ROUTE60â¢: a new vertical probing technology

ePAPER READ

DOWNLOAD ePAPER

swtest.org

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

START NOW

Scrub mark pictures

ROUTE60 on 58×65 μm pads

at 65 μm pitch

June 3-6, 2007

IEEE SW Test Workshop

Probe-tip Clean on Demand - Semiconductor Wafer Test Workshop

VLSIresearch - Semiconductor Wafer Test Workshop

Probing Lead Free Solder Bumps in Final Wafer Test

Tutorial - Semiconductor Wafer Test Workshop

Preliminary Program (PDF) - Semiconductor Wafer Test Workshop

July, 2002 Issue - Semiconductor Wafer Test Workshop

Very Low Cost Probe Cards - Semiconductor Wafer Test Workshop

Impact of Vibration on Contact Resistance

Probe Card Cleaning Media Survey - Semiconductor Wafer Test ...

Standard Probe Head Interface for Cobra Space Transformer

IntelÂ® Sort-Interface-Unit (SIU) Design Methods for Reducing Burn ...

Effect of Ground Return Path on Timing Accuracy

C4 Probe Card Space Transformer Technology Overview

with Pyramid Probe Cards - Semiconductor Wafer Test Workshop

Scrub mark pictures ROUTE60 on 58×65 μm pads at 65 μm pitch June 3-6, 2007 IEEE SW Test Workshop 16

Mechanical Results Alignment: Planarity: Align (μm) 16 14 12 10 8 6 4 2 0 0 kTD 130 kTD Plan (μ m) 25 20 15 10 5 0 -5 -10 -15 -20 -25 0 KTD 130 KTD June 3-6, 2007 IEEE SW Test Workshop 17

Page 1 and 2: Raffaele Vallauri STMicroelectronic
Page 3 and 4: Table of contents ROUTE60 Technolog
Page 5 and 6: Technology Introduction - Design Gr
Page 7 and 8: Product test flow description Packa
Page 9 and 10: Electrical results @ ROOM T (EWS3)
Page 11 and 12: Electrical results @ -40°C (EWS4)
Page 13 and 14: Scrub mark pictures @ +125°C Epoxy
Page 15: Electrical results after EWS1 and E
Page 19 and 20: Scrub depth analysis @ ROOM T - 1TD
Page 21 and 22: 6M2T pad over active Bonding point
Page 23 and 24: Conclusions ROUTE60 is the first ve
Page 25: Acknowledgements A special thanks t

ROUTE60â¢: a new vertical probing technology

You also want an ePaper? Increase the reach of your titles

Delete template?

Save as template?

ROUTE60â¢: a new vertical probing technology