Methodologies for Assessing On-line Probe Process Parameters
Methodologies for Assessing On-line Probe Process Parameters
Methodologies for Assessing On-line Probe Process Parameters
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Motivation<br />
Joint Venture Overview<br />
FM: <strong>Probe</strong> Materials<br />
ITS: Lab Capabilities<br />
NXP: Production Environment<br />
Contact Resistance and Fritting Theory<br />
Experimental Data<br />
Production Data<br />
Results & Future Work<br />
June 11 / 2008 Martens, Allgaier, Allgaier Allgaier, , Broz IEEE SW Test Workshop 44
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