TEMA 15 - Materials Science Institute of Madrid
TEMA 15 - Materials Science Institute of Madrid
TEMA 15 - Materials Science Institute of Madrid
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Análisis de muestras delgadas<br />
Muestras delgadas:~10s um<br />
Si(Li) detector<br />
X-ray<br />
Target<br />
X-ray<br />
E o<br />
E = E o – E (E
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