Technical Program

Germany); Christian Kargel (University of the Bundeswehr Munich, Germany)
Temporal Image Reconstruction in Electrical Tomography Using a Motion Estimation Based Approach
Samir Teniou (Petroleum Institute, UAE); Mahmoud MMeribout (Petroleum Institute, UAE)
Direct Image Reconstruction for 3D Electrical Resistance Tomography by Using the Factorization Method
Zhang Cao (Beihang University, P.R. China); Lijun Xu (Beihang University, P.R. China)
Fast Bayesian Inference for an Inverse Heat Transfer Problem using Approximations
Markus Neumayer (Graz University of Technology, Austria); Daniel Watzenig (Graz University of Technology &
Virtual Vehicle Research Center, Austria); Helcio Orlande (Federal University of Rio de Janeiro, UFRJ, Brazil);
Marcelo Colaco (Federal University of Rio de Janeiro, Brazil); George Dulikravich (Florida International
University, Austria)
A Novel Electrical Resistance Tomography System Based on C4D Technique
Baoliang Wang (Zhejiang University, P.R. China); Yuanyuan Hu (Zhejiang University, P.R. China); Haifeng Ji
(Zhejiang University, P.R. China); Zhiyao Huang (Zhejiang University, P.R. China); Haiqing Li (Zhejiang
University, P.R. China)
14:00 - 16:30
Nano-Scale Instrumentation and Measurement.
Room: KMS
Poster
Trade-off between the control bandwidth and the measurement accuracy in Atomic Force Microscopy
Stefan Kuiper (TU Delft, The Netherlands); Paul Van den Hof (TU Delft, The Netherlands); Georg Schitter
(Vienna University of Technology, Austria)
AC magnetization measurement employing a pair of differentiating coils for magnetic nanoparticle
noninvasive and remote temperature estimation
Jing Zhong (Huazhong University of Science and Technology, P.R. China); Wenzhong Liu (Huazhong University
of Science and Technology, P.R. China); Ming Zhou (Huazhong University of Science and Technology, P.R.
China); Le He (Huazhong University of Science and Technology, P.R. China)
Aerosol Size Distribution Measurement using a SMPS: scanning mode and uncertainty analysis
Loïc Coquelin (Engineering School SUPELEC & National Laboratory of Metrology and Testing, France); Nicolas
Fischer (National Laboratory of Metrology and Testing, France); Laurent Le Brusquet (Supelec, France); Gilles
A Fleury (Ecole Supérieure d'Electricité, France); Charles Motzkus (National Laboratory of Metrology and
Testing, France); François Gensdarmes (IRSN, France)
14:00 - 16:05
Optical, chemical, and biological sensors 2
Room: S1
Oral
An Active Pixel Sensor based System for Real Time Dosimeter in Interventional Radiology
Elia Conti (University of Perugia, Italy); Pisana Placidi (University of Perugia, Italy); Francesca Baldaccini
(University of Perugia, Italy); Maurizio Biasini (University of Perugia, Italy); Lucia Bissi (University of Perugia,
Italy); Andrea Calandra (University of Perugia, Italy); Bruno Checcucci (INFN, University of Perugia, Italy);
Stefania Chiocchini (University of Perugia, Italy); Roberto Cicioni (University of Perugia, Italy); Roberto Di
Lorenzo (ASL3-Umbria, Italy); Anna Concetta Dipilato (University of Perugia, Italy); Alessandro Esposito
(University of Perugia, Italy); Livio Fanò (University of Perugia, Italy); Massimiliano Paolucci (ASL3-Foligno,
Italy); Daniele Passeri (University of Perugia, Italy); Andrea Pentiricci (ASL1- Città di Castello, Italy); Leonello
Servoli (INFN, Italy)