15.02.2013 Views

Breakthroughs Breakthroughs - ETH - Ultrafast Laser Physics

Breakthroughs Breakthroughs - ETH - Ultrafast Laser Physics

Breakthroughs Breakthroughs - ETH - Ultrafast Laser Physics

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

IEEE Photonics Journal Short-Wavelength Free-Electron <strong>Laser</strong>s<br />

Short-Wavelength Free-Electron <strong>Laser</strong>s<br />

Keith A. Nugent 1 and William A. Barletta 2;3<br />

(Invited Paper)<br />

1 Australian Research Council Centre of Excellence for Coherent X-ray Science,<br />

School of <strong>Physics</strong>, The University of Melbourne, Melbourne, Vic. 3010, Australia<br />

2 Department of <strong>Physics</strong>, Massachusetts Institute of Technology, Cambridge, MA 02139 USA<br />

3 Sincrotrone Trieste, 34149 Trieste, Italy<br />

DOI: 10.1109/JPHOT.2010.2044654<br />

1943-0655/$26.00 Ó2010 IEEE<br />

Manuscript received February 10, 2010. Current version published April 23, 2010. Corresponding<br />

author: K. A. Nugent (e-mail: keithan@unimelb.edu.au).<br />

Abstract: This paper presents a short review of the development of and the motivation for<br />

short-wavelength free-electron lasers. The first observation of coherent X-ray production<br />

was reported from the Linac Coherent Light Source in April 2009.<br />

Index Terms: X-rays, <strong>Laser</strong>s, free-electron lasers, synchrotrons.<br />

X-ray science has been developing with remarkable rapidity in recent years. There have been<br />

exceptional increases in the coherent output of the available sources, and a great deal of work has<br />

been published on the development of coherent X-ray methods [1].<br />

The source of many of the gains in the brightness of X-ray sources has been the improvement in<br />

the electron beam quality and the use of structured magnetic arrays (known generically as insertion<br />

devices) to improve the X-ray output from the beam.<br />

Several proposals [2]–[4] have suggesting that the underlying developments in beam physics,<br />

accelerator technology, and insertion-device technology could lead to stimulated emission of<br />

radiation and subsequent high-gain amplification from an electron beam. The electron beam acts as a<br />

gain medium for free-to-free energy transitions and was first demonstrated in a low-gain system by<br />

Madey in 1973 [5], [6]. Such a free-electron laser (FEL) combines a linear accelerator and with a long<br />

insertion device. In an FEL, electrons pass through a magnetic structure of alternating dipoles<br />

producing X-rays which then interact with the electrons in such a manner as to further enhance the<br />

radiation outputVa process known as self-amplified spontaneous emission (SASE). The high-gain<br />

SASE process was first demonstrated in 1986 [7] and extended to visible wavelengths in the last ten<br />

years or so [8], and it has led to the development of a number of FEL facilities.<br />

Over the last five years or so, vacuum ultraviolet free to soft X-ray FELs have been operating in<br />

Hamburg, Germany (the FLASH facility) [9], and in Japan [10], with further facilities being constructed<br />

or proposed elsewhere [11]. The long term goal for X-ray science is the establishment and operation<br />

of X-ray FEL systems that can produce highly coherent beams with wavelengths in the range of 0.1 to<br />

40 nm. The first FEL hard X-ray beam at 0.1 nm was produced at the SLAC National Accelerator<br />

Laboratory in April 2009 [12].<br />

A high-profile, but by no means the only, motivation for the development of hard X-ray FEL<br />

facilities is that the extraordinary brightness of FEL sources will such that it might be possible to<br />

image single biomolecules without the need for crystals [13]. Conventional macromolecular<br />

crystallography, as performed at synchrotron facilities, requires the formation of a crystal of the<br />

biomolecule of interest, the acquisition of X-ray diffraction data, and the inversion of that data to<br />

Vol. 2, No. 2, April 2010 Page 221<br />

Authorized licensed use limited to: <strong>ETH</strong> BIBLIOTHEK ZURICH. Downloaded on May 11,2010 at 11:24:39 UTC from IEEE Xplore. Restrictions apply.

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!