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EPC GaN Transistor Application Readiness Phase One Testing Standard relatively

EPC GaN Transistor Application Readiness: Phase One Testing

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RELIABILITY REPORT<br />

<strong>Phase</strong> <strong>One</strong> <strong>Testing</strong><br />

Appendix VI: Temperature Cycling -40˚C to 125˚C<br />

<strong>EPC</strong>1014 TC -40˚C to 125˚C<br />

Normalized RDS(ON)<br />

TC <strong>EPC</strong>1014 R DS(ON) vs. Stress<br />

2.0<br />

1.8<br />

1.6<br />

1.4<br />

1.2<br />

1.0<br />

0.8<br />

0.6<br />

0.4<br />

0.2<br />

0.0<br />

1 10 100 1000<br />

Stress Cycles<br />

IGSS @ 5 V (µA)<br />

TC <strong>EPC</strong>1014 I GSS @ 5 V vs. Stress<br />

2000<br />

1800<br />

1600<br />

1400<br />

1200<br />

1000<br />

2000<br />

800<br />

600<br />

400<br />

200<br />

0 1 10 100 1000<br />

Stress Cycles<br />

Normalized VTH<br />

TC <strong>EPC</strong>1014 V TH vs. Stress<br />

2.0<br />

1.8<br />

1.6<br />

1.4<br />

1.2<br />

1.0<br />

0.8<br />

0.6<br />

0.4<br />

0.2<br />

0.0<br />

1 10 100 1000<br />

Stress Cycles<br />

IDSS @ 40 V (µA)<br />

TC <strong>EPC</strong>1014 I DSS vs. Stress<br />

200<br />

180<br />

160<br />

140<br />

120<br />

100<br />

80<br />

60<br />

40<br />

20<br />

0<br />

1 10 100 1000<br />

Stress Cycles<br />

<strong>EPC</strong> – EFFICIENT POWER CONVERSION CORPORATION | WWW.<strong>EPC</strong>-CO.COM | COPYRIGHT 2011 | | PAGE 14

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