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New developments in wide bandgap CdZnTe (CZT) semiconductor ...

New developments in wide bandgap CdZnTe (CZT) semiconductor ...

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Experimental techniques available <strong>in</strong> BNL<br />

� Experimental techniques are used to identify the<br />

extended defect and to measure their effect:<br />

• IR microscopy<br />

• White X-ray beam diffraction topography<br />

• Micro-resolution X-ray beam mapp<strong>in</strong>g<br />

• Surface etch<strong>in</strong>g

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