Test-data validation - Semiconductor Wafer Test Workshop
Test-data validation - Semiconductor Wafer Test Workshop
Test-data validation - Semiconductor Wafer Test Workshop
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<strong>Test</strong>-Data; where does it come from?<br />
Spec<br />
Design<br />
Product<br />
<strong>Test</strong> program<br />
test<br />
Part variance<br />
<strong>Test</strong> variance<br />
<strong>data</strong><br />
June 7 to 10, 2009<br />
Screening (PAT)<br />
Pass/fail<br />
Adaptive test<br />
IEEE SW <strong>Test</strong> <strong>Workshop</strong> 5
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