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BSM 75 GB 120 DN2 - Datasheet Catalog

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<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong><br />

I<strong>GB</strong>T Power Module<br />

• Half-bridge<br />

• Including fast free-wheeling diodes<br />

• Package with insulated metal base plate<br />

Type V CE I C Package Ordering Code<br />

<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong> <strong>120</strong>0V 105A HALF-BRIDGE 1 C67076-A2106-A70<br />

Maximum Ratings<br />

Parameter Symbol Values Unit<br />

Collector-emitter voltage V CE <strong>120</strong>0 V<br />

Collector-gate voltage<br />

R GE = 20 kΩ<br />

V CGR<br />

<strong>120</strong>0<br />

Gate-emitter voltage V GE ± 20<br />

DC collector current<br />

T C = 25 °C<br />

T C = 80 °C<br />

Pulsed collector current, t p = 1 ms<br />

T C = 25 °C<br />

T C = 80 °C<br />

Power dissipation per I<strong>GB</strong>T<br />

T C = 25 °C<br />

I C<br />

105<br />

<strong>75</strong><br />

I Cpuls<br />

210<br />

150<br />

P tot<br />

625<br />

Chip temperature T j + 150 °C<br />

Storage temperature T stg -55 ... + 150<br />

Thermal resistance, chip case R thJC ≤ 0.2 K/W<br />

Diode thermal resistance, chip case R thJCD ≤ 0.5<br />

Insulation test voltage, t = 1min. V is 2500 Vac<br />

Creepage distance - 20 mm<br />

Clearance - 11<br />

DIN humidity category, DIN 40 040 - F -<br />

IEC climatic category, DIN IEC 68-1 - 55 / 150 / 56<br />

A<br />

W<br />

Semiconductor Group 1 Mar-29-1996


<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong><br />

Electrical Characteristics, at T j = 25 °C, unless otherwise specified<br />

Parameter Symbol Values Unit<br />

min. typ. max.<br />

Static Characteristics<br />

Gate threshold voltage<br />

V GE = V CE, I C = 3 mA<br />

Collector-emitter saturation voltage<br />

V GE = 15 V, I C = <strong>75</strong> A, T j = 25 °C<br />

V GE = 15 V, I C = <strong>75</strong> A, T j = 125 °C<br />

Zero gate voltage collector current<br />

V CE = <strong>120</strong>0 V, V GE = 0 V, T j = 25 °C<br />

V CE = <strong>120</strong>0 V, V GE = 0 V, T j = 125 °C<br />

Gate-emitter leakage current<br />

V GE = 20 V, V CE = 0 V<br />

AC Characteristics<br />

Transconductance<br />

V CE = 20 V, I C = <strong>75</strong> A<br />

Input capacitance<br />

V CE = 25 V, V GE = 0 V, f = 1 MHz<br />

Output capacitance<br />

V CE = 25 V, V GE = 0 V, f = 1 MHz<br />

Reverse transfer capacitance<br />

V CE = 25 V, V GE = 0 V, f = 1 MHz<br />

V GE(th)<br />

4.5 5.5 6.5<br />

V CE(sat)<br />

-<br />

-<br />

I CES<br />

-<br />

-<br />

2.5<br />

3.1<br />

1<br />

4.5<br />

3<br />

3.7<br />

1.5<br />

-<br />

I GES<br />

- - 320<br />

g fs<br />

31 - -<br />

C iss<br />

- 5.5 -<br />

C oss<br />

- 0.8 -<br />

C rss<br />

- 0.3 -<br />

V<br />

mA<br />

nA<br />

S<br />

nF<br />

Semiconductor Group 2 Mar-29-1996


<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong><br />

Electrical Characteristics, at T j = 25 °C, unless otherwise specified<br />

Parameter Symbol Values Unit<br />

min. typ. max.<br />

Switching Characteristics, Inductive Load at T j = 125 °C<br />

Turn-on delay time<br />

t d(on)<br />

V CC = 600 V, V GE = 15 V, I C = <strong>75</strong> A<br />

R Gon = 15 Ω<br />

- 30 60<br />

Rise time<br />

t r<br />

V CC = 600 V, V GE = 15 V, I C = <strong>75</strong> A<br />

R Gon = 15 Ω<br />

- 70 140<br />

Turn-off delay time<br />

t d(off)<br />

V CC = 600 V, V GE = -15 V, I C = <strong>75</strong> A<br />

R Goff = 15 Ω<br />

- 450 600<br />

Fall time<br />

V CC = 600 V, V GE = -15 V, I C = <strong>75</strong> A<br />

R Goff = 15 Ω<br />

t f<br />

- 70 100<br />

ns<br />

Free-Wheel Diode<br />

Diode forward voltage<br />

I F = <strong>75</strong> A, V GE = 0 V, T j = 25 °C<br />

I F = <strong>75</strong> A, V GE = 0 V, T j = 125 °C<br />

Reverse recovery time<br />

I F = <strong>75</strong> A, V R = -600 V, V GE = 0 V<br />

di F /dt = -900 A/µs, T j = 125 °C<br />

Reverse recovery charge<br />

I F = <strong>75</strong> A, V R = -600 V, V GE = 0 V<br />

di F /dt = -900 A/µs<br />

T j = 25 °C<br />

T j = 125 °C<br />

V F<br />

-<br />

-<br />

2.3<br />

1.8<br />

t rr<br />

- 0.125 -<br />

Q rr<br />

-<br />

-<br />

3.2<br />

12<br />

2.8<br />

-<br />

-<br />

-<br />

V<br />

µs<br />

µC<br />

Semiconductor Group 3 Mar-29-1996


<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong><br />

Power dissipation<br />

P tot = ƒ(T C )<br />

parameter: T j<br />

≤ 150 °C<br />

650<br />

Safe operating area<br />

I C = ƒ(V CE )<br />

parameter: D = 0, T C = 25°C , T j<br />

≤ 150 °C<br />

10 3<br />

W<br />

550<br />

A<br />

t p<br />

= 19.0µs<br />

P tot<br />

500<br />

10 2<br />

450<br />

400<br />

350<br />

300<br />

10 1<br />

1 ms<br />

250<br />

200<br />

150<br />

10 0<br />

I C<br />

10 0 10 1 10 2 10 3 V<br />

100 µs<br />

10 ms<br />

100<br />

DC<br />

50<br />

0<br />

0 20 40 60 80 100 <strong>120</strong> °C 160<br />

T C<br />

10 -1<br />

V CE<br />

Collector current<br />

I C = ƒ(T C )<br />

parameter: V GE<br />

≥ 15 V , T j<br />

≤ 150 °C<br />

I C<br />

90<br />

10 -1<br />

Transient thermal impedance I<strong>GB</strong>T<br />

Z th JC = ƒ(t p )<br />

parameter: D = t p / T<br />

<strong>120</strong><br />

10 0<br />

A<br />

K/W<br />

100<br />

80<br />

70<br />

60<br />

50<br />

10 -2<br />

D = 0.50<br />

0.20<br />

40<br />

30<br />

20<br />

10 -3<br />

single pulse<br />

0.10<br />

0.05<br />

0.02<br />

0.01<br />

10<br />

0<br />

0 20 40 60 80 100 <strong>120</strong> °C 160<br />

T C<br />

Z thJC<br />

10 -5 10 -4 10 -3 10 -2 10 -1 10 0<br />

10 -4<br />

t p<br />

s<br />

Semiconductor Group 4 Mar-29-1996


<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong><br />

Typ. output characteristics<br />

I C = f (V CE )<br />

parameter: t p = 80 µs, T j = 25 °C<br />

Typ. output characteristics<br />

I C = f (V CE )<br />

parameter: t p = 80 µs, T j = 125 °C<br />

150<br />

A<br />

150<br />

A<br />

I C<br />

<strong>120</strong><br />

110<br />

100<br />

17V<br />

15V<br />

13V<br />

11V<br />

9V<br />

7V<br />

I C<br />

<strong>120</strong><br />

110<br />

100<br />

17V<br />

15V<br />

13V<br />

11V<br />

9V<br />

7V<br />

90<br />

90<br />

80<br />

80<br />

70<br />

70<br />

60<br />

60<br />

50<br />

50<br />

40<br />

40<br />

30<br />

30<br />

20<br />

20<br />

10<br />

0<br />

0 1 2 3 V 5<br />

V CE<br />

10<br />

0<br />

0 1 2 3 V 5<br />

V CE<br />

Typ. transfer characteristics<br />

I C = f (V GE )<br />

parameter: t p = 80 µs, V CE = 20 V<br />

150<br />

A<br />

I C<br />

<strong>120</strong><br />

110<br />

100<br />

90<br />

80<br />

70<br />

60<br />

50<br />

40<br />

30<br />

20<br />

10<br />

0<br />

0 2 4 6 8 10 V 14<br />

V GE<br />

Semiconductor Group 5 Mar-29-1996


<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong><br />

Typ. gate charge<br />

V GE = ƒ(Q Gate )<br />

parameter: I C puls = <strong>75</strong> A<br />

20<br />

Typ. capacitances<br />

C = f (V CE )<br />

parameter: V GE = 0, f = 1 MHz<br />

10 2<br />

V GE<br />

V<br />

16<br />

C<br />

nF<br />

14<br />

600 V<br />

800 V<br />

10 1<br />

12<br />

10<br />

Ciss<br />

8<br />

6<br />

4<br />

2<br />

10 0<br />

Coss<br />

Crss<br />

0<br />

0 100 200 300 400 nC 550<br />

Q Gate<br />

10 -1<br />

0 5 10 15 20 25 30 V 40<br />

V CE<br />

Reverse biased safe operating area<br />

I Cpuls = f(V CE ) , T j = 150°C<br />

parameter: V GE = 15 V<br />

Short circuit safe operating area<br />

I Csc = f(V CE ) , T j = 150°C<br />

parameter: V GE = ± 15 V, t SC ≤ 10 µs, L < 50 nH<br />

2.5<br />

12<br />

I Cpuls<br />

/I C<br />

I Csc<br />

/I C<br />

1.5<br />

8<br />

6<br />

1.0<br />

4<br />

0.5<br />

2<br />

0.0<br />

0 200 400 600 800 1000 <strong>120</strong>0 V 1600<br />

V CE<br />

0<br />

0 200 400 600 800 1000 <strong>120</strong>0 V 1600<br />

V CE<br />

Semiconductor Group 6 Mar-29-1996


<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong><br />

Typ. switching time<br />

I = f (I C ) , inductive load , T j = 125°C<br />

par.: V CE = 600 V, V GE = ± 15V, R G = 15 Ω<br />

10 4<br />

Typ. switching time<br />

t = f (R G ) , inductive load , T j = 125°C<br />

par.: V CE = 600V, I C = <strong>75</strong> A<br />

10 4<br />

ns<br />

ns<br />

t<br />

t<br />

10 3<br />

10 3<br />

tdoff<br />

tdoff<br />

10 2<br />

tr<br />

tf<br />

10 2<br />

tr<br />

tdon<br />

tf<br />

tdon<br />

10 1<br />

0 20 40 60 80 100 <strong>120</strong> 140 A 180<br />

I C<br />

Typ. switching losses<br />

E = f (I C ) , inductive load , T j = 125°C<br />

par.: V CE = 600 V, V GE = ± 15 V, R G = 15 Ω<br />

10 1<br />

0 10 20 30 40 50 60 Ω 80<br />

R G<br />

Typ. switching losses<br />

E = f (R G ) , inductive load , T j = 125°C<br />

par.: V CE = 600 V, V GE = ± 15 V, I C = <strong>75</strong> A<br />

40<br />

30<br />

E<br />

mWs<br />

30<br />

Eon<br />

E<br />

mWs<br />

Eon<br />

25<br />

20<br />

20<br />

15<br />

15<br />

Eoff<br />

10<br />

Eoff<br />

10<br />

5<br />

5<br />

0<br />

0 20 40 60 80 100 <strong>120</strong> 140 A 180<br />

I C<br />

0<br />

0 10 20 30 40 50 60 Ω 80<br />

R G<br />

Semiconductor Group 7 Mar-29-1996


<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong><br />

Forward characteristics of fast recovery<br />

reverse diode I F = f(V F )<br />

parameter: T j<br />

Transient thermal impedance<br />

Z th JC = ƒ(t p )<br />

parameter: D = t p / T<br />

Diode<br />

150<br />

A<br />

10 0<br />

K/W<br />

I F<br />

<strong>120</strong><br />

110<br />

10 -1<br />

Z thJC<br />

10 -5 10 -4 10 -3 10 -2 10 -1 10 0<br />

100<br />

90<br />

80<br />

70<br />

60<br />

50<br />

40<br />

30<br />

20<br />

T j =125°C<br />

T j =25°C<br />

10 -2<br />

10 -3<br />

single pulse<br />

D = 0.50<br />

0.20<br />

0.10<br />

0.05<br />

0.02<br />

0.01<br />

10<br />

0<br />

0.0 0.5 1.0 1.5 2.0 V 3.0<br />

V F<br />

10 -4<br />

t p<br />

s<br />

Semiconductor Group 8 Mar-29-1996


<strong>BSM</strong> <strong>75</strong> <strong>GB</strong> <strong>120</strong> <strong>DN2</strong><br />

Circuit Diagram<br />

Package Outlines<br />

Dimensions in mm<br />

Weight: 250 g<br />

Semiconductor Group 9 Mar-29-1996


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www.datasheetcatalog.com<br />

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