Searching For Correlations in HVM Wafer Testing
Searching For Correlations in HVM Wafer Testing
Searching For Correlations in HVM Wafer Testing
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Simulation<br />
Assumptions:<br />
• 300 IO<br />
• 400 die/wafer<br />
• Cres fail at >10 Ohm<br />
• Setup fails at >5 occurrence high Cres fail<br />
Simulation Results:<br />
• Average wafers per setup: 35<br />
0 100 200 300 400 500<br />
3000<br />
2000<br />
1000<br />
Count Axis<br />
Exponential Plot<br />
10<br />
9<br />
8<br />
7<br />
6<br />
5<br />
.01<br />
4<br />
3<br />
.05<br />
.1<br />
2<br />
.2<br />
.3<br />
1<br />
.4<br />
.5<br />
0<br />
.9<br />
0 50 100 150 200 250 300 350<br />
<strong>Wafer</strong>s Per Setup<br />
-log(Surv)<br />
16
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