Huge Images? - GIT Verlag

More documents

Recommendations

Info

E l E c t r o n M i c r o s c o p y Enabling 360 degree TEM/STEM of Nanoparticles Functionalized Holders for 3D Electron Microscopy A new protocol for functionalizing sample holders has been developed for 360° TEM/STEM observation of nanoparticles and nanostructures. The three step process includes FIB milling to customize sample stub geometry, thin film deposition for substrate selection and subsequent chemical functionalization for nanoparticle adhesion. This protocol was used to determine the morphology and local material properties of individual Au/SiO 2 core-shell nanoparticles used in a DNA detection assay. Nanoscience Imaging & Spectroscopy Tools for characterizing nanoparticles with complex three-dimensional (3D) geometrics are required to further nanoscience research and enable the continuing development of viable nanotechnologies. In this manuscript we report a protocol which combines focused ion beam milling (FIB), thin film deposition and solution chemistry to customize a rotation holder [1] for 3D structural and chemical analysis of nanoparticles with transmission, and scanning transmission electron microscopy (TEM and STEM). By using this protocol the geometry, sub- Fig. 1: A. A novel sample holder allowing for 360° rotation in a TEM/STEM [6]. The location of the sample to be analyzed is indicated by the arrow. B. Illustrated geometry of rotation holder sample, incident electron beam and analytical detectors. 24 • G.I.T. Imaging & Microscopy 4/2007 strate material and chemistry of the STEM or TEM rotation holder can be optimized for the nanoparticle system of interest. To illustrate this protocol, 3D STEM imaging rotation holders were modified for analysis of core-shell nanoparticles used in a DNA detection assay. The details of the Au/SiO 2 core-shell nanoparticle synthesis and resulting increased DNA detection efficiency are reported elsewhere [2]. Electron microscopy techniques are widely used to characterize morphology and electronic properties of materials at the near-atomic scale but are not well suited for visualizing complex structures Keywords: nanoscience, nanoanalysis, 3D STEM, functionalized holder, bionanotechnology in 3D [3, 4]. A nanoparticle must be either tilted or rotated with respect to the electron beam to enable multiazimuthal observation and 3D analysis. This requires a “nanoparticle holder” which can be either rotated or titled in a TEM or STEM. A 3D rotation holder, with sample location indicated by the arrow in Figure 1A, allows analysis from a full 360 degrees as opposed to traditional tomographic tilt-series based analysis which suffers from the missing wedge [5]. Unfortunately the scanning electron microscopy (SEM) and focused ion beam (FIB) based nano-manipulation techniques traditionally used for attaching samples to such rotation holders are not well suited for mounting individual nanoparticles [6–8]. Due to the small particle size and the practical difficulties of attaching and depositing individual particles with nanomanipulators a new technique is needed. To enable 3D STEM or TEM analysis of nanoparticles a three step process was developed to functionalize the brass needle stubs used in the rotation holder. In
C U T T I N G E D G E T E C H N O L O G Y D E L I V E R I N G U N I Q U E S O L U T I O N S For further information please visit us at www.smt.zeiss.com/nts Enabling the Nano-Age World ® Carl Zeiss SMT Nano Technology Systems Division Carl-Zeiss-Str. 56 73447 Oberkochen Germany C a r l Z e i s s S M T – N a n o T e c h n o l o g y S y s t e m s D i v i s i o n ZEISS CrossBeam ® Solutions The ultimate 3D research tool that combines FIB and GEMINI ® column to one extraordinary powerful system with new dimensions in analytical science. Combining high precision, unique live imaging and perfect handling. NEON ® 40, 40EsB, 60 and NVision 40 – unlimited analytical capabilities for all requirements Tel. +49 73 64 / 20 44 88 Fax +49 73 64 / 20 43 43 info-nts@smt.zeiss.com www.smt.zeiss.com/nts EDITORS’ EDITORS’ CHOICE Best Product 2007
Page 1 and 2: 69721 VOLUME 9 NOVEMbER 2007 4 3D O
Page 3 and 4: Nobel Prize for Surface Scientist G
Page 5 and 6: � ��
Page 7 and 8: MICROSCIENCE 2008 June 23-26 ExCeL,
Page 9 and 10: Want to know what your cells are up
Page 11 and 12: Understand the Dynamic Processes of
Page 14 and 15: R M S I n F o c u S The RMS - Acces
Page 16 and 17: C o m pa n y n e w s Nanosolution C
Page 18 and 19: A n n o u n c e m e n t Focus on Mi
Page 20 and 21: E v E n t R E p o R t See You Later
Page 22 and 23: E v E n t R E p o R t Dr Christel G
Page 24 and 25: E v E n t r E p o r t At the Region
Page 28 and 29: E l E c t r o n M i c r o s c o p y
Page 30 and 31: Verifying Engineering at the Nanosc
Page 36 and 37: Ultrafast Confocal Raman Imaging Ac
Page 38 and 39: S c a n n i n g S e c t i o n Ultra
Page 40 and 41: S c a n n i n g S e c t i o n Fig.
Page 42 and 43: S c a n n i n g S e c t i o n 3D Or
Page 44 and 45: S c a n n i n g S e c t i o n Combi
Page 46 and 47: M i c r o s c o p y Fa c i l i t i
Page 48 and 49: C o v e r S t o ry The “F” Word
Page 50 and 51: Systematic Analysis of FRAP Experim
Page 52 and 53: L i g h t M i c r o s c o p y where
Page 54 and 55: L i g h t M i c r o s c o p y Wide-
Page 56 and 57: tures themselves to redirect the be
Page 58 and 59: L i g h t M i c r o s c o p y Fig.
Page 60 and 61: Fundamental Knowledge Part 1 D i g
Page 62 and 63: D i g i ta l M at e r i a l s a n a
Page 64 and 65: Photo: Pixelio I m a g e P r o c e
Page 66 and 67: I m a g e P r o c e s s I n g alrea
Page 68 and 69: I & M S H o w c a S e Features: Com
Page 70 and 71: N o t e s f r o m N i k o N Control
Page 72 and 73: P r o d u c t s Creating Own Filter
Page 74 and 75: P r o d u c t s Intuitive Smart Cam
Page 76 and 77:
P r o d u c t s New Stereo Microsco
Page 78:
��
show all

Huge Images? - GIT Verlag

Create successful ePaper yourself

Delete template?

Save as template?