Searching For Correlations in HVM Wafer Testing
Searching For Correlations in HVM Wafer Testing
Searching For Correlations in HVM Wafer Testing
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<strong>Wafer</strong>s Per Setup Distribution<br />
• Exponential distribution:<br />
P(<br />
t)<br />
= λe<br />
−λ t<br />
where, λ is the only characteristic parameter determ<strong>in</strong><strong>in</strong>g<br />
the distribution<br />
• The wafer sort<strong>in</strong>g process can be simulated as a Poisson<br />
process which can be easily programmed<br />
Poisson process<br />
Event<br />
Wait<strong>in</strong>g time<br />
<strong>Wafer</strong> Test<strong>in</strong>g<br />
Setup fail<br />
<strong>Wafer</strong>s per setup<br />
10
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