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REVIEWS<br />

G. M. Whitesides et al.<br />

Table 1. The recent past, present, and future of semiconductor technology.<br />

[10c, 12]<br />

Year Lithographic method Resolution<br />

Bits<br />

[nm] [a] (DRAM)<br />

[b]<br />

Photolithography (l[nm])<br />

1992 UV (436), g line of Hg lamp 500 16 M<br />

1995 UV (365), i line of Hg lamp 350 64 M<br />

1998 DUV (248), KrF excimer laser 250 256 M<br />

2001 DUV (193), ArF excimer laser 180 1 G<br />

2004 DUV (157), F 2 excimer laser 120 4 G<br />

2007 DUV (126), dimer discharge from an 100 16 G<br />

argon laser<br />

2010 Advanced lithography < 100 [c] > 16 G<br />

extreme UV (EUV, 13 nm)<br />

soft X-ray (6 ± 40 nm)<br />

focused ion beam (FIB)<br />

electron-beam writing<br />

proximal-probe methods<br />

Figure 1. Microelectronics is based on photolithography and is very<br />

important, but the more expensive technology to surmount the ª100-nm<br />

barrierºÐa critical point in reducing feature sizes set by a combination of<br />

diffraction limitations to projected images and the lack of lenses that are<br />

transparent at wavelengths below 160 nmÐmake the future of photolithography<br />

on <strong>this</strong> small scale unclear. In addition, new opportunities in<br />

microfabrication are emerging as new types of microsystems (right) are<br />

developed; for these opportunities, photolithography is not always the best<br />

option. For most applications, cost is a dominant parameter.<br />

tained is approximately the wavelength (l) of the light used.<br />

As a result, illuminating sources <strong>with</strong> shorter wavelengths are<br />

progressively introduced into photolithography to generate<br />

structures <strong>with</strong> smaller feature sizes (Table 1). [10c] As structures<br />

become increasingly small, they also become increasingly<br />

difficult and expensive to produce.<br />

In the late 1960s and early 1970s, Gorden Moore, founder of<br />

both Fairchild Semiconductor and Intel, projected that the<br />

number of transistors in an integrated circuit would double<br />

[a] The size of the smallest feature that can be manufactured. [b] The size of<br />

the dynamic random access memory (DRAM). [c] These techniques are<br />

still in early stages of development, and the smallest features that they can<br />

produce economically have not yet been defined.<br />

every 18 months or so. This prediction was later known as<br />

Moores Law. [2] Over the past three decades many trends in<br />

the semiconductor industry have followed <strong>this</strong> law (Figure 2)<br />

thanks to continuous developments in photolithography that<br />

have allowed the size of features to decrease by a factor of<br />

approximately one-half every three years (Table 1). It is<br />

plausible that features as small as 100 nm can be manufactured<br />

optically in the future by employing advanced mask/<br />

resist technologies and deep UV (DUV) radiation. [10d] Below<br />

<strong>this</strong> size, however, it is generally accepted that current<br />

strategies for photolithography may be blocked by optical<br />

diffraction and by the opacity of the materials used for making<br />

lenses or supports of photomasks. New approaches must be<br />

developed if Moores Law is to extend into the range below<br />

Younan Xia was born in Jiangsu, China, in 1965. He received a<br />

B.S. degree from the University of Science and Technology of<br />

China in 1987, and then worked as a graduate student for four<br />

years at the Fujian Institute of Research on the Structure of Matter,<br />

Academia Sinica. He came to the United States in 1991, and<br />

received a M.S. degree from the University of Pennsylvania (<strong>with</strong><br />

A. G. MacDiarmid) in 1993 and a Ph.D. degree from Harvard<br />

University (<strong>with</strong> G. M. Whitesides) in 1996. He is currently<br />

Assistant Professor of Chemistry at the University of Washington<br />

in Seattle. His research interests include micro- and nanofabrication,<br />

self-assembled monolayers, inorganic functional materials,<br />

nanomaterials, conducting polymers, microanalytical systems,<br />

Y. Xia G. M. Whitesides<br />

microelectromechanical systems, and novel devices for optics, optoelectronics, and display.<br />

George M. Whitesides was born in 1939 in Louisville, Kentucky, USA. He received an A.B. degree from Harvard<br />

University in 1960 and a Ph.D. degree from the California Institute of Technology (<strong>with</strong> J. D. Roberts) in 1964. He was a<br />

member of the faculty of the Massachusetts Institute of Technology from 1963 to 1982. He joined the Department of<br />

Chemistry of Harvard University in 1982 and was department chairman from 1986 to 1989; he is now Mallinckrodt<br />

Professor of Chemistry. His present research interests include biochemistry, surface chemistry, materials science, molecular<br />

virology, optics, self-assembly, bioanalytical chemistry, microelectromechanical systems, and microfluidics.<br />

552 Angew. Chem. Int. Ed. 1998, 37, 550 ± 575

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