Understanding Infrared Thermography Reading 7 Part 2 of 2.pdf
Understanding Infrared Thermography Reading 7 Part 2 of 2.pdf
Understanding Infrared Thermography Reading 7 Part 2 of 2.pdf
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<strong>Infrared</strong> Thermal Testing<br />
<strong>Reading</strong> VII <strong>Part</strong> 1 <strong>of</strong> 2<br />
My ASNT Level III,<br />
Pre-Exam Preparatory<br />
Self Study Notes<br />
12 June 2015<br />
Charlie Chong/ Fion Zhang
6. Basic Elements Of An In-house Program<br />
The creation <strong>of</strong> an in-house program to utilize infrared thermography would<br />
be customized to each facility’s methods <strong>of</strong> conducting operations. The basic<br />
elements <strong>of</strong> each program, however, would probably be much the same. This<br />
section outlines a generic approach to developing and implementing a<br />
comprehensive infrared thermography program. A discussion <strong>of</strong> the basic<br />
elements is followed by a sample program.<br />
Charlie Chong/ Fion Zhang
6.1 Basic Elements<br />
An in-house program can be developed by many different approaches. A<br />
program that is limited to the use <strong>of</strong> only qualitative thermal imaging<br />
instruments (as compared to radiometric/quantitative) is likely to be less<br />
comprehensive. Assuming that a program was created to make full use <strong>of</strong> a<br />
radiometric/quantitative imager and image processing s<strong>of</strong>tware, the following<br />
topics would need to be addressed:<br />
• Introduction<br />
• Definitions<br />
•Scope<br />
• Responsibilities<br />
• Precautions<br />
• Prerequisites<br />
• Conduct <strong>of</strong> the Survey<br />
• Acceptance criteria<br />
• Reporting requirements<br />
• Qualification <strong>of</strong> personnel<br />
• Scheduling<br />
• Equipment matrix<br />
• References<br />
Charlie Chong/ Fion Zhang
6.1.1 Introduction<br />
This section provides a discussion <strong>of</strong> the purpose and goal <strong>of</strong> the IR survey.<br />
6.1.2 Definitions<br />
In order to put the program in the proper context, the definitions should be at<br />
the front. This will allow the reader or reviewer to have an easy reference for<br />
the terminology that follows.<br />
6.1.3 Scope<br />
The scope <strong>of</strong> the program should be very specific as to what is covered and<br />
what is not. The applications for infrared thermography are very broad.<br />
Inspections <strong>of</strong> ro<strong>of</strong>s and buildings should not be addressed in a document<br />
that has inspections <strong>of</strong> safety-related equipment as its main purpose. An<br />
addendum to the main procedure should be used to avoid confusion.<br />
Charlie Chong/ Fion Zhang
6.1.4 Responsibilities<br />
This section should clearly delineate who is responsible for the various<br />
aspects <strong>of</strong> the program from administration through corrective action. The<br />
main areas <strong>of</strong> responsibility are administration, inspection (<strong>Infrared</strong><br />
Thermographer), and corrective action. Most <strong>of</strong> the difficulty in applying this<br />
technology is in image interpretation and diagnosis. It might be necessary to<br />
use others in this effort and, if so, their role should be specifically identified.<br />
6.1.5 Precautions<br />
Many <strong>of</strong> the infrared inspections necessitate that panels be removed from<br />
energized electrical equipment. Precautions as to electrical and personnel<br />
safety should be included.<br />
Charlie Chong/ Fion Zhang
IR Viewing Window<br />
Charlie Chong/ Fion Zhang<br />
http://www.testequipmentdepot.com/fluke/ir-windows/075-<br />
clkt.htm?utm_source=bing&utm_medium=cpc&utm_campaign=Bing%20Product%20Ad<br />
s&utm_term=%7BQueryString%7D
IR Viewing Window – Opaque Polymer Grill<br />
Charlie Chong/ Fion Zhang<br />
http://irviewingwindows.com/
6.1.6 Prerequisites<br />
All <strong>of</strong> the prerequisites for conducting the survey should be identified here.<br />
This should include the qualification <strong>of</strong> personnel, calibration <strong>of</strong> equipment,<br />
approvals needed from Operations and/or Management, and the required<br />
resources (equipment and personnel).<br />
6.1.7 Conduct <strong>of</strong> the Survey<br />
This section could reference or include specific procedures for inspections.<br />
Specific techniques and a suggested sequence <strong>of</strong> inspections could also be<br />
included.<br />
Charlie Chong/ Fion Zhang
6.1.8 Acceptance Criteria<br />
All survey results should be compared to either a baseline thermogram or<br />
other industry accepted standards. Problems or anomalies should then be<br />
reviewed for determination <strong>of</strong> which corrective action, if any, should be<br />
undertaken. The following acceptance criteria provide a generic example but<br />
would need adaptation for component-specific use.<br />
An alternative to the above classification is that used in Military Standard MIL-<br />
STD-2194 (1988). The MIL Standard uses four categories as follows:<br />
Charlie Chong/ Fion Zhang
The main difference between the two methods <strong>of</strong> problem classification is that<br />
the MIL Standard references temperature rise above ambient and the guide<br />
classification relates to a temperature rise above a reference value. That<br />
reference value could be ambient or, in the case <strong>of</strong> three-phase electrical<br />
circuits, a temperature rise above an adjacent phase. Each facility should<br />
adopt criteria that provide a balance between maintenance requirements and<br />
operational considerations.<br />
Charlie Chong/ Fion Zhang
6.1.9 Reporting Criteria<br />
A rigid process should be established when reporting the results <strong>of</strong> infrared<br />
inspections. This rigidity is necessary due to the ease <strong>of</strong> misinterpretation <strong>of</strong><br />
the thermograms by untrained personnel. A typical quarterly survey <strong>of</strong><br />
electrical equipment might result in 25 to 50 problems in 200 pieces <strong>of</strong><br />
inspected equipment. The vast majority <strong>of</strong> these problems might be minor in<br />
nature and require corrective action on a low priority. The process that works<br />
best, based on industry responses, is one that keeps the report distribution<br />
and decision-making in the hands <strong>of</strong> the right people (operations,<br />
maintenance, and/or program managers). The format for the report should<br />
also be consistent.<br />
Charlie Chong/ Fion Zhang
At a minimum, it should include the following:<br />
•Time/date<br />
• Equipment identification<br />
• Location<br />
• Specific problem<br />
• Corrective action recommended<br />
• Problem action criteria<br />
• Visible photograph<br />
• <strong>Infrared</strong> photograph<br />
• Inspector’s name and signature<br />
Charlie Chong/ Fion Zhang
6.1.10 Qualification <strong>of</strong> Personnel<br />
Personnel responsible for conducting the surveys and interpreting the results<br />
should be trained in the use <strong>of</strong> the equipment and certified by their employer.<br />
The training and certification criteria, established by the American Society for<br />
Nondestructive Testing (ASNT), should be adapted and incorporated into the<br />
program. These criteria are outlined in their document SNT-TC-1A and will be<br />
discussed in more detail in Section 7.<br />
6.1.11 Scheduling<br />
The documentation requirements and listing <strong>of</strong> equipment to be evaluated<br />
during the survey should be established in advance so that trends in<br />
equipment operation can be translated easily into predictions <strong>of</strong> future results.<br />
This is the key to predictive maintenance. The program must also be flexible<br />
enough to accommodate emergency inspections and inspections during<br />
unplanned outages. Typically, the administrator <strong>of</strong> the IR program provides<br />
this interface.<br />
Charlie Chong/ Fion Zhang
6.1.12 Equipment Matrix<br />
The equipment to be surveyed, the selection criteria, and the locations and<br />
frequency <strong>of</strong> inspection should be compiled in a matrix. Typically, the<br />
electrical equipment is grouped together, as are the other major component<br />
groups. An alternate approach would be to list the equipment in a route <strong>of</strong><br />
survey-format, which might save time for the infrared thermographer.<br />
6.1.13 References<br />
References to any helpful information should be provided. These typically<br />
include training materials, textbooks on the subject, and equipment operation<br />
manuals.<br />
Charlie Chong/ Fion Zhang
EPRI Licensed Material<br />
Basic Elements <strong>of</strong> an In-House Program<br />
6.2 Sample Program<br />
This section incorporates the above recommendations and could serve as the basis for a program<br />
using infrared thermography as part <strong>of</strong> a predictive maintenance program.<br />
1.0 INTRODUCTION<br />
1.1 This program is for the administration and conduct <strong>of</strong> an infrared inspection program <strong>of</strong><br />
electrical and mechanical equipment. The purpose <strong>of</strong> this program is to identify<br />
equipment that requires maintenance and to improve its reliability through the use <strong>of</strong><br />
infrared thermography (IR).<br />
1.2 This document contains the recommended scope, frequency, and corrective action criteria<br />
for routine and unscheduled infrared surveys.<br />
1.3 Requests for changes to this program and questions relative to it shall be directed to the<br />
administrator <strong>of</strong> the IR program.<br />
2.0 DEFINITIONS<br />
2.1 <strong>Infrared</strong> – Electromagnetic radiation having wavelengths that are greater than those <strong>of</strong><br />
visible light, but shorter than microwaves. As it applies to IR thermography, the<br />
wavelengths are between 3 to 15 micrometers.<br />
2.2 <strong>Infrared</strong> Survey – A comprehensive examination <strong>of</strong> components and equipment with an<br />
infrared imaging system.<br />
2.3 Emissivity – The ratio <strong>of</strong> radiance from a surface to the radiance at the same wavelength<br />
from a perfect blackbody at the same temperature. Functionally, this is the radiation<br />
efficiency <strong>of</strong> a surface in the infrared spectrum.<br />
2.4 Radiosity – Thermal energy <strong>of</strong> a surface as seen by the infrared detector.<br />
2.5 Thermogram – A recorded, displayed, or hard-copy image <strong>of</strong> the output <strong>of</strong> an infrared<br />
imaging system.<br />
2.6 Isotherm – A thermal contour on a thermogram where all <strong>of</strong> the spots along it are at the<br />
same apparent temperature.<br />
2.7 <strong>Infrared</strong> thermographer – An individual who is trained and qualified to operate infrared<br />
imaging equipment and to interpret the images.<br />
3.0 SCOPE<br />
3.1 The requirements <strong>of</strong> this procedure shall apply to all safety-related components. It shall<br />
also be applicable to non-safety-related equipment where financial benefit might be<br />
achieved by monitoring (that is, increased plant availability, decreased maintenance<br />
costs, and so on).<br />
3.2 This procedure includes guidelines for the following:<br />
• Component selection<br />
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• Interval selection<br />
• Determining component acceptability<br />
4.0 RESPONSIBILITIES<br />
4.1 Administrator <strong>of</strong> IR – It is the administrator’s responsibility to oversee the program. This<br />
includes making changes to the procedure. All surveys, whether they are scheduled or<br />
conducted on an emergency basis, shall be approved by the administrator or his/her<br />
designee. The administrator shall be responsible for budgeting, planning, and interfacing<br />
with outside organizations.<br />
4.2 <strong>Infrared</strong> Thermographer – The infrared thermographer is the only person trained and<br />
qualified to operate the infrared imaging equipment. He/she is responsible for conducting<br />
the surveys, interpreting the images, writing the reports, and acting as a technical<br />
resource to other plant departments. The infrared thermographer is responsible for the<br />
maintenance and calibration <strong>of</strong> the infrared imaging equipment.<br />
4.3 Cognizant Engineer – At the request <strong>of</strong> the infrared thermographer, a discipline-cognizant<br />
engineer will provide assistance in diagnosing a problem. The cognizant engineer will<br />
also suggest corrective action and provide coordination with other plant disciplines.<br />
4.4 Root Cause – Determination <strong>of</strong> root cause and the subsequent applicable action level<br />
shall be the responsibility <strong>of</strong> plant management. When necessary, the infrared<br />
thermographer shall request assistance from a cognizant systems or maintenance engineer<br />
in determining the root cause or the recommended corrective action.<br />
5.0 PRECAUTIONS<br />
5.1 Many <strong>of</strong> the components that are being inspected represent potential plant trip hazards;<br />
exercise extreme care.<br />
5.2 All safe work practices as outlined in the plant safety manual, shall be followed. These<br />
practices include exhibiting caution near energized electrical equipment, rotating<br />
equipment, and hot pipes. All surveys shall be conducted from a safe stable location.<br />
5.3 <strong>Infrared</strong> surveys within the Radiological Controls Area shall be conducted within the<br />
guidelines <strong>of</strong> the Health Physics Department. In areas <strong>of</strong> potential contamination, the<br />
infrared thermographer shall be responsible for covering the equipment with plastic as<br />
directed by Health Physics.<br />
5.4 When practical, surveys in areas <strong>of</strong> airborne contamination should be avoided. When this<br />
is not possible, a thin piece <strong>of</strong> polyethylene or plastic can be placed over the lens. If this<br />
is done, the transmittance <strong>of</strong> the covering must be taken into account.<br />
6.0 PREREQUISITES<br />
6.1 Personnel – The infrared thermographer and one craft person constitute the minimum<br />
personnel necessary to conduct a survey when the operating or opening <strong>of</strong> equipment is<br />
necessary.<br />
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6.2 Approvals – The required approvals to conduct a survey shall be coordinated with the IR<br />
administrator. The control room should be notified both prior to the start <strong>of</strong> the survey<br />
and at its end. If requested, the infrared thermographer will inform the control room prior<br />
to opening equipment that presents a possible plant trip hazard.<br />
6.3 Emergencies – In cases where requests for surveys are done on an emergency basis, the<br />
infrared thermographer shall fulfill the duties <strong>of</strong> the IR administrator and provide the<br />
necessary coordination.<br />
7.0 CONDUCT OF THE SURVEY<br />
7.1 The equipment survey matrix shall identify the equipment to be surveyed and the<br />
frequency <strong>of</strong> the survey.<br />
7.2 The sequence <strong>of</strong> the survey is not important unless specifically stated in the procedure or<br />
requested by either Maintenance or Operations. All equipment on the matrix must be<br />
surveyed unless it is not in operation or conditions dictate otherwise. The infrared<br />
thermographer shall note any exceptions in the inspection report.<br />
7.3 Standard practice is to videotape all surveys and to include an audio track for verbal<br />
identification and discussion.<br />
7.4 The thermal images must be <strong>of</strong> sufficient resolution to identify the components and any<br />
problem areas.<br />
7.5 When problems are identified, the thermographer shall reposition the imager and obtain<br />
more than one view. This is done to eliminate the possibility <strong>of</strong> apparent problems being<br />
caused by reflections from hot objects. The hard-copy images should be obtained from<br />
the position that provides the best image.<br />
7.6 All problems are to be photographed in the visible as well as in the infrared. This is to<br />
allow proper and easy identification <strong>of</strong> the problem areas, which will facilitate<br />
maintenance activities.<br />
7.7 The problems shall be customarily reported as a temperature rise. This rise can be<br />
calculated from ambient, thermal baseline data, or made by comparison in the cases<br />
where similar equipment exists.<br />
7.8 When absolute temperatures are requested or required, the infrared thermographer shall<br />
determine and use the target's effective emissivity to assure accuracy. A standard table <strong>of</strong><br />
effective emissivities will be developed by measurement and will be maintained by the<br />
infrared thermographer.<br />
7.9 Important information relating to test conditions, such as load, flow, and pressure shall be<br />
noted by the thermographer if it is available. This information will be used in component<br />
trend analysis.<br />
7.10 The components shall be inspected with the imager aimed along a line normal<br />
(perpendicular) to the target surface whenever possible, to minimize the potential for<br />
errors due to reflections.<br />
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7.11 During the infrared inspection, the components must also be inspected visually and any<br />
discolorations, questionable noise, or smell should be reported.<br />
7.12 In cases where precise measurements must be obtained, the instrument background<br />
radiation effects must be taken into account. Instrument background temperature can be<br />
determined by placing a good diffuse reflector (such as a piece <strong>of</strong> aluminum foil that has<br />
been crumpled and re-flattened) in ambient air and measuring its apparent temperature<br />
with the imager’s emissivity set to 1.0.<br />
7.13 Where external optics, such as telescopic and wide-angle lenses are used, the<br />
transmittance <strong>of</strong> the optics must be taken into account. The information that corrects the<br />
effects <strong>of</strong> these devices is supplied by the manufacturer and is entered directly into the<br />
imager s<strong>of</strong>tware.<br />
7.14 When measurements are being made on targets, the size <strong>of</strong> the target and the distance<br />
must be known. The IFOVmeas (Instantaneous Field <strong>of</strong> View for measurement) <strong>of</strong> the<br />
instrument must fit comfortably within the required target spot at the measurement<br />
distance. If these criteria are not satisfied, the instrument must be moved closer to the<br />
target and/or a higher magnification lens must be used. (See section 3.3.4 for a more<br />
detailed discussion <strong>of</strong> this subject).<br />
7.15 The survey should be done with the imager scanned at a speed that does not cause<br />
blurring <strong>of</strong> the image so that acceptable thermograms can be obtained from the videotape<br />
on playback.<br />
7.16 If requested or desired, a second (backup) measure <strong>of</strong> temperature can be obtained<br />
through the use <strong>of</strong> contact thermocouples or spot radiometers. (Care should be used in<br />
evaluating the results <strong>of</strong> measurements that are not calibrated.)<br />
7.17 In general, equipment shall be surveyed when in a normal operational state. In cases<br />
where equipment is not energized or running normally, the thermographer shall note it in<br />
the IR inspection report.<br />
7.18 Equipment such as batteries shall be surveyed during both normal operation and during<br />
discharge tests.<br />
7.19 Requests for equipment operation for the sole purpose <strong>of</strong> an infrared inspection shall be<br />
coordinated with operations by the IR administrator. In most cases, this should be<br />
avoided.<br />
7.20 All infrared inspections, whether done by on-site personnel or outside contractors, will be<br />
performed under the guidance and procedures listed in this program. Special tests outside<br />
<strong>of</strong> the normal inspection shall be reviewed and approved in advance by the IR<br />
administrator.<br />
8.0 ACCEPTANCE CRITERIA<br />
8.1 Subsequent to an initial thermal baseline, the following action levels are to be used to<br />
classify each problem:<br />
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Advisory (Level 1)<br />
Intermediate (Level 2)<br />
Serious (Level 3)<br />
Critical (Level 4)<br />
1°F to 15°F rise<br />
16°F to 50°F rise<br />
51°F to 100°F rise<br />
in excess <strong>of</strong> 100°F rise<br />
8.2 When indications on components fall into levels 2, 3, 4, section 9 <strong>of</strong> the program shall be<br />
followed for reporting.<br />
8.3 To determine acceptability <strong>of</strong> the inspection, the results and final report shall be<br />
compared against the criteria set forth in this program.<br />
9.0 REPORTING REQUIREMENTS<br />
9.1 Every scheduled and unscheduled infrared inspection shall be documented and reported<br />
in accordance with the requirements <strong>of</strong> this section (see Figure 6-1).<br />
9.2 At a minimum, the report shall contain the following:<br />
• Summary <strong>of</strong> inspection and findings<br />
• Equipment list<br />
• Data sheets with IR and visible photographs <strong>of</strong> anomalies<br />
• Root cause analysis and corrective action<br />
• Comments<br />
9.3 The report shall be issued to the IR administrator within five working days <strong>of</strong> the<br />
completion <strong>of</strong> the survey.<br />
9.4 A verbal report shall always be given to the on-site IR administrator upon completion <strong>of</strong><br />
the survey.<br />
9.5 The reporting <strong>of</strong> problems that fall within the four acceptance action levels are as<br />
follows:<br />
Advisory (Level 1)<br />
Normal cycle <strong>of</strong> corrective maintenance.<br />
Intermediate (Level 2) High priority during an unscheduled shutdown.<br />
Serious (Level 3)<br />
Critical (Level 4)<br />
Alert Operations—potential failure. Correct ASAP.<br />
Alert Operations, Management. Remove from service ASAP.<br />
9.6 Items classified as serious are to be immediately reported to the IR administrator who<br />
will advise Maintenance and Operations.<br />
9.7 Items classified as critical are to be immediately reported to Operations, Maintenance,<br />
and the IR administrator.<br />
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10.0 QUALIFICATION OF PERSONNEL<br />
10.1 The infrared thermographer shall be qualified by examination and certified by the plant to<br />
conduct the survey.<br />
10.2 The qualifying examination and training shall meet the guidelines <strong>of</strong> ASNT SNT-TC-1A<br />
(current edition).<br />
10.3 In addition to the ASNT qualifications, the thermographer shall be knowledgeable in the<br />
following areas:<br />
• Equipment-specific operation<br />
• <strong>Infrared</strong> theory<br />
• Heat transfer modes<br />
• Safety practices<br />
10.4 Certification <strong>of</strong> the thermographer shall be made through a written and a practical<br />
examination.<br />
10.5 The plant Training Department shall administer the initial and re-qualification training.<br />
11.0 SCHEDULING<br />
11.1 The IR administrator is responsible for scheduling all routine infrared inspections.<br />
11.2 The Equipment Matrix (Program, section 12.0) lists the frequency <strong>of</strong> inspection for each<br />
component.<br />
11.3 Inspections on an emergency basis or for a special test shall be scheduled and coordinated<br />
by the IR administrator.<br />
12.0 EQUIPMENT MATRIX<br />
12.1 Component Selection Criteria<br />
12.1.1 The components that are to be included in the thermographic analysis program should be<br />
selected based on the perceived or documented benefit <strong>of</strong> thermography on the type <strong>of</strong><br />
equipment and the following criteria categories:<br />
A. Critical: Critical equipment shall be defined as:<br />
• Equipment whose function is necessary and must be available at all times.<br />
• Equipment upon which thermography has been used to deviate from a specific<br />
vendor-recommended preventive maintenance activity.<br />
• Equipment necessary to maintain full-power generating capabilities (that is, nonredundant).<br />
B. Vital: Vital equipment shall be defined as those components whose function is<br />
necessary but that, through redundant design, do not have to be available at all times.<br />
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C. Vendor Recommended: Vendor-recommended equipment whose manufacturer or<br />
vendor recommends the periodic monitoring <strong>of</strong> the equipment with infrared<br />
thermography.<br />
D. Non-Vital: Non-Vital equipment shall be defined as:<br />
• Equipment whose replacement cost versus periodic monitoring cost does not differ<br />
greatly and does not fall into category A or B above.<br />
• Components that are used very infrequently and do not fall into category A or B.<br />
12.1.2 The IR administrator shall maintain a listing <strong>of</strong> all <strong>of</strong> the components in the<br />
thermographic analysis program, the category to which they belong, and their monitoring<br />
interval.<br />
12.1.3 Equipment in category D that has a failure history relating to thermography might be<br />
included in the program in order to determine root cause, or to prevent failure recurrences<br />
or significant inconveniences. Otherwise, equipment in category D should be omitted<br />
from the program.<br />
12.1.4 The above recommended component selection criteria should be applied predominantly<br />
to electrical equipment such as:<br />
• Motor control centers<br />
• Load centers<br />
• Transformers<br />
• Switchgear<br />
• Battery chargers<br />
• Switchyard equipment<br />
• Large motor termination<br />
12.1.5 The above criteria can also be applied to:<br />
• Pumps/motors<br />
• Steam traps<br />
• Valves<br />
12.2 Performance Intervals<br />
12.2.1 The selection <strong>of</strong> performance intervals should be based upon several factors, such as:<br />
• The impact <strong>of</strong> the component on plant operation and personnel safety if an<br />
unexpected failure were to occur.<br />
• The speed at which a component fault manifests itself into a stage <strong>of</strong> degradation,<br />
which affects the component’s operability.<br />
• Vendor/manufacturers’ recommendations.<br />
• The category <strong>of</strong> the component as stated in section 12.1.1 <strong>of</strong> the program.<br />
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12.2.2 When considering the vendor’s recommended frequency for thermography, the<br />
application <strong>of</strong> the equipment should be taken into consideration (that is, the run time<br />
experienced by the equipment in this installation versus what the vendor expects for<br />
typical run times). Also, if the component falls into categories A or B <strong>of</strong> 12.1.1, then the<br />
most limiting interval (between the vendor-recommended interval and the recommended<br />
interval in section 12.2.3 <strong>of</strong> the program) shall be used for the monitoring <strong>of</strong> the<br />
equipment.<br />
12.2.3 The following recommended intervals for the given categories should be used:<br />
A. Critical Equipment<br />
• Monitor quarterly for those components that are operated continuously or are optested<br />
at least quarterly.<br />
• Monitor semi-annually for those components that are operated continuously or are<br />
run-tested at least semi-annually.<br />
• At start-up, monitor when the component is placed on-line, is at a stabilized<br />
temperature, and has not been monitored for at least one monitoring interval.<br />
• Equipment less than 240 V does not require periodic monitoring.<br />
B. Vital Equipment<br />
• Monitor equipment greater than 480 V quarterly.<br />
• Monitor equipment greater than 240 V but less than 480 V semi-annually.<br />
• Equipment less than 240 V does not require periodic monitoring.<br />
12.2.4 Changes to monitoring intervals should be reviewed carefully prior to making changes in<br />
order to ensure that maximum component availability and program efficiency is<br />
provided.<br />
12.2.5 At a minimum, documentation for interval changes shall be maintained, by the IR<br />
administrator.<br />
12.2.6 Components need not be operated for the sole purpose <strong>of</strong> collecting thermography data.<br />
13.0 SUGGESTED PROGRAM REFERENCES<br />
13.1 <strong>Infrared</strong> <strong>Thermography</strong> Guide (Revision 3), (formerly NP-6973)<br />
13.2 Plant Administrative Procedures Manual<br />
13.3 Plant Safety Manual<br />
13.4 Plant Training Manual<br />
13.5 Plant Quality Assurance Procedures Manual<br />
13.6 Plant Systems Training Manual<br />
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13.7 <strong>Infrared</strong> Imager Instruction Manual<br />
13.8 Plant Predictive Maintenance, INPO Good Practice 89-009.<br />
13.9 Wolfe, W. L. and Zissis, G.J., The <strong>Infrared</strong> Handbook. Environmental Research Institute<br />
<strong>of</strong> Michigan (1996).<br />
13.10 Mil-Std-2194, <strong>Infrared</strong> Thermal Imaging Survey Procedure Electrical Equipment.<br />
13.11 American Society for Nondestructive Testing Standard Practice SNT-TC-1A,<br />
Qualifications Guidelines.<br />
13.12 American Society for Nondestructive Testing <strong>Infrared</strong> and Thermal Testing Handbook,<br />
2001.<br />
13.13 American Society for Nondestructive Testing Level III Study Guide: <strong>Infrared</strong> and<br />
Thermal Testing Method, 2001.<br />
6-13
EPRI Licensed Material<br />
Basic Elements <strong>of</strong> an In-House Program<br />
Figure 6-1<br />
<strong>Infrared</strong> Survey Results<br />
6-14
7. TRAINING AND CERTIFICATION<br />
This section deals solely with the efforts <strong>of</strong> the American Society <strong>of</strong><br />
Nondestructive Testing (ASNT) in the training and certification <strong>of</strong> infrared<br />
thermographers. The purpose is to provide guidelines for training individuals<br />
who will be able to deliver the best level <strong>of</strong> service possible. It is important to<br />
understand that certification via the ASNT Certification Program, does not<br />
imply authorization or licensing <strong>of</strong> the certificate holder to perform infrared<br />
thermography tasks. It is solely the employer's responsibility to review the<br />
individual’s qualification records for completeness and to authorize individuals<br />
to perform infrared thermography tasks.<br />
Charlie Chong/ Fion Zhang
7.1 Background<br />
Commercially available infrared imagers are quite easy to both use and<br />
misuse. Many small, independent contractors, from electricians to engineers,<br />
provide a wide range <strong>of</strong> services to many different industries. In the absence<br />
<strong>of</strong> formal training, most <strong>of</strong> these people have learned on the job while working<br />
with more experienced individuals. At the request <strong>of</strong> many ASNT members, a<br />
committee was formed in the fall <strong>of</strong> 1989 to propose modifying ASNT<br />
Recommended Practice No. SNT-TC-1A, the qualification guideline for<br />
nondestructive testing, to accept and recognize infrared thermography as a<br />
valid nondestructive examination method. At this writing, all <strong>of</strong> the training,<br />
qualification, and certification guidelines are in place and SNT-TC-1A has<br />
been updated (1996) to include the T/IR (Thermal <strong>Infrared</strong>) method. Two<br />
additional ASNT publications were released in 2001 to support training and<br />
certification:<br />
• ASNT <strong>Infrared</strong> and Thermal Testing Handbook, 2001<br />
• ASNT Level III Study Guide: <strong>Infrared</strong> and Thermal Testing Method, 2001<br />
Charlie Chong/ Fion Zhang
Recommended training and certification guidelines for infrared<br />
thermographers are summarized in the ASNT <strong>Infrared</strong> and Thermal Testing<br />
Handbook on pages 15 -18, and are explained in detail in SNT-TC-1A.<br />
The ASNT training program is intended to supplement equipment-specific<br />
training that might be <strong>of</strong>fered by the manufacturers. Certification is the<br />
responsibility <strong>of</strong> the individual employer. SNT-TC-1A states the following<br />
in this regard:<br />
“Written Practice. The employer shall establish a written practice for the<br />
control and administration <strong>of</strong> nondestructive personnel training, examination<br />
and certification. The employer’s written practice should describe the<br />
responsibility <strong>of</strong> each level <strong>of</strong> certification for determining the acceptability <strong>of</strong><br />
materials and components in accordance with applicable codes, standards,<br />
specifications and procedures.”<br />
Charlie Chong/ Fion Zhang
7.2 Levels <strong>of</strong> Qualification<br />
The recommended Levels <strong>of</strong> Qualification for infrared thermographers follow<br />
those <strong>of</strong> traditional NDE methods. These levels are as follows:<br />
■ Level I<br />
A Level I infrared thermographer shall be qualified to perform specific IR<br />
inspections in accordance with detailed written instructions and to record the<br />
results; the Level 1 infrared thermographer shall perform inspections under<br />
the cognizance <strong>of</strong> a Level II or Level III. The Level I shall not independently<br />
perform nor evaluate inspection results for acceptance or rejection when such<br />
inspection results are for the purpose <strong>of</strong> verifying compliance to code or<br />
regulatory requirements. (if the result is not for the purpose <strong>of</strong> verifying<br />
compliance to code or regulatory requirements; then the Level I could<br />
independently perform and evaluate inspection result?)<br />
Charlie Chong/ Fion Zhang
■ Level II<br />
A Level II infrared thermographer shall be qualified to set up and calibrate<br />
equipment, conduct inspections, and to interpret inspection results in<br />
accordance with procedure requirements. The individual shall be familiar with<br />
the limitations and scope <strong>of</strong> the method employed and shall have the ability to<br />
apply techniques over a broad range <strong>of</strong> applications within the limits <strong>of</strong> their<br />
certification. The Level II shall be able to organize and report inspection<br />
results. A Level II must have the ability to correctly identify components and<br />
parts <strong>of</strong> components within the scope <strong>of</strong> the IR inspection.<br />
■ Level III<br />
A Level III infrared thermographer is capable <strong>of</strong> designating a particular<br />
inspection technique, establishing techniques and procedures, and<br />
interpreting results. The individual shall have sufficient practical background<br />
in his/her area <strong>of</strong> expertise to develop innovative techniques and to assist in<br />
establishing acceptance criteria where none are otherwise available. The<br />
individual shall have general familiarity with other nondestructive evaluation<br />
(NDE) methods and inspection technologies. The Level III individual shall be<br />
qualified to train and examine Level I and Level II personnel for qualification<br />
and certification as an infrared thermographer.<br />
Charlie Chong/ Fion Zhang
7.3 Training Requirements<br />
The training requirements for each level <strong>of</strong> the infrared thermographer<br />
qualification parallel those for the other traditional NDE methods in that onthe-job<br />
training, educational background, and classroom work all count<br />
toward qualification. There are qualification examinations and annual requalification<br />
requirements at all levels. It is up to the utilities’ training<br />
organization and individual employers to implement the appropriate<br />
recommendations <strong>of</strong> the training program set forth in SNT-TC-1A.<br />
Charlie Chong/ Fion Zhang
The experience and education recommendations for the three levels are:<br />
• Level I A high school diploma (or equivalent) or 6 months <strong>of</strong> experience<br />
• Level II A two-year college or technical degree or 18 months <strong>of</strong> experience<br />
• Level III A four-year technical degree from a college or university or 5<br />
years <strong>of</strong> experience<br />
The required classroom training is as follows:<br />
• Level I 40 hours <strong>of</strong> instruction, 50-question written examination, classroom<br />
experiment<br />
• Level II 40 hours <strong>of</strong> instruction, 75-question written examination,<br />
classroom experiment<br />
• Level III 40 hours <strong>of</strong> instruction, 75-question written examination,<br />
procedure preparation for classroom experiment<br />
Charlie Chong/ Fion Zhang
The classroom training is based on the body <strong>of</strong> knowledge reviewed, adopted,<br />
and updated by ASNT, summarized in ASNT Recommended Practice No.<br />
SNT-TC-1A, and reviewed in ASNT Level III Study Guide: <strong>Infrared</strong> and<br />
Thermal Testing Method, 2001. The depth that is covered by these areas<br />
corresponds to the level <strong>of</strong> the training. This translates into more extensive<br />
training at Level III than Level I, even though the classroom hours are the<br />
same. The four areas for training and associated practical aspects are listed<br />
below. At the conclusion <strong>of</strong> training, the trainee will:<br />
A. Radiosity or Target Exitance<br />
• Understand the concepts <strong>of</strong> radiosity and associated parameters.<br />
• Be able to measure emissivity, reflectance, transmittance, background<br />
temperature, foreground temperature, and target temperature.<br />
• Be cognizant <strong>of</strong> potential errors in the measurement <strong>of</strong> the above<br />
parameters, caused by variation across the target surface.<br />
Charlie Chong/ Fion Zhang
B. Spatial Resolution<br />
• the concept <strong>of</strong> spatial resolution. • Understand the difference between<br />
image resolution and measurement resolution.<br />
• Understand the effect on measurement <strong>of</strong> the distance between the<br />
instrument and the target.<br />
• Be able to calculate measurement spot size.<br />
• Be able to exploit equipment- pecific aids to determine measurement<br />
adequacy.<br />
Charlie Chong/ Fion Zhang
C. Heat Transfer<br />
• Understand the fundamental concepts <strong>of</strong> heat transfer including<br />
conduction, convection, and radiation.<br />
• Understand the difference between steady state and transient heat flow<br />
and application dependence.<br />
• Understand the effect <strong>of</strong> the environmental conditions <strong>of</strong> sky temperature,<br />
view factor, wind velocity, and surface orientation.<br />
• Understand the potential problems if evaporation or condensation occur at<br />
the target surface.<br />
Charlie Chong/ Fion Zhang
D. Equipment Operation<br />
• Be able to set up and operate the necessary equipment.<br />
• Understand dynamic range and its implication in image acquisition.<br />
• Demonstrate good data acquisition practices.<br />
• Demonstrate the use <strong>of</strong> accessories.<br />
• Understand how to compensate for external optics.<br />
• Understand the implications <strong>of</strong> system spectral response.<br />
The written examination is derived from a pool <strong>of</strong> 200-300 questions that are<br />
reviewed and approved by the ASNT T/IR committee members. During<br />
training, practical exams are conducted through classroom experiments and<br />
are focused on one particular concept, such as transient thermal heat transfer.<br />
The actual practical exam is determined by the trainer and is conducted<br />
within the guidelines for each particular level. <strong>Infrared</strong> thermography was<br />
adopted as a nondestructive inspection method in the fall <strong>of</strong> 1991.<br />
Charlie Chong/ Fion Zhang
7.4 Predictive Maintenance (PdM) Level III Certification<br />
Program<br />
Recognizing that there are areas <strong>of</strong> specialization within the infrared<br />
thermography discipline, the ASNT T/IR committee has promoted the<br />
development <strong>of</strong> specialty certification. The Predictive Maintenance Level III<br />
Certification Program has been developed by ASNT in response to this effort.<br />
Developed to meet the needs <strong>of</strong> the predictive maintenance sector <strong>of</strong> the<br />
industry, this program incorporates the vibration analysis (VA) and<br />
infrared/thermal (IR) test methods. A PdM-specific body <strong>of</strong> knowledge,<br />
including knowledge <strong>of</strong> the Recommended Practice No. SNT-TC-1A and the<br />
ANSI/ASNT CP-189 standard, is used for the two-hour PdM basic<br />
examination. The VA and IR method tests are the same as those used in the<br />
ASNT NDT Level III program. A separate and distinct PdM Level III certificate<br />
is issued for this certification.<br />
Charlie Chong/ Fion Zhang
The PdM basic examination is more specific than the ASNT NDT Level III<br />
basic examination, and thus, PdM certificate holders wishing to gain<br />
traditional NDT Level III certification will still be required to sit for the ASNT<br />
NDT Level III basic examination, as well as taking an ASNT NDT Level III<br />
method test.<br />
Certification via the ASNT PdM Level III Certification Program, as with the<br />
ASNT NDT Level III program, does not imply authorization or licensing <strong>of</strong> the<br />
PdM certificate holder to perform PdM tasks. It is solely the employer’s<br />
responsibility to review the individual’s qualification records for completeness<br />
and to authorize individuals to perform PdM.<br />
Charlie Chong/ Fion Zhang
The Expert!
Appendix-A<br />
The Science Of <strong>Thermography</strong> (Practical<br />
Application Of Thermographic And Thermal<br />
Sensing Equipment)<br />
Charlie Chong/ Fion Zhang
A.1 Introduction<br />
This appendix is presented as a reference guide to provide the practical<br />
thermographer with an understanding <strong>of</strong> the science behind the<br />
measurements. It is intended as an aid in performing and understanding<br />
non-contact thermal and thermographic measurements using infrared sensing<br />
equipment. The deployment and operation <strong>of</strong> infrared sensing instruments<br />
was, at one time, cumbersome and difficult. Thermographers were <strong>of</strong>ten<br />
required to perform on-the-spot calculations in order to reduce their<br />
measurement data and determine actual temperature values; this is no longer<br />
so. Modern instruments are light in weight, portable, and rugged.<br />
Menu-driven on-board s<strong>of</strong>tware now makes it relatively simple to operate<br />
equipment and to gather data directly in terms <strong>of</strong> target temperature. Because<br />
<strong>of</strong> this very ease <strong>of</strong> operation, it is also relatively simple to misinterpret the<br />
results so easily and quickly obtained.<br />
Charlie Chong/ Fion Zhang
Erroneous conclusions can have an extremely negative effect on the<br />
measurements program and on the credibility <strong>of</strong> the thermographer.<br />
A solid understanding <strong>of</strong> the basis on which thermographic measurements<br />
are made will go a long way toward minimizing operator error and ensuring<br />
the success <strong>of</strong> the thermographic program.<br />
The subject matter in this appendix begins with a discussion <strong>of</strong> heat transfer<br />
and how radiative heat transfer is the basis for infrared thermography. The<br />
basic physics <strong>of</strong> infrared radiation and how it applies to instrument<br />
performance is explained. Finally, the performance parameters <strong>of</strong> infrared<br />
point-sensing and imaging instruments are discussed, including how to select,<br />
calibrate, and evaluate the performance <strong>of</strong> the instrument that is best suited<br />
to your application.<br />
Charlie Chong/ Fion Zhang
A.2 Heat Transfer and Radiation Exchange Basics for<br />
<strong>Thermography</strong><br />
This section is to provide the reader with an understanding <strong>of</strong> how heat<br />
transfer phenomena affect non-contact infrared thermal sensing and<br />
thermographic measurements. <strong>Infrared</strong> thermography depends on measuring<br />
the distribution <strong>of</strong> radiant thermal energy (heat) emitted from a target surface,<br />
thus, the thermographer requires an understanding <strong>of</strong> heat, temperature, and<br />
the various types <strong>of</strong> heat transfer as an essential prerequisite in preparing to<br />
undertake a program <strong>of</strong> IR thermography.<br />
Charlie Chong/ Fion Zhang
A.2.1 Heat and Temperature<br />
What is <strong>of</strong>ten referred to as a heat source (like an oil furnace or an electric<br />
heater) is really one form or another <strong>of</strong> energy conversion; the energy stored<br />
in one object is converted to heat and flows to another object.<br />
Heat can be defined as thermal energy in transition. It flows from one place or<br />
object to another as a result <strong>of</strong> temperature difference, and the flow <strong>of</strong> heat<br />
changes the energy levels in the objects.<br />
Temperature is a property <strong>of</strong> matter and not a complete (that means it need<br />
other input to completely quantify the internal energy) measurement <strong>of</strong><br />
internal energy. It defines the direction <strong>of</strong> heat when another temperature is<br />
known. Heat always flows from the object that is at the higher temperature to<br />
the object that is at the lower temperature. As a result <strong>of</strong> heat transfer, hotter<br />
objects tend to become cooler and cooler objects become hotter, approaching<br />
thermal equilibrium. To maintain a steady-state condition, energy needs to be<br />
continuously supplied to the hotter object by some means <strong>of</strong> energy<br />
conversion so that the temperature and, hence, the heat flow remains<br />
constant.<br />
Charlie Chong/ Fion Zhang
A.2.2 Converting Temperature Units<br />
Temperature is expressed in either absolute or relative terms. There are two<br />
absolute scales called degree Rankine (English system) and Kelvin (metric<br />
system). There are two corresponding relative scales called Fahrenheit<br />
(English system) and Celsius or Centigrade (metric system). Absolute zero is<br />
the temperature at which no molecular action takes place. This is expressed<br />
as zero Kelvins or zero Rankines (0 K or 0 °R). Relative temperature is<br />
expressed as degrees Celsius or degrees Fahrenheit (°C or °F). The<br />
numerical relations among the four scales are as follows:<br />
T Celsius = 5/9 (T Fahrenheit - 32 )<br />
T Fahrenheit = 9/5 T Celsius + 32<br />
T Rankine = T Fahrenheit + 459.7<br />
T Kelvin = T Celsius + 273.16<br />
Absolute zero is equal to -273.1°C and is also equal to -459.7°F.<br />
Charlie Chong/ Fion Zhang
To convert changes in temperature or delta T between the English and Metric<br />
systems, the simple 9/5 (1.8 to 1) relationship is used:<br />
ΔT Fahrenheit (or Rankine) = 1.8 ΔT Celsius (or Kelvin)<br />
Table A-1 is a conversion table to allow for the rapid conversion <strong>of</strong><br />
temperature between Fahrenheit and Celsius values. Instructions for the use<br />
<strong>of</strong> the table are shown at the top.<br />
(ΔT ≡ temperature interval)<br />
Charlie Chong/ Fion Zhang
Table A-1 Temperature Conversion Chart Instructions for Use:<br />
1. Start in the Temp. column and find the temperature that you wish to convert.<br />
2. If the temperature to be converted is in °C, scan to the right column for the °F equivalent.<br />
3. If the temperature to be converted is in °F, scan to the left column for the °C equivalent.<br />
Charlie Chong/ Fion Zhang
A.2.3 The Three Modes <strong>of</strong> Heat Transfer<br />
There are three modes <strong>of</strong> heat transfer: (1) conduction, (2) convection, and (3)<br />
radiation (and nothing else) . All heat transfer processes occur by one or<br />
more <strong>of</strong> these three modes. <strong>Infrared</strong> thermography is based on the<br />
measurement <strong>of</strong> radiative heat flow radiation (and nothing else) and is,<br />
therefore, most closely related to the radiation mode <strong>of</strong> heat transfer.<br />
A.2.4 Conduction<br />
Conduction is the transfer <strong>of</strong> heat in stationary media. It is the only mode <strong>of</strong><br />
heat flow in solids, but can also take place in liquids and gases. It occurs as<br />
the result <strong>of</strong> molecular collisions (in liquids) (fluid, both liquid and gas) and<br />
atomic vibrations (in solids), whereby energy is moved one molecule at a time,<br />
from higher temperature sites to lower temperature sites. Figure A-1 is an<br />
illustration <strong>of</strong> conductive heat flow. The Fourier conduction law expresses the<br />
conductive heat flow through the slab shown in Figure A-1.<br />
Charlie Chong/ Fion Zhang
Figure A-1 Conductive Heat Flow<br />
Charlie Chong/ Fion Zhang
The Fourier Conduction Law:<br />
Q/A<br />
Q<br />
= K (T 1 -T 2 ) / L<br />
= K∙ΔT∙A / L<br />
Where:<br />
Q/A<br />
L<br />
T 1<br />
T 2<br />
K<br />
= the rate <strong>of</strong> heat transfer through the slab per unit area<br />
perpendicular to the flow<br />
= the thickness <strong>of</strong> the slab<br />
= the higher temperature (at the left)<br />
= the lower temperature (at the right)<br />
= the thermal conductivity <strong>of</strong> the slab material<br />
Charlie Chong/ Fion Zhang
Thermal conductivity is analogous to electrical conductivity and is inversely<br />
proportional to thermal resistance, as shown in the lower portion <strong>of</strong> Figure A-1.<br />
The temperatures, T 1 and T 2 , are analogous to voltages V1 and V2, and the<br />
heat flow, Q/A, is analogous to electrical current, I, so that: if:<br />
R electrical = V1 - V2/ I<br />
then:<br />
R thermal<br />
= T1 - T2 / Q /A = L/K<br />
Heat flow is usually expressed in English units. K is expressed in<br />
BTU/hr∙ft²∙°F and thermal resistance (1/K) would then be expressed in<br />
°F∙hr∙ft²/BTU.<br />
Charlie Chong/ Fion Zhang
A.2.5 Convection<br />
Convective heat transfer takes place in a moving medium and is almost<br />
always associated with transfer between a solid and a moving fluid (such as<br />
air). Forced convection takes place when an external driving force, such as<br />
wind or an air pump, moves the fluid. Free convection takes place when the<br />
temperature difference necessary for heat transfer produces density changes<br />
in the fluid and the warmer fluid rises as a result <strong>of</strong> increased buoyancy. In<br />
convective heat flow, heat transfer takes effect by means <strong>of</strong> two mechanisms,<br />
(1) the direct conduction through the fluid and (2) the motion <strong>of</strong> the fluid itself.<br />
Figure A-2 illustrates convective heat transfer between a flat plate and a<br />
moving fluid. The presence <strong>of</strong> the plate causes the velocity <strong>of</strong> the fluid to<br />
decrease to zero at the surface and influences its velocity throughout the<br />
thickness <strong>of</strong> a boundary layer. The thickness <strong>of</strong> the boundary layer depends<br />
on the free velocity, V∞, <strong>of</strong> the fluid. It is greater for free convection and<br />
smaller for forced convection. The rate <strong>of</strong> heat flow depends on the thickness<br />
<strong>of</strong> the convection layer, as well as the temperature difference between Ts and<br />
T∞ (Ts is the surface temperature, T∞ is the free field fluid temperature<br />
outside <strong>of</strong> the boundary layer.)<br />
Charlie Chong/ Fion Zhang
Newton’s cooling law defines the convective heat transfer coefficient:<br />
(h is expressed in BTU/hr-ft²-°F)<br />
rearranged:<br />
= ΔT∙h<br />
where:<br />
Rc = 1/h and is the resistance to convective heat flow<br />
Rc is also analogous to electrical resistance and is easier to use when<br />
determining combined conductive and convective heat transfer.<br />
Charlie Chong/ Fion Zhang
Figure A-2 Convective Heat Flow<br />
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang
A.2.6 Radiation<br />
Radiative heat transfer is unlike the other two modes in several respects:<br />
1. It can take place in a vacuum.<br />
2. It occurs by electromagnetic emission and absorption.<br />
3. It occurs at the speed <strong>of</strong> light.<br />
4. The energy transferred is proportional to the fourth power <strong>of</strong> the<br />
temperature difference between the objects (ΔT 4 or T 4 ?) .<br />
The electromagnetic spectrum is illustrated in Figure A-3. Radiative heat<br />
transfer takes place in the infrared portion <strong>of</strong> the spectrum, between 0.75 µm<br />
and about 100 µm (0.1mm) , although most practical measurements can be<br />
made out to 20 µm. (µ or µm stands for micrometers or microns. A micron is<br />
one-millionth <strong>of</strong> a meter and is the measurement unit for radiant energy<br />
wavelength.) (radiative heat only take place at the aforementioned portion <strong>of</strong><br />
spectrum?)<br />
Charlie Chong/ Fion Zhang
Figure A-3 <strong>Infrared</strong> in the Electromagnetic Spectrum<br />
Charlie Chong/ Fion Zhang
A.2.7 Radiation Exchange at the Target Surface<br />
The measurement <strong>of</strong> thermal infrared radiation is the basis for non-contact<br />
temperature measurement and thermal imaging (or thermography). The<br />
process <strong>of</strong> thermal infrared radiation leaving a surface is called exitance or<br />
radiosity. It can be emitted from the surface, reflected <strong>of</strong>f <strong>of</strong> the surface, or<br />
transmitted through the surface. This is illustrated in Figure A-4. The total<br />
radiosity is equal to the sum <strong>of</strong> the emitted component (E), the reflected<br />
component (R), and the transmitted component (T). The surface temperature<br />
is related to E, the emitted component only.<br />
Charlie Chong/ Fion Zhang
Thermal infrared radiation impinging on a surface can be absorbed, reflected,<br />
or transmitted as illustrated in Figure A-5. Kirchh<strong>of</strong>f’s law states that the sum<br />
<strong>of</strong> the three components is always equal to the received radiation (the<br />
percentage sum <strong>of</strong> the three components equals unity):<br />
A (absorptivity) + R (reflectivity) + T (transmissivity) = 1<br />
(ε + ρ + τ = 1)<br />
When making practical measurements, the specularity or diffusivity <strong>of</strong> a target<br />
surface is taken into effect by accounting for the emissivity <strong>of</strong> the surface.<br />
Emissivity is discussed as part <strong>of</strong> the detailed discussion <strong>of</strong> the<br />
characteristics <strong>of</strong> infrared thermal radiation in section A.3.<br />
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang
Figure A-4 Radiative Heat Flow<br />
Charlie Chong/ Fion Zhang
Figure A-4 Radiative Heat Flow<br />
W ε = σεT e<br />
4<br />
W ρ = σρT r<br />
4<br />
W τ = στT t<br />
4<br />
Charlie Chong/ Fion Zhang
Figure A-5 Radiation Exchange at the Target Surface<br />
Charlie Chong/ Fion Zhang
A.2.8 Specular and Diffuse Surfaces<br />
It should be noted that the roughness or structure <strong>of</strong> a surface will determine<br />
the type and direction <strong>of</strong> reflection <strong>of</strong> incident radiation. A smooth surface will<br />
reflect incident energy at an angle complementary to the angle <strong>of</strong> incidence.<br />
This is called a specular reflector. A rough or structured surface will scatter or<br />
disperse some <strong>of</strong> the incident radiation; this is a diffuse reflector.<br />
No perfectly specular or perfectly diffuse surface can exist in nature. All real<br />
surfaces have some diffusivity and some specularity.<br />
Charlie Chong/ Fion Zhang
Specular or Diffuse Surfaces<br />
Charlie Chong/ Fion Zhang
Specular or Diffuse Surfaces<br />
Diffuse<br />
Reflector<br />
Specular<br />
Reflector?<br />
Charlie Chong/ Fion Zhang<br />
http://www.hunantv.com/v/3/56616/f/750962.html?f=lb#
Specular and Diffuse Surfaces<br />
Diffuse<br />
Reflector<br />
Specular<br />
Reflector?<br />
Charlie Chong/ Fion Zhang
Specular and Diffuse Surfaces<br />
Confused<br />
Specular<br />
Reflector?<br />
Charlie Chong/ Fion Zhang
Specular or Diffuse Surfaces<br />
Charlie Chong/ Fion Zhang
Specular reflection is the mirror-like reflection <strong>of</strong> light (or <strong>of</strong> other kinds <strong>of</strong><br />
wave) from a surface, in which light from a single incoming direction (a ray) is<br />
reflected into a single outgoing direction. Such behavior is described by the<br />
law <strong>of</strong> reflection, which states that the direction <strong>of</strong> incoming light (the incident<br />
ray), and the direction <strong>of</strong> outgoing light reflected (the reflected ray) make the<br />
same angle with respect to the surface normal, thus the angle <strong>of</strong> incidence<br />
equals the angle <strong>of</strong> reflection θ 2 = θ 1 in the figure), and that the incident,<br />
normal, and reflected directions are coplanar.<br />
Charlie Chong/ Fion Zhang
Reflections <strong>of</strong>f Specular and Diffuse Surfaces<br />
Charlie Chong/ Fion Zhang
Reflections <strong>of</strong>f Specular and Diffuse Surfaces<br />
Charlie Chong/ Fion Zhang
A.2.9 Transient Heat Exchange The discussions <strong>of</strong> the three types <strong>of</strong> heat<br />
exchange in sections A.2.4, A.2.5, and A.2.6 deal with steady-state heat<br />
exchange for reasons <strong>of</strong> simplicity and easier understanding. Two fixed<br />
temperatures are assumed to exist at the two points between which the heat<br />
flows. In many applications, however, temperatures are in transition, so that<br />
the values shown for energy radiated from a target surface are the<br />
instantaneous values from the moment that measurements are made. There<br />
are numerous instances where existing transient thermal conditions are<br />
exploited in order to use thermography to reveal material or structural<br />
characteristics in test articles.<br />
Charlie Chong/ Fion Zhang
The thermogram <strong>of</strong> the outside surface <strong>of</strong> an insulated vessel carrying heated<br />
liquid, for example, should be relatively isothermal and somewhat warmer<br />
than the ambient air. Insulation voids or defects will cause warm anomalies to<br />
appear on the thermogram, allowing the thermographer to pinpoint areas <strong>of</strong><br />
defective or damaged insulation. Here a passive approach can be taken<br />
because the transient heat flow (or it is a steady state heat flow?) from the<br />
liquid through the insulation to the outside air produces the desired<br />
characteristic thermal pattern on the product surface. Similarly, water<br />
saturated areas on flat ro<strong>of</strong>s will retain solar heat well into the night; long after<br />
the dry sections have radiated their stored heat to the cold night sky, the<br />
saturated sections will continue to radiate and exhibit distinct anomalies to the<br />
thermographer. When there is no heat flow through the material or the test<br />
article to be evaluated, an active, or thermal injection, approach is used to<br />
generate a transient heat flow.<br />
Comment: In general steady state heat flow always lead to thermal<br />
equilibrium, for IRT, transient heat flows are exploited to reveal abnormalities.<br />
Charlie Chong/ Fion Zhang
This approach requires the generation <strong>of</strong> a controlled flow <strong>of</strong> thermal energy<br />
across the laminar structure <strong>of</strong> the sample material under test, thermography<br />
monitoring <strong>of</strong> one <strong>of</strong> the surfaces (or sometimes both) <strong>of</strong> the sample, and a<br />
search for anomalies in the thermal patterns that will indicate a defect in<br />
accordance with established accept-reject criteria. This approach has been<br />
used extensively and successfully by the aerospace community in the<br />
evaluation <strong>of</strong> composite structures for impurities, flaws, voids, disbonds,<br />
delaminations, and variations in structural integrity. Most recently, time-based<br />
heat injection methods have been applied successfully to measure the depth<br />
<strong>of</strong> voids, as well as their location. This is effective because thinner sections <strong>of</strong><br />
a given material will heat more rapidly than thicker sections.<br />
Charlie Chong/ Fion Zhang
Steady-state conduction<br />
Steady state conduction is the form <strong>of</strong> conduction that happens when the temperature<br />
differences ΔT driving the conduction are constant, so that (after an equilibration time), the<br />
spatial distribution <strong>of</strong> temperatures (temperature field) in the conducting object does not change<br />
any further. Thus, all partial derivatives <strong>of</strong> temperature with respect to space may either be zero<br />
or have nonzero values, but all derivatives <strong>of</strong> temperature at any point with respect to time are<br />
uniformly zero. In steady state conduction, the amount <strong>of</strong> heat entering any region <strong>of</strong> an object is<br />
equal to amount <strong>of</strong> heat coming out (if this were not so, the temperature would be rising or falling,<br />
as thermal energy was tapped or trapped in a region).<br />
For example, a bar may be cold at one end and hot at the other, but after a state <strong>of</strong> steady state<br />
conduction is reached, the spatial gradient <strong>of</strong> temperatures along the bar does not change any<br />
further, as time proceeds. Instead, the temperature at any given section <strong>of</strong> the rod remains<br />
constant, and this temperature varies linearly in space, along the direction <strong>of</strong> heat transfer.<br />
In steady state conduction, all the laws <strong>of</strong> direct current electrical conduction can be applied to<br />
"heat currents". In such cases, it is possible to take "thermal resistances" as the analog to<br />
electrical resistances. In such cases, temperature plays the role <strong>of</strong> voltage, and heat transferred<br />
per unit time (heat power) is the analog <strong>of</strong> electrical current. Steady state systems can be<br />
modelled by networks <strong>of</strong> such thermal resistances in series and in parallel, in exact analogy to<br />
electrical networks <strong>of</strong> resistors. See purely resistive thermal circuits for an example <strong>of</strong> such a<br />
network.<br />
Charlie Chong/ Fion Zhang<br />
https://en.wikipedia.org/wiki/Thermal_conduction
Transient conduction<br />
In general, during any period in which temperatures change in time at any place within an object,<br />
the mode <strong>of</strong> thermal energy flow is termed transient conduction. Another term is "non steadystate"<br />
conduction, referring to time-dependence <strong>of</strong> temperature fields in an object. Non-steadystate<br />
situations appear after an imposed change in temperature at a boundary <strong>of</strong> an object. They<br />
may also occur with temperature changes inside an object, as a result <strong>of</strong> a new source or sink <strong>of</strong><br />
heat suddenly introduced within an object, causing temperatures near the source or sink to<br />
change in time.<br />
When a new perturbation <strong>of</strong> temperature <strong>of</strong> this type happens, temperatures within the system<br />
change in time toward a new equilibrium with the new conditions, provided that these do not<br />
change. After equilibrium, heat flow into the system once again equals the heat flow out, and<br />
temperatures at each point inside the system no longer change. Once this happens, transient<br />
conduction is ended, although steady-state conduction may continue if heat flow continues. If<br />
changes in external temperatures or internal heat generation changes are too rapid for<br />
equilibrium <strong>of</strong> temperatures in space to take place, then the system never reaches a state <strong>of</strong><br />
unchanging temperature distribution in time, and the system remains in a transient state.<br />
An example <strong>of</strong> a new source <strong>of</strong> heat "turning on" within an object, causing transient conduction,<br />
is an engine starting in an automobile. In this case the transient thermal conduction phase for the<br />
entire machine is over, and the steady state phase appears, as soon as the engine reaches<br />
steady-state operating temperature. In this state <strong>of</strong> steady-state equilibrium, temperatures vary<br />
greatly from the engine cylinders to other parts <strong>of</strong> the automobile, but at no point in space within<br />
the automobile does temperature increase or decrease. After establishing this state, the transient<br />
conduction phase <strong>of</strong> heat transfer is over.<br />
Charlie Chong/ Fion Zhang<br />
https://en.wikipedia.org/wiki/Thermal_conduction
A.3 The Basic Physics <strong>of</strong> <strong>Infrared</strong> Radiation and Sensing<br />
All targets radiate energy in the infrared spectrum. The hotter the target, the<br />
more energy is radiated (∝T 4 ). Very hot targets radiate in the visible as well,<br />
and our eyes can see this because they are sensitive to light. The sun for<br />
example, at about 6000 K, appears to glow white-hot; a tungsten filament, at<br />
about 3000 K, has a yellowish glow, and an electric stove element, at 800 K,<br />
glows red. As the stove element cools, it loses its visible glow but it continues<br />
to radiate. We can feel it with a hand placed near the surface but we can’t see<br />
the glow because the energy has shifted from red to infrared. <strong>Infrared</strong><br />
detectors can sense infrared radiant energy and produce useful electrical<br />
signals proportional to the temperature <strong>of</strong> target surfaces. Instruments that<br />
use infrared detectors and optics to gather and focus energy from the targets<br />
onto these detectors are capable <strong>of</strong> measuring target surface temperatures<br />
with sensitivities better than 0.1°C, and with response times as fast as<br />
microseconds. Instruments that combine this measurement capability with<br />
capabilities for scanning the target surface are called infrared thermal imagers.<br />
Charlie Chong/ Fion Zhang
They can produce thermal maps or thermograms where the brightness<br />
intensity or color hue <strong>of</strong> any spot on the map is representative <strong>of</strong> the<br />
temperature <strong>of</strong> the surface at that point. In most cases, thermal imagers can<br />
be considered as extensions <strong>of</strong> radiation thermometers or as a radiation<br />
thermometer with scanning capability. The performance parameters <strong>of</strong><br />
thermal imagers are extensions <strong>of</strong> the performance parameters <strong>of</strong> radiation<br />
thermometers.<br />
Charlie Chong/ Fion Zhang
A.3.1 Some Historical Background<br />
The color <strong>of</strong> a glowing metal is a fair indication <strong>of</strong> its temperature (the higher<br />
the temperature, the whiter the color). The ancient sword-maker and<br />
blacksmith knew from the color <strong>of</strong> a heated part when it was time to quench<br />
and temper. This technique is still in use today; precision optical matching<br />
pyrometers are used to match the brightness in color <strong>of</strong> a product with that <strong>of</strong><br />
a glowing filament. The brightness <strong>of</strong> the filament is controlled by adjusting a<br />
knob that is calibrated in temperature. The next logical step is to substitute a<br />
photomultiplier for the operator’s eye and, thus, calibrate the measurement.<br />
Finally, a differential measurement is made between what the brightness <strong>of</strong><br />
the product is and what it should be (the set point), and the differential signal<br />
is injected into the process and used to drive the product temperature to the<br />
set point. With the advent <strong>of</strong> modern infrared detectors, the precision<br />
measurement <strong>of</strong> thermal energy radiating from surfaces that do not glow<br />
became possible. Measurements <strong>of</strong> cool surfaces, well below 0°C, are<br />
accomplished routinely with even the least expensive <strong>of</strong> infrared sensors.<br />
Charlie Chong/ Fion Zhang
A.3.2 Non-Contact Thermal Measurements<br />
<strong>Infrared</strong> non-contact thermal sensing instruments are classified as infrared<br />
radiation thermometers by the American Society <strong>of</strong> Testing and Materials<br />
(ASTM), even though they don’t always read out in temperatures. The laws <strong>of</strong><br />
physics allow for the conversion <strong>of</strong> infrared radiation measurements to<br />
temperature measurements. This is done by first measuring the self-emitted<br />
radiation in the infrared portion <strong>of</strong> the electromagnetic spectrum <strong>of</strong> target<br />
surfaces, and then converting these measurements to electrical signals. In<br />
making these measurements, three sets <strong>of</strong> characteristics need to be<br />
considered:<br />
• The target surface<br />
• The transmitting medium between the target and the instrument<br />
• The measuring instrument<br />
Charlie Chong/ Fion Zhang
A.3.3 The Target Surface<br />
The chart <strong>of</strong> the electromagnetic spectrum (Figure A-3) indicates that the<br />
infrared portion <strong>of</strong> the spectrum lies adjacent to the visible. Every target<br />
surface above absolute zero (0 Kelvins or -273° Centigrade) radiates energy<br />
in the infrared. The hotter the target, the more radiant energy is emitted.<br />
When targets are hot enough, they radiate or glow in the visible part <strong>of</strong> the<br />
spectrum as well ( and beyond that, again becoming invisible again, example<br />
UV & ɣ ray) . As they cool, the eye becomes no longer able to see the emitted<br />
radiation and the targets appear to not glow at all. <strong>Infrared</strong> sensors are<br />
employed here to measure the radiation in the infrared, which can be related<br />
to target surface temperature. The visible spectrum extends from energy<br />
wavelengths <strong>of</strong> 0.4 µm for violet light to about 0.75 µm for red light. (µ or µm<br />
stands for micrometers or microns. A micron is one-millionth <strong>of</strong> a meter and is<br />
the measurement unit for radiant energy wavelength.) For practical purposes<br />
<strong>of</strong> temperature measurement, the infrared spectrum extends from 0.75 µm to<br />
about 20 µm.<br />
Charlie Chong/ Fion Zhang
The visible spectrum extends from<br />
energy wavelengths <strong>of</strong><br />
0.4 µm for violet light to about 0.75<br />
µm for red light. For practical purposes <strong>of</strong><br />
temperature measurement, the infrared spectrum<br />
extends from 0.75 µm to about 20 µm.<br />
for my ASNT Exam<br />
Charlie Chong/ Fion Zhang
Figure A-6 shows the distribution <strong>of</strong> emitted energy over the electromagnetic<br />
spectrum <strong>of</strong> targets at various temperatures. The sun, at 6000 K, appears<br />
white hot because its emitted energy is centered over the visible spectrum<br />
with a peak at 0.5 µm. Other targets, such as a tungsten filament at 3000 K, a<br />
red-hot surface at 800 K, and the ambient earth at 300 K (about 30°C), are<br />
also shown in this illustration. It becomes apparent that, as surfaces cool, not<br />
only do they emit less energy, but the wavelength distribution shifts to longer<br />
infrared wavelengths. Even though the eye becomes no longer capable <strong>of</strong><br />
sensing this energy, infrared sensors can detect these invisible longer<br />
wavelengths. They enable us to measure the self-emitted radiant energy from<br />
even very cold targets and, thereby, determine the temperatures <strong>of</strong> target<br />
surfaces remotely and without contact.<br />
Keypoints:<br />
The visible spectrum extends from energy wavelengths <strong>of</strong> 0.4 µm for violet<br />
light to about 0.75 µm for red light.<br />
For practical purposes <strong>of</strong> temperature measurement, the infrared spectrum<br />
extends from 0.75 µm to about 20 µm.<br />
Charlie Chong/ Fion Zhang
Figure A-6<br />
Blackbody Curves<br />
at Various<br />
Temperatures<br />
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang
λ m = b/T = (2897/T μm)<br />
Charlie Chong/ Fion Zhang<br />
http://www.nasa.gov/centers/goddard/news/topstory/2004/0107filament.html
Two physical laws define the radiant behavior illustrated in Figure A-6:<br />
The Stephan-Boltzmann Law (1):<br />
W = εδT 4<br />
and Wien’s Displacement Law (2):<br />
λ m = b/T = (2897/T μm)<br />
Where:<br />
W = Radiant flux emitted per unit are a (watts/cm²)<br />
ε = Emissivity (unity for a blackbody target)<br />
δ = Stephan-Boltzmann constant = 5.673 x10 -12 watts cm -2<br />
T = Absolute temperature <strong>of</strong> target (K)<br />
λ m = Wavelength <strong>of</strong> maximum radiation (µm)<br />
b = Wien’s displacement constant = 2897 (µm∙K)<br />
Charlie Chong/ Fion Zhang
According to (1), the radiant energy emitted from the target surface (W)<br />
equals two constants multiplied by the fourth power <strong>of</strong> the absolute<br />
temperature (T 4 ) <strong>of</strong> the target. The instrument measures W and calculates T.<br />
One <strong>of</strong> the two constants, δ, is a fixed number.<br />
Emissivity (ξ) is the other constant and is a surface characteristic that is only<br />
constant for a given material over a given range <strong>of</strong> temperatures.<br />
For point measurements, one can usually estimate the emissivity setting<br />
needed to dial into the instrument from available tables and charts. One can<br />
also learn, experimentally, the proper setting needed to make the instrument<br />
produce the correct temperature reading by using samples <strong>of</strong> the actual target<br />
material. This more practical setting value is called effective emissivity (e*).<br />
Charlie Chong/ Fion Zhang
According to (2), the wavelength at which a target radiates its peak energy is<br />
defined as simply a constant (b = 2897≈ 3000) divided by the target<br />
temperature (T) in Kelvins. For the 300 K ambient earth, for example, the<br />
peak wavelength would be (λ max = 2897/300) or ≈ 10 µm. This quick<br />
calculation is important in selecting the proper instrument for a measurement<br />
task, as will be discussed in section A.4.<br />
Target surfaces can be classified in three categories: (1) black bodies, (2)<br />
gray bodies, and (3) non-gray bodies.<br />
The targets shown in Figure A-6 are all blackbody radiators (or black bodies).<br />
A blackbody radiator is a theoretical surface having unity emissivity at all<br />
wavelengths and absorbing all <strong>of</strong> the energy available at its surface. This<br />
would be an ideal target to measure because the temperature calculation<br />
within the instrument would be simply mechanized and always constant.<br />
Fortunately, although blackbody radiators do not exist in practice, the<br />
surfaces <strong>of</strong> most solids are gray bodies, that is, surfaces whose emissivities<br />
are high and fairly constant with wavelength.<br />
Charlie Chong/ Fion Zhang
Figure A-7 shows the comparative spectral distribution <strong>of</strong> energy emitted by a<br />
blackbody, a gray body, and a non-gray body (also called a spectral body), all<br />
at the same temperature. For gray body measurements, a simple emissivity<br />
correction can usually be dialed in when absolute measurements are required.<br />
For non-gray bodies, the solutions are more difficult. To understand the<br />
reason for this, it is necessary to see what an instrument sees when it is<br />
aimed at a non-gray target surface.<br />
Keywords:<br />
non-gray body (also called a spectral body)<br />
Charlie Chong/ Fion Zhang
Figure A-7 Spectral Distribution <strong>of</strong> a Blackbody, a Gray Body, and a Non-<br />
Gray Body<br />
Charlie Chong/ Fion Zhang
Figure A-7 Spectral Distribution <strong>of</strong> a Blackbody, a Gray Body, and a Non-<br />
Gray Body<br />
Charlie Chong/ Fion Zhang
Figure A-8 shows that the instrument sees three components <strong>of</strong> energy: first,<br />
emitted energy (ε); second, reflected energy from the environment (ρ); and<br />
third, energy transmitted through the target from sources behind the target (τ).<br />
The percentage sum <strong>of</strong> these components is always unity (1). The instrument<br />
sees only ε, the emitted energy, when aimed at a blackbody target because a<br />
blackbody reflects and transmits nothing. For a gray body, the instrument<br />
sees ε and ρ, the emitted and reflected energy. The instrument sees all three<br />
components when aimed at a nongray body because a non-gray body is<br />
partially transparent.<br />
Keywords:<br />
because a non-gray body is partially transparent.(?)<br />
Charlie Chong/ Fion Zhang
Figure A-8 Components <strong>of</strong> Energy Reaching the Measuring Instrument<br />
Charlie Chong/ Fion Zhang
If the emissivity <strong>of</strong> a gray body is very low, as in the case <strong>of</strong> polished metal<br />
surfaces, the reflectance becomes high (reflectance = 1 - emissivity) and can<br />
generate erroneous readings if not properly handled. Reflected energy from a<br />
specific source can generally be redirected by proper orientation <strong>of</strong> the<br />
instrument with respect to the target surface, as shown in Figure A-9. This<br />
illustrates the proper and improper orientation that is necessary to avoid<br />
reflected energy from a specific source.<br />
Charlie Chong/ Fion Zhang
Figure A-9 Aiming the Instrument to Avoid Point Source Reflections<br />
Charlie Chong/ Fion Zhang
Under certain conditions, an error in temperature indication can occur as the<br />
result <strong>of</strong> a high temperature background, such as a boiler wall (behind the<br />
instrument), reflecting <strong>of</strong>f <strong>of</strong> a reflective target surface and contributing to the<br />
apparent temperature <strong>of</strong> the target. Most instrument manufacturers provide a<br />
background temperature correction to compensate for this condition. Often, in<br />
practice, the troublesome component is T, the energy transmitted through a<br />
non-gray target from sources behind the target. A discussion <strong>of</strong> solutions to<br />
this type <strong>of</strong> problem is included in section A.4.<br />
Non-Gray body – An object whose emissivity varies with wavelength over the<br />
wavelength interval <strong>of</strong> interest. A radiating object that does not have a<br />
spectral radiation distribution similar to a blackbody; also called a “colored<br />
body” or “realbody”. Glass and plastic films are examples <strong>of</strong> non-graybodies.<br />
An object can be a graybody over one wavelength interval and a non-gray<br />
body over another. http://www.infraredtraininginstitute.com/thermography-terms-definitions/<br />
Charlie Chong/ Fion Zhang
Blackbody, Graybody & Non-graybody (colored body or real body)<br />
Charlie Chong/ Fion Zhang<br />
http://www.moistureview.com/resources/infrarods-blog/page/4
EXAM score!<br />
Non-graybody<br />
(colored body or real body)<br />
for my ASNT exam<br />
for my ASNT exam<br />
Charlie Chong/ Fion Zhang
A.3.4 The Transmitting Medium<br />
The transmission characteristics <strong>of</strong> the medium in the measurement path<br />
between the target and the instrument need to be considered in making nonontact<br />
thermal measurements. No loss <strong>of</strong> energy is encountered when<br />
measuring through a vacuum. For short path lengths, a few feet for example,<br />
most gases including the atmosphere, absorb very little energy and can be<br />
ignored (except where measurements <strong>of</strong> precision temperature values are<br />
required). As the path length increases to hundreds <strong>of</strong> feet, or as the air<br />
becomes heavy with water vapor, the absorption might become a factor. It is<br />
then necessary to consider the infrared transmission characteristics <strong>of</strong> the<br />
atmosphere.<br />
Charlie Chong/ Fion Zhang
Figure A-10 illustrates the spectral transmission characteristics <strong>of</strong> 0.3 km <strong>of</strong><br />
ground level atmosphere (what is the object to detector distance in tabulating<br />
the chart? or this is not a factor as the transmittance is given as a ratio (%)<br />
with respect to transmittance in vacuum (Transmittance in vacuum=100%)).<br />
Two spectral intervals can be seen to have very high transmission. These are<br />
known as the 1.5 µm and the 8.14 µm atmospheric windows, and almost all<br />
infrared sensing and scanning instruments are designed to operate in one or<br />
the other <strong>of</strong> these windows. (unless) Usually, the difficulties encountered with<br />
transmitting media occur when the target is viewed by the instrument through<br />
another solid object such as a glass or quartz viewing port in a process.<br />
Keywords:<br />
These are known as the 1.5 µm and the 8.14 µm atmospheric windows.<br />
Charlie Chong/ Fion Zhang
Figure A-10 <strong>Infrared</strong> Transmission <strong>of</strong> 0.3 km <strong>of</strong> Sea Level Atmosphere<br />
Charlie Chong/ Fion Zhang
Figure A-10 <strong>Infrared</strong> Transmission <strong>of</strong> 0.3 km <strong>of</strong> Sea Level Atmosphere<br />
Charlie Chong/ Fion Zhang
Figure A-11 shows transmission curves for various samples <strong>of</strong> glass and<br />
quartz. Upon seeing these, our first impression is that glass is opaque at 10<br />
µm where ambient (30°C) surfaces radiate their peak energy. This impression<br />
is correct and, although in theory, infrared measurements can be made <strong>of</strong><br />
30°C targets through glass, it is hardly practical. The first approach to the<br />
problem is to attempt to eliminate the glass, or at least a portion <strong>of</strong> it, through<br />
which the instrument can be aimed at the target. If, for reasons <strong>of</strong> hazard,<br />
vacuum, or product safety, a window must be present; a material that<br />
transmits in the longer wavelengths might be substituted.<br />
Charlie Chong/ Fion Zhang
Figure A-11 <strong>Infrared</strong> Spectral Transmission <strong>of</strong> Glass<br />
Charlie Chong/ Fion Zhang
Figure A-11 <strong>Infrared</strong> Spectral Transmission <strong>of</strong> Glass<br />
Charlie Chong/ Fion Zhang
Figure A-11 shows transmission curves for various samples <strong>of</strong> glass and<br />
quartz. Upon seeing these, our first impression is that glass is opaque at 10<br />
µm where ambient (30°C) surfaces radiate their peak energy (?). This<br />
impression is correct and, although in theory, infrared measurements can be<br />
made <strong>of</strong> 30°C targets through glass, it is hardly practical. The first approach<br />
to the problem is to attempt to eliminate the glass, or at least a portion <strong>of</strong> it,<br />
through which the instrument can be aimed at the target. If, for reasons <strong>of</strong><br />
hazard, vacuum, or product safety, a window must be present; a material that<br />
transmits in the longer wavelengths might be substituted.<br />
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang<br />
http://www.technicalglass.com/fused_quartz_transmission.html
EXAM score!<br />
Glass is opaque<br />
λ > 5µm at 30ºC?<br />
for my ASNT exam<br />
Charlie Chong/ Fion Zhang
Figure A-12 shows the spectral transmission characteristics <strong>of</strong> several <strong>of</strong><br />
these materials, many <strong>of</strong> which transmit energy past 10 µm. These materials<br />
are <strong>of</strong>ten used as lenses and optical elements in low-temperature infrared<br />
sensors. Of course, as targets become hotter and the emitted energy shifts to<br />
the shorter wavelengths, glass and quartz windows pose less <strong>of</strong> a problem<br />
and are even used as elements and lenses in high-temperature sensing<br />
instruments.<br />
Charlie Chong/ Fion Zhang
Figure A-12 Characteristics <strong>of</strong> IR Transmitting Materials<br />
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang
The characteristics <strong>of</strong> the window material will always have some effect on<br />
the temperature measurement, but the attenuation can always be corrected<br />
by pre-calibrating the instrument with a sample window placed between the<br />
instrument and a target <strong>of</strong> known temperature. In closing the discussion <strong>of</strong> the<br />
transmitting medium, it is important to note that infrared sensors can only<br />
work when all <strong>of</strong> the following spectral ranges coincide or overlap:<br />
1. The spectral range over which the target emits<br />
2. The spectral range over which the medium transmits<br />
3. The spectral range over which the instrument operates<br />
3<br />
2<br />
1<br />
Charlie Chong/ Fion Zhang
IR Lenses – Sapphire Lens<br />
Charlie Chong/ Fion Zhang<br />
http://www.ecvv.com/product/3411419.html
IR Lenses – LWIR Len<br />
Charlie Chong/ Fion Zhang<br />
http://eom.umicore.com/en/infrared-optics/product-range/25-mm-f-1.2/
IR Lenses – Fresnel Len<br />
Charlie Chong/ Fion Zhang<br />
http://www.glolab.com/pirparts/pirparts.html
IR Lenses – Fresnel Len<br />
Charlie Chong/ Fion Zhang<br />
http://www.glolab.com/pirparts/pirparts.html
A.3.5 The Measuring Instrument<br />
Figure A-13 shows the necessary components <strong>of</strong> an infrared radiation<br />
thermometer. Collecting optics (an infrared lens, for example) is necessary in<br />
order to focus the energy emitted by the target onto the sensitive surface <strong>of</strong><br />
an infrared detector, which, in turn, converts this energy into an electrical<br />
signal.<br />
Charlie Chong/ Fion Zhang
Figure A-13 Components <strong>of</strong> an <strong>Infrared</strong> Radiation Thermometer<br />
Thermal or photon<br />
detector, single<br />
element or FPA.<br />
Charlie Chong/ Fion Zhang
When an infrared radiation thermometer (point-sensing instrument) is aimed<br />
at a target, it collects energy within a collecting beam, the shape <strong>of</strong> which is<br />
determined by the configuration <strong>of</strong> the optics and the detector.<br />
The cross- section <strong>of</strong> this collecting beam is called the field <strong>of</strong> view <strong>of</strong> the<br />
instrument, and it determines the size <strong>of</strong> the area (spot size) on the target<br />
surface that is measured by the instrument.<br />
On thermal imaging instruments, this is called the instantaneous field <strong>of</strong> view<br />
(IFOV) and becomes one picture element on the thermogram.<br />
Comment:<br />
for single element detector; FOV = IFOV<br />
for FPA multi element detector; IFOV (D) = θ(rad) x d<br />
Where, d= focal to object distance<br />
Charlie Chong/ Fion Zhang
<strong>Infrared</strong> optics are available in two general configurations, refractive and<br />
reflective;<br />
■<br />
Refractive optics (lenses), which are at least partly transparent to the<br />
wavelengths <strong>of</strong> interest, are used most <strong>of</strong>ten for high- temperature<br />
applications where their throughput losses can be ignored.<br />
■<br />
Reflective optics (mirrors), which are more efficient but somewhat<br />
complicate the optical path, are used more <strong>of</strong>ten for low-temperature<br />
applications, where the energy levels cannot warrant throughput energy<br />
losses.<br />
An infrared interference filter is <strong>of</strong>ten placed in front <strong>of</strong> the detector to limit the<br />
spectral region or band <strong>of</strong> the energy reaching the detector. The reasons for<br />
spectral selectivity will be discussed later in this section.<br />
Charlie Chong/ Fion Zhang
The processing electronics unit amplifies and conditions the signal from the<br />
infrared detector and introduces corrections for such factors as (1) detector<br />
ambient temperature drift and (2) target surface emissivity. Generally, a meter<br />
indicates the target temperature and an analog output is provided. The analog<br />
signal is used to record, display, alarm, control, correct, or any combination <strong>of</strong><br />
these.<br />
Figure A-14 illustrates the configuration <strong>of</strong> a typical instrument employing all<br />
<strong>of</strong> the elements outlined. The germanium lens collects the energy from a spot<br />
on the target surface and focuses it on the surface <strong>of</strong> the radiation thermopile<br />
detector. The 8.14 µm filter limits the spectral band <strong>of</strong> the energy reaching the<br />
detector so that it falls within the atmospheric window. The detector generates<br />
a dc emf proportional to the energy emitted by the target surface. The autozero<br />
amplifier senses ambient temperature changes and prevents ambient<br />
drift errors. The output electronics unit conditions the signal and computes the<br />
target surface temperature based on a manual emissivity setting. The analog<br />
output terminals accept a 15 - 30 VDC loop supply and generate a 4 - 20<br />
milliampere signal, proportional to target surface temperature.<br />
Charlie Chong/ Fion Zhang
All infrared detector-transducers exhibit some electrical change in response<br />
to the radiant energy impinging on their sensitive surfaces. Depending on the<br />
type <strong>of</strong> detector this can be (1) an impedance change, (2) a capacitance<br />
change, (3) the generation <strong>of</strong> an emf (voltage), or (4) the release <strong>of</strong> photons.<br />
Detectors are available with response times as fast as nanoseconds or as<br />
slow as fractions <strong>of</strong> seconds. Depending on the requirement, either a<br />
broadband detector or a spectrally limited detector can be selected.<br />
Keywords:<br />
Depending on the type <strong>of</strong> detector this can be<br />
(1) an impedance change, (Z) (thermal detector?)<br />
(2) a capacitance change, (C) (thermal detector?)<br />
(3) the generation <strong>of</strong> an emf (voltage), (Emf) (thermal detector?)<br />
(4) the release <strong>of</strong> photons. (E=hѵ) (photon detector?)<br />
Charlie Chong/ Fion Zhang
Sequences <strong>of</strong> Events:<br />
1. The germanium lens collects the energy from a spot on the target surface<br />
2. focuses it on the surface <strong>of</strong> the radiation thermopile detector.<br />
3. The 8.14 µm filter (pass) limits the spectral band <strong>of</strong> the energy reaching<br />
the detector so that it falls within the atmospheric window.<br />
4. The detector generates a dc emf proportional to the energy emitted by the<br />
target surface. (thermal detector)<br />
5. The auto-zero amplifier senses ambient temperature changes and<br />
prevents ambient drift errors. (electronic)<br />
6. The output electronics unit conditions the signal and computes the target<br />
surface temperature based on a manual emissivity setting. (W = εσT 4 )<br />
7. The analog output terminals accept a 15 - 30 Volt, DC loop supply and<br />
generate a 4 - 20 milliampere signal, proportional to target surface<br />
temperature.<br />
Charlie Chong/ Fion Zhang
Figure A-14 Typical <strong>Infrared</strong> Radiation Thermometer Schematic<br />
Charlie Chong/ Fion Zhang
Germanium Len<br />
Charlie Chong/ Fion Zhang
Germanium Len<br />
Charlie Chong/ Fion Zhang
Germanium Len<br />
Charlie Chong/ Fion Zhang
Thermopile Detector<br />
Charlie Chong/ Fion Zhang
Thermopile Detector<br />
Charlie Chong/ Fion Zhang
Thermopile Detector<br />
Charlie Chong/ Fion Zhang<br />
http://wanda.fiu.edu/teaching/courses/Modern_lab_manual/stefan_boltzmann.html
Thermopile Detector<br />
Charlie Chong/ Fion Zhang<br />
https://www.adafruit.com/products/2023
Thermopile Detector<br />
Charlie Chong/ Fion Zhang
Thermopile Detector<br />
Charlie Chong/ Fion Zhang<br />
https://www.adafruit.com/products/2023
Thermopile Detector<br />
Charlie Chong/ Fion Zhang<br />
https://www.adafruit.com/products/2023
Thermopile Detector<br />
The Grid-EYE 64-thermopile infrared array sensor from Panasonic adds state-<strong>of</strong>-the-art sensing technology to Avnet Abacus'<br />
passives portfolio. Based on Panasonic’s advanced MEMS technology, the 8x8 grid format infrared array sensor combines a builtin<br />
thermistor and an integrated circuit for temperature sensing in a small SMT package measuring only 11.6x4.3x8.0mm. Grid-<br />
EYE enables contactless temperature detection over the entire specified area. It can use passive infrared detection to determine<br />
temperature differentiation allowing it to detect multiple objects simultaneously. It is able to measure actual temperature and<br />
temperature gradients, providing thermal images and identifying the direction <strong>of</strong> movement <strong>of</strong> people or objects. The device’s 64<br />
pixel range yields accurate temperature sensing, within the range <strong>of</strong> -20°C to 100°C, over a viewing angle <strong>of</strong> 60° provided by a<br />
silicon lens. It uses an external I²C communication interface, enabling temperature measurement at speeds <strong>of</strong> 1 or 10 frames/s.<br />
An interrupt function is also available. The operating voltage <strong>of</strong> the device is 3.3 or 5.0V.<br />
Charlie Chong/ Fion Zhang<br />
http://www.electronics-eetimes.com/en/64-thermopile-infrared-array-sensor-available-fromavnet-abacus.html?cmp_id=7&news_id=222915463
Thermopile Detector<br />
Charlie Chong/ Fion Zhang<br />
http://www.electronics-eetimes.com/en/64-thermopile-infrared-array-sensor-available-fromavnet-abacus.html?cmp_id=7&news_id=222915463
Thermopile Detector - DR46 Thermopile Detector<br />
Features- A two-channel or a one-channel compensated thin-film thermopile in a TO-8 package. Each active area is 4mm x<br />
0.6mm. Offers high output with excellent signal-to-noise ratio. An internal aperture minimizes channel-to-channel crosstalk<br />
increasing sensitivity. Applications: Gas analysis, non-contact temperature measurement, fire detection / suppression.<br />
Charlie Chong/ Fion Zhang<br />
http://www.dexterresearch.com/?module=Page&sID=dr46
The IR Detectors<br />
<strong>Infrared</strong> detectors fall into two broad categories:<br />
■<br />
■<br />
thermal detectors, which have broad, uniform spectral responses,<br />
somewhat lower sensitivities, and slower response times (on the order <strong>of</strong><br />
milliseconds), and<br />
photodetectors, (or photon detectors), which have limited spectral<br />
responses, higher peak sensitivities, and faster response times (on the<br />
order <strong>of</strong> microseconds).<br />
Thermal detectors will generally operate at or near room temperature, while<br />
photodetectors are generally cooled to optimize performance. The mercury-<br />
Cadmium-telluride (HgCdTe) detector, for example, is a photodetector cooled<br />
to 77 K for 8.14 µm operation and to 195 K for 3.5 µm operation. Because <strong>of</strong><br />
its fast response, this detector is used extensively in high-speed scanning<br />
and imaging applications.<br />
Charlie Chong/ Fion Zhang
The radiation thermopile, on the other hand, is a broadband thermal detector<br />
operating uncooled. It is used extensively for spot measurements <strong>of</strong> cool<br />
targets. It generates a dc emf proportional to the radiant energy reaching its<br />
surface and is ideal for use in portable, battery powered instruments. Figure<br />
A-15 illustrates the spectral responses <strong>of</strong> various infrared detectors.<br />
Charlie Chong/ Fion Zhang
Figure A-15 Spectral Sensitivity <strong>of</strong> Various <strong>Infrared</strong> Detectors<br />
Charlie Chong/ Fion Zhang
Thermal Detectors & Photon Detectors<br />
Photon<br />
Detector<br />
Thermal<br />
Detector<br />
Charlie Chong/ Fion Zhang
The Mercury- Cadmium-telluride (Hgcdte) Detector,<br />
Charlie Chong/ Fion Zhang
Discussion<br />
Subject: Why there are many curves for HgCdTe.<br />
Charlie Chong/ Fion Zhang<br />
http://irassociates.com/index.php?page=hgcdte
The Mercury- Cadmium-Telluride (HgCdTe) Detector – FPA<br />
WISE Mercury Cadmium Telluride Focal Plane Mount Assembly (HgCdTe FPMA). This picture<br />
shows one <strong>of</strong> the four WISE detectors. The sensitive area shows as green and contains 1 million<br />
pixel elements.<br />
Charlie Chong/ Fion Zhang<br />
http://wise.ssl.berkeley.edu/gallery_detector.html
The Mercury- Cadmium-Telluride (HgCdTe) Detector – FPA<br />
Charlie Chong/ Fion Zhang<br />
http://spie.org/x91246.xml
The Mercury- Cadmium-Telluride (HgCdTe) Detector – FPA<br />
October 24, 2011 - All Eyes on Oldest Recorded Supernova<br />
This image combines data from four different space telescopes to create a multi-wavelength view <strong>of</strong> all that remains <strong>of</strong> the oldest documented example <strong>of</strong> a<br />
supernova, called RCW 86. The Chinese witnessed the event in 185 A.D., documenting a mysterious "guest star" that remained in the sky for eight months.<br />
X-ray images from the European Space Agency's XMM-Newton Observatory and NASA's Chandra X-ray Observatory are combined to form the blue and<br />
green colors in the image. The X-rays show the interstellar gas that has been heated to millions <strong>of</strong> degrees by the passage <strong>of</strong> the shock wave from the<br />
supernova.<br />
Charlie Chong/ Fion Zhang<br />
http://wise.ssl.berkeley.edu/gallery_detector.html
Discussion<br />
Subject: Why it wasn’t pixel-like correspond to the spatial resolution <strong>of</strong> 10 6 ?<br />
Charlie Chong/ Fion Zhang<br />
http://wise.ssl.berkeley.edu/gallery_detector.html
The Mercury- Cadmium-Telluride (HgCdTe) Detector – FPA<br />
Sept 29, 2011 - Portrait <strong>of</strong> Two Asteroids in Different Light - This animation illustrates the benefits <strong>of</strong> observing asteroids in infrared light. It begins by<br />
showing two artistic interpretations <strong>of</strong> asteroids up close. They are about the same size but the one on the right is darker. The animation zooms away to<br />
show how a visible-light telescope would see these two space rocks, located at the same distance millions <strong>of</strong> miles away from Earth, against a background<br />
<strong>of</strong> more distant stars. The one on the left would be much easier to see because it reflects more visible light from the sun. The animation then transitions to<br />
an infrared view <strong>of</strong> the same two objects. Both asteroids are equally as bright because the telescope is picking up infrared light coming from the bodies<br />
themselves, as a result <strong>of</strong> being heated by the sun. The measurements are not strongly affected by how light or dark an asteroid is, a property called albedo.<br />
Instead, the brightness is more directly related to an asteroid's size. Therefore, infrared telescopes like WISE are better at both finding the small, dark<br />
asteroids and determining asteroid sizes.<br />
Charlie Chong/ Fion Zhang<br />
http://wise.ssl.berkeley.edu/gallery_detector.html
Sept 29, 2011 - Portrait <strong>of</strong> Two Asteroids in Different Light - This animation<br />
illustrates the benefits <strong>of</strong> observing asteroids in infrared light.<br />
■<br />
http://wise.ssl.berkeley.edu/video/quicktime/V2-TwoAsteroids-HD.mov<br />
Charlie Chong/ Fion Zhang<br />
http://wise.ssl.berkeley.edu/gallery_detector.html
Point-sensing instruments for measuring very hot targets, usually operate in<br />
shorter wavelengths (0.9 - 1.1 µm, for example), and instruments for<br />
measuring cooler targets usually operate in longer wavelengths (3.5 µm or<br />
8.14 µm, for example). Most infrared thermal imagers operate in either the 3.5<br />
µm or 8.14 µm spectral region.<br />
The spectral Selectivity:<br />
■ Very hot - 0.9 - 1.1 µm<br />
■ Hot - 3.5 µm<br />
■ Cool - 8.14 µm<br />
Charlie Chong/ Fion Zhang
A.3.6 Introduction to Thermal Scanning and Imaging Instruments<br />
When problems in temperature monitoring and control cannot be solved by<br />
the measurement <strong>of</strong> one or several discrete points on a target surface, it<br />
becomes necessary to spatially scan (that is, to move the collecting beam<br />
(field <strong>of</strong> view) <strong>of</strong> the instrument relative to the target). This can be<br />
accomplished by:<br />
(1) inserting a movable optical element into the collecting beam, or<br />
(2) by employing a multi-detector array or mosaic, and scanning the array<br />
electronically. (line scanner & FPA)<br />
A brief overview <strong>of</strong> scanning and imaging instruments follows. A more<br />
detailed overview can be found in section 2.<br />
Charlie Chong/ Fion Zhang
A.3.6.1 Line Scanning<br />
The purpose <strong>of</strong> spatial scanning is to derive information concerning the<br />
distribution <strong>of</strong> radiant energy over a target scene. Quite <strong>of</strong>ten, a single straight<br />
line scanned on the target is all that is necessary to locate a critical thermal<br />
anomaly. The instantaneous position <strong>of</strong> the scanning element (or the position<br />
<strong>of</strong> the element in the linear array) is controlled or sensed, so that the<br />
radiometric output signal can be accompanied by a position signal output and<br />
be displayed on a chart recorder, an oscilloscope, or some other recording<br />
device.<br />
A typical high-speed commercial line scanner develops a high-resolution<br />
thermal map by scanning normal to the motion <strong>of</strong> a moving target, such as a<br />
paper web or a strip steel process. The resulting output is a thermal strip map<br />
<strong>of</strong> the process as it moves normal to the scan line (as illustrated in Figure A-<br />
16). The output signal information is in real-time computer compatible format<br />
and can be used to monitor, control or predict the behavior <strong>of</strong> the target.<br />
Charlie Chong/ Fion Zhang
Figure A-16 Scanning Configuration <strong>of</strong> an <strong>Infrared</strong> Line Scanner<br />
The line scanner<br />
could be a single<br />
element or linear<br />
array detector.<br />
Charlie Chong/ Fion Zhang
A.3.6.2 Two-Dimensional Scanning<br />
The purpose <strong>of</strong> spatial scanning is to derive information concerning the<br />
distribution <strong>of</strong> infrared radiant energy over a target scene. Scanning can be<br />
accomplished either opto-mechanically or electronically.<br />
Opto-mechanical scanning can be done by moving the target with the<br />
instrument fixed, or by moving (translating or panning) the instrument, but it is<br />
more practically accomplished by inserting movable optical elements into the<br />
collected beam. Although an almost infinite variety <strong>of</strong> scanning patterns can<br />
be generated using two moving elements, the most common pattern is<br />
rectilinear, and this is most <strong>of</strong>ten accomplished by two elements, each<br />
scanning a line normal to the other. A typical rectilinear scanner employs two<br />
rotating prisms behind the primary lens system (refractive scanning). An<br />
alternate configuration uses two oscillating mirrors behind the primary lens<br />
(reflective scanning). This is also commonly used in commercial scanners, as<br />
are combinations <strong>of</strong> reflective and refractive scanning elements.<br />
Charlie Chong/ Fion Zhang
Now, electronically scanned thermal imaging is accomplished by means <strong>of</strong> an<br />
infrared focal plane array (IRFPA), whereby a two-dimensional staring array<br />
<strong>of</strong> detectors collects radiant energy from the target and is digitally scanned to<br />
produce the thermogram. In the case <strong>of</strong> the line scanner (Figure A-16), the<br />
opto-mechanical scanning approach is gradually being superceded by<br />
replacement <strong>of</strong> the single-element detector with an electronically scanned<br />
linear focal plane array (a line <strong>of</strong> detectors), thus eliminating the scanning<br />
mechanism entirely. At the time <strong>of</strong> this writing, focal plane array imagers have<br />
all but completely replaced optomechanically scanned imagers in<br />
manufacturers’ inventory and product literature. Because many optomechanically<br />
scanned line scanners and imagers are still in use throughout<br />
the predictive maintenance community, the following discussion is included in<br />
this appendix.<br />
Charlie Chong/ Fion Zhang
Opto-mechanical Scanner<br />
A typical commercial rectilinear opto-mechanical scanner is shown<br />
schematically in Figure A-17. It employs two oscillating mirrors (reflective<br />
scanning) behind the primary lens and is commonly used in commercially<br />
available scanners. This approach has the advantage <strong>of</strong> a broad spectral<br />
response limited only by the spectral characteristics <strong>of</strong> the detector and the<br />
primary lens system. The main disadvantage is that the elements and their<br />
associated drive mechanisms must be arranged so that there is no optical or<br />
mechanical interference. This makes compact design more difficult. An<br />
alternate approach to scanning employs two rotating prisms behind the<br />
primary lens system. This instrument, using refractive scanning elements, has<br />
the advantage <strong>of</strong> compact design, because all <strong>of</strong> the scanning elements can<br />
be arranged in a line. It has the disadvantage <strong>of</strong> spectral limitation in that<br />
each element must transmit the entire portion <strong>of</strong> the infrared spectrum for<br />
which the instrument was designed. Some energy is absorbed by each<br />
refractive element, reducing the throughput somewhat, and the rather high<br />
cost <strong>of</strong> infrared transmitting materials add to the instrument cost. It should be<br />
pointed out that opto-mechanical scanners can employ refractive or reflective<br />
scanning elements or even combinations <strong>of</strong> both elements.<br />
Charlie Chong/ Fion Zhang
Figure A-17 Schematic <strong>of</strong> a Typical Opto-Mechanically Scanned Imager<br />
Charlie Chong/ Fion Zhang
Electronic scanning<br />
Electronic scanning involves no mechanical scanning elements.the surface is<br />
scanned electronically. The earliest type <strong>of</strong> electronically scanned thermal<br />
imager is the pyrovidicon.<br />
Pyrovidicon thermal imagers<br />
Pyrovidicon thermal imagers (pyroelectric vidicons) or thermal video<br />
systems are devices in which charge proportional to target temperature is<br />
collected on a single pyroelectric detector surface within an electronic<br />
picture tube, and scanning is accomplished by an electronic scanning<br />
beam. The pyrovidicon is a video camera tube that operates in the<br />
infrared (2.14 µm) region instead <strong>of</strong> in the visible spectrum. Electronically<br />
scanned thermal imaging systems based on pyrovidicons and operating<br />
in the 8.14 µm atmospheric window are in common use today. They<br />
provide qualitative thermal images and are classified as thermal viewers.<br />
Charlie Chong/ Fion Zhang
Focal plane array (FPA) imagers<br />
Focal plane array (FPA) imagers have, over the last decade, become the<br />
imagers <strong>of</strong> choice over opto-mechanically scanned imagers, replacing<br />
them in virtually all commercial applications. Manufacturers <strong>of</strong> FPA<br />
imagers <strong>of</strong>fer a wide choice <strong>of</strong> both cooled and uncooled detector arrays,<br />
with a wide selection <strong>of</strong> spectral ranges for both measuring (quantitative)<br />
and non-measuring (qualitative) applications. A more detailed discussion<br />
<strong>of</strong> focal plane array imagers can be found in Section 2.<br />
Published performance characteristics <strong>of</strong> currently available infrared<br />
commercial thermal imaging systems, including detailed discussions <strong>of</strong><br />
diagnostic s<strong>of</strong>tware and image recording methods, can also be found in<br />
Section 2, Table 2-1.<br />
Figure A-18 is a schematic <strong>of</strong> a typical focal plane array based thermal<br />
imager.<br />
Charlie Chong/ Fion Zhang
Figure A-18 Schematic <strong>of</strong> a Typical (Staring) FPA-Based Thermal<br />
Imager<br />
Charlie Chong/ Fion Zhang
Staring Array<br />
A staring array, staring-plane array, focal-plane array (FPA), or focal-plane is<br />
an image sensing device consisting <strong>of</strong> an array (typically rectangular) <strong>of</strong> lightsensing<br />
pixels at the focal plane <strong>of</strong> a lens. FPAs are used most commonly for<br />
imaging purposes (e.g. taking pictures or video imagery), but can also be<br />
used for non-imaging purposes such as spectrometry, LIDAR, and wave-front<br />
sensing.<br />
In radio astronomy the term "FPA" refers to an array at the focus <strong>of</strong> a radiotelescope<br />
(see full article on Focal Plane Arrays). At optical and infrared<br />
wavelengths it can refer to a variety <strong>of</strong> imaging device types, but in common<br />
usage it refers to two-dimensional devices that are sensitive in the infrared<br />
spectrum. Devices sensitive in other spectra are usually referred to by other<br />
terms, such as CCD (charge-coupled device) and CMOS image sensor in the<br />
visible spectrum. FPAs operate by detecting photons at particular<br />
wavelengths and then generating an electrical charge, voltage, or resistance<br />
in relation to the number <strong>of</strong> photons detected at each pixel. This charge,<br />
voltage, or resistance is then measured, digitized, and used to construct an<br />
image <strong>of</strong> the object, scene, or phenomenon that emitted the photons.<br />
Charlie Chong/ Fion Zhang<br />
http://military.wikia.com/wiki/Staring_arrayc
Applications for infrared FPAs include missile or related weapons guidance<br />
sensors, infrared astronomy, manufacturing inspection, thermal imaging for<br />
firefighting, medical imaging, and infrared phenomenology (such as observing<br />
combustion, weapon impact, rocket motor ignition and other events that are<br />
interesting in the infrared spectrum).<br />
Comparison To Scanning Array<br />
Staring arrays are distinct from scanning array and TDI (time-domain<br />
integration) imagers in that they image the desired field <strong>of</strong> view without<br />
scanning. Scanning arrays are constructed from linear arrays (or very narrow<br />
2-D arrays) that are rastered across the desired field <strong>of</strong> view using a rotating<br />
or oscillating mirror to construct a 2-D image over time. A TDI imager<br />
operates in similar fashion to a scanning array except that it images<br />
perpendicularly to the motion <strong>of</strong> the camera. A staring array is analogous to<br />
the film in a typical camera; it directly captures a 2-D image projected by the<br />
lens at the image plane.<br />
Charlie Chong/ Fion Zhang<br />
http://military.wikia.com/wiki/Staring_arrayc
A scanning array is analogous to piecing together a 2D image with photos<br />
taken through a narrow slit. A TDI imager is analogous to looking through a<br />
vertical slit out the side window <strong>of</strong> a moving car, and building a long,<br />
continuous image as the car passes the landscape.<br />
Scanning arrays were developed and used because <strong>of</strong> historical difficulties in<br />
fabricating 2-D arrays <strong>of</strong> sufficient size and quality for direct 2-D imaging.<br />
Modern FPAs are available with up to 2048 x 2048 pixels, and larger sizes<br />
are in development by multiple manufacturers. 320 x 256 and 640 x 480<br />
arrays are available and affordable even for non-military, non-scientific<br />
applications.<br />
Charlie Chong/ Fion Zhang<br />
http://military.wikia.com/wiki/Staring_arrayc
Staring<br />
Charlie Chong/ Fion Zhang
A.4 Performance Parameters <strong>of</strong> Thermal-Sensing<br />
Instruments<br />
To select an instrument suitable to a particular application, the thermographer<br />
needs to understand how to determine and specify its required performance.<br />
This section provides information regarding the performance parameters <strong>of</strong> (1)<br />
point-sensing instruments and (2) scanning & imaging instruments.<br />
Charlie Chong/ Fion Zhang
A.4.1 Point-Sensing Instruments<br />
For point-sensing instruments (infrared radiation thermometers), the following<br />
performance parameters should be considered:<br />
• Temperature range: The high and low limits over which the target<br />
emperature can vary<br />
• Absolute accuracy: As related to the National Institute <strong>of</strong> Standards and<br />
Technology (NIST) standard<br />
• Repeatability: How faithfully a reading is repeated for the same target<br />
• Temperature sensitivity: The smallest target temperature change that the<br />
instrument needs to detect<br />
• Speed <strong>of</strong> response: How fast the instrument responds to a temperature<br />
change at the target surface<br />
• Target spot size and working distance: The size <strong>of</strong> the spot on the target to<br />
be measured, and its distance from the instrument (FOV/IFOV)<br />
• Output requirements: How the output signal is to be used<br />
• Spectral range: The portion <strong>of</strong> the infrared spectrum over which the<br />
instrument will operate<br />
• Sensor environment: The ambient conditions under which the instrument<br />
will operate<br />
Charlie Chong/ Fion Zhang
Temperature range and absolute accuracy will always be interrelated; for<br />
example, the instrument might be expected to measure a range <strong>of</strong><br />
temperatures from 0 to 200°C with an absolute accuracy ± 2°C over the<br />
entire range. This could alternately be specified as ± 1% absolute accuracy<br />
over full scale. On the other hand, we might require the best accuracy at<br />
some specific temperature, say 100°C. In this case, the manufacturer should<br />
be so informed. The instrument can then be calibrated to exactly match the<br />
manufacturer’s laboratory calibration standard at that temperature.<br />
It is difficult for a manufacturer to comply with a tight specification for absolute<br />
accuracy because absolute accuracy is based on traceability to the National<br />
Institute <strong>of</strong> Standards and Technology (NIST) standard. An absolute accuracy<br />
<strong>of</strong> ±0.5°C ± 1% <strong>of</strong> full scale is about as tight as can be reasonably specified.<br />
Repeatability, on the other hand, can be more easily assured by the<br />
manufacturer, and is usually more important to the user.<br />
Charlie Chong/ Fion Zhang
Temperature sensitivity is also called thermal resolution (≠ spatial resolution)<br />
or noise equivalent temperature difference. It is the smallest temperature<br />
change at the target surface that must be clearly sensed at the output <strong>of</strong> the<br />
instrument. This is almost always closely associated with the cost <strong>of</strong> the<br />
instrument, so unnecessarily fine temperature sensitivity should not be<br />
specified.<br />
An important rule to remember is that, for any given instrument, target<br />
sensitivity will improve for hotter targets where there is more energy available<br />
for the instrument to measure. We should specify temperature sensitivity,<br />
therefore, at a particular target temperature, and this should be near the low<br />
end <strong>of</strong> the range <strong>of</strong> interest. We might, for example, specify temperature<br />
sensitivity to be 0.25°C at a target temperature <strong>of</strong> 25°C, and be confident that<br />
the sensitivity <strong>of</strong> the instrument will be at least that for targets hotter than<br />
25°C.<br />
Keywords<br />
Temperature sensitivity is also called thermal resolution or noise equivalent<br />
temperature difference (NETD).<br />
Charlie Chong/ Fion Zhang
EXAM score!<br />
Temperature sensitivity is also<br />
called thermal resolution or<br />
noise equivalent temperature<br />
difference (NETD).<br />
for my ASNT exam<br />
Charlie Chong/ Fion Zhang
EXAM score!<br />
thermal resolution<br />
(≠ spatial resolution)<br />
for my ASNT exam<br />
Charlie Chong/ Fion Zhang
NETD - Noise Equivalent Temperature Difference<br />
Noise Equivalent Temperature Difference is used to measure the<br />
performance <strong>of</strong> a infrared cameras ability discern the minimum level <strong>of</strong><br />
thermal sensitivity and is very similar to the MRTD with the exception that the<br />
test is based on the output <strong>of</strong> the detector only, without taking into<br />
consideration the performance <strong>of</strong> the infrared cameras image as it would be<br />
displayed to a thermographer. The results are usually expressed as the<br />
NETD. A common specification for an IR cameras NETD is 0.02 deg. C at 30<br />
deg. C.<br />
MRTD - Minimum Resolvable Temperature Difference<br />
Minimum Resolvable Temperature Difference is a test developed by the<br />
Department <strong>of</strong> Defense (ASTM Standard E1213) and used to measure the<br />
performance <strong>of</strong> a infrared cameras ability discern the minimum level <strong>of</strong><br />
thermal sensitivity that a operator <strong>of</strong> the camera can see. The test involves<br />
selecting the smallest test pattern (4 bars with a 7:1 length to width aspect<br />
ratio) that can be clearly distinguished by the operator as viewed on a display.<br />
Charlie Chong/ Fion Zhang<br />
http://www.prothermographer.com/training/IRBasics/qualitative_thermography/mrtd<br />
_minimum_resolvable_temperature_difference.htm
NETD - Noise Equivalent Temperature Difference<br />
NETD is used to measure the performance <strong>of</strong> a infrared cameras ability<br />
discern the minimum level <strong>of</strong> thermal sensitivity and is very similar to the<br />
MRTD with the exception that the test is based on the output <strong>of</strong> the detector<br />
only, without taking into consideration the performance <strong>of</strong> the infrared<br />
cameras image as it would be displayed to a thermographer. The results are<br />
usually expressed as the NETD. A common specification for an IR cameras<br />
NETD is 0.02 deg. C at 30 deg. C.<br />
MRTD - Minimum Resolvable Temperature Difference<br />
METD is a test developed by the Department <strong>of</strong> Defense (ASTM Standard<br />
E1213) and used to measure the performance <strong>of</strong> a infrared cameras ability<br />
discern the minimum level <strong>of</strong> thermal sensitivity that a operator <strong>of</strong> the camera<br />
can see. The test involves selecting the smallest test pattern (4 bars with a<br />
7:1 length to width aspect ratio) that can be clearly distinguished by the<br />
operator as viewed on a display.<br />
Charlie Chong/ Fion Zhang<br />
http://www.prothermographer.com/training/IRBasics/qualitative_thermography/mrtd<br />
_minimum_resolvable_temperature_difference.htm
Speed <strong>of</strong> response is generally defined as the time it takes the instrument<br />
output to respond to 95% <strong>of</strong> a step change at the target surface.<br />
Figure A-19 shows this graphically. Note that the sensor time constant is<br />
defined by convention to be the time required to reach 63% <strong>of</strong> a step change<br />
at the target surface. Instrument speed <strong>of</strong> response is about 5 time constants,<br />
and is generally limited by the detector used. As previously discussed, this<br />
limit is on the order <strong>of</strong> microseconds for photodetectors and milliseconds for<br />
thermal detectors. There is, however, a trade<strong>of</strong>f between speed <strong>of</strong> response<br />
and temperature sensitivity. As in all instrumentation systems, as the speed <strong>of</strong><br />
response becomes faster (wider information bandwidth), the sensitivity<br />
becomes poorer (lower signal-to-noise ratio). We learn from this that the<br />
speed <strong>of</strong> response should not be over-specified.<br />
Keywords:<br />
■ 63%<br />
■ 95%<br />
Charlie Chong/ Fion Zhang
Figure A-19 Instrument Speed <strong>of</strong> Response and Time Constant<br />
Charlie Chong/ Fion Zhang
Target spot size (also called spatial resolution) and working distance can be<br />
specified as just that (1 cm at 1 meter, for example), or we can put it in more<br />
general terms such as field <strong>of</strong> view angle (10 milliradians, 1 degree, 2<br />
degrees) or a field <strong>of</strong> view (spot size-to -working distance) ratio (D/15, D/30,<br />
D/75). A D/15 ratio means that the instrument measures the emitted energy <strong>of</strong><br />
a spot one-fifteenth the size <strong>of</strong> the working distance (3 cm at 45 cm, for<br />
example).<br />
Figure A-20 illustrates the fields <strong>of</strong> view for several instruments and how an<br />
instrument can be selected based on the spot size and working distance<br />
required. An examination <strong>of</strong> the collecting beams <strong>of</strong> the instruments shown<br />
also shows that, at very close working distances, this simple ratio does not<br />
always apply. If close-up information is not clearly provided in the product<br />
literature, the instrument manufacturer should be consulted. For quick<br />
reference, a method <strong>of</strong> approximating spot size based on manufacturerrovided<br />
information is illustrated in Appendix C, Plate 2.<br />
Charlie Chong/ Fion Zhang
Figure A-20 Fields <strong>of</strong> View <strong>of</strong> <strong>Infrared</strong> Radiation Thermometers<br />
Charlie Chong/ Fion Zhang
Figure A-20 Fields <strong>of</strong> View <strong>of</strong> <strong>Infrared</strong> Radiation Thermometers<br />
Charlie Chong/ Fion Zhang
Figure A-20 Fields <strong>of</strong> View <strong>of</strong> <strong>Infrared</strong> Radiation Thermometers<br />
Charlie Chong/ Fion Zhang
Figure A-20 Fields <strong>of</strong> View <strong>of</strong> <strong>Infrared</strong> Radiation Thermometers<br />
An examination <strong>of</strong> the collecting<br />
beams <strong>of</strong> the instruments shown also<br />
shows that, at very close working<br />
distances, this simple ratio does not<br />
always apply. If close-up information<br />
is not clearly provided in the product<br />
literature, the instrument<br />
manufacturer should be consulted.<br />
Charlie Chong/ Fion Zhang
The output requirements are totally dependent on the user’s needs. If a<br />
readout indicator is required, a wide selection is usually <strong>of</strong>fered. An analog<br />
output suitable for recording, monitoring, and control is commonly provided. In<br />
addition, most manufacturers <strong>of</strong>fer a broad selection <strong>of</strong> output functions<br />
including digital (BCD coded) outputs, high, low, and proportional set-points,<br />
signal peak or valley sensors, sample and hold circuits, and even closed-loop<br />
controls for specific applications. Many currently available instruments, even<br />
portable hand-held units, include microprocessors that provide many <strong>of</strong> the<br />
above functions on standard models.<br />
Charlie Chong/ Fion Zhang
As previously noted, the operating spectral range <strong>of</strong> the instrument is <strong>of</strong>ten<br />
critical to its performance. For cooler targets, up to about 500°C, most<br />
manufacturers <strong>of</strong>fer instruments operating in the 8.14 µm atmospheric<br />
window. For hotter targets, shorter operating wavelengths are selected,<br />
usually shorter than 3 µm.<br />
One reason for choosing shorter wavelengths is that this enables<br />
manufacturers to use commonly available and less expensive quartz and<br />
glass optics, which have the added benefit <strong>of</strong> being visibly transparent for<br />
more convenient aiming and sighting. Another reason is that estimating<br />
effective emissivity incorrectly will result in smaller temperature errors when<br />
measurements are made at shorter wavelengths. A good general rule to<br />
follow, particularly when dealing with targets <strong>of</strong> low or uncertain effective<br />
emissivities, is to work at the shortest wavelengths possible without<br />
compromising sensitivity or risking susceptibility to reflections from visible<br />
energy sources.<br />
Charlie Chong/ Fion Zhang
Spectrally selective instruments employ interference filters to allow only a<br />
very specific broad or narrow band <strong>of</strong> wavelengths to reach the detector. (A<br />
combination <strong>of</strong> a spectrally selective detector and a filter can also be used.)<br />
This can make the instrument highly selective to a specific material whose<br />
temperature is to be measured in the presence <strong>of</strong> an intervening medium or<br />
an interfering background. For example, for measuring the temperature <strong>of</strong><br />
objects from 200°C to 1000°C inside a heating chamber with a glass port, or<br />
inside a glass bell jar, an instrument operating in the 1.5 to 2.5 µm band will<br />
see through the glass and make the measurement easily. A very important<br />
generic example <strong>of</strong> the need for spectral selectivity is in the measurement <strong>of</strong><br />
plastics in the process <strong>of</strong> being formed into films and other configurations.<br />
Keywords:<br />
interference filters<br />
Charlie Chong/ Fion Zhang
Thin films <strong>of</strong> many plastics are virtually transparent to most infrared<br />
wavelengths but do emit at certain wavelengths. Polyethylene, polypropylene,<br />
and other related materials, for example, have a very strong, though narrow,<br />
absorption band at 3.45 µm. Polyethylene film is formed at about 200°C in the<br />
presence <strong>of</strong> heaters that are at about 700°C.<br />
Figure A-21 shows the transmission spectra <strong>of</strong> 1.5- mil thick polyethylene film<br />
and the narrow absorption band at 3.45 µm. The instrument selected for<br />
measuring the surface <strong>of</strong> the film has a broadband thermal detector and a<br />
3.45 µm spike band pass filter. The filter makes the instrument blind to all<br />
energy outside <strong>of</strong> 3.45 µm, and enables it to measure the temperature <strong>of</strong> the<br />
surface <strong>of</strong> the plastic film without seeing through the film to the heaters.<br />
Charlie Chong/ Fion Zhang
Figure A-21 Spectral Filtering for Polyethylene Temperature<br />
Measurement<br />
Charlie Chong/ Fion Zhang
The object is opaque to 3.45 µm radiation, by using 3.45 µm pass filter, only<br />
the object’s 3.45 µm is monitored, all other bandwidth from the object or<br />
transmitted from the process hot roller are filtered <strong>of</strong>f.<br />
3.45 µm pass filter<br />
Charlie Chong/ Fion Zhang
Figure A-22 shows a similar solution for 0.5-mil thick polyester (Mylar) film<br />
under about the same temperature conditions. Here, the strong polyester<br />
absorption band, from 7.7 to 8.2 µm, dictates the use <strong>of</strong> a 7.9 µm spike filter<br />
placed in front <strong>of</strong> the same broadband detector.<br />
Charlie Chong/ Fion Zhang
Figure A-22 Spectral Filtering for Polyester Temperature Measurement<br />
Charlie Chong/ Fion Zhang
A.4.2 Scanners and Imagers.Qualitative and Quantitative<br />
The parameters used for assessing the performance <strong>of</strong> infrared thermal<br />
imaging scanners are complex and the methods used for testing performance<br />
have generated some controversy among manufacturers and users <strong>of</strong> these<br />
instruments. A thermal image is made up <strong>of</strong> a great number <strong>of</strong> discrete point<br />
measurements, however, many <strong>of</strong> the performance parameters <strong>of</strong> infrared<br />
thermal imagers are the same as those <strong>of</strong> radiation thermometers (pointsensing<br />
infrared radiometers that read out in temperature). Others derive from,<br />
or are extensions <strong>of</strong>, radiation thermometer performance parameters.<br />
Qualitative (non-measuring) thermal imagers, also called thermal viewers,<br />
differ from quantitative (measuring) thermal imagers, also called imaging<br />
radiometers, in that thermal viewers do not provide temperature or thermal<br />
energy measurements.<br />
It should be noted, therefore, that for users requiring qualitative rather than<br />
quantitative thermal images, many <strong>of</strong> the parameters discussed herein are <strong>of</strong><br />
no importance.<br />
Charlie Chong/ Fion Zhang
A.4.3 Performance Parameters <strong>of</strong> Imaging Radiometers<br />
The Environmental Research Institute, Michigan (ERIM) <strong>Infrared</strong> Handbook<br />
[13] provides an extensive table <strong>of</strong> terms and definitions (section 19.1.2) and<br />
a list <strong>of</strong> specimen specifications (section 19.4.1). The section <strong>of</strong> the<br />
Handbook covering infrared imaging systems does not, however, deal with<br />
the imager as a quantitative measurement instrument, and so the<br />
performance parameters related with temperature measurement need to be<br />
added. Some simplifications can be made, which result in some acceptable<br />
approximations. Bearing these qualifications in mind, the following definitions<br />
<strong>of</strong> the key performance parameters <strong>of</strong> infrared thermal scanners are <strong>of</strong>fered:<br />
Charlie Chong/ Fion Zhang
• Total field <strong>of</strong> view (TFOV): the image size, in terms <strong>of</strong> scanning angle.<br />
(example: TFOV = 20°V x 30°H)<br />
• Instantaneous field <strong>of</strong> view (IFOV): the angular projection <strong>of</strong> the detector<br />
element at the target plane; imaging spatial resolution. (example: IFOV= 2<br />
milliradians )<br />
• Measurement spatial resolution (IFOVmeas): the spatial resolution<br />
describing the minimum target spot size on which an accurate temperature<br />
measurement can be made. (example: IFOVmeas = 5 milliradians)<br />
• Frame repetition rate: The number <strong>of</strong> times every point on the target is<br />
scanned in one second. (example: Frame rate = 30 /second)<br />
• Minimum resolvable temperature (MRT) (NETD? / MRDT?) : The smallest<br />
blackbody equivalent target temperature difference that can be observed;<br />
temperature sensitivity (example: MRT=0.1°C @ 30°C target temperature)<br />
Charlie Chong/ Fion Zhang
Minimum resolvable temperature MRT<br />
MRT and the terms relating to spatial resolution are interrelated and cannot<br />
be considered independently. (unlike the point sensing: IR thermometer)<br />
Other parameters, such as spectral ranges, target temperature ranges,<br />
accuracy and repeatability, and focusing distances, are essentially the same<br />
as those defined previously for infrared radiation thermometers, although they<br />
can be expressed differently. Dynamic range and reference level range, for<br />
example, are the terms that define the target temperature ranges for thermal<br />
imagers. While the operating spectral range <strong>of</strong> a radiation thermometer is<br />
<strong>of</strong>ten critical to its performance, the spectral range <strong>of</strong> operation <strong>of</strong> a thermal<br />
imager is not usually as critical to the user, except for a few specialized<br />
applications. Most commercial thermal imagers operate in either the 2.5 µm<br />
or the 8.12 µm atmospheric window, depending on the manufacturer’s choice<br />
<strong>of</strong> detector. Filter wheels or slides are usually available to enable users to<br />
insert special interference filters and perform spectrally selective<br />
measurements when necessary.<br />
Charlie Chong/ Fion Zhang
Despite some manufacturers’ claims to the contrary, there is usually little<br />
difference in overall performance between an imager operating in the 2.5 µm<br />
band and an imager operating in the 8.12 µm band, all other parameters<br />
being equal.<br />
For a specific application, however, there might be a clear choice. One<br />
example <strong>of</strong> this would be selecting an imager operating in the 2 .5 µm band to<br />
observe a target through a quartz window. There would be no alternative<br />
because quartz is virtually opaque in the 8.12 µm region. Another example<br />
would be selecting an imager operating in the 8.12 µm band to observe a cool<br />
target through a long atmospheric path. The choice would be obvious<br />
because long-path atmospheric absorption is substantially greater in the 2.5<br />
µm window than in the 8.12 µm window.<br />
Charlie Chong/ Fion Zhang
For qualitative (non measuring) thermal viewers, parameters relating to<br />
temperature range are only applicable in the broadest sense. Absolute<br />
accuracy and stability parameters are not applicable. MRT is applicable only<br />
as an approximation because stability cannot be assured. IFOV meas is not<br />
applicable.<br />
Secondary features, such as field uniformity and spatial distortion, are design<br />
parameters and are assumed to be handled by responsible manufacturers. A<br />
discussion <strong>of</strong> the significant performance parameters (figures <strong>of</strong> merit) follows.<br />
Charlie Chong/ Fion Zhang
A.4.3.1 Temperature Sensitivity, Minimum Resolvable Temperature<br />
Difference<br />
(MRTD) or Minimum Resolvable Temperature (MRT) Temperature sensitivity,<br />
also called thermal resolution or noise equivalent temperature difference<br />
(NETD) for a radiation thermometer, is the smallest temperature change at<br />
the target surface and can be clearly sensed at the output <strong>of</strong> the instrument.<br />
For an imaging system, the MRT or MRTD defines temperature sensitivity but<br />
also implies spatial resolution (IFOV). MRTD is expressed as a function <strong>of</strong><br />
angular spatial frequency. Testing for MRTD is usually accomplished by<br />
means <strong>of</strong> a subjective procedure developed by the Department <strong>of</strong> Defense<br />
community.<br />
Keywords:<br />
■ the MRT or MRTD defines temperature sensitivity but also implies spatial<br />
resolution (IFOV) (for 2D thermography; both thermal viewer & thermal<br />
radiometric imaging) .<br />
■ MRTD is expressed as a function <strong>of</strong> angular spatial frequency. (?)<br />
Charlie Chong/ Fion Zhang
This involves selecting the smallest (highest frequency) standard periodic test<br />
pattern (four bars, 7:1 length-to-width aspect ratio) that can be distinguished<br />
as a 4 bar contrast target by the observer, and recording the smallest<br />
detectable element-to-element temperature difference between two<br />
blackbody elements on this pattern. Unlimited viewing time and optimization<br />
<strong>of</strong> controls is allowed and the target is oriented with the bars normal to the<br />
horizontal scan line.<br />
Figure A-23 illustrates the setup using an ambient pattern and a heated<br />
background. The MRTD curve shown is a function <strong>of</strong> spatial frequency<br />
(cycles/mRad). Additional points on the curve are achieved by changing the<br />
pattern size or the distance to the scanner.<br />
Charlie Chong/ Fion Zhang
Figure A-23 Test Setup for MRTD Measurement, MRTD Curve<br />
heated background<br />
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang
A.4.3.2 Spot Size (FOV) , Instantaneous Field <strong>of</strong> View (IFOV), Imaging<br />
Spatial Resolution (?) , Measurement Spatial Resolution (IFOVmeas)<br />
For thermal imagers, the instantaneous field <strong>of</strong> view (IFOV) expresses spatial<br />
resolution for imaging purposes but not for measurement purposes.<br />
Measurement instantaneous field <strong>of</strong> view (IFOVmeas) expresses spatial<br />
resolution for measurement purposes.<br />
The modulation transfer function (MTF) is a measure <strong>of</strong> imaging spatial<br />
resolution. Modulation is a measure <strong>of</strong> radiance contrast and is expressed:<br />
Modulation = (L max -L min ) / (L max + L min )<br />
L = luminosity?<br />
Modulation transfer is the ratio <strong>of</strong> the modulation in the observed image to<br />
that in the actual object.<br />
Charlie Chong/ Fion Zhang
For any system, MTF will vary with scan angle and background, and will <strong>of</strong>ten<br />
be different when measured along the horizontal than it is when measured<br />
along the vertical.<br />
For this reason, a methodology was established and accepted by<br />
manufacturers and users alike to measure the MTF <strong>of</strong> an imager and, thereby,<br />
to verify the spatial resolution for imaging (night vision) purposes. A sample<br />
procedure follows for a system where IFOV is specified at 2.0 milliradians.<br />
This is shown in Figure A-24 and uses the same setup as illustrated in Figure<br />
A-23:<br />
Charlie Chong/ Fion Zhang
■<br />
A standard 4 bar (slit) resolution target (7:1 aspect ratio) with a 2-mm slit<br />
width is placed in front <strong>of</strong> a heated blackbody reference surface at a<br />
distance <strong>of</strong> 1 meter from the primary optic <strong>of</strong> the instrument. The ratio <strong>of</strong><br />
the 2-mm slit width to the 1-meter working distance is 2 milliradians). The<br />
target is centered in the scanned field (oriented so that the horizontal axis<br />
is normal to the slit), and a single line scan output signal is monitored.<br />
The analog signal value <strong>of</strong> the 4 peaks (Vmax), as the slits are scanned,<br />
and the analog signal value <strong>of</strong> the 3 valleys (Vmin), are recorded using<br />
the bar target surface ambient temperature as a base reference. The<br />
MTF is expressed as a ratio equal to (Vmax -Vmin) / (Vmax + Vmin). If<br />
this ratio is at least 0.35, the 2 milliradian IFOV is verified.<br />
There are some disagreements among users and manufacturers regarding<br />
the acceptable minimum value <strong>of</strong> MTF to verify imaging spatial resolution,<br />
with values varying between 0.35 and 0.5, depending on the manufacturer<br />
and the purpose <strong>of</strong> the instrument. For most users, a tested value <strong>of</strong> MTF,<br />
equal to or greater than 0.35 for a slit width representing a specified spatial<br />
resolution is generally considered sufficient to demonstrate that spatial<br />
resolution for imaging purposes.<br />
Charlie Chong/ Fion Zhang
Figure A-24 Modulation Transfer Function, Imager Spatial Resolution<br />
Charlie Chong/ Fion Zhang
Both MRTD and MTF are functions <strong>of</strong> spatial frequency for any given system.<br />
This is illustrated in Figure A-25, reprinted from J.M. Lloyd, Thermal Imaging<br />
Systems [14], for a typical system rated by the manufacturer to be 1<br />
milliradian. The cut-<strong>of</strong>f frequency is where the IFOV equals 1 cycle (one bar<br />
and one slit) so that the intersection <strong>of</strong> the two curves at the half-cut-<strong>of</strong>f<br />
frequency represents the actual performance <strong>of</strong> the system for an MRTD <strong>of</strong><br />
1°C. MTF is seen to be about 0.22 for this system.<br />
Charlie Chong/ Fion Zhang
Figure A-25 MRTD and MTF for a System Rated at 1.0 Milliradian<br />
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang
For measurement purposes, <strong>of</strong> course the slit width should, ideally, be<br />
increased until the modulation reaches unity. For this reason the MTF method<br />
was found to be unsatisfactory for commercial thermal imagers where<br />
quantitative temperature measurement and control are <strong>of</strong>ten necessary.<br />
Another procedure, called the Slit Response Function (SRF), was developed<br />
for this purpose and is generally accepted for measuring IFOVmeas. In this<br />
method, illustrated in Figure A-26, a single variable slit is placed in front <strong>of</strong> a<br />
blackbody source and the slit width is varied until the resultant single-line- can<br />
signal approaches the signal <strong>of</strong> the blackbody reference. Because there are<br />
other errors in the optics, the 100% level <strong>of</strong> SRF is approached rather slowly,<br />
as shown in the curve <strong>of</strong> Figure A-26. The slit width at which the SRF<br />
reaches 0.9, divided by the distance to the slit (W/d), is usually accepted<br />
as the IFOVmeas <strong>of</strong> the instrument under test. Figures A-23 and A-26 are<br />
adapted from the Ohman paper, .Measurement Versus Imaging in<br />
<strong>Thermography</strong>. [15], which provides a detailed description <strong>of</strong> the Slit<br />
Response Method, setup diagrams, and a discussion <strong>of</strong> imaging and<br />
measurement spatial resolution figures <strong>of</strong> merit. The step-by-step procedure<br />
for measuring SRF is described in detail in Appendix C, Plate 6.<br />
Charlie Chong/ Fion Zhang
IFOVmeas: The slit width at which the SRF reaches 0.9, divided by the<br />
distance to the slit (W/d), is usually accepted as the IFOVmeas <strong>of</strong> the<br />
instrument under test.<br />
for IFOV or IFOV geometric :<br />
D = σ∙d, σ (IFOV) = D / d<br />
σ<br />
D<br />
d<br />
for IFOV meas = D meas /d<br />
σ<br />
D meas<br />
d<br />
Charlie Chong/ Fion Zhang
Figure A-26 Setup and Curves for Slit Response Function Test<br />
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang
Note: Because FPA imagers have all but replaced opto-mechanically<br />
scanned imagers, many experienced thermographers suggest that the SRF<br />
measurement procedure be performed in both the horizontal and vertical<br />
scan-line direction. The larger <strong>of</strong> the two results is then accepted as the<br />
IFOV meas <strong>of</strong> the imager under test.<br />
Charlie Chong/ Fion Zhang
FPA<br />
Charlie Chong/ Fion Zhang<br />
http://spie.org/x34358.xml
FPA<br />
Charlie Chong/ Fion Zhang
FPA<br />
Charlie Chong/ Fion Zhang
FPA<br />
Charlie Chong/ Fion Zhang
A.4.3.3 Speed <strong>of</strong> Response and Frame Repetition Rate<br />
Speed <strong>of</strong> response <strong>of</strong> a radiation thermometer is generally defined as the time<br />
it takes the instrument output to respond to 95% <strong>of</strong> a step change at the<br />
target surface (about 5 time constants). This parameter is not applicable to<br />
thermal imagers. Frame repetition rate is the measure <strong>of</strong> the data update <strong>of</strong> a<br />
thermal imager. This is not the same as field repetition rate. (Manufacturers<br />
might use fast field rates with not all <strong>of</strong> the picture elements included in any<br />
one scan, and then interlace the fields so that it takes multiple fields to<br />
complete a full frame. This might produce a more flicker-free image and be<br />
more pleasing to the eye than scanning full data frames at a slower rate.<br />
Frame repetition rate is the number <strong>of</strong> times per second every picture element<br />
is scanned.<br />
Charlie Chong/ Fion Zhang
Figure A-19 Instrument Speed <strong>of</strong> Response and Time Constant<br />
Charlie Chong/ Fion Zhang
A.4.4 Thermal Imaging S<strong>of</strong>tware<br />
In order to optimize the effectiveness <strong>of</strong> thermography measurement<br />
programs, the thermographer needs a basic understanding <strong>of</strong> thermal image<br />
processing techniques. The following is a broad discussion <strong>of</strong> thermal image<br />
processing and diagnostics. A detailed description <strong>of</strong> thermal imaging and<br />
diagnostic s<strong>of</strong>tware currently available from manufacturers is provided in<br />
section 2.<br />
Thermal imaging s<strong>of</strong>tware can be categorized into the following groupings:<br />
• Quantitative thermal measurements <strong>of</strong> targets<br />
• Detailed processing and image diagnostics<br />
• Image recording, storage, and recovery<br />
• Image comparison<br />
• Archiving and database*<br />
*Although data and image database development is not an exclusive<br />
characteristic <strong>of</strong> thermal imaging s<strong>of</strong>tware, it should be considered an<br />
important part <strong>of</strong> the thermographer’s tool kit.<br />
Charlie Chong/ Fion Zhang
With the introduction <strong>of</strong> computer-assisted thermal image storage and<br />
processing, thermography has become a far more exact science, and the<br />
ability to perform image analysis and trend analysis has greatly expanded its<br />
reach. Innovative s<strong>of</strong>tware has been tailored specifically for detailed image<br />
and thermal data analysis, and has been rapidly updated and expanded.<br />
Most s<strong>of</strong>tware packages for thermography image analysis and diagnostics<br />
<strong>of</strong>fer a number <strong>of</strong> standard features. These include spot temperature readout,<br />
multiple X and Y analog traces, monochrome and multiple-color scale<br />
selection, image shift, rotation and magnification, area analysis with<br />
histogram display, image averaging and filtering, and permanent disk storage<br />
and retrieval. Some <strong>of</strong> these capabilities are <strong>of</strong>fered as part <strong>of</strong> the basic<br />
instrument and some are found in a diagnostics package <strong>of</strong>fered separately.<br />
Charlie Chong/ Fion Zhang
The newest field-portable instruments allow the thermographer to store<br />
images to disc (or data card) during field measurements, and perform detailed<br />
image analysis upon return to home base (see Section 2 for details). The<br />
ability to perform differential thermography is a most powerful feature <strong>of</strong><br />
thermographic s<strong>of</strong>tware routines. This is the capability for archiving thermal<br />
images <strong>of</strong> acceptable operating components, and assemblies and<br />
mechanisms, and using these stored images as models for comparison to<br />
subsequently inspected items. Subtractive routines produce differential<br />
images, illustrating the deviation <strong>of</strong> each pixel (picture element) from its<br />
corresponding model.<br />
Another powerful routine that was recently introduced is an emissivity<br />
determination and correction program, which produces true surfacetemperature<br />
thermograms <strong>of</strong> microelectronic devices and other very small<br />
targets.<br />
Keywords:<br />
Subtractive routines<br />
Charlie Chong/ Fion Zhang
To perform this function, the unpowered device is heated sequentially to two<br />
known low-level temperatures, and the stored thermal images are used to<br />
allow the computer to calculate emissivity <strong>of</strong> each pixel. The device is then<br />
powered and the image produced is corrected, point by point, for the<br />
emissivities previously computed. There is great interest in applying this<br />
spatial emissivity correction to larger targets such as circuit cards. The<br />
difficulty in developing a reliable emissivity matrix lies in achieving tight<br />
control over the temperature and temperature uniformity while heating a<br />
target <strong>of</strong> this size.<br />
For the pr<strong>of</strong>essional thermographer, the maintenance <strong>of</strong> an historical<br />
database is most critical, and thermography s<strong>of</strong>tware allows this to be done<br />
systematically. The historical data included with stored images (time, date,<br />
location, ambient conditions, distance to target, estimated effective emissivity,<br />
scanner serial number, and additional stored comments) serve as important<br />
inputs and subsequent backup for the written report. New s<strong>of</strong>tware to aid the<br />
thermographer in the efficient and rapid preparation <strong>of</strong> pr<strong>of</strong>essional looking<br />
reports is also available from most manufacturers <strong>of</strong> thermal imagers (see<br />
Section 2).<br />
Charlie Chong/ Fion Zhang
Appendix B<br />
Measuring Emissivity, Reflectance & Transmittance<br />
Charlie Chong/ Fion Zhang
B.1 Introduction<br />
An infrared radiometer measures the sum <strong>of</strong> the emitted (We), reflected (Wr),<br />
and transmitted (Wt) energies coming from the target <strong>of</strong> interest. Figure B-1<br />
(repeated from Appendix A, Figure A-8) demonstrates this graphically. The<br />
sum <strong>of</strong> We + Wr + Wt is called Exitance or Radiosity. To determine the<br />
temperature <strong>of</strong> the target, the emitted energy must first be subtracted from the<br />
reflected and transmitted energies. This value must then be corrected to<br />
account for the emissivity <strong>of</strong> the target and to obtain a blackbody equivalent<br />
value. The blackbody equivalent value is then converted to temperature by<br />
referencing a calibration curve. All <strong>of</strong> the techniques discussed below for<br />
measuring emissivity, reflectance, and transmittance assume that the user<br />
has a thermal imager. Also note that the values for emissivity, reflectance,<br />
and transmittance are valid only for the spectral range <strong>of</strong> that instrument.<br />
Charlie Chong/ Fion Zhang
Figure B-1 Target Radiosity<br />
Charlie Chong/ Fion Zhang
B.2 Measuring Emissivity<br />
There are several common techniques for the measurement <strong>of</strong> emissivity<br />
using a single band radiometer, two <strong>of</strong> which are illustrated below.<br />
■ The first technique, known as the reference emitter technique, is<br />
accomplished by direct comparison with a known emitter at the same<br />
temperature.<br />
■ The second technique, known as the reflective emissivity technique, is<br />
accomplished by calculating emissivity indirectly using measured values <strong>of</strong><br />
reflectance (and transmittance if applicable).<br />
Charlie Chong/ Fion Zhang
The reference emitter technique works well when the target is at a different<br />
temperature than the background, such as in the case <strong>of</strong> a steam inlet valve<br />
whose body is at system operating temperature, while the applied emissivity<br />
reference is at the same temperature as the target.<br />
The reflective emissivity technique works well for smooth surfaces such as an<br />
electrical connection. The reflective emissivity technique is independent <strong>of</strong><br />
target temperature, although the temperature <strong>of</strong> the target must remain<br />
constant throughout the measurement.<br />
A third, field-type method for estimating the effective emissivity <strong>of</strong> a specific<br />
target under specific conditions, is described in Section 3.3.3 and is illustrated<br />
in Appendix C, Plate 5.<br />
Charlie Chong/ Fion Zhang
B.2.1 Reference Emitter Technique<br />
The reference emitter technique assumes both that the transmittance through<br />
the target is zero, and that a constant temperature difference between the<br />
target and the background is maintained. Ideally, this temperature difference,<br />
either hotter or colder, should be in the range <strong>of</strong> at least 15°F to 25°F. If the<br />
target is colder than the background, it should be above the dew point so that<br />
condensation on the surface <strong>of</strong> the target cannot occur.<br />
The reference emitter technique will only work if a reference emitter is applied<br />
to the surface <strong>of</strong> the target.<br />
Good reference emitters (E) are foot-powder, dye check developer, or black<br />
electrician’s tape, as previously discussed in sections 4.1.2 through 4.1.4.<br />
The procedure for determining the effective emissivity <strong>of</strong> a target using the<br />
reference emitter is as follows (refer to Figure B-2):<br />
Charlie Chong/ Fion Zhang
1. Apply the reference emitter (E) to a portion <strong>of</strong> the target (an area <strong>of</strong> at least<br />
one square inch is normally adequate).<br />
2. Set the imager to measure isotherm units.<br />
3. Measure the background thermal level (B) adjacent to the target. Do this<br />
by placing a piece <strong>of</strong> cardboard to which is applied a crumpled, flattened<br />
piece <strong>of</strong> aluminum foil. Take this measurement over a large area <strong>of</strong> the foil.<br />
(An area <strong>of</strong> at least one square foot is normally adequate.)<br />
4. Measure the target thermal level (T).<br />
5. Measure the reference emitter level (R). The reference emitter must be in<br />
thermal equilibrium with the target. This thermal equilibrium condition will<br />
be apparent when the reference emitter thermal level is not changing. (In<br />
the case <strong>of</strong> dye check developer, its application cools the surface as the<br />
propellant evaporates. Wait at least 15 minutes after application unless the<br />
target is very warm.)<br />
6. Calculate the emissivity by using the equation: Emissivity=(T-B)/(R-B)<br />
7. Measure the emissivity several times. Determine the final value by taking<br />
an average <strong>of</strong> all measured emissivity values.<br />
Charlie Chong/ Fion Zhang
Figure B-2 Using the Reference Emitter Technique<br />
Charlie Chong/ Fion Zhang
B.2.2 Reflective Emissivity Technique<br />
The reflective emissivity technique involves measuring the reflectance <strong>of</strong> the<br />
target and subtracting it from 1.0 (emissivity = 1 minus target reflectance).<br />
ε= 1-ρ<br />
The procedure for determining emissivity using the reflective emissivity<br />
technique works best when dealing with highly reflected or mirrored surfaces,<br />
such as mirror insulation, and when dealing with pipes or electrical contacts.<br />
Some <strong>of</strong> these surfaces naturally have a low emissivity. In this technique, the<br />
target should not be coated with a reference emitter and must be kept at a<br />
constant temperature. Also, once a range is chosen for measuring<br />
temperature, both measurements must be made on that range. This<br />
technique is temperature independent. The emissivity, using the reflective<br />
emissivity technique, is calculated from the ratio <strong>of</strong> the thermal level<br />
differences. The procedure for determining the reflective emissivity technique<br />
follows (refer to Figure B-3). Note: The temperatures <strong>of</strong> the two sources must<br />
be constant and with a substantial spread between them (15°F to 25°F).<br />
Charlie Chong/ Fion Zhang
1. Establish that the two sources are at different temperatures and are<br />
thermally stable. This can be adequately accomplished with a hand-held<br />
contact pyrometer. The exact temperature <strong>of</strong> each surface does not need<br />
to be known, only the ΔT. The ΔT, however, is limited by the temperature<br />
range <strong>of</strong> the imager.<br />
2. Aim the imager at each source and measure the direct isotherm levels (S a<br />
and S b ).<br />
3. Reposition the imager so that the sources are reflected <strong>of</strong>f the target.<br />
Measure the reflected isotherm levels (T a and T b ). In most situations, this<br />
requires reflecting one source at a time (the exception is when they are<br />
reflected <strong>of</strong>f a large uniform surface).<br />
4. Calculate the target reflectance: Reflectance = (T a -T b ) /(S a -S b ) To ensure<br />
that the data is reliable, take the average <strong>of</strong> several <strong>of</strong> these<br />
measurements over several parts <strong>of</strong> the surface, particularly if the surface<br />
is non-uniform in appearance. The exception to this is when an imager,<br />
either directly or through s<strong>of</strong>tware, allows an area to be defined and<br />
averaged.<br />
Charlie Chong/ Fion Zhang
Figure B-3 Using the Reflective Emissivity Technique<br />
Reflectance = (T a -T b ) /(S a -S b )<br />
Charlie Chong/ Fion Zhang
B.2.3 Transmittance Measurement<br />
The transmittance <strong>of</strong> non-opaque targets is measured similar to the<br />
reflectance measurement technique. As shown in Figure B-4, two sources are<br />
again used. In this case, the target is placed directly in front <strong>of</strong> the two<br />
sources rather than reflected <strong>of</strong>f <strong>of</strong> it. To calculate transmittance, substitute<br />
the reflected levels in the equation cited previously for reflectance (Section<br />
B.2.2) with the transmitted thermal levels.<br />
Charlie Chong/ Fion Zhang
Figure B-4 Using the Transmittance Technique (Measuring<br />
Transmittance)<br />
Transmittance = (T a -T b ) /(S a -S b )<br />
Charlie Chong/ Fion Zhang
B.2.4 Generic Emissivity Values<br />
Table B-1 lists broadband, generic normal emissivity values for several<br />
common materials (repeated from Section 4, Table 4-1. These values should<br />
only be used as references until the user can compile a library <strong>of</strong> values<br />
based on actual measurements.<br />
Table B-1 Normal Emissivity Values <strong>of</strong> Common Materials<br />
Charlie Chong/ Fion Zhang
Appendix C<br />
Quick Reference Charts And Plates<br />
Charlie Chong/ Fion Zhang
Calculating Instantaneous Field Of View, Quick Calculation<br />
Charlie Chong/ Fion Zhang
MTF Determination<br />
Using An Ir Imager<br />
Charlie Chong/ Fion Zhang
Minimum Resolvable<br />
Temperature Difference<br />
(MRTD) Estimate Using An Ir<br />
Imager<br />
Charlie Chong/ Fion Zhang
Measuring And Setting Effective Emissivity Using An Imager Or A Point<br />
Sensor<br />
Charlie Chong/ Fion Zhang
MEASURING IFOV meas OF AN IMAGER<br />
USING THE SLIT RESPONSE FUNCTION (SRF)<br />
Charlie Chong/ Fion Zhang
Classification Of Faults (Guidelines) Relating To 50% Of Maximum Load<br />
Joule.s Law: P = I 2 R. Use this to proportion the temperature rise to 50% <strong>of</strong> the<br />
load.<br />
For example:<br />
At 20% <strong>of</strong> load, an 8°C rise is seen. To proportion it to 50% <strong>of</strong> load, multiply<br />
by the square <strong>of</strong> the load ratio as follows:<br />
(50/20)² = 6.25; 6.25 x 8°C = 50°C equivalent temperature rise<br />
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang
Charlie Chong/ Fion Zhang
End Of <strong>Reading</strong> Three<br />
Charlie Chong/ Fion Zhang
<strong>Reading</strong>: Four<br />
Emissivity: Understand the difference<br />
between apparent and actual IR<br />
temperatures<br />
Charlie Chong/ Fion Zhang<br />
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Emissivity: Understand the difference between<br />
apparent and actual IR temperatures<br />
Taking infrared temperature measurements is certainly a lot easier than it<br />
used to be. The tricky part is understanding when an infrared reading is<br />
accurate as is and when you need to account for certain properties <strong>of</strong> the<br />
materials you’re measuring, or for other things like heat transfer.<br />
The most common use <strong>of</strong> infrared temperature measurement is for the<br />
inspection <strong>of</strong> electrical power distribution equipment. Let’s look at a typical<br />
three-phase fused power disconnect (Figure 1) and the corresponding<br />
infrared image (Figure IR1) below.<br />
Charlie Chong/ Fion Zhang<br />
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Figure 1 shows a typical three-phase fused power disconnect. The<br />
corresponding infrared image, figure IR1, was taken with the emissivity<br />
setting at 1 on our thermal imager. The temperature span and color scale for<br />
the infrared image is set to 95.5 ºF referring to black, with warmer<br />
temperatures indicated progressively by blue (105 ºF), green (115 ºF), red<br />
(125 ºF) and white (133 ºF and hotter). We also measured the load in phase<br />
A, B and C (from left to right), at approximately 34 amps each.<br />
A simple analysis <strong>of</strong> the thermal image indicates that Phase A is significantly<br />
hotter than phases B and C. The fuse clip at the top <strong>of</strong> Phase A indicates<br />
133.4 F, while the end <strong>of</strong> the fuse, specifically the metal cap <strong>of</strong> the top <strong>of</strong> the<br />
fuse, appears much cooler with a temperature <strong>of</strong> 103.6 ºF and the fuse body<br />
just below the cap appears to be 121.9 ºF.<br />
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Figure 1: Fused power disconnect.<br />
Charlie Chong/ Fion Zhang<br />
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Figure IR1: Corresponding infrared image.<br />
Charlie Chong/ Fion Zhang<br />
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Can this be true? Is the metal cap only 103 ºF? No. You are seeing an<br />
example <strong>of</strong> the apparent temperature and the effect <strong>of</strong> emissivity. The fuse<br />
end cap is a highly reflective metal, in this case copper. Notice that the body<br />
<strong>of</strong> the fuse also appears hotter than the metal cap. The temperature <strong>of</strong> the<br />
cap is actually as hot as the fuse body it’s in contact with.<br />
To explain why the apparent temperature seen through a thermal imager can<br />
be significantly different than the actual temperature, let’s review our<br />
knowledge <strong>of</strong> physics.<br />
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Thermal radiation and properties <strong>of</strong> materials<br />
All objects emit infrared (thermal) radiation. The intensity <strong>of</strong> the radiation<br />
depends on the temperature and nature <strong>of</strong> the material’s surface. At lower<br />
temperatures, the majority <strong>of</strong> this thermal radiation is at longer wavelengths.<br />
As the object becomes hotter, the radiation intensity rapidly increases and the<br />
peak <strong>of</strong> the radiation shifts towards shorter wavelengths. The relationship<br />
between total radiation intensity (all wavelengths) and temperature is defined<br />
by the Stefan-Boltzmann Law: (broad band)<br />
Q = eσT 4<br />
where:<br />
Q = radiation intensity<br />
e = emissivity <strong>of</strong> material<br />
σ = Stefan-Boltzmann constant<br />
T = absolute temperature<br />
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At a given temperature, the maximum radiation is achieved when the object<br />
has an emissivity <strong>of</strong> 1. This is referred to as blackbody radiation, because<br />
with an emissivity <strong>of</strong> 1, the object is a perfect radiator. However in our real<br />
world, there are no true blackbodies – that is, no perfect radiators. Since real<br />
materials are less than perfect radiators, the relevant issue is “how much less<br />
than perfect are they?” Emissivity is defined as the measure <strong>of</strong> how much<br />
less than perfectly a material radiates when compared to a blackbody. But,<br />
emissivity is only one <strong>of</strong> three factors that cause an object to be less than a<br />
perfect radiator.<br />
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The thermal nature <strong>of</strong> materials.<br />
Materials (objects in everyday life, whether they be solids, liquids or gases)<br />
are constantly affected by their surroundings. Thermally, all objects attempt to<br />
exchange energy with other objects in their natural drive toward thermal<br />
equilibrium with their surroundings. In this search for thermal equilibrium, heat<br />
is exchanged between objects via three mechanisms: conduction, convection<br />
and radiation.<br />
Conduction is defined as heat transfer between two solid bodies that are in<br />
physical contact with each other. Convection is heat transfer usually between<br />
a solid material and a liquid or gas. Conduction and convection are<br />
dependent on physical contact between materials. Radiation is a process <strong>of</strong><br />
heat transfer, characteristic <strong>of</strong> all matter (at temperatures above absolute<br />
zero). Radiation passes through a vacuum and can also pass through gasses,<br />
liquids and even solids.<br />
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When radiative power is incident on an object, a fraction <strong>of</strong> the power will be<br />
reflected (ρ), another portion will be absorbed (α), and the final portion will be<br />
transmitted through the object (τ). The transmitted fraction is τ. All <strong>of</strong> this is<br />
described by the Total Power Law:<br />
ρ + α + τ = 1<br />
where:<br />
ρ = fraction reflected<br />
α = fraction absorbed<br />
τ = fraction transmitted<br />
The ability <strong>of</strong> an object to absorb radiation is also related to its ability to emit<br />
radiation. This is defined by Kirchh<strong>of</strong>f's Law<br />
α = ε<br />
where<br />
α = absorbance coefficient<br />
ε = emissive coefficient<br />
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So in plain English, when the thermal imager observes the thermal radiation<br />
from real objects, part <strong>of</strong> what the thermal imager sees is reflected from the<br />
surface <strong>of</strong> the object, part is emitted by the object, and part may be<br />
transmitted through the object. In our example <strong>of</strong> a steel part, the<br />
transmission is zero (opaque, τ = 0), but to the degree that the part is<br />
reflective, it is less emissive and therefore real objects will usually appear<br />
cooler than they actually are. Except when there is something hotter in the<br />
vicinity; since with opaque materials, the lower the emissivity, the higher the<br />
reflectivity. The result in this case is materials appear to be hotter than they<br />
actually are! Let’s examine some real objects to illustrate these effects.<br />
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Applying emissivity to real objects<br />
In the figure IR1 example, not only is the fuse end cap temperature actually<br />
much hotter than the 103.6 ºF that it appears, the hot spot above it is most<br />
assuredly hotter than the 133.4 ºF that it appears.<br />
So, how much hotter might it be? This fused power disconnect is electrically<br />
energized, so let’s conduct a simple experiment with a metal part that is not<br />
electrically energized. Note: While this experiment may not be shocking, it<br />
can still burn you.<br />
Picture a round stainless steel block sitting at ambient temperature.<br />
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Figure 2: Stainless steel block. (at ambient temperature)<br />
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Observed with our thermal imager (with emissivity set to 1), the metal<br />
appears to vary in temperature from about 74 ºF to 87 ºF. This seems to<br />
make sense, since the block could have picked up a little heat from our hands<br />
during handling. Actually, the metal block is very uniform in temperature. The<br />
apparent hot spot is a reflection <strong>of</strong> my face on the surface <strong>of</strong> the metal. Can<br />
you see my eye glasses in the image? (Figure IR2)<br />
Figure IR2: Thermal image <strong>of</strong> stainless steel block.<br />
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Observed with our thermal imager (with emissivity set to 1), the metal<br />
appears to vary in temperature from about 74 ºF to 87 ºF. This seems to<br />
make sense, since the block could have picked up a little heat from our hands<br />
during handling. Actually, the metal block is very uniform in temperature. The<br />
apparent hot spot is a reflection <strong>of</strong> my face on the surface <strong>of</strong> the metal. Can<br />
you see my eye glasses in the image? (Figure IR2)<br />
Figure IR2: Thermal image <strong>of</strong> stainless steel block.<br />
Charlie Chong/ Fion Zhang<br />
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Can you see my eye glasses in the image? (Figure IR2)<br />
Charlie Chong/ Fion Zhang
Can you see my eye glasses in the image?<br />
Charlie Chong/ Fion Zhang<br />
https://en.wikipedia.org/wiki/Douglas_MacArthur
The block appears to vary in temperature from about 92 ºF to 110 ºF – and<br />
you can see the image <strong>of</strong> my face in the warm metal surface even more<br />
clearly than before. Using a thermocouple, we measure the surface<br />
temperature and find that it’s actually 169 ºF (see Figure 2a).<br />
Figure 2a: DMM with thermocouple, measuring surface temperature <strong>of</strong> the<br />
steel block.<br />
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How can the thermal imager’s readings appear reasonable when the metal<br />
part is at room temperature and be so wrong (still producing a mirror image <strong>of</strong><br />
my face on the hot surface) when the part is 169 ºF?<br />
At room temperature, the block appears to be room temperature because the<br />
block is primarily reflecting the thermal radiation from everything around it.<br />
Since the ambient temperature in the room is in the 70s, the reflection from<br />
the surface <strong>of</strong> the block appears also to be similar. When the same part is<br />
heated in the oven, the part becomes much hotter than the surroundings, so<br />
the thermal imager is able to see an increase in radiant energy, albeit 尽 然<br />
much lower in apparent temperature because <strong>of</strong> the low emissivity value <strong>of</strong><br />
the surface.<br />
Let’s modify our experiment to better demonstrate what the thermal imager<br />
sees. We take another stainless steel block and paint half <strong>of</strong> it with a flat black<br />
paint (flat black paint has an emissivity <strong>of</strong> 1 or 0.98 to be a little precise) and<br />
bake it (in a slightly warmer oven) another three hours (Figure 3, Figure IR3).<br />
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Figure 3: Steel block, left side painted black.<br />
Figure IR3: Corresponding thermal image <strong>of</strong> steel block.<br />
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When we remove the block from the oven this time, the unpainted side<br />
appears to be 92 ºF, but the thermal imager now indicates the painted sided<br />
to be 198 ºF. We can make a very good estimation <strong>of</strong> the actual emissivity <strong>of</strong><br />
this material by observing the unpainted surface with our IR camera and<br />
adjusting the emissivity value on the thermal imager until the reading matches<br />
the temperature observed on the painted side. In this case, the emissivity is<br />
found to be approximately 0.12.<br />
Assumed<br />
ε = 0.98<br />
Adjusted<br />
ε = 0.12<br />
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Emissivity is a cantankerous 脾 气 坏 且 抱 怨 不 休 的 variable<br />
As we’ve seen, emissivity varies by surface condition, but also by viewing<br />
angle, and even by temperature and by spectral wavelength. A table <strong>of</strong><br />
common emissivity values is published in the operating manual for your<br />
thermal imager. The table should be considered only a rough guide in<br />
estimating an emissivity value to use with any particular material. If actual<br />
temperature values are required, it is best to perform experiments as<br />
described here, to properly characterize the emissivity for the material and its<br />
application.<br />
The two most common techniques for providing a higher emissivity reference<br />
surface are the application <strong>of</strong> a flat black high emissivity paint to the surface<br />
(as discussed in the previous section), or application <strong>of</strong> common black<br />
electrical tape to the material’s surface. Both black electrical tape and flat<br />
black tape have an emissivity <strong>of</strong> approximately 0.96. Another option is to use<br />
an infrared thermometer with adjustable emissivity, and a contact probe,<br />
adjusting the emissivity until the contact probe and infrared temperature<br />
displays equilibrate.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
In this experiment we see that the difference between the apparent<br />
temperature on the unpainted side and actual temperature is an error <strong>of</strong> 106<br />
ºF. If we were to conduct a similar experiment with a high-temperature<br />
infrared sensor, and examine steel at 2,000 ºF, the error between the actual<br />
and apparent temperatures could be more than 400 ºF. Of course, neither<br />
black paint or tape could survive 2,000 ºF. It’s <strong>of</strong>ten useful to use a narrow<br />
spectral band similar to the wavelength <strong>of</strong> the object’s radiant energy.<br />
Wien’s displacement law helps us determine the peak wavelength <strong>of</strong> the<br />
object’s peak radiant energy for an object at a certain temperature.<br />
λ max = b / T<br />
where:<br />
λ max = peak wavelength <strong>of</strong> radiant energy<br />
b = 2897 μm/ °K<br />
T = temperature (Kelvin)<br />
Charlie Chong/ Fion Zhang<br />
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Wien’s Displacement Law<br />
Charlie Chong/ Fion Zhang<br />
http://www.sun.org/encyclopedia/electromagnetic-spectrum
Charlie Chong/ Fion Zhang<br />
http://www.sun.org/encyclopedia/electromagnetic-spectrum
When you are working with high-temperature materials, you can greatly<br />
reduce the errors due to uncertainty in emissivity by selecting infrared<br />
detectors that operate at narrow wavelength bands at shorter wavelengths.<br />
The math and physics necessary to prove this is beyond the scope <strong>of</strong> this<br />
application note. However, calculations demonstrate that by choosing an<br />
infrared sensor with a wavelength band close to 1 μm (rather than the 8 μm<br />
to 14 μm spectral band used by most thermal imagers), the maximum<br />
difference between the 2,000 ºF actual and apparent temperatures would be<br />
closer to 50 degrees (without knowing the precise emissivity <strong>of</strong> the material<br />
with better certainty).<br />
(the reflected low temperature spectrum is filter out leaving the high energy<br />
narrow wavelength representing the high temperature λ max )<br />
To summarize: Temperature measurement without knowledge in this case<br />
would result in an error <strong>of</strong> more than 400 ºF. Making the same measurement<br />
with knowledge would reduce the error to 50 ºF, with no better determination<br />
<strong>of</strong> the material’s emissivity.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
Using a narrow band filter<br />
to measure this<br />
temperature range<br />
The ambient reflection<br />
ρ is filter out<br />
Charlie Chong/ Fion Zhang<br />
http://www.sun.org/encyclopedia/electromagnetic-spectrum
Discussion<br />
Subject: Are the following statement true?<br />
• Is the absolute emittance (≠ emissivity, ε) <strong>of</strong> an object constant with<br />
disregard <strong>of</strong> reflectance ρ?<br />
• Is the 1= ε + ρ + τ, a weighted ratio <strong>of</strong> three contributing factor meant for<br />
IR thermographic measurement purpose and not a physical property <strong>of</strong> the<br />
object?<br />
• What ever the reflectance be (by surface conditioning, texture, shielding,<br />
by raising the T amb to T obj etc.) , the emittance from the object is always the<br />
same as long the T obj remain the same?<br />
• Could be say that will reflectance, transmittance coupled with the object<br />
emissivity, the actual power radiating from the object is higher than the<br />
black body?<br />
Charlie Chong/ Fion Zhang
Emissivity, the variable’s variable!<br />
Back to our steel block example, let’s discuss another very significant<br />
phenomena. We will take our unpainted metal block and drill three holes part<br />
way into the body. All three holes are one-eighth <strong>of</strong> an inch in diameter. The<br />
first is one-eighth-inch deep, the second is one-fourth-inch deep, and the third<br />
is three-eighths-inch deep.<br />
Figure IR4: Thermal image <strong>of</strong> steel block with three holes.<br />
Charlie Chong/ Fion Zhang<br />
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Bake the block for another three hours, then remove the block and observe it<br />
again with the camera. Interestingly, the hot block surface appears to be<br />
about 84 F, and now appears to have three hot spots.<br />
■<br />
■<br />
■<br />
The one-eighth-inch deep hole appears to be 106 ºF.<br />
The one-fourth-inch deep hole appears to be 112 ºF; and<br />
the three-eighth-inch deep hole appears to be 125 ºF.<br />
We know that the metal block is actually about 175 ºF (measured by a<br />
thermocouple) and the surface finish is uniform and has an emissivity <strong>of</strong><br />
approximately 0.12. The reason the temperature appears to be higher in the<br />
holes is that a hole in a body enhances the emissivity. The greater the<br />
depth/diameter ratio <strong>of</strong> the hole, the greater the emissivity enhancement. By<br />
adjusting the emissivity on the thermal imager to match the actual<br />
temperature at each hole, we find that the emissivity appears to be 0.25 for<br />
the one-eighth-inch deep hole. The emissivity <strong>of</strong> the one-fourth-inch deep<br />
hole appears to be 0.35 and the three-eighth-inch deep hole appears to have<br />
an emissivity <strong>of</strong> 0.45. This is an extremely important effect. Let’s look at<br />
another piece <strong>of</strong> electrical equipment to see why.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
Emissivity and electrical equipment<br />
In Figures 5 and IR5, you see another power disconnect with the conductors<br />
bolted in place using Allen head bolts. The corresponding infrared image<br />
shows a hot connection on the middle phase.<br />
Figure 5: 3-phase power disconnect.<br />
Charlie Chong/ Fion Zhang<br />
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Figure IR5: Corresponding thermal image.<br />
Notice the apparent hot spot in the hot Allen socket head. The well <strong>of</strong> the bolt<br />
head appears hotter primarily because the well illustrates the blackbody effect<br />
<strong>of</strong> a hole.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
In manufacturing processes, steel or aluminum rolls are <strong>of</strong>ten used to heat or<br />
cool a material such as in paper or plastic film processing. These rolls are<br />
usually polished metal surfaces, and it’s important to understand the thermal<br />
pr<strong>of</strong>ile since the manufacturing process depends on thermal uniformity across<br />
the rolls. The temperature <strong>of</strong> these rolls can be difficult to measure with a<br />
thermal imager because they have very low emissivities. However, there are<br />
<strong>of</strong>ten points where the material passes between two rolls. The tangent point<br />
between two rolls also tends to simulate the blackbody effect, allowing for<br />
effective temperature measurement in an otherwise difficult situation.<br />
This effect is illustrated in common electrical equipment as well. Look at<br />
Figure 6.<br />
Charlie Chong/ Fion Zhang<br />
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Figure 6: Power<br />
disconnect with knife<br />
blade connectors.<br />
Figure IR6:<br />
Corresponding thermal<br />
image.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
In this case, we have another power disconnect with knife blade switches.<br />
This type <strong>of</strong> switch utilizes shiny metal blades, and the proximity <strong>of</strong> the blades<br />
with narrow gaps simulates the blackbody effect for greatly improved effective<br />
emissivity. The important message here is to develop your understanding <strong>of</strong><br />
apparent and actual temperature measurement. Actual temperature<br />
measurement requires an intimate understanding <strong>of</strong> physics, heat transfer<br />
and characteristics <strong>of</strong> materials.<br />
Aimed here<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
Qualitative vs. quantitative infrared thermography<br />
Emissivity difficulties are not a barrier to effectively using infrared<br />
thermography for predictive maintenance (PdM). ASTM standards exist to<br />
guide thermographic PdM inspections. These standards describe the use <strong>of</strong><br />
thermal imagers for qualitative and quantitative infrared inspections.<br />
Quantitative infrared inspections require determining the emissivity <strong>of</strong> each<br />
component, to make accurate temperature measurements possible. This<br />
practice may not always be necessary for routine inspections, unless the<br />
exact temperature value is needed for long term tracing. Qualitative methods,<br />
in contrast, allow you to leave the emissivity at 1.0 and evaluate the<br />
equipment on a relative basis: Has it changed, or is it different? The basis for<br />
qualitative evaluation is comparing similar equipment under similar loads.<br />
Looking back at Figure 1 and IR1, you can see that there is little value to be<br />
gained in spending time estimating or debating the emissivity <strong>of</strong> the various<br />
parts in the power disconnect. The value is in understanding that Phase A is<br />
hotter than phase B and C. In addition to realizing that a phase is hotter, it is<br />
essential to measure the load <strong>of</strong> the three phases.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
Figure IR1: Corresponding infrared image.<br />
there is little value to be gained in<br />
spending time estimating or debating the<br />
emissivity <strong>of</strong> the various parts in the<br />
power disconnect. The value is in<br />
understanding that Phase A is hotter than<br />
phase B and C.<br />
A B C<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
Greater electrical load inherently means more heat is present<br />
W = I 2 R<br />
where<br />
W = power in watts (heat)<br />
I = current in amps<br />
R = resistance in ohms<br />
The first rule <strong>of</strong> thermography in predictive maintenance PDM is to compare<br />
comparable equipment under comparable loads. In electrical power<br />
distribution, comparable equipment is usually the easy part since each<br />
electrical phase is usually similar in materials to the phase next to it. Load is a<br />
very different matter. Figure 7 illustrates an electrician measuring the<br />
electrical load.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
Figure 7: Measuring the loads on a power disconnect.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
So, just observing that there is a hot spot does not indicate a problem.<br />
Electrical components can be appropriately hot for the electrical load and<br />
conditions. If you measure the loads, you can determine if the presence <strong>of</strong> a<br />
thermal anomaly indicates a problem. Thermal imagers do not identify<br />
thermal problems – trained, knowledgeable, qualified people make educated<br />
assessments <strong>of</strong> equipment. This leads to real value in preventive<br />
maintenance and reduced frequency <strong>of</strong> equipment breakdowns.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
Summary<br />
Predictive maintenance PDM with a thermal imager can be effectively<br />
performed by utilizing qualitative analysis <strong>of</strong> equipment.<br />
Qualitative techniques allow the emissivity setting on the thermal imager to be<br />
kept at 1.0 and apparent temperatures used for comparisons between similar<br />
equipment under similar load. With basic training, most technicians can<br />
reliably perform qualitative analysis.<br />
Quantitative infrared analysis requires a deeper understanding <strong>of</strong> thermal<br />
theory and application to be truly effective. It refers to the attempt to measure<br />
actual temperatures <strong>of</strong> materials using infrared thermography. Actual<br />
temperature measurement involves more than simply adjusting for emissivity.<br />
Total incident radiance requires dealing with the effect <strong>of</strong> reflection and<br />
transmission in addition to emissivity.<br />
Today’s thermal imagers are becoming increasingly affordable and easy to<br />
use. But, what does easy mean? The practice <strong>of</strong> infrared thermography looks<br />
straight forward and simple; but it has its tricks. It is much like most<br />
endeavors in life: the more you learn, the more you discover that there is<br />
more to learn.<br />
Charlie Chong/ Fion Zhang<br />
http://reliableplant.com/Read/14134/emissivity-underst-difference-between-apparent,-actual-ir-temps
It is much like most endeavors in life: the more you learn, the more you<br />
discover that there is more to learn.<br />
Charlie Chong/ Fion Zhang
It is much like most endeavors in life: the more you learn, the more you<br />
discover that there is more to learn.<br />
Charlie Chong/ Fion Zhang
Good Luck<br />
Charlie Chong/ Fion Zhang
Good Luck<br />
Charlie Chong/ Fion Zhang
Good Luck<br />
Charlie Chong/ Fion Zhang
Charlie https://www.yumpu.com/en/browse/user/charliechong<br />
Chong/ Fion Zhang