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Worldwide IC Packaging Foundries WLCSP Market Technology ...

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Die Edge with Epoxy Flow and Fillet Die Edge with No Epoxy Flow nor Fillet<br />

Figure 3. Schematic of X3 Thin QFN Package Construction<br />

characterization studies on its rigidity and warpage throughout the<br />

processes needed to be performed.<br />

Die must be thin and small to fit into the package but not too thin and<br />

too small that the assembly processes are unable to be performed or are<br />

difficult to handle. The die, usually a diode, requires conductive epoxy<br />

to provide the electrical conductivity between the die and the die pad.<br />

For the small die size of the X3 Thin QFN, it is important to prevent<br />

any die tilt that may cause an inconsistent wire loop height during<br />

wire bonding. Due to the small package size, there is insufficient<br />

clearance to accommodate epoxy flow as commonly available in the<br />

larger QFN packages. Therefore, it is preferably to select epoxy type<br />

with no epoxy fillet after die attach as described in Figure 3. Eutectic<br />

die attach or die attach film are options that meet these requirements.<br />

However, they were discarded due to several constraints. Instead,<br />

wafer backside coating (WBC) was selected.<br />

Wire must be conductive, of suitable thickness and properties to<br />

form ultra low loop to provide sufficient wire to package top clearance<br />

to prevent exposed wire after molding or laser marking.<br />

It is essential to select a fine filler compound to completely fill the<br />

narrow space within the ultra-small thin package. The flexural strength<br />

and modulus are also important so that the compound is able to<br />

provide appropriate mechanical strength when dealing with thin and<br />

flimsy strips prior to the singulation process.<br />

Processes Development Study<br />

Along the assembly front end of line (FEOL) and back-end of line<br />

(BEOL) processes, we have carried out many characterization studies<br />

to create a robust X3 product including die attach characterization<br />

study, compound selection, laser mark study, saw singulation process<br />

optimization and offloading.<br />

Die Attach Characterization Study<br />

As the die size gets smaller, it becomes a challenge at die attach.<br />

The pick-up tool needs to be small enough to grip the die effectively<br />

but the small size tool would lead to low vacuum performance as well<br />

as short tool life. Die ejection is also critical since the needle needs to<br />

be small enough to have good ejection but its small size can easily<br />

lead to indentation on the die back. However, it is also important to<br />

ensure that the die attach bonder motion of the pick-up and ejection<br />

are synchronized to have a good pick up and die placement as well as<br />

enabling the bonding tools to achieve acceptable tool life.<br />

Effect of Die Attach Bond Parameter<br />

Bond force, time, and temperature must be evaluated to ensure<br />

sufficient die adhesion to the pad and minimal epoxy spread. For<br />

Chip Scale Review March/April 2011 [ChipScaleReview.com] 25

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