Methodologies for Assessing On-line Probe Process Parameters
Methodologies for Assessing On-line Probe Process Parameters
Methodologies for Assessing On-line Probe Process Parameters
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Number of Contacts<br />
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0<br />
Production Data<br />
Exist Material<br />
New Material<br />
CRES Difference<br />
550 mOhm<br />
4 4.2 4.4 4.6 4.8 5 5.2 5.4<br />
Overall Path Resistance [Ohm]<br />
June 11 / 2008 Martens, Allgaier, Allgaier Allgaier, , Broz IEEE SW Test Workshop 43
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