Low Level Measurements Handbook

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Low LevelMeasurementsHandbookPrecision DC Current, Voltage,and Resistance MeasurementsSIXTH EDITION
Page 1: www.keithley.comLLM6 th EditionLow
Page 5 and 6: 2.3 Low Current Measurements.......
Page 7 and 8: 4.6.2 High Resolution Temperature M
Page 9 and 10: FIGURE 1-1: Standard Symbols Used i
Page 11 and 12: FIGURE 1-2: Theoretical Limits of V
Page 13 and 14: 2. Circuit loading must be minimize
Page 15 and 16: function instruments and are corres
Page 17 and 18: 1.4 Understanding Instrument Specif
Page 19 and 20: For example, the specification of
Page 21 and 22: instrument’s accuracy cannot be g
Page 23 and 24: 1.5 Circuit Design BasicsCircuits u
Page 25 and 26: values reduce the input time consta
Page 27 and 28: FIGURE 1-12: Neutralizing Shunt Cap
Page 29 and 30: 1.5.3 Coulombmeter CircuitThe coulo
Page 31 and 32: The disadvantage of this method is
Page 33 and 34: DMM OhmmeterThe typical DMM uses th
Page 35 and 36: FIGURE 1-24:Micro-ohmmeter in Pulse
Page 37 and 38: FIGURE 1-27: DMM Block DiagramACAtt
Page 39 and 40: FIGURE 1-29: Source I Mode of SMU×
Page 42 and 43: SECTION 2Measurements fromHigh Resi
Page 44 and 45: the connecting cable. A practical v
Page 46 and 47: known for their low input bias curr
Page 48 and 49: FIGURE 2-5: Guarded ConfigurationCo
Page 50 and 51: this input capacitance consists of
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2.2.2 Insulation ResistanceElectrom
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cleaned. Teflon PTFE is the type of
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of good quality insulators, but avo
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FIGURE 2-12: Guarding to Reduce Lea
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FIGURE 2-14: Test Fixture Guarding
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TABLE 2-3: Minimum Recommended Sour
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FIGURE 2-16: Typical Magnitudes of
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FIGURE 2-19: Using External Current
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FIGURE 2-21: Piezoelectric EffectAp
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FIGURE 2-23: Effects of Voltage Bur
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SMU Overload Protection (in Force V
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2.3.8 Using a Coulombmeter to Measu
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FIGURE 2-28: Fixed Integration Time
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source are required. Some electrome
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compared with a source resistance t
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across the DUT. If we assume that t
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FIGURE 2-35: Settling Time is the R
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If the source voltage is at least 1
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where: Q = charge (coulombs)C = cap
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See Section 2.6.6 for details on ap
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FIGURE 2-44: Shielding a High Imped
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Ionization InterferenceCurrent meas
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For example, the rise time of a cir
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FIGURE 2-49: Shunt Type AmmeterI S
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Metallic conductors approach this t
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FIGURE 2-53: Noise Current vs. Band
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FIGURE 2-54: Coaxial and Triaxial C
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quality BNC and triax connectors us
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FIGURE 2-57: Analog Output LoadingE
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SECTION 3Measurements fromLow Resis
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These sources include thermoelectri
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Connections to Avoid Thermoelectric
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FIGURE 3-5: Voltage Noise Frequency
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FIGURE 3-7: Shielded Connections to
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FIGURE 3-8: Thermal Noise Voltage a
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FIGURE 3-10: Minimizing Interferenc
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used by other instruments, machiner
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FIGURE 3-13: Effects of Reversing L
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age drop across the lead resistance
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FIGURE 3-17: Canceling Thermoelectr
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and,V MR = ___IAgain, note that the
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3.3.5 Dry Circuit TestingMany low r
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FIGURE 3-21Check for oscillations b
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4.1 IntroductionThe applications fo
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FIGURE 4-1:Using an SMU to Measure
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FIGURE 4-3:Ion-Selective Electrode
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Conductivity CellsMeasuring the ele
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FIGURE 4-7:Simple Capacitor Leakage
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ductors are related to the dielectr
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4.3.3 Light Measurements with Photo
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Picoammeter. If the PMT requires no
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FIGURE 4-18: Ion Collector with BNC
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4.4 High Resistance Measurement App
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4.4.2 Resistivity Measurements of I
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electrodes. Note the top electrode
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time for a given sample. The Hi-R S
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FIGURE 4-26: Realistic Circuit of t
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FIGURE 4-28: van der Pauw Resistivi
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FIGURE 4-30a: Erroneous Measurement
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FIGURE 4-32: Model 4200-SCS SMU Con
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R 2 = resistance calculated with se
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After the reading has been recorded
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stable. The voltage of the individu
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4.6.2 High Resolution Temperature M
Page 180 and 181:
The temperature inside and outside
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Excessive current through the conta
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sample. The sensitivity of the Mode
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For determining the critical curren
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on samples that are flat, homogeneo
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SECTION 5Low LevelInstrumentSelecti
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FIGURE 5-1: Low Level Instrument Fu
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TABLE 5-1a: Low Current/High Resist
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Table 5-1c: Low Voltage and Low Res
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Table 5-2: High Speed Power Supplie
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Table 5-3: Connectors, Adapters, an
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Table 5-4: Cables (cont’d)TERMINA
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Table 5-6: Switching Cards for the
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Table 5-6: Switching Cards for the
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Table 5-7: Switching Card Accessori
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Table 5-9: Switching Card Accessori
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Measurement Type andTypical Applica
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APPENDIX BCable andConnectorAssembl
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FIGURE B-1: Cable Preparation12345C
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ABSOLUTE ACCURACY. A measure of the
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ELECTROSTATIC COUPLING. A phenomeno
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MAXIMUM ALLOWABLE INPUT. The maximu
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change and the availability of the
Page 226 and 227:
TRIGGER. An external stimulus that
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Test System SafetyMany electrical t
Page 230 and 231:
For maximum safety, do not touch th
Page 232 and 233:
INDEX
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high resistancemeasurements, 4-20 t
Page 236 and 237:
Temperaturederating, 1-13gradients,
Page 238 and 239:
Specifications are subject to chang
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Low Level Measurements Handbook

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