ISMI Probe Council - Semiconductor Wafer Test Workshop
ISMI Probe Council - Semiconductor Wafer Test Workshop
ISMI Probe Council - Semiconductor Wafer Test Workshop
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Method<br />
• At nominal overtravel, DC current is applied to the<br />
probe for 2 minutes, then removed. A force<br />
measurement is taken at least 10 seconds after the<br />
current is removed. The current is then incremented<br />
and the cycle repeated until the probe spring force is<br />
reduced by 40%. The CCC rating becomes the average<br />
of all readings at which a permanent 20% force<br />
reduction is measured.<br />
June 7 to 10, 2009<br />
IEEE SW <strong>Test</strong> <strong>Workshop</strong> 14
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