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Alfredo Dubra's PhD thesis - Imperial College London

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2. Lateral shearing interferometer design<br />

f AC<br />

max<br />

f DC<br />

max<br />

f c<br />

f sampling<br />

Figure 2.2: Lateral shearing interferogram spectra produced by a glass wedge. The<br />

red circle in the center contains the DC term, while the other two circles contain the<br />

AC terms that carry the phase information. The indicated spatial frequencies are: the<br />

sampling frequency f sampling , the carrier frequency f c and the maximum DC and AC<br />

term frequencies fmax DC and fmax AC respectively.<br />

this is not an important limitation because we have an extra degree of freedom in the<br />

shear, that can be tuned later by sliding the wedge position along the optical axis of<br />

the system, as will be explained in section 2.7.1.<br />

Two conditions must be met to avoid aliasing when spatially sampling the interferogram.<br />

Firstly, the spectra of the AC and DC terms of the interferogram intensity<br />

must not overlap, as it is the case in the example shown in figure 2.2. This is ensured<br />

by choosing a carrier frequency f c (i.e. the wedges angle) larger than the sum of the<br />

highest spatial frequencies of the DC and AC terms, that is<br />

f DC<br />

max + f AC<br />

max < f c . (2.13)<br />

Secondly, according to the sampling theorem, the spatial sampling frequency must be<br />

equal to or larger than twice highest spatial frequency of the interferogram, that is<br />

f c + f AC<br />

max < f sampling /2. (2.14)<br />

If information on the spatial content of the tear topography were available, one could<br />

put figures into these conditions and estimate an adequate angle for the wedges and the<br />

29

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