Application Compendium - Agilent Technologies

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AGILENT TECHNOLOGIES MATERIALS TESTING AND RESEARCH SOLUTIONS From the extraction of raw materials through the development, manufacturing and utilization of advanced materials, to material reuse and recycling, Agilent Technologies offers innovative, reliable analytical solutions for your business. Our comprehensive line of instruments for materials testing and research will ensure you consistently and cost-effectively deliver the highest quality finished products and materials. Materials market overview The materials market comprises the industries involved in the extraction of raw minerals from the earth (geosciences, mining and mineralogy) and the subsequent characterization and transformation of those raw minerals into metal alloys, ceramics, glass, and other engineered materials — described collectively as “advanced materials”. These advanced materials are developed with purpose specific characteristics and properties in a wide variety of industries. Materials market lifecycle Examples of advanced materials include: Aero and automotive (metals, composites) Polymers and composites Glass/ceramics/optics and photonics (lenses and coatings, eyewear) Specialty films and surface coatings (paint, adhesives, resins) Semiconductor and electronics (LEDs, LCDs, disk drives, thin-film electronics, fuel cells, solar cells) Textiles, paper and packaging Consumer goods (jewelry, gemstones, cosmetics) Construction (cement, architectural glass, metal alloys)
When accuracy and reliability in measuring the quality and chemical composition of plastics and polymers is critical to your success, choose Agilent. Agilent molecular spectroscopy products provide the information required for development, QA/QC and to monitor the in-use service of these materials. Laboratory FTIR bench and microscopy systems provide insight into both bulk and detailed structure of polymers and rubber materials. Mobile FTIR spectroscopy affords nondestructive analysis of polymer, composite and rubberbased objects, regardless of location, shape or size. In addition, Agilent atomic force microscopy (AFM) systems permit the detailed surface characterization of polymers and rubbers at the nanoscale. These highprecision, modular AFM systems offer industry-leading environmental/temperature control and electrical measurement capabilities to keep moving R&D forward. Agilent also offers an innovative, extremely compact fieldemission scanning electron microscopy (FE-SEM) system optimized to provide high surface contrast using lowvoltage imaging techniques. When mechanical properties characterization at the nanoscale is needed, user friendly Agilent nanoindentation systems ensure unrivaled accuracy and outstanding versatility. Polymers and rubber are used across industry in an ever widening set of products and subassemblies. As synthesized materials, their properties, performance and longevity are directly related to achieving proper composition and structure. These materials have finite lifetimes, which are directly related to environmental affects, additives and stabilizers and overall usage. Agilent solutions AGILENT TECHNOLOGIES SOLUTIONS FOR POLYMERS AND RUBBERS Agilent FTIR spectrometers, microscopes and chemical imaging systems deliver: Detailed structural analysis of polymer and rubber based products. QA/QC support in the production of polymer and rubber. Defect analysis and analysis of layered materials via FTIR microscopy. Nondestructive, in situ analysis of polymer and rubber based objects in support of determining effect of use on longevity and performance. Handheld FTIR for nondestructive analysis of polymer, composites and rubber in any shape, size or location Use Agilent LC systems for: Investigating very small differences between the chemical structures of polymers Analysis of additives in polymers, such as phenolic antioxidants and erucamide slip additives. Screening and qualitative identification of antioxidant polymer additives. Agilent’s GPC/SEC portfolio provides: High-performance analysis of engineering polymers such as PEEK and polybutylene terephthalate, polyolefins such as polyethylene and polypropylene, low molecular weight resins such as epoxy resins, polyesters and phenolic resins, or elastomers such as styrenebutadiene and natural rubber A comprehensive portfolio of GPC/SEC columns and calibrants for polymer analysis. Agilent AFM and FE-SEM systems facilitate: Surface properties characterization in various environments (for example, heat, cold, gases). Electrical testing of charged polymers. Agilent nanoindentation systems enable: Indentation and scratch testing of coatings on plastics. Mechanical properties characterization of tires, PVC, and polyethylene.
Page 1: MATERIALS TESTING AND RESEARCH SOLU
Page 5 and 6: AGILENT TECHNOLOGIES APPLICATIONS F
Page 7 and 8: Figure 1. Agilent Cary 630 FTIR spe
Page 9 and 10: The calibration samples were measur
Page 11 and 12: Author Frank Higgins Agilent Techno
Page 13 and 14: Figure 1. The overlaid aliphatic be
Page 15 and 16: Author John Seelenbinder Agilent Te
Page 17 and 18: Figure 3. Sample is lightly pressed
Page 19 and 20: Author Dr. Mustafa Kansiz Agilent T
Page 21 and 22: microscopy provides for a factor of
Page 23 and 24: Standard ATR IR Image No Pressure (
Page 25 and 26: A visual inspection of the sample u
Page 27 and 28: Experimental Instrumentation To per
Page 29 and 30: Authors Jonah Kirkwood † and Must
Page 31 and 32: Spectra were collected from each lo
Page 33 and 34: Infrared mapping allows for multipl
Page 35 and 36: The spectra in Figure 2 are visuall
Page 37 and 38: Conclusion Agilent‟s Cary 610 FTI
Page 39 and 40: Authors Dr. Wayne Collins*, John Se
Page 41 and 42: The calibration curve obtained for
Page 43 and 44: Conclusion Select ‘Peak Ratio’
Page 45 and 46: Summary This method describes a pro
Page 47 and 48: Method configuration To determine t
Page 49 and 50: Authors Dr. Wayne Collins*, John Se
Page 51 and 52: The calibration curve for the deter
Page 53 and 54:
Figure 6. The MicroLab PC FTIR soft
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Summary An analytically representat
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Figure 3. The Irganox 1010 peak are
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Authors Dr. Wayne Collins*, John Se
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The calibration curve and equation
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Select ‘Peak Ratio’ - from the
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Summary An analytically representat
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Figure 3. The GMS peak height absor
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Advanced Atomic Force Microscopy: E
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signal) image indicating the overwh
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A dependence of surface potential o
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A B C Figure 6A-C. The topography (
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A B Figure 10A-C. The topography (A
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KFM with AM-FM operation in the int
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ibbons is only slightly different f
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References 1. G. Binnig, C.F. Quate
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Figure 1. AFM topographic image of
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100nm 100nm 350nm 100nm Figure 3. A
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to perfect hexagonal patterns, whic
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Single-pass KFM studies have been k
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images due to the difference of the
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0.5 V) of the nanowires. Additional
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appeared in the topography image. T
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of PSS component. TEM studies of mo
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Atomic Force Microscopy Studies in
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on graphite and MoS2 are shown in F
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A B C D Scan size: 5 µm. Scan size
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images of PEDOT:PSS blend, (PEDOT -
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Young’s Modulus of Dielectric ‘
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Figure 3. Young’s modulus as a fu
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Nanoindentation, Scratch, and Eleva
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The samples listed as “D” sampl
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Figure 6. Elastic modulus results f
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Figure 11. Elastic modulus results
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Sample B Figure 16. Scratch curves
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Conclusions Nanoindentation and scr
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measurement technique has been expl
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References 1. J.L. Hay, “Using In
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Theory The complex shear modulus (G
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References 1. Jain, S.K., Bhattacha
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LCCC relies on carrying out isocrat
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log Mp 5 4.6 4.2 3.8 0.5 15% Water
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Authors Wei Luan and Chunxiao Wang
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Table 1. Chemical Information of An
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Injection Volume Influence of Real
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translator into three modes on diff
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To identify the matrix influence on
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Authors Chun-Xiao Wang and Wei Luan
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Table 1. Polymer Additives in ASTM
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1 2 3 4 5 1 Tinuvin P 2 BHT 3 BHEB
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1 Tinuvin P 2 BHT 3 BHEB 4 Isonox 1
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Authors Edgar Naegele Agilent Techn
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Results and discussion To meet the
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Authors Melissa Dunkle, Gerd Vanhoe
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Experimental The analyses were perf
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Repeatability of the SFC/MS analysi
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Conclusion The combination of the A
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Introduction Phthalates form a grou
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The analytical method was applied t
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Introduction Bisphenol A (BPA) is a
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Preparation of standards BPA and BP
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Limit of Detection (LOD) and Limit
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Sample analysis The content of BPA
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The calibration for BPA and BPF, wh
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Author Stephen Ball Agilent Technol
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Results and discussion By operating
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Introduction The wavelength of UV r
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LC parameters Premixed solutions of
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Linearity A linearity study was per
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References 1. Dr. James H. Gibson,
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Instrumentation Columns: 2 x PLgel
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Authors Greg Saunders and Ben MacCr
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Authors Greg Saunders, Ben MacCreat
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Author Greg Saunders Agilent Techno
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Figure 5. Universal calibration cur
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Methods and Materials Conditions Co
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Materials and Methods A column set
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