Download PDF - International Solid-State Circuits Conference
Download PDF - International Solid-State Circuits Conference
Download PDF - International Solid-State Circuits Conference
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
DISPLAY AND IMAGER ELECTRONICS<br />
Session Chair: Iliana Fujimori-Chen, Analog Devices, Wilmington, MA<br />
Associate Chair: Oh-Kyong Kwon, Hanyang University, Seoul, Korea<br />
15.1 A Piecewise-Linear 10b DAC Architecture with Drain-Current Modulation for<br />
Compact AMLCD Driver ICs<br />
1 1 1 1 2 2 2<br />
Y-J. Jeon , H-M. Lee , S-W. Lee , G-H. Cho , H. Kim , Y-K. Choi , M. Lee<br />
1 2 KAIST, Daejeon, Korea; Samsung Electronics, Yongin, Korea<br />
1:30 PM<br />
A piecewise-linear 10b DAC for an AMLCD data driver with interpolation by drain-current<br />
modulation is reported. The DAC achieves a DNL of 0.37 LSB and INL of 1.71 LSB. Output<br />
voltage mean and standard deviation of 6.35mV and 0.54mV are achieved. Each DAC<br />
occupies 14×473μm 2 in 0.10μm CMOS and total chip power consumption is 9.4mW.<br />
15.2 A 10b Column Driver with Variable-Current-Control Interpolation for Mobile<br />
Active-Matrix LCDs<br />
1 1 1 1 2 2 2<br />
H-M. Lee , Y-J. Jeon , S-W. Lee , G-H. Cho , H-R. Kim , Y-K. Choi , M. Lee ,<br />
1KAIST, Daejeon, Korea<br />
2 Samsung Electronics, Yongin, Korea<br />
SESSIONS 15 & 16<br />
2:00 PM<br />
A 10b column driver for mobile AMLCDs uses variable-current-control interpolation in<br />
buffer amplifiers. Bias-current steering improves the interpolation accuracy. The INL and<br />
DNL are 0.7 LSB and 0.4 LSB, respectively. A total chip size of 20.18×1.68mm 2 is obtained<br />
in a 0.10μm 1.5V/5V CMOS process. The total power consumption is 20mW.<br />
15.3 A 0.1e - Vertical FPN 4.7e - Read Noise 71dB DR CMOS Image Sensor with 13b<br />
Column-Parallel Single-Ended Cyclic ADCs<br />
2:15 PM<br />
1 1 1 1 1 1 1 1<br />
J. Park , S. Aoyama , T. Watanabe , T. Akahori , T. Kosugi , K. Isobe , Y. Kaneko , Z. Liu ,<br />
1 1 2<br />
K. Muramatsu , T. Matsuyama , S. Kawahito<br />
1 2 Brookman Lab, Hamamatsu, Japan; Shizuoka University, Hamamatsu, Japan<br />
A CIS with 13b column-parallel cyclic ADCs is presented. A single-ended architecture with<br />
low read noise increases DR up to 71dB. A vertical FPN of 0.1e - rms is attained using digital<br />
CDS, which performs A/D conversion twice in a horizontal scan period of 6.83μs. The<br />
imager has 7.07V/lx·s sensitivity, 5.6μm ADC pitch, 61μV/e - conversion gain, 4.7e - rms read<br />
noise and