TEMA 15 - Materials Science Institute of Madrid
TEMA 15 - Materials Science Institute of Madrid
TEMA 15 - Materials Science Institute of Madrid
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Estructura cristalina mediante “channeling”<br />
rgago@icmm.csic.es Instituto de Ciencia de Materiales de <strong>Madrid</strong> (CSIC) 49/62<br />
Localización de defectos mediante channeling<br />
<br />
Análisis de impurezas/dopantes:<br />
1<br />
1<br />
RBS Yield<br />
d<br />
Random<br />
Defects<br />
Dechanneling<br />
2<br />
2Zzie<br />
Ángulo crítico : <br />
4<br />
dE<br />
Surface<br />
peak<br />
Norm. Yield<br />
Rmd<br />
(1)<br />
Aligned<br />
0<br />
~ 0.01<br />
E<br />
i<br />
0<br />
0 <br />
0<br />
0 <br />
Substitutional Large displacement<br />
1<br />
1<br />
0<br />
0 <br />
0<br />
0 <br />
Small displacement Instertitial<br />
rgago@icmm.csic.es Instituto de Ciencia de Materiales de <strong>Madrid</strong> (CSIC) 50/62<br />
25
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