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Application Compendium - Agilent Technologies

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To construct these materials, adhesive (tie) layers are<br />

often required between two adjacent but chemical<br />

incompatible layers. Typically these incompatibilities<br />

are between materials with differing polarities, such as<br />

nylon and polyethylene.<br />

The adhesives typically have intermediate polarity or<br />

contain functional groups with an affinity to both polar<br />

and non-polar layers and hence act as good binding<br />

material. Such adhesive layers in laminates can be very<br />

thin, e.g., between 2 to 10 microns.<br />

Polymer laminates can range in complexity and<br />

thickness from those containing only two layers to<br />

more than 10 layers (not including adhesive layers).<br />

With total cross-sectional thicknesses ranging from<br />

200 microns, polymer laminates are<br />

used in a variety of packaging applications, which are<br />

employed in industries such as food and<br />

pharmaceuticals.<br />

What are the analytical challenges/requirements<br />

for polymer laminates?<br />

With ever increasing manufacturing sophistication<br />

enabling more complex and thinner laminate structures<br />

to be produced, the analytical challenges to ensure<br />

good product quality control, troubleshooting or the<br />

reverse engineering of competitive products are also<br />

increasing in complexity.<br />

The analytical tools available to analyze such laminates<br />

are wide and varied and include a range of optical<br />

microscopy techniques, thermal techniques (such as<br />

differential scanning calorimetry) and various<br />

spectroscopic techniques.<br />

In particular, Fourier Transform Infrared (FTIR)<br />

microscopy has proven most useful for the analysis of<br />

polymer laminates. This has resulted from the core<br />

application of FTIR spectroscopy in the identification<br />

and characterization of polymers, combined with the<br />

ability to obtain this information from small areas.<br />

2<br />

When applied to polymer laminate analysis, FTIR<br />

microscopy is typically performed in transmission mode<br />

and requires that the total sampled thickness be within<br />

a certain limit. For polymeric materials, this is typically<br />

10–20 microns. Preparing thinly sliced polymer and<br />

polymer laminate materials at a thickness of<br />

10–20 microns presents some challenges. Typically,<br />

dedicated (and often expensive) specialized cutting<br />

devices such as microtomes are required. Even then,<br />

the cut samples are often difficult to handle due to<br />

curling or difficulties with static stick. To minimize<br />

these effects, samples can be embedded in resin before<br />

cutting and microtomed together within the resin<br />

support (Figure1). This unfortunately adds another<br />

material with a complex IR spectrum to the sample.<br />

Once cut, if the sample is flat, it can be placed in a<br />

sandwich between infrared transparent windows and<br />

sampled in transmission mode. However, because of<br />

internal reflections between the front and back surfaces<br />

of the sample, ―fringing effects‖ can commonly be<br />

observed. This results in a sinusoidal baseline during<br />

such measurements.<br />

With these issues and sampling preparation steps<br />

aside, transmission FTIR microscopy is a relatively<br />

simple technique to obtain spectra from small areas. It<br />

does however suffer from one major limitation: spatial<br />

resolution is relatively poor, especially when compared<br />

to optical microscopy techniques. Typical spatial<br />

resolution limits for transmission mode FTIR<br />

microscopy are about 10–15 microns.<br />

In comparison to transmission mode, the use of micro<br />

attenuated total reflectance (ATR) as the mode of<br />

analysis removes the requirement for samples to be a<br />

certain thickness, so samples no longer need to be<br />

thinly cut. However, as ATR requires intimate contact<br />

with the samples, there are still some important sample<br />

preparation requirements. Primarily, the sample must<br />

be flat and smooth to ensure that there is full and<br />

complete contact across the ATR measurement’s field<br />

of view. Additionally, and of paramount importance to<br />

the detection of ultrathin layers, micro ATR FTIR

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