Graphene-on-SiC - ISOM

CS INDUSTRY AWARDS WINNERS
METROLOGY, TEST AND MEASUREMENT AWARD
Winner: Jordan Valley Semiconductors Ltd
For: QC3 Fast HRXRD Metrology Tool
Richard Stevenson, Editor,
congratulates Paul Ryan,
UK Site Manager
tHE QC3 High-resolution X-ray Diffractometer
(HrXrD) from Jordan Valley is a true leapfrog
technology over the existing HrXrD technology
within the market. the QC3 boasts more than
an order-of-magnitude improvement in
performance compared to other HrXrD
systems, with scans taking seconds rather than
minutes or even hours.
this provides LED manufacturers a dramatic
improvement in quality control of LED devices,
with more wafers and higher sampling within
wafers possible.
the development and market launch of QC3
demonstrates the success of JVs’ 2008
acquisition of Bede’s HrXrD and compound semi
technology.
Furthermore, it reinforces JVs management’s
ability to apply its business model and expertise
in providing the semiconductor market with
enabling, high-throughput systems with low costof-ownership,
achieving market dominance with a
valued, customer-preferred product.
Features and benefits:
Productivity and Precision: the QC3 has a
dedicated and optimised HrXrD system for
LED quality control. As a result of its high intensity,
the system gives higher precision and throughput
compared to other HrXrD systems.
Automation: the system operates with fullyautomated
alignment, measurement and analysis
of wafers, conducting batch wafer measurements
with optional robot or multi-sample plates. the
multi-sample plates allow up to 20 wafers to be
loaded into the system for measurement without
requiring a robot.
For the automated analysis of the data spectra,
the QC3 uses tried and trusted industry-leading
rADs software for automated analysis which
will automatically analyse the collected data and
report the results for specific wafers, batches,
chambers. this reporting can be extended to host
reporting if required.
Economy: QC3 incorporates XrGProtect, to
ensure the tube lifetime is maximised. It also
has an Eco-mode; ensuring system power
consumption is reduced when there is no
measurement being performed.
Simplicity and Reliability: the system is so
reliable and easy to use, that no expert is required
to operate the system.
© 2013 Angel Business Communications.
Permission required.
Richard Stevenson, Editor of
Compound Semiconductor comments:
“X-ray diffraction is an essential characterization
tool in many fabs. With many diffractometers,
this process can take hours, holding back fab
throughput. But that’s not the case with the
QC3 High-Resolution X-Ray Diffractometer from
Jordan Valley, which can scan wafers in a
matter of seconds.”
38 www.compoundsemiconductor.net April/May 2013