The Röntgen Radiation and its application in studies of ... - Mansic
The Röntgen Radiation and its application in studies of ... - Mansic
The Röntgen Radiation and its application in studies of ... - Mansic
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
In order to improve parallelism <strong>of</strong> the primary beam is <strong>application</strong> <strong>of</strong> the Göbel<br />
mirrors (or Parallel Beam) – these capture <strong>in</strong> a large solid angle, the X radiations<br />
from the source <strong>and</strong> produce an <strong>in</strong>tense parallel beam without the Kβ radiations<br />
(Figure 13).<br />
Parallel beam diffractometers have became more common <strong>in</strong> the use, <strong>in</strong> the<br />
recent years <strong>and</strong> have captured some <strong>application</strong>s from traditional Bragg-<br />
Brentano diffractometers (<strong>in</strong> th<strong>in</strong> films measurements <strong>and</strong> reflectometry).<br />
Multilayer parabolic mirrors proved their efficiency as they collimate <strong>in</strong>cident<br />
beams <strong>and</strong> are used <strong>in</strong> a variety <strong>of</strong> <strong>application</strong>s [10].<br />
Figure 13. Beam form<strong>in</strong>g by use <strong>of</strong> the Göbel mirror<br />
Figure 14. Comparison Bragg-Brentano Geometry versus Parallel Beam Geometry<br />
<strong>The</strong> results are obta<strong>in</strong>ed <strong>in</strong> the form <strong>of</strong> X-ray diffraction pattern, which shows<br />
dependence <strong>of</strong> collected <strong>in</strong>tensity versus scatter<strong>in</strong>g angle θ (Figure 15).<br />
For the computation <strong>of</strong> the data different exist<strong>in</strong>g programs are be<strong>in</strong>g used (such<br />
as the TOPAZ s<strong>of</strong>tware for the DIFFRAC plus ). Figure 16 shows an example <strong>of</strong> the<br />
qualitative phase analysis supported by computer phase filter<strong>in</strong>g. Also X-ray diffraction<br />
pattern can be collected versus change <strong>of</strong> some external parameter applied to<br />
the sample such as temperature, pressure, magnetic or electric field ect. Figure<br />
17 reveals set for X-ray diffraction patterns collected versus temperature change.<br />
Physics <strong>of</strong> Advanced Materials W<strong>in</strong>ter School 2008 12