Technical Program

Estimation of the geographic vertical position of a person using a shank-mounted inertial sensor
Antonio Miguel López (University of Oviedo, Spain); Diego Álvarez (University of Oviedo, Spain); Rafael
González (University of Oviedo, Spain); Juan Carlos Alvarez (Universidad de Oviedo, Spain)
Sensors uncertainty on an Android smart phone
Maria Grazia D'Elia (University of Salerno, Italy); Vincenzo Paciello (University of Salerno & University of
Salerno, Italy)
Smartphones as a Platform for Advanced Measurement and Processing
Charl A Opperman (University of Pretoria, South Africa); Gerhard P Hancke (Royal Holloway, University of
London, United Kingdom)
14:15 - 16:20
SPECIAL SESSION: Nano-Scale Instrumentation and Measurement.
Room: S6
Oral
Challenges and limitations of nanomeasuring technology
Gerd Jaeger (Ilmenau University of Technology & Institute of Process Measurement and Sensor Technology,
Germany)
Displacement Measurement of Planar Stage by Diffraction Planar Encoder in Nanometer Resolution
Kuang-Chao Fan (National Taiwan University, Taiwan); Bo-Hsun Liao (National Taiwan University, Taiwan); Yi-
Cheng Chung (National Taiwan University, Taiwan); Tien-Tung Chung (National Taiwan University, Taiwan)
Dimensional nanometrology at PTB
Hans-Ulrich Danzebrink (Physikalisch-Technische Bundesanstalt (PTB), Germany); Gaoliang Dai (Physikalisch-
Technische Bundesanstalt (PTB), Germany); Frank Pohlenz (Physikalisch-Technische Bundesanstalt (PTB),
Germany); Thorsten Dziomba (Physikalisch-Technische Bundesanstalt (PTB), Germany); Sebastion Bütefisch
(Physikalisch-Technische Bundesanstalt (PTB), Germany); Jens Flügge (Physikalisch-Technische
Bundesanstalt (PTB), Germany); Harald Bosse (Physikalisch-Technische Bundesanstalt (PTB), Germany)
Design and Characterization of Band-pass Filters in Fourier Transform Profilometry for Accurate 3-D Surface
Measurement
Liang-Chia Chen (National Taiwan University, Taiwan)
Development of a metrological scanning probe microscope incorporating a quartz tuning fork sensor and
heterodyne laser interferometry
Jan Herrmann (National Measurement Institute Australia, Australia); Bakir Babic (National Measurement
Institute Australia, Australia); Chris Freund (National Measurement Institute Australia, Australia); Malcolm Gray
(National Measurement Institute Australia, Australia); Magnus Hsu (National Measurement Institute Australia,
Australia); Terry McRae (National Measurement Institute Australia, Australia)
SPECIAL SESSION: Process Tomography and Inverse Problems
Room: S7
Oral
Three-dimensional industrial process tomography using electrical and electromagnetic tomography: recent
developments
H Wei (University of Bath, United Kingdom); C Yang (University of Bath, United Kingdom); Lu Ma (University of
Bath, United Kingdom); Z Ye (University of Bath, United Kingdom); A Yao (University of Bath, United Kingdom);
Soleimani Manuchehr (University of Bath, United Kingdom)
Multi-Dimensional Opportunities and Data Fusion in Industrial Process Tomography
Brian S Hoyle (University of Leeds, United Kingdom); Mi Wang (Institute of Particle Science and Engineering,
United Kingdom)