Searching For Correlations in HVM Wafer Testing
Searching For Correlations in HVM Wafer Testing
Searching For Correlations in HVM Wafer Testing
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Validation<br />
• The same probe card is then populated with a 600 IO probe array<br />
• Apply<strong>in</strong>g the p<strong>in</strong> level probability extracted from the previous<br />
experiment to the model, we simulate the new wafers per setup<br />
distribution<br />
Count<br />
1200<br />
800<br />
400<br />
<strong>Wafer</strong>s Per Setup Distribution<br />
of 600 Probe Array<br />
100% 1<br />
80% 0.8<br />
60%<br />
0.6<br />
40% 0.4<br />
20%<br />
0.2<br />
Accumulated Percentage<br />
of 600 Probe Array<br />
0<br />
<strong>Wafer</strong>s Per Setup<br />
0<br />
Simulated Data<br />
12
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