FutureSuite UPDATE NOTICE REV 3.01 - Advantest

Cover 

C 

FutureSuite 

UPDATE NOTICE 

REV 3.01 

MANUAL NUMBER 

8409712-21 

2004 ADVANTEST CORPORATION 

First printing September 7, 2004 

All rights reserved. 

Printed in Japan

PREFACE 

PREFACE 

ADVANTEST and FutureSuite are trademarks of ADVANTEST Corporation. 

FutureSuite UPDATE NOTICE REV 3.01 

The description of the T5771 in this manual also applies to the T5771ES and T5724 unless otherwise 

specified. 

Sun, Sun Microsystems, The Sun logo, Solaris, NFS, SunVTS, Forte and Sun Workshop are 

trademarks or registered trademarks of Sun Microsystems, Inc. in the United States and other 

countries. 

All SPARC trademarks are used under license and are trademarks or registered trademarks of SPARC 

international, Inc. in the United States and other countries. Products bearing SPARC trademarks are 

based upon an architecture developed by Sun Microsystems, Inc. 

NI-488.2M is a trademark of National Instruments Corp. 

FLEXlm is a trademark of GLOBEtrotter Software, Inc. 

Netscape and Netscape Navigator are registered trademarks of Netscape Communications 

Corporation in the United States and other countries. 

The following logo is the trademark of ADVANTEST Corporation. 

All other marks referenced herein are also trademarks or registered trademarks of their respective 

owners. 

This IC Test System includes National Instruments GPIB driver software. 

By using this software, you agree to be bound all the terms and conditions of 

"NATIONAL INSTRUMENTS SOFTWARE LICENSE AGREEMENT" 

Sep 7/04 

Preface

Manual 

Rev 

Sep 7/04 

Date 

RECORD OF REVISIONS 

Remarks 

(Software REV) 

12 Nov 20/03 (REV 1.10) 

13 Mar 5/04 (REV 3.00) 

14 May 17/04 (REV 3.00-1) 

15 Jun 15/04 (REV 3.00-2) 

16 Jul 7/04 (REV 3.00-3) 

17 Jul 27/04 (REV 3.00-4) 

18 Aug 4/04 (REV 3.00-5) 

19 Aug 30/04 (REV 3.00-6) 

20 Sep 10/04 (REV 3.00-7) 

21 Sep 7/04 (REV 3.01) 

Manual 

Rev 


Date 

Remarks 

(Software REV) 

R-1

TABLE OF CONTENTS 

TABLE OF CONTENTS 


1. SUMMARY OF REVISION ................................................................ 1-1 

2. GENERAL ............................................................................................. 2-1 

2.1 On Adopting Sun Blade150 (H3-610146) ............................................... 2-1 

2.2 On Upgrading .......................................................................................... 2-1 

3. ENHANCED FUNCTIONS ................................................................ 3-1 

3.1 ATL ......................................................................................................... 3-1 

3.1.1 MEAS DC/VS/JUDGE ....................................................................... 3-1 

3.2 MCI ......................................................................................................... 3-1 

3.2.1 UTL_MeasDct/MCIs Creating HIDAR Data ...................................... 3-1 

3.2.2 UTL_SetDctReadPinMode, UTL_ReadDctPin, 

UTL_ReadDctPinOverflowPolarity ................................................................... 3-1 

3.3 Utilities .................................................................................................... 3-1 

3.3.1 Control Panel .................................................................................... 3-1 

3.3.2 FS Commands .................................................................................. 3-1 

3.3.3 Log Setting Tool ................................................................................ 3-2 

3.3.4 Margin Tool ....................................................................................... 3-2 

3.3.5 Pattern Tracer ................................................................................... 3-2 

3.3.6 Real Wave Tool ................................................................................ 3-2 

3.3.7 Shmoo Plot ....................................................................................... 3-3 

3.3.8 Test Condition Monitor ...................................................................... 3-3 

3.3.9 Wave Tracer ..................................................................................... 3-3 

3.4 VTC ......................................................................................................... 3-3 

3.4.1 Basic APIs to Control Testers ........................................................... 3-3 

4. IMPROVED ITEMS ............................................................................. 4-1 

4.1 ATL ......................................................................................................... 4-1 

4.1.1 ATL Interpreter .................................................................................. 4-1 

4.1.2 CALL CALB ....................................................................................... 4-1 

4.1.3 SELECT FCOUNT ............................................................................ 4-1 

4.2 FutureSuite Installation Guide ................................................................. 4-2 

4.2.1 Solaris Patch Installation Procedure ................................................. 4-2 

4.3 FutureSuite System Management Commands ....................................... 4-2 

4.3.1 fsdiskless .......................................................................................... 4-2 

4.3.2 fstimezone ......................................................................................... 4-2 

4.4 MCI ......................................................................................................... 4-3 

4.4.1 Memory Leak .................................................................................... 4-3 

4.4.2 UTL_OnPowerSeq, UTL_OffPowerSeq ............................................ 4-3 

4.4.3 The Problem Occurred by a Non-null-terminated String Variable ..... 4-4 

4.5 Online Manual ......................................................................................... 4-4 

Sep 7/04 

C-1


Table of Contents 

4.5.1 FutureSuite MCI Reference Manual ................................................. 4-4 

4.6 System Control ....................................................................................... 4-5 

4.6.1 Tester Bus ......................................................................................... 4-5 

4.6.2 utsc_em ............................................................................................ 4-5 

4.6.3 utsc_fm_master ................................................................................ 4-5 

4.6.4 utsc_fm_slave ................................................................................... 4-5 

4.6.5 utsc_smios, libatfssc.so .................................................................... 4-6 

4.7 Utilities .................................................................................................... 4-7 

4.7.1 Category Counter .............................................................................. 4-7 

4.7.2 Control Panel .................................................................................... 4-7 

4.7.3 Device Counter ................................................................................. 4-8 

4.7.4 Fail Bit Map ....................................................................................... 4-8 

4.7.5 Margin Tool ....................................................................................... 4-13 

4.7.6 Pattern Tool ...................................................................................... 4-14 

4.7.7 Pattern Tracer ................................................................................... 4-14 

4.7.8 Shmoo Plot ....................................................................................... 4-14 

4.7.9 Test List Viewer ................................................................................ 4-18 

4.7.10 Wafer Map ........................................................................................ 4-18 

4.7.11 fsclear, Control Panel ........................................................................ 4-19 

4.7.12 fsstdio, Test Array Terminal .............................................................. 4-19 

C-2 

Sep 7/04

1. SUMMARY OF REVISION 

Sep 7/04 

(1) Revision number 

• FutureSuite REV 3.01 



(2) Related manuals 

FutureSuite Installation Guide 8409637-11 

FutureSuite System Management Guide 

FutureSuite Basic User Interface Operation Manual 

FutureSuite Standard Utility Tool Operation Manual 

FutureSuite Operation Manual 

FutureSuite MCI REFERENCE MANUAL 

FutureSuite VTC Reference Manual 

(3) Reason of revision 

Improvement of functions 

Adopting Solaris 8 2/04 

Upgrading to FutureSuite REV 3.01 requires upgrading to Solaris 8 (2/04). 

Adopting Sun Blade150 (H3-610146) 

Sun Blade150 (H3-610146) is available for EWS from FutureSuite REV 3.01 or later. 

(4) Revised product 

Product code Product name 

PNFS57-00E FutureSuite 

The product code has been changed from PNFS57-71E to PNFS57-00E. 

(5) Revision list 

Product name Revision 

Solaris 8 (2/04) 

FutureSuite 3.01 

ATFSdg000 3.01A or later 

(6) Hard disk space required for installation 

Approximately 1.4 GB 

(7) System program size 

Approximately 700 MB 

1-1



(8) Relevant systems 

T5771 

T5771ES 

T5724 

1-2 Sep 7/04

2. GENERAL 

2.1 On Adopting Sun Blade150 (H3-610146) 


Sun Blade150 (H3-610146) is available for EWS from FutureSuite REV 3.01 or later. 

2.2 On Upgrading 

Sep 7/04 

Upgrading to FutureSuite REV 3.01 requires upgrading to Solaris 8 (2/04). 

2. GENERAL 

2-1

3. ENHANCED FUNCTIONS 

3.1 ATL 

3.1.1 MEAS DC/VS/JUDGE 

3.2 MCI 



(1) The HIDAR function has been added. 

This function enables the MEAS DC/JUDGE measurement values to be statistically processed 

according to the HIDAR condition. 

For more information, refer to "FutureSuite ATL TEST PLAN PROGRAM REFERENCE 

MANUAL". 

3.2.1 UTL_MeasDct/MCIs Creating HIDAR Data 

(1) The HIDAR function has been added. 

This function enables the UTL_MeasDct measurement value to be statistically processed 

according to the HIDAR condition. 

For more information, refer to "FutureSuite MCI REFERENCE MANUAL". 

3.2.2 UTL_SetDctReadPinMode, UTL_ReadDctPin, 

UTL_ReadDctPinOverflowPolarity 

3.3 Utilities 

(1) Whether the measured value overflows the positive limit or negative limit can be read. 

3.3.1 Control Panel 

(1) The following tools can be started now from the Tools menu. 

Log Setting Tool 

3.3.2 FS Commands 

Sep 7/04 

(1) The fssplogstart and fssplogend command have been able to specify target sites. For more 

information, refer to the "FutureSuite Basic User Interface Operation Manual". 

Accordingly, the fssplogstatus output format has been changed so that the data can be output 

on each site. 

3-1



(2) The following commands have been added. 

fsviewfile 

It arranges and displays the contents of the file that is saved in the tool. 

fshidar_j 

It displays a HIDAR condition list, add a HIDAR condition, delete individual HIDAR conditions, 

and delete all HIDAR conditions and collected HIDAR data. 

fshidar_h 

It displays the data from HIDAR data that matches the HIDAR condition in a histogram. 

For more information on these commands, refer to the "FutureSuite Basic User Interface 

Operation Manual". 

3.3.3 Log Setting Tool 

(1) The Log Setting Tool has been added. 

The Log Setting Tool is used to set the logging to the auto logger. For more information on 

this tool, refer to the “FutureSuite Basic User Interface Operation Manual”. 

3.3.4 Margin Tool 

(1) The site DUT selection function has been added. 

The scan can be executed for any site DUT by using this function. 

3.3.5 Pattern Tracer 

(1) The trace result can be saved in the file. 

(2) Any names can be specified for the trace items. 

(3) The number of the steps, which can be displayed in the trace result display area, can be 

set. Therefore, any number of the trace result can be displayed. 

(4) The transfer of the following register values can be controlled when the trace starts. 

3.3.6 Real Wave Tool 

The register value that is described in the pattern program. 

The register value that is stored in the register buffer. 

(1) The Real Wave Tool has been added. 

The Real Wave Tool is used to display and analyze the real waveform. For more information 

on this tool, refer to the “FutureSuite Standard Utility Tool Operation Manual”. 

3-2 Sep 7/04

3.3.7 Shmoo Plot 

Sep 7/04 

(1) The multiple setup conditions can be saved to a file. 

3.3.8 Test Condition Monitor 



(1) The “--unit” has been added to the utu_tcm startup option. 

The test condition of the unit specified as the “--unit” option can be displayed at the starting 

of Test Condition Monitor. 

3.3.9 Wave Tracer 

3.4 VTC 

(1) The system DUT selection function has been added. 

The trace can be executed for any system DUT by using this function. 

(2) The real wave tool can be started according to the condition for obtaining the specified area 

of the simulation waveform. 

3.4.1 Basic APIs to Control Testers 

(1) Basic APIs to control testers have been supported. Refer to “FutureSuite VTC Reference 

Manual”. 

3-3

4. IMPROVED ITEMS 

4.1 ATL 

4.1.1 ATL Interpreter 



(1) The following statements executed processes for FutureSuite TESIM's Power-on Sequence 

Monitor Utility regardless of FutureSuite or FutureSuite TESIM. 

RON, ROF, SRON, SROF MEAS DC/VS/MPAT START MPAT VSIM, ISVM SET EXCLU- 

SION, RESET EXCLUSION, SET EXCLUSION2, RESET EXCLUSION2, SET REJEC- 

TION PCON, VCON 

Relevant software revisions: REV 3.00 through REV3.00-6 

4.1.2 CALL CALB 

Improvement The following statements execute processes for FutureSuite TESIM's 

Power-on Sequence Monitor Utility only on FutureSuite TESIM. As a result, 

the execution time improved 3ms on FutureSuite. 

RON, ROF, SRON, SROF MEAS DC/VS/MPAT START MPAT VSIM, ISVM SET EXCLU- 

SION, RESET EXCLUSION, SET EXCLUSION2, RESET EXCLUSION2, SET REJEC- 

TION PCON, VCON 

(1) When CALL CALB was executed, it was a runtime error. 


Improvement CALL CALB can be executed. 

4.1.3 SELECT FCOUNT 

Sep 7/04 

(1) When '*' was specified for parameter, the value of ommited parameter was an default value. 


Improvement The value of ommited parameter is a previous setting. 

4-1



4.2 FutureSuite Installation Guide 

4.2.1 Solaris Patch Installation Procedure 

(1) The X server was sometimes terminated while the fail bit map was executed because of 

problems with the X server. 


Improvement The X server is not terminated while the fail bit map is executed. 

A Solaris patch that solves the problems with the X server is included in 

the FutureSuite CD-ROM. The procedure to install the Solaris patch has 

been added to the FutureSuite installation guide. 

For more information on the problems mentioned above, refer to "4.7 

Utilities". 

4.3 FutureSuite System Management Commands 

4.3.1 fsdiskless 

(1) If the following conditions are all met, fsdiskless tried to delete any non existent diskless 

clients that were listed. 

4.3.2 fstimezone 

If the -r option is specified (if the diskless client setting is deleted) 

If the --all option is specified (if all diskless clients are selected) 


Improvement The fsdiskless command does not try to delete the non existent diskless 

client. 

(1) The public user could not display TIMEZONE. 


Improvement The public user can display TIMEZONE. 

4-2 Sep 7/04

4.4 MCI 

4.4.1 Memory Leak 

Sep 7/04 

(1) A memory leak occurred in the following MCIs: 

UTL_GetCategoryCursor 

UTL_GetPbTypeHandle 

UTL_GetPbidHandle 

UTL_InitTest 

UTL_ReadCategory 

UTL_ReadDataLogSwitchCondition 

UTL_ReadDutXLocation 

UTL_ReadDutYLocation 

UTL_ReadSort 

UTL_ReadSymbol 

UTL_ReadTestMode 

UTL_ReadTestModeOptionsSwitchCondition 

UTL_ResetCategory 

UTL_SendSocketConditionByFile 

UTL_SendSort 

UTL_SendStartAdc 

UTL_SendSymbol 


UTL_Test 

A system error occurred if memory shortage was caused by memory leak. 


Improvement A system error caused by memory leak does not occur. 

4.4.2 UTL_OnPowerSeq, UTL_OffPowerSeq 


(1) If a value, which was smaller than 50.0e-6 was specified as the 

UTL_SetPowerSeqWaitTime() wait time, reference-on of the sequential reference-on or 

reference-off of the sequential reference-off were sometimes not executed on the target 

units. 


Improvement Reference-on and reference-off are executed. 

4-3



4.4.3 The Problem Occurred by a Non-null-terminated String Variable 

(1) A runtime error occurred by a non-null-terminated internal string variable used in the following 

MCIs. 

4.5 Online Manual 

UTL_BurstGoto 

UTL_BurstLabel 

UTL_GetDutCount 

UTL_GetDutCursor 

UTL_GetPbTypeHandle 


Improvement A runtime error does not occur. 

4.5.1 FutureSuite MCI Reference Manual 

(1) The argument for UTL_GetRegRb was incorrect. 


Improvement The argument for UTL_GetRegRb is correct. 

(2) The argument for UTL_GetRegUs was incorrect. 


Improvement The argument for UTL_GetRegUs is correct. 

(3) No description existed in case there was no performance board in the explanation of 

UTL_ReadPbType. 


Improvement The description has been added. 

(4) No description existed in case there was no performance board in the explanation of 

UTL_ReadPbid. 


Improvement The description has been added. 

4-4 Sep 7/04

4.6 System Control 

4.6.1 Tester Bus 

Sep 7/04 



(1) The library for accessing tester bus was located at ${ATFSROOT}/${ATFSARCH}/${ATF- 

SOS}/${ATFSTBUS}/${ATFSBMODEL}/lib/libatfstb.so. 


4.6.2 utsc_em 

Improvement The library for accessing tester bus was moved to ${ATFSROOT}/ 

${ATFSARCH}/${ATFSOS}/${ATFSTBUS}/lib/libatfstb.so. 

(1) If many utilities and FS command processes were executed simultaneously, FutureSuite 

sometimes did not terminate correctly. 


Improvement FutureSuite terminates correctly. 

4.6.3 utsc_fm_master 

(1) In the following case, the ‘Calibration Initialize’ check button of the control panel was not 

deselected. 

4.6.4 utsc_fm_slave 

When the main program terminated by testend or aborted or a runtime error for all 

sites. 


Improvement In the following case, the ‘Calibration Initialize’ check button of the control 

panel is deselected. 

When the main program terminated by testend or aborted or a runtime 

error for all sites. 

(1) If a non-existing directory was specified as the current directory, a runtime error occurred 

when startfs or exitfs was executed. 


Improvement Even if a non-existing directory is specified as the current directory, 

startfs and exitfs can be executed correctly. 

(2) If a user-created data processing program was set as a program which is started when a 

test starts, program debugging could not be performed correctly. 


Improvement Program debugging can be performed correctly. 

4-5



(3) The debugger did not start in the specified current directory when the following condition 

was satisfied: 

If device programs of the same name existed in different directories and these device 

programs had been debugged before. 

[Example] 

/home/user/device1/testprog ...(A) 

/home/user/device2/testprog ...(B) 

(a) (A) was debugged by using a debugger. 

(b) If (B) was debugged by using a debugger, the current directory of the debugger changed 

to the current directory that was specified for (A). 


Improvement The debugger is started in the specified current directory. 

4.6.5 utsc_smios, libatfssc.so 

(1) Many resources were used in FutureSuite. 


Improvement The resources that are used in FutureSuite has been reduced and the 

number of utilities that can be simultaneously executed has been increased. 

(2) If utilities such as the error console and test array terminal were executed simultaneously, 

the following problems occurred: 

The EWS process speed became extremely slow. 

The Solaris command execution failed. 


Improvement If utilities such as the error console and test array terminal were executed 

simultaneously, none of the following problems occur: 

The EWS process speed becomes extremely slow. 

The Solaris command execution fails. 

4-6 Sep 7/04

4.7 Utilities 

4.7.1 Category Counter 

Sep 7/04 



(1) If a device program was executed when the following conditions were satisfied, the total 

counts of incorrect category numbers (category number 0) was displayed. 

[Counted Category] was selected from [Counter Display Mode]. 

The category counter information was cleared. 

The total number of category numbers that was counted after a device program was 

executed was smaller than the total number of category numbers before the device 

program was executed. 


Improvement The total counts of incorrect category numbers (category number 0) 

have not been displayed. 

(2) If the wafer start was executed when the following conditions were satisfied, the total 

counts of incorrect category numbers (category number 0) were displayed. 

4.7.2 Control Panel 

[Counted Category] was selected from [Counter Display Mode]. 

The category counter information was cleared. 


Improvement The total counts of incorrect category numbers (category number 0) 

have not been displayed. 

(1) No directory selection dialog box was displayed when the following conditions were satisfied: 

If the directory that was set as the current directory did not exist in the file system. 

The file selection dialog box was displayed in a directory that did not exist when the following 

conditions were satisfied: 

If the file directory that was set in the main program did not exist in the file system. 

If the file directory that was set in the socket program did not exist in the file system. 


Improvement If the directories described above do not exist in the file system, the directory 

selection dialog box and the file selection dialog box have been 

displayed in the home directory. 

4-7



4.7.3 Device Counter 

(1) DUTs, for which no warning should be displayed, were displayed when the following conditions 

were satisfied: 

[Yield] was selected for the display content on the main window. 

The total counts of devices were displayed for each site DUT. 

The number of DUTs that were tested in parallel in a site was two or more. 

Any DUT, at which the yield became lower than the yield value that was set in the 

Warning Indication dialog box, existed in site. 

The DUT number in the site was larger than the DUT, at which the yield became lower 

than the value that was set in the Warning Indication dialog box. 


Improvement A warning has been displayed only for the value that is lower than the 

yield value that is set in the Warning Indication dialog box. 

(2) The last few characters of a character string in the wafer number display area were not displayed 

when the following conditions were satisfied: 

4.7.4 Fail Bit Map 

The counter information was cleared before the device counter started. 

The wafer number and wafer ID were set before the device counter started. 

The length of a character string that was displayed in the wafer number display area 

exceeded the width of the wafer number display area. 


Improvement The set wafer ID has been displayed correctly. 

(1) An error occurred and fail bit information was not able to be displayed when the following 


Set the desired FCM Access Address 

The total number of bits of the address specified as FCM Access Address was equal to 

the total number of bits of FCM Config Address. 

The each number of bits of X, Y, and Z was not equal to the FCM Config Address. 


Improvement The correct fail bit information has been displayed, without an error occurring. 

4-8 Sep 7/04

Sep 7/04 



(2) It was impossible to scroll in the Logical Map Viewer when the following conditions were 

satisfied: 

Page size was a fixed size. 

Fail bit information was displayed, 


Improvement It has been able to scroll normally. 

(3) The fail bit map was terminated when the following condition was satisfied: 

An error occurred when a file was read from Main Viewer. 


Improvement An error dialog box has been displayed. 

(4) No fail bit information was read into the Logical Map Viewer that most recently started from 

the file but was read into the Logical Map Viewer that had previously started when the following 

conditions were satisfied. 

[Multi-Window] in the [Options] menu of Main Viewer was set to on. 

Logical Map Viewer has already started. 

The file, in which logical sum (OR) of the fail bit information was stored, was read. 


Improvement The fail bit information has been read into Logical Map Viewer that most 

recently started. 

(5) No error message was displayed when the following conditions were satisfied: 

The size of the page address area was changed by using the [View] menu. 

The X/Y address that was displayed in the page address area was smaller than 8 x 8. 


Improvement An error message has been displayed. 

(6) A runtime error occurred when the following conditions were satisfied: 

No pattern program was specified in the device program. 

The fail bit information was displayed by clicking the Execute button. 


Improvement No pattern has been executed if no pattern program is specified. Therefore, 

no runtime error occurs. 

4-9



(7) X and Y of the fail address were reversely displayed when the following conditions were 

satisfied: 

The Fail Address window was displayed. 

The link orders of X and Y axes that were saved in the file was the same as the link 

orders of the X and Y axes in the display area. 

The link orders of the X and Y axes in the display area were replaced after the fail bit 

information was read from the file. 

Then, the Read button of Logical Map Viewer was clicked. 


Improvement The correct fail address has been displayed. 

(8) The fail address that was displayed in the Fail Address window was incorrect when the following 

condition was satisfied: 

The address size of the horizontal axis was smaller than 8. 



(9) If the following conditions were satisfied, the address list in the Fail Address window did not 

move if the scroll bar was moved up. 

Many failure addresses existed. 

The scroll bar was available. 

Failure addresses were only displayed in the window when the scroll bar was moved 

down. 


Improvement The address list has scrolled in accordance with the scroll bar. 

(10) The fail bit map was terminated if the following conditions were satisfied: 

The file, which was saved by using the REV1.xx fail bit map tool, was read. 


Improvement The file has been read correctly. 

4-10 Sep 7/04

Sep 7/04 


(11) The X server was terminated when the following conditions were satisfied: 


All or a part of the fail bit information display area of Logical Map Viewer was not completely 

in the display screen. 

The zoom operation was performed in the Zoom-out display area. The selected range 

was also displayed in the fail bit information display area. 

The zoomed range in the zoom-out display area was not completely in the display 

screen when it was in the fail bit information area. 


Improvement The X server operates correctly by following the instructions in the installation 

guide and applying a Solaris patch (108606-35). 

(12) Two operation dialog boxes overlapped and the execution could not be interrupted when 

the following conditions were satisfied: 

The operation mode was set to the tester mode. 

The fail bit information was saved. 


Improvement Only one operation dialog box has been displayed. 

(13) I/O numbers were displayed in the Fail Address window when the following conditions were 

satisfied: 

The file, in which the logical sum (OR) of the fail bit map was stored, was read. 

The Fail Address window was displayed. 


Improvement "---" has been displayed in the I/O column. 

(14) An incorrect fail address was displayed when the following conditions were satisfied: 

The file, in which the logical sum (OR) of the fail bit map was stored, was read. 

[Or] was selected from the [I/O Display] submenu of the [View] menu. 



(15) Fail addresses were sorted by I/O number and were stored when the following conditions 

were satisfied: 

[Addr] was selected in the read out order of the Fail Address window. 

Fail addresses were saved by using the [File] menu of the Fail Address window. 


Improvement Fail addresses have been sorted by address. 

4-11



(16) No zoom was executed when the following conditions were satisfied: 

The Zoom Compress Ratio dialog box was opened. 

Only the address was changed and the [OK] button was clicked without changing the 

compression ratio. 


Improvement The zoom has been executed even if only the address is changed. 

(17) The Fail Bit Map terminated when the following conditions were satisfied: 

The address size of the horizontal axis was 21 bits or more. 

A fail bit information was saved. 


Improvement The correct fail bit information has been saved, without terminating. 

(18) An error occurred when the following conditions were satisfied: 

A file was read into Logical Map Viewer. 

The system DUT number saved at the file was not the target for a test. 

Fail bit information loading-source was set to [Tester], and the [Execute] button was 

pushed. 


Improvement The correct fail bit information has been displayed, without an error occurring. 

(19) The Fail Bit Map sometimes terminated when the following conditions were satisfied: 

Fail bit information was displayed on Logical Map Viewer. 

The Fail Bit Information Display Area was scrolled. 

Assignment of the FCM address was changed with the Fail Capture Memory Tool. 

The [Execute] button of Logical Map Viewer was pushed. 


Improvement The correct fail bit information has been displayed, without terminating. 

4-12 Sep 7/04

Sep 7/04 



A file was read into Logical Map Viewer. 

The fail bit information on the target I/O number were all pass or all fail. 

Zoomed to the compression ratio of multiple address per 1 pixel. 



Improvement Fail bit information has been displayed correctly, without terminating. 

(21) The value displayed on the page fail count was wrong when the following conditions were 

satisfied: 

The file which saved the logical OR of fail bit information was read. 

Zoomed to the compression ratio of displaying 16 or more address per 1 pixel. 


Improvement The correct page fail count has been displayed. 


The file which saved the fail bit information beyond 8M bits was read. 

8M bits of the last of fail bit information were all pass or all fail. 




4.7.5 Margin Tool 

Enabled to display the total fail count. 

The file which saved the logical OR of fail bit information was read. 

Horizontal or vertical address size was smaller than 8. 



(1) The start value of STRB2 was set as the start value of STRB1 when the following condition 

was satisfied: 

A double-strobe was set. 


Improvement Scan has been performed with the correct start value. 

4-13



4.7.6 Pattern Tool 

(1) No error occurred when the following condition was satisfied: 

4.7.7 Pattern Tracer 

After setting up the correct register conditions, they are set up again. 

As register conditions, #100000000-#FFFFFFFFF is set to IDX1-IDX8 or IDXW1- 

IDXW8. 


Improvement An error has occurred. 

(1) C was displayed as the control bit C0-C11. 


Improvement The control bit C0-C11 is independently displayed. 

(2) The number of the pattern tracers, which can be started at the same time, was limited. 


4.7.8 Shmoo Plot 

Improvement The number of the pattern tracers, which can be started at the same 

time, was not limited. Therefore, multiple pattern tracers can be started 

at the same time. 

(1) Shmoo was executed incorrectly when the following conditions were satisfied: 

A pinlist name was set for the pins, for which Shmoo was executed. 

A site existed, in which the set pinlist name did not exist. 


Improvement Shmoo has been executed correctly if the following condition is satisfied: 

The set pinlist name exists in the system DUT to be measured. 

(2) No error occurred when the following condition was satisfied: 

0 was set in the [Step Count] text box of the [Shmoo Condition] dialog box. 


Improvement An error has occurred. 

4-14 Sep 7/04

Sep 7/04 



(3) Setting values returned to their initial state when the following conditions were satisfied: 

Shmoo execution conditions were set by using the [Shmoo Condition] dialog box. 

Setting values were changed. 

The setting values became invalid if other conditions were changed (example: in Transition 

Shmoo, the [Step Count] value became invalid if [Binary] was selected in [Scan 

Type]). 

The settings were applied by clicking either the [OK] button or [Apply] button under the 

above conditions. 


Improvement No values have become invalid. 

(4) Shmoo plot was displayed incorrectly when the following conditions were satisfied: 

Three-dimensional Normal Shmoo was used 

[Transition(Fail to Pass)] was set as the display type. 

Multiple system DUT results were displayed by overlapping. 


Improvement Shmoo plot has been displayed correctly. 

(5) Pass results were displayed as all system DUT results when the following conditions were 

satisfied: 


[Slice] was set as the display type. 

The [DUT Display...] in the [View] menu was used. 

The grid that has no execution result was right-clicked. 


Improvement No results have been displayed. 

(6) An incorrect value was displayed in the X, Y, Z Value label of the [DUT Display] dialog box 

when the following conditions were satisfied: 



The X or Y axis was set as the axis to be sliced. 

The [DUT Display...] in the [View] menu was used. 


Improvement The correct value has been displayed. 

4-15



(7) The result of the first grid was always [Limitation] when the following conditions were satisfied: 

The tester resource setting value that was set to the scan condition of each axis was 

outside the specification. 

Shmoo was executed twice in a row. 


Improvement The correct result has been displayed. 

(8) [No Data] was displayed as the Shmoo result when the following conditions were satisfied: 


[Transition(Pass to Fail)] or [Transition(Fail to Pass)] was set as the display type. 

All the Z-axis results were [Limitation]. 


Improvement [Limitation] has been displayed as the Shmoo result. 

(9) The Shmoo execution could not be interrupted when the following condition was satisfied: 

The execution result of the mid-operation grid of Shmoo was [Limitation]. 


Improvement The Shmoo execution has been interrupted. 

(10) The Shmoo plot was terminated when the following conditions were satisfied: 

Shmoo was executing, or Shmoo execution was pausing. 

The [Scan Condition] dialog box was displayed. 

The [Condition Apply] button in the [Scan Condition] dialog box was clicked. 


Improvement The Shmoo plot has not been terminated but an error has occurred. 

(11) The incorrect execution result was displayed when the following conditions were satisfied: 



The following procedures were used to operate Shmoo. 

Set the value that was displayed in the axis to be sliced. 

Set the scan conditions of the number of steps which was smaller than the set value. 

Execute Shmoo. 


Improvement The correct execution result has been displayed. 

4-16 Sep 7/04

Sep 7/04 


(12) The Shmoo plot was terminated when the following conditions were satisfied: 



The following procedures were used to operate Shmoo. 

Set the value that was displayed in the axis to be sliced. 


Read the Shmoo data file, in which scan conditions of the number of steps which was 

smaller than the set value. 


Improvement The Shmoo data file has been read correctly. 

(13) The unit displayed on Index of the Scan Condition dialog box was "V" when the following 

condition was satisfied: 

ILH or ILL was specified as a unit condition in the Scan Condition dialog box. 


Improvement The unit displayed on Index has been "A". 

(14) The display position of the original point marker of the Z-axis was wrong when the following 


The file saved with the Shmoo plot tool of Rev1.xx was read. 

The data of this file was 3D Normal Shmoo. 

The display type was [Slice]. 

The target axis to slice was not the Z-axis. 


Improvement The original point marker of the Z-axis has been displayed on the correct 

position. 

(15) The timing set number of RATE in the original point data of the outputted text was not enclosed 

in parenthesis"" when the following conditions were satisfied: 

RATE was set as the scanning conditions of an axis. 

The Shmoo data was outputted to a text. 


Improvement The timing set number of RATE in the original point data of the outputted 

text bas been enclosed in parenthesis"". 

4-17



(16) Shmoo execution was not performed correctly when the following conditions were satisfied: 

Shmoo was executing, or Shmoo execution was pausing. 

Operated on the following dialog box. 

[DUT Display] dialog box 

[Shmoo Condition] dialog box 

[Category Assignment] dialog box 

[Color Selection] dialog box 


Improvement A dialog box has not been able to be operated when Shmoo is executing 

or Shmoo execution is pausing. 

4.7.9 Test List Viewer 

(1) The test result of other site was saved instead of the test result of the displayed site when 

the following condition was satisfied. 

4.7.10 Wafer Map 

After the test results of all sites were saved by using [All Site...], the specified site was 

saved by using [Display Site...]. 


Improvement The test result of the displayed sited has been saved. 

(1) In Shot Viewer, the sort numbers, which were displayed in the dies, were different from the 

selected character location. 


Improvement The sort numbers has been displayed according to the selected character 

location. 

(2) The correct scale for the horizontal direction was not displayed when the origin of the display 

data is set to the following settings: 

Top-Right-XY 

Top-Right-YX 

Bottom-Right-XY 

Bottom-Right-YX 


Improvement The correct scale has been displayed. 

4-18 Sep 7/04

4.7.11 fsclear, Control Panel 

Sep 7/04 



(1) All system DUTs were set as the test target when the following condition was satisfied: 

The execution condition of the device program was cleared by using fsclear or the control 

panel. 


Improvement The test target system DUT has not been changed even if the execution 

condition of the device program is cleared. 

4.7.12 fsstdio, Test Array Terminal 

(1) If fsstdio or the test array terminal was executed, the output of the data processing program 

was not displayed. 


Improvement The output of the data processing program has been displayed. 

4-19

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