EPC GaN Transistor Application Readiness Phase One Testing Standard relatively
EPC GaN Transistor Application Readiness: Phase One Testing
EPC GaN Transistor Application Readiness: Phase One Testing
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RELIABILITY REPORT<br />
<strong>Phase</strong> <strong>One</strong> <strong>Testing</strong><br />
Appendix VI: Temperature Cycling -40˚C to 125˚C<br />
<strong>EPC</strong>1014 TC -40˚C to 125˚C<br />
Normalized RDS(ON)<br />
TC <strong>EPC</strong>1014 R DS(ON) vs. Stress<br />
2.0<br />
1.8<br />
1.6<br />
1.4<br />
1.2<br />
1.0<br />
0.8<br />
0.6<br />
0.4<br />
0.2<br />
0.0<br />
1 10 100 1000<br />
Stress Cycles<br />
IGSS @ 5 V (µA)<br />
TC <strong>EPC</strong>1014 I GSS @ 5 V vs. Stress<br />
2000<br />
1800<br />
1600<br />
1400<br />
1200<br />
1000<br />
2000<br />
800<br />
600<br />
400<br />
200<br />
0 1 10 100 1000<br />
Stress Cycles<br />
Normalized VTH<br />
TC <strong>EPC</strong>1014 V TH vs. Stress<br />
2.0<br />
1.8<br />
1.6<br />
1.4<br />
1.2<br />
1.0<br />
0.8<br />
0.6<br />
0.4<br />
0.2<br />
0.0<br />
1 10 100 1000<br />
Stress Cycles<br />
IDSS @ 40 V (µA)<br />
TC <strong>EPC</strong>1014 I DSS vs. Stress<br />
200<br />
180<br />
160<br />
140<br />
120<br />
100<br />
80<br />
60<br />
40<br />
20<br />
0<br />
1 10 100 1000<br />
Stress Cycles<br />
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