SpecificationsSpecifications1. X-ray Fluorescence SpectrometerElements to be determined: 4Be ~ 92UElements determined simultaneously: Up to 36 elementsMode of analysis: Simultaneous determination of many elementsAtmosphere: Vacuum, air, helium (optional)■Spectrometer UnitFixed monochrometer: Converging method with curved crystal.Vacuum type for all the elements.Crystal: SX, TAP, PET, Ge, NaCl, LiFDetector: Gas sealed detector for 11Na ~ 92UNe, Ar, Kr exatronNe, Ar, Kr multitronFPC for 5B, 6C, 8O, 9FScanning monochrometer (optional): Parallel beam method with flat crystal.Used for heavy elementsCrystal: LiFDetector: Scintillation counter (SC)Elements to be determined: 22Ti ~ 92U (with crystal for heavy element determination)Present mechanism: Up to 30 elements may be preset■Measuring ElectronicsType: Pulse counting system for all the elements controlled with a microprocessorCounting capacity: 4 x 10 9 counts/elementCounting method: integration for the preset timeIntegration time: Adjustable for each group, from 1 to 999 secondsHigh voltage supply for detector: 1,550 to 2,150 V■X-ray GeneratorX-ray tube: End win<strong>do</strong>w type with Rh target.X-ray win<strong>do</strong>w: Beryllium win<strong>do</strong>w (Thin Win<strong>do</strong>w)Maximum output: 4 kWX-ray power controllerRectification: Full wave rectification and smoothing with a capacitorControl method: Secondary side detection, primary side control, control with the CPUMaximum rating: 50 kV, 100 mA, 4 kWStability: ±0.01% (for 10% source fluctuation), both the current and voltageTube voltage setting: 5 kV steps from 20 to 50 kVTube current setting: 50 kA steps form 5 to 100 mASafety circuit: Against overvoltage, overcurrent, overload, and abnormal cooling watersupply■Sample Feeding MechanismType: Accurate sample positioning with a swing arm type sample feederTurntable: Accepts 8 samples togetherSpinner: 60 rpm (50/60 Hz)Sample holder: 64 mmf, 43 mm highMax. sample size: 51 mmf, 38 mm high■Evacuation SystemOil rotary pump:Evacuation rate: About 130 L / 160 L /min. (50/60 Hz)Oil mist filter providedVacuum gauge: Pirani gauge, constant temperature typeVacuum stabilizer: Controlled with a microcomputer. The degree of vacuum canbe stabilized at an arbitrary point.■Gas Supply System for Flow Proportional CounterUse: Used of determination of B, C, N, O, and FGas: PR gas (Ar 90% and CH4 10%)Gas flow consumption: 10 to 15 mL /min.Gas density stabilizer: Controlled by a microcomputerFlow control: Needle valve and flow meterGas cylinder: A 6 Nm 3 cylinder (If light elements (4Be~9F) are attached)■X-ray ProtectionWarning: Yellow lamp on the front panel and red lamp on the X-ray control panel.Safety device: If the sample setter and the X-ray shutter are opened at thesame time, the X-ray tube will be automatically turned off.Also the moment the panel is opened the X-ray output is cutoff.■X-ray Tube Cooling Unit (CWC-16, incorporated in the main body)Type: Circulation of distilled water (a 18-liter tank is attached.)Method of heat exchange: Carried out in a dual tube between externalcooling water and the distilled water.Heat exchange capacity: 4 kW (3.440 kcal / hour)Water purity maintenance: By ion exchangeAlarm: Temperature, flow rate, and electric conductivityExternal cooling water: Necessary (Not necessary if using HYCOOL 30)2. Data Processing Unit■Hardware (IBM PC / AT compatible)OS: Win<strong>do</strong>ws XPMain Memory: 256MB or moreKeyboard: Full keyboardFloppy disk: 3.5"<strong>do</strong>uble-sided, <strong>do</strong>uble density (1.44 MB / disk). Single drive.Hard disk: 10GB or morePrinter: Laser printer■SoftwareProgram for quantitative analysisMaximum number of elements to be processed: Arbitrary number of elementsMaximum number of elements to be simultaneously determined: 36 per sampleNumber of analysis groups: Arbitrary number of groupsRepeated analysis: Arbitrary number of timesPriority interrupt analysis: Possible, automatic return to sequential analysisPrintout: Printout order can be specified for each group. Compound names andelement names may be printed out. Pass and fail marks may be printed out.Number of calibration curves: Per each group, per each elementType of calibration curve: Second-order polynomialCorrection for dead timeCorrection for absorption and enhancement: Per each group, per each elementMaximum number of elements to be corrected for absorption and enhancement: Arbitrarynumber of elements per equationCorrection for drift: 2-point method or 1-point methodCorrection for overlapping: 2-point method or 1-point methodInternal standard method: Available for each group or each elementChemical correction: 2-point method or 1-point methodNumber of calculation formula: Arbitrary channels for concentration calculationProgram for scanner: Arbitrary number of elementsProgram for qualitative analysisScanner: For heavy element determinationMethod: Step scanningMethod of processing: Automatic peak search and automatic peak element determinationData output: 0n display and printerFactor calculationCalibration factor: By the method of least squares, up to second-order polynomialFactor for correcting absorption and enhancement: By the method of multiple regression(concentration correction and sensitivity correction)Maintenance programPulse height distribution: Graphic displayMonochromator alignment aid: Graphic displayCounter unit: Graphic displayAlarm: Display of alarm number, cause, and measure.Manual instrument diagnosis: Parts by part check is possible.External transmission program: Analysis data may be transmitted externally, in qualitativeanalysis.External transmission (analysis results, errors, etc.)LAN and RS-232C (optional)Automatic notification via e-mail possible20
AccessoriesAccessoriesSample preparation for X-ray fluorescence analysisType of sampleSampleTreatmentSample HolderPurpose of treatmentSolidIron, cast ironSteelHigh alloy steelFerroalloyCopper alloyAluminum alloyAmorphous substanceCut Polish with emery paper Solid sample holderCut Lathe Solid sample holderCentrifugal casting Polish/lathe Solid sample holderSurface smoothingPowerMetal powderChemicalsHigh polymersPlantsCeramic materialsOresSoilsDepositsOxidesGrind Briquet Solid sample holderGrind Melt Solid sample holderDensity uniformingand surface smoothingSuppression of grainsize effect andsuppression of influenceof matrix elementOilWaterNo treatmentLiquid sample holder(No treatment)LiquidOil/water Drop on filter paper DryWaterCollect on ion exchange filter paperSettle/concentrate on DDTCDryDrySolid sampleholder withfilter holderSolidifyingConcentrating andsolidifying21
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