05.12.2012 Views

Diplomarbeit Diplom-Ingenieur - Institut für Halbleiter

Diplomarbeit Diplom-Ingenieur - Institut für Halbleiter

Diplomarbeit Diplom-Ingenieur - Institut für Halbleiter

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

16<br />

There are two important, adjustable apertures between the objective and<br />

intermediate lens. The first is the objective aperture, which is located at the level of<br />

the focal plane and allows the selection of electrons from distinct scattered beams for<br />

image formation. The other is placed in the image plane of the objective lens and acts<br />

as a virtual aperture to choose the area of interest on the sample. It is called field-<br />

limiting aperture or selected area diffraction aperture (SAD).<br />

The JEOL JEM 2011 FastTem uses a LaB6 filament as electron source and the<br />

electrons can be accelerated up to 200keV between the Wehnelt cylinder and the<br />

anode plates. Electrons with an energy of 200keV are in the range where relativistic<br />

effects are playing a role. This leads to a wavelength of the particles of 2.5·10 -2 Å.<br />

The microscope is an electron system, thus the theoretical diffraction limit is given by<br />

the Rayleigh criterion (eqn. 3.1) [32].<br />

The denominator of equation 3.1 is called the numerical aperture and is the product of<br />

the diffraction-index and sin β, whereas β is the semiangle of collection. λ refers to<br />

the wavelength of the electrons. For an electron energy of 200keV this wavelength is<br />

2.5·10 -2 Å. The maximum resolution (the numerical aperture is set to 1) is then<br />

1.53·10 -2 Å.<br />

0.<br />

61⋅<br />

λ<br />

δ =<br />

n ⋅sin<br />

β<br />

The practical resolution is much worse than the theoretical diffraction limit. The<br />

main reasons are lens aberrations and in particular the spherical aberration of the<br />

magnetic lenses (see Fig. 3.3) [32]. The spherical aberration causes a stronger bend of<br />

off-axis electrons toward the optical axis, and thus a spot is reproduced as a disk in the<br />

image plane. The radius of this disk is given by Csβ 3 . β is again the semiangle of<br />

collection and Cs the spherical aberration coefficient, which is an important<br />

characteristic of a TEM. With this value and the Rayleigh criterion one can estimated<br />

a practical point-to-point resolution (eqn. 3.2) [32] of the microscope.<br />

r<br />

min<br />

≈ s<br />

( ) 4<br />

1<br />

3<br />

C<br />

0. 91 λ<br />

(3.1)<br />

(3.2)

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!