New developments in wide bandgap CdZnTe (CZT) semiconductor ...
New developments in wide bandgap CdZnTe (CZT) semiconductor ...
New developments in wide bandgap CdZnTe (CZT) semiconductor ...
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Experimental techniques available <strong>in</strong> BNL<br />
� Experimental techniques are used to identify the<br />
extended defect and to measure their effect:<br />
• IR microscopy<br />
• White X-ray beam diffraction topography<br />
• Micro-resolution X-ray beam mapp<strong>in</strong>g<br />
• Surface etch<strong>in</strong>g