in the channel. channel. The The ATSC ATSC standard standard specifies Reed Solomon Solomon and 

Trellis coding as as channel channel coding blocks. 802.15.4 standard standard specifies differential encoding encoding and bit to chip 

chip 

mapping to add redundancy. The output of the channel coding block is still a series of 0s and 1s. The next 

block in the chain is the modulation block which converts the bits into an in in-phase phase (I) and quadraturephase 

(Q) data. This block typically typically also involves the step of pulse shaping to reduce inter-symbol 

interference and reduce bandwidth. The next block in the link involves an an analog analog upconversion to the the RF 

RF 

frequency at at which the the signal is transmitted. A mirror image image of of these these steps steps is is repeated at the receiver 

side. 





This brings us to our final final section section on designing PXI systems for for semiconductor validation. Here, we will 

will 

look at architectural and platform-level platform level solutions for emerging test needs and how PXI can provide 

unique implementations for solving these needs. 



With the growing presence ce of SoC and SiP architectures, there is an increased burden on chip test 

test 

solutions to be be very very flexible flexible in order order to accommodate new tests. tests. In In addition addition new systems systems must must have 

diverse measurement capabilities including digital, DC, mixed mixed-signal signal and RF capabilities. capabi Finally, new 

systems must be geared toward functional test solutions as opposed opposed to the the structural structural analysis analysis and 

discrete characterization that is common on component test. 



Traditional approaches to testing these new complex designs leave room for improvement. In the case of 

ATE solutions, solutions, initial initial costs costs can be very high and support contracts contracts can can push push these costs costs even further, 

making it tough for low-volume volume components to be tested in a cost cost-effective effective manner. Additionally, ATE 

testers are specialized for common components, but integrating integrating customized measurements measurements can be 

difficult. 

An alternate to ATE solutions is building a custom system with stand stand-alone alone instruments, however, this 

can have its own issues. Most notably, a lack of integration coupled wit with low-speed speed busses make some 

applications very tough to accomplish and leave others without an answer. 



PXI is is becoming becoming increasingly increasingly utilized utilized for semiconductor validation validation on new new ICs ICs that incorporate incorporate unique 

measurement needs. 

In addition to the capabilities ies and advantages that we’ve we’ve already already shown, this section will be focused on 

solution-based based approaches to solving evolving test needs. 



A unique benefit offered by NI in the PXI form-factor form is easily-programmable programmable FPGAs that can be targeted 

with NI LabVIEW. EW. Using the same graphical programming paradigm as all LabVIEW platforms platforms you can 

quickly and easily easily configure your FPGA application and and take full advantage advantage of of the the parallel programming 

and timing structures that graphical dataflow programming offers. 

In this manner, manner, standard and custom protocols can be developed and and implemented implemented in in a very very short 

short 

amount of time to realize intelligent communication with hardware. 



Digital protocols are used used in in a a wide wide variety of applications to communicate communicate between different 

different 

components on a plug-in in board or within a computer, or to connect different subsystems subsystems within a car car or 

or 

an airplane. They are are used used to transfer audio from your DVD DVD player player to your stereo or to to pass the 

information from the touchpad on your laptop to the mothe motherboard rboard and processor. Being able to read, 

write and monitor such protocols is a critical part of many many test test applications applications to verify verify and control the 

operation of different components as well as their interfaces. 

Some of these interfaces have commercial off-the-shelf off shelf hardware that may be purchased, but many 

times these communication interface devices require require custom hardware hardware to to be be built. 

built. 



The term term “protocol “protocol aware ATE” ATE” has has been a hot topic, and was mentioned heavily at at the 2007 ITC 

(international test conference) ce) that focuses on semiconductor test. test. There There has been a a call call in the industry 

for a a better way way to to intelligently intelligently communicating communicating with with chips and and ICs ICs instead of simply simply sending sending pre-saved 

pre 

vectors and performing pass-fail fail analysis on returned responses. 













. 



There are are 2 2 main main methods methods for programming digital digital protocols protocols using LabVIEW FPGA. The The first is is directly 

directly 

programming LabVIEW code using state-machines state machines or sequential code to execute the required patterns. 



The second method uses UML-stan standard state-chart chart models to represent the protocol, which can then be 

directly converted to LabVIEW code and targeted to the FPGA on on-board board a PXI module. This represents a 

incredibly quick, but but powerful way to transition directly from from a custom protocol’s doc documentation to a 

working communication with intelligent capabilities. 



A quick example of a common protocol that can be implemented in this this method is SPI. Note Note that SPI SPI is 

not a standard, standard, but it is a protocol that was established by Motorola. It can be used us 

to talk to just about 

any type of peripheral from converters and and sensors sensors to to EEPROMs. However, SPI SPI tends to be be used more 

with the streaming type type of of devices devices such such as as ADCs and and codecs due to to its its high high performance. 

performance. 

SPI is a 4-write write serial communication interface used by may ICs. It stands for Serial Peripheral Interface 

and it is a synchronous, full-duplex duplex bus. This means that with each clock transition, data is sent to and 

received from the device at the same time. time. It can run at highs speeds in in the 10s of MHz MHz. 

MHz 



We’ve already seen how PXI has a diversity of mixed mixed-signal signal instrumentation for analog and RF signals. A 

key benefit to to this modular hardware is is that there there are complimentary software solutions for for specific 

specific 

functional tests. In particular, there are software solutions for audio analysis, video measurements, and 

RF analysis and modulation modulation that compliment compliment the the PXI hardware. hardware. These software software packages offer offer the ability 

to use ready-to-run run solutions as well as customizing your own analysis. 



NI provides Sound nd and and vibration analysis software, including both interactive, interactive, configuration-based 

configuration 

software and National National Instruments LabVIEW analysis VIs, for for audio audio measurements, fractional fractional-octave 

fractional 

analysis, frequency analysis, transient analysis, and order tracking. 

With the Sound and and Vibration Vibration Assistant, Assistant, you you can continually continually interact with with live data data to to modify modify analysis 

analysis 

settings dynamically while logging data to disk for more analysis later. The software includes support for 

for 

power spectra, ANSI and IEC octave analysis, sound and vibration level, order tracking, time data 

recording, Universal File Format (UFF58) file I/O, and report generation. 

NI LabVIEW analysis analysis VIs VIs are are available available for for noise, vibration, vibration, and harshness harshness (NVH); machine condition 

monitoring; and audio test applicat applications. Express VIs and more than 50 ready-to-run run LabVIEW example 

code bases are also also included included to to shorten shorten time to first first measurement. measurement. Frequency Frequency analysis, analysis, transient 

transient 

analysis, and and order tracking are among the the available available functions for developing developing a custom applicat application applicat in 

LabVIEW. 



Functionality – VI Count 

Scaling, Calibration & Limit Testing – 13 

UFF58 File I/O – 18 

Weighting, Integration, & Generation – 8 

Sound & Vibration Level – 16 

Octave Analysis – 14 

Frequency & Transient Analysis – 49 

Swept Sine – 41 

Distortion & Single Tone Measurements – 17 

Order Analysis Pre-processing & Level – 7 

Tachometer Processing – 7 

Order Analysis – 18 

Fault Detection & Order Utilities – 9 

Order Data & Waterfall Displays – 10 

TOTAL – 227 

120 


MicroLEX Systems (now acquired by NI) created VideoMASTER to lower the cost of both analog and 

digital video video test. Besides costing less than many video test test solutions, solutions, VideoMASTER VideoMASTER leverages leverages the the high 

high 

throughput and and low low latency latency of of the PXI PXI bus to help reduce test test times. For For example, example, the the time to acquire ac a 

signal from from the the Composite Composite video, Component video, and HDMI HDMI outputs outputs of of a product product (set-top (set box, DVD 

player, and so so on) on) and and perform an an entire entire set of common measurements can be as short short as as six to eight 

seconds. Many consumer electronics products includ include e both audio and video outputs; since 

VideoMASTER is is built on the PXI platform, you can expand your your test test capabilities to include audio audio in 

in 

addition to to analog analog and digital video analysis. You can even add video video generation functionality if the 

application requires ires it. To view a comprehensive demonstration of the VideoMASTER VideoMASTER analog analog and and digital 

digital 

video analysis analysis platform, platform, watch watch the the “Analog and Digital Video Measurements” Measurements” webcast. (available (available at 

ni.com/videotest) 

VideoMASTER offers an efficient and modern way of test testing ing video products in manufacturing or in the 

development lab. 

Example 1: : Test of Composite video (CVBS) can be done in 2.5 2.5–3 3 sec. (incl. Color Bar, Bar Line Time, 

Horizontal timing, Dif. Gain & Diff. Phase, K-Factor, K Factor, Multiburst and Noise Spectrum). 

Example 2: : Test of Component video (CAV) can be done in 4–6 4 6 sec. (incl. Color Bar, Horizontal timing, K- 

K 

Factor, Multiburst and Noise Spectrum). 



Example 3 Test of three different outputs of one UUT, CVBS & CAV and HDMI (digital) for features like 

above, can be done completely in about 6–8 sec. 

122 


The VideoMASTER VideoMASTER analog video analysis suite from microLEX Systems is is built on the PXI platform. platform. It It uses 

uses 

the PXIe-5122 100 MS/s, 14-bit bit digitizer for acquisition of Composite, 

S-Video Video or Component Video signals. Once you have acquired the data, you can use the configurationbased 

environment environment to to easily select test steps from a a comprehensive library of measurements, or you you can 

can 

create custom measurements for your signal. While you configure configure measurement measurement steps in LabVIEW, you yo 

can create a test test sequence sequence using using the the NI TestStand test test executive to manage all all of of the measurements for 

for 

the test unit. unit. You You can also also add quantitative quantitative limits to each step to provide provide pass/fail criteria. In addition, addition, NI 

TestStand gives you easy access to test data and reporting. 

ni.com/swf/demos/us/modularinstruments/analogvideo/ 



The VideoMASTER VideoMASTER digital video analysis analysis suite suite from from microLEX Systems Systems is is also also built on the the PXI platform. platform. It 

It 

uses the PXI SPX-I I module for serial-to-parallel serial conversion of HDMI or DVI signals and the PXI-6542 PXI 100 

MHz high-speed speed digital interface for acquisition of of the color data. Once you have acquired acquired the data, you 

you 

can use the configuration-based based environment to easily easily select test steps steps from a a comprehensive comprehensive library library of 

of 

measurements, or you ou can create custom measurements for your your signal. While While you you configure 

configure 

measurement steps in LabVIEW, you can can create create a a test test sequence using the NI TestStand test executive to 

to 

manage all of of the measurements for the test test unit. unit. You can also also add quantitative quantitative lim 

limits to each step to 

provide pass/fail criteria. In addition, NI TestStand gives you you easy easy access access to to test data and reporting. 

When we we are are testing testing digital video, video, we we are are not not as as concerned concerned with with things things we would would normally normally care care about about in 

digital signal testing (things s like those in digital parametric parametric testing). testing). Instead, Instead, we we are are more more concerned with 

functional test test parameters, which are are more more descriptive descriptive of what what our our eyes see see when when we we see the video 

displayed on the TV screen. 

Functional test of digital video may typically fo focus on: 

Performance of traditional characteristics of video, as as in analog Component (Color Bar, 

K-Factor, Factor, Multiburst, Noise, etc.). 

The purpose purpose of the functional functional test test is is to to check for performance degradation due to: 



Internal signal processing: 

Up scaling (higher resolution than incoming signal) 

Down scaling (lower resolution than incoming signal) 

Format scaling (3:4 to 16:9, 14:9, etc.) 

Picture improvement algorithms 

Noise interference 

Delay testing, etc. 

125 






The AmFax PXI-5020 5020 GSM/EDGE meas measurement urement suite is a highly optimized platform for accurately testing 

GSM & & EDGE EDGE enabled enabled devices. devices. The software provides a highly integrated integrated set set of measurement measurement routines 

routines 

that can can be be integrated integrated into the manufacturing process process or utilised in development. The soft software soft 

algorithms are based on the powerful PXI platform with the NI PXI PXI-5660 5660 RF Signal Analyzer and NI PXI- 

5671 RF Signal Generator solutions. This low-cost low cost platform provides one of the most optimised data 

transfer architectures available, ideal for reducin reducing g test times and minimizing investment. The robust PXI 

product portfolio also makes it easy to address non non-RF RF testing requirements, including electrical and 

audio performance. The AmFax PXI-5020 PXI 5020 software is designed to both integrate seamlessly into the 

National Instruments’ off-theshelf, theshelf, TestStand test executive, via via Custom Custom Step Step Types, Types, and also as ActiveX 

modules for use with most industry standard standard ADE’s available on on the the market. market. A A run-time run interface for 

stand alone bench testing is also provided. The algorithms provided are optimized for speed to reduce 

test time and are are verified verified for their accuracy. Moreover, the adjustable pass/fail limits for each each test are 

are 

factory set set to the the necessary GSM/EDGE specification recommendations. The software software contains 

automated routines for for self self calibration calibration to ease introduction into the test environment environment and simplify 

support. 



Formats Supported 

• GSM - 450/480/750/850 

• PGSM - 900 

• EGSM - 900 

• RGSM - 900 

• DCS - 1800 

• PCS - 1900 

Call Processing 

• Via Emergency or Test Mode 

• RF or RS232 Interface 

Transmitter Tests 

• Frequency Error 

• Transmit Power 

• Phase Error 

• Peak 

• RMS 

• Error vs. Bit Position 

• Power vs. Time 

• Output RF Emissions 

• Switching 

• Modulation 

• Spurious Emissions 

Receiver Tests 

• Nominal Error Rate 

• Residual Bit Error Rate (Ib, II) 

• Frame Erasure Rate 

• Intermodulation 

• Bit Error Histogram 

129 


VISN RFID RFID toolset toolset for for LabVIEW is a software package testing testing radio radio frequency identification identification (RFID) 

(RFID) 

interrogators and and tags by using National Instruments RF hardware modules. This This toolset suppor 

supports high 

frequency (HF) and ultra high frequency (UHF) RFID RFID standards. standards. For For UHF RFID, RFID, you you have have two hardware 

hardware 

options, host host based based and and IF IF RIO RIO based. The host based option uses uses NI NI vector signal generator generator (NI (NI-5671) (NI 

and analyzer (NI- 5660) hardware as RF instrumen instruments, ts, and uses host controller, such as PXI embedded 

controller, as the the command generator and response analyzer. This This host based based option supports supports both both HF 

and UHF UHF RFID RFID standards. However, the UHF standard standard (EPC class 1 1 generation generation 2) 2) requires requires real real-time 

communication tion between the interrogator and and tag to complete the query sequence, so you you need the the IF 

IF 

RIO (NI-5640R) 5640R) based option to do do the full query sequence. This IF IF RIO RIO based based option uses the on-board on 

FPGA to do the real-time time handshake, and uses the host controller to do the post analysis. 

Note: VI Services Services does provide provide other products but keep in in mind that that this company company does not not pursue 

pursue 

integration outside outside of of China. China. It is best to have a customer customer purchase purchase their turn turn key key solutions solutions like the RFID 

RFID 

toolkit. 





A prime example of how the software-defined software defined approach to testing a device can save on cost. In the case 

of testing a cell-phone phone which communicates communicates with with a variety of wireless protocols, protocols, there there is is either either a choice 

choice 

to have a dedicated instrument for each type of test or to use a single piece of hardware that can be 

configured via software software to do all tests. Here, Here, PXI PXI can serve as an RFID tester, a power meter, a a radio 

tester, a spectrum analyzer, a WLAN tester and and a a GSM tester tester for for a a fraction fraction of of the price and and in in a fraction 

of the space as traditional solutions. 

This concept applies not only to to RF RF measurements, measurements, but but to any type of test that can can leverage leverage the the same 

same 

hardware front-end end along with customized analysis software. 



The final unique benefit that we’re going to hit on today is the complete test platform offered by NI. 

We’ve seen how PXI offers many benefits in regards to cost, speed, speed, size, and versatility, but it is is just just one 

one 

form-factor factor that that fits into the larger vision of virtual instrumentation. instrumentation. Integration Integration of of I/O modu 

modules with 

hardware platforms, platforms, driver layers, application software such as as LabVIEW, and and Test Test Management 

Software such as as NI NI TestStand TestStand is ultimately what makes a test test system most most successful. 

successful. 

By modularizing you test programs, you can use the system management software to call/perform the 

specific functions. Then if changes in software or hardware are required, you you are able able to to easily isolate 

the components that need to be changed. The system management layer layer allows you to call these 

program, manage various user levels, log log and manage data, data, and generate generate reports. 



Awarded Test Product of the Year by readers of Test & Measurement World magazine, National 

Instruments TestStand is off-the-shelf 

test management software used by 15 of the top 15 electronics 

manufacturers worldwide for rapid test system development and scalability (Electronic (Electronic Business Business 300, 

2006). NI TestStand TestStand delivers delivers a a modular modular test test architecture architecture with a graphical sequence sequence editor, an open 

language interface for automating tests written in any language, multithreaded sequence execution, 

flexible reporting, and and robust robust database connectivity for today’s automated prototype, validation, validation, and 

manufacturing test systems. Using NI TestStand TestStand you immediately eliminate hundreds of of hours hours from from your 

development time while le maintaining complete complete control over the environment to modify components components to 

to 

match your exact needs. Through unparalleled integration integration with the leading test development development languages 

and innovative technology technology including autoscheduling and user interface controls for developing custom 

operator interfaces in minutes, NI TestStand TestStand reduces reduces test system development effort by 75 percent. 



Building and maintaining in-house house test executive software software can can be daunting. The The operator operator interface, 

sequence development environment 

environment, , database integration, and interface with various test development 

languages are just a few of the factors you must must consider when determining the amount of of development 

time and cost associated with building your own in-house test executive. 

Fortunately, NI I TestStand provides many off-the-shelf off shelf features and a development framework that helps 

you build your test systems 75 percent faster. faster. NI TestStand is is also designed with with your your unique 

requirements in mind for custom operator interfaces, custom reports, and ccustom 

ustom tests. The bottom 

line: NI TestStand TestStand saves you time and money money by providing the core functionality you would otherwise 

have to rely on on someone someone else else within your organization organization to design, code, maintain, and support. 



Another key care-about about for automate automated d test systems, especially in a production setting, is parallel test. NI 

TestStand now provides both an auto-scheduler auto scheduler and test sequence profiler to speed the execution and 

analysis of your parallel test system. 



Today, we’ve seen a variety of ways in wh which ich the PXI platform can be used to reduce the cost of 

semiconductor test test in in addition addition to to adding new new capabilities. capabilities. Thank Thank you for attending the 

NI semiconductor validation seminar – for more information please visit: 

ni.com/semiconductor or contact your loc local field engineer with more questions. 



















Literatur: 

Aktuelle Veröffentlichungen: 

1. Rahman Jamal: Green Engineering – Technologien für ressourcenschonende Anwendungen in: 

elektrotechnik 6/2008, Seite 15 

2. Rahman Jamal: Green Engineering: Messtechnik im Wandel in: Markt& Technik 24/2008, Seite 

24. 

3. Rahman Jamal: Grüne Technik rechnet sich in: Technische Rundschau 11/2008, Seite 65-66. 

4. Rahman Jamal: Die Technik wird grün in: :K 05/2008, Seite 30-31 

5. Ronald Heinze: Green Engineering in: etz 09/2008, Seite 3 

6. Heiner Illig: Kostengünstige und zuverlässige funkgestützte Messtechnik in: polyscope 17/2008, 

Seite 18-20 

7. Heiner Illig: Weniger ist manchmal mehr – die WiFi-/WLAN-Datenerfassungsgeräte von NI in: 

MSR 10/2008, Seite 24-25 

8. Klaus Dinnes: Die Anwendung machts aus: Das passende Bussystem für Ihre 

Digitizer/Oszilloskop-Anwendung in: Polyscope 11/2008, Seite 20-21. 

9. Klaus Dinnes: Das passende Bussystem für Ihre Digitizer/Oszilloskop-Anwendung in: elektronik 

industrie 5/2008, Seite 48-50 

10. Ralf Müller: Aussagekräftige Messergebnisse für die Automobilentwicklung in: SPS Automotive, 

Seite 50-53 

11. Christoph Landmann, FlexRIO – Automated Test neu definiert, in: Elektronik Informationen 

03/2009 

12. Todd Dobberstein: Neue CompactRIO-Systeme für die Maschinensteuerung und als Zielplattform 

im Serieneinsatz in: etz 12/2007, Seite 10-11 

13. Rahman Jamal, Christoph Landmann: Parallele Welten sicher beherrschen in: Elektronik Messen 

& Testen 2007, Seite 50-53 

Aktuelle Bücher: 

1. Rahman Jamal, Hans Jaschinski, „Virtuelle Instrumente in der Praxis – Begleitband zum Kongress 

VIP 2008“, 2008 Hüthig Verlag 

2. Reinhard Lerch: Elektrische Messtechnik, 4. Auflage 2008, Springer Verlag 

3. Bernward Mütterlein: Handbuch für die Programmierung mit LabVIEW, 1. Auflage 2007, Elsevier 

Verlag 

4. Josef Kolerus: Zustandsüberwachung von Maschinen, 4. Auflage 2008, Expert Verlag 

146

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