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A <strong>Slew</strong> <strong>Rate</strong> <strong>Controlled</strong> <strong>Output</strong> <strong>Driver</strong><br />

<strong>Using</strong> <strong>PLL</strong> <strong>as</strong> Compensation Circuit<br />

Soon-Kyun Soon Kyun Shin, Seok-Min Seok Min Jung, Jin-Ho Jin Ho Seo,<br />

Myeong-Lyong<br />

Myeong Lyong Ko and Jae-Whui Jae Whui Kim<br />

SAMSUNG Electronics


✙ Overview<br />

Outline<br />

✙ Introduction to <strong>Slew</strong> <strong>Rate</strong> Control<br />

✙ Circuits for Compensation & <strong>Slew</strong> <strong>Rate</strong> Control<br />

✙ Simulation & Test Results<br />

✙ Conclusions<br />

24 September 2002 -2/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin


✙ Applications<br />

ATA Mode<br />

Overview of ATA/ATAPI<br />

HDD, DVD-ROM, CD-ROM,CD-RW<br />

IEEE1394 to ATAPI Bridge Chip<br />

USB2.0 to ATAPI Bridge Chip<br />

Data <strong>Rate</strong><br />

(Signal Frequency)<br />

<strong>Slew</strong> <strong>Rate</strong> Specification<br />

@Load Condition<br />

33 MBps<br />

UDMA33 Min tr,tf 5ns@40pF<br />

(8.25MHz)<br />

66 MBps<br />

UDMA66 Max 1.25[V/ns]@40pF<br />

(16.5MHz)<br />

100 MBps<br />

UDMA100 0.4 ~ 1.0[V/ns]@15~40pF<br />

(25MHz)<br />

133 MBps<br />

UDMA133 0.4 ~ 1.0[V/ns]@15~40pF<br />

(33.3MHz)<br />

Cable Type<br />

40 conductor<br />

80 conductor<br />

80 conductor<br />

80 conductor<br />

24 September 2002 -3/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin


Key issues<br />

✙ <strong>Slew</strong> <strong>Rate</strong> : 0.4 ~ 1.0 [V/ns] @15~40pF<br />

Must guarantee within 2.5 times variation over PVT (<br />

Process, Voltage, Temperature) variation.<br />

Load variation is 2.67 times variation compared to15pF.<br />

<strong>Slew</strong> rate is too f<strong>as</strong>t to use feedback architecture.<br />

External resistor is not allowed.<br />

⇒ PVT compensation circuit is needed.<br />

⇒ Compensation for load variation is needed.<br />

24 September 2002 -4/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin


Voltage<br />

Voltage<br />

PAD<br />

pMOS driver<br />

Gate voltage<br />

Concept of <strong>Slew</strong> <strong>Rate</strong> Control<br />

Interval time<br />

15pF Load<br />

First step<br />

Interval time<br />

First step<br />

15pF Load<br />

Second step<br />

nMOS driver<br />

Gate voltage<br />

40pF Load<br />

40pF Load<br />

Second step<br />

PAD<br />

time<br />

time<br />

✙ The second step of gate<br />

voltage does not affect the<br />

slew rate of small load<br />

capacitance.<br />

✙ The interval time can be<br />

estimated through simulation<br />

of first voltage step over PVT<br />

variation.<br />

24 September 2002 -5/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin


TRI-STATE<br />

DATA<br />

FIN<br />

Simplified Block Diagram<br />

Ph<strong>as</strong>e<br />

Frequency<br />

Detector<br />

Tri-state<br />

Control<br />

Logic<br />

UP<br />

DOWN<br />

PC<br />

NC<br />

<strong>Slew</strong> <strong>Rate</strong><br />

Control Block<br />

Divider<br />

(1/N)<br />

Voltage<br />

<strong>Controlled</strong><br />

Oscillator<br />

24 September 2002 -6/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin<br />

VCON<br />

PG<br />

NG<br />

FOUT<br />

Tolerant & Failsafe<br />

pMOS <strong>Driver</strong><br />

Tolerant & Failsafe<br />

nMOS <strong>Driver</strong><br />

VPBIAS<br />

VNBIAS<br />

PAD


VCON<br />

Voltage <strong>Controlled</strong> Oscillator<br />

Id<br />

Ctot<br />

N : the Number of delay stage<br />

VDD<br />

VPBIAS<br />

FOUT<br />

VNBIAS<br />

24 September 2002 -7/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin<br />

f<br />

osc<br />

1<br />

= =<br />

N( t1+ t2) N<br />

I d<br />

CV<br />

tot DD<br />

fosc : oscillation frequency of VCO<br />

t1, t2 : charge and discharge time<br />

N : number of delay stage<br />

Ctot : total capacitance of each stage<br />

Vdd : supply voltage<br />

Id : bi<strong>as</strong> current


Characteristics of <strong>PLL</strong><br />

✙ <strong>PLL</strong>’s characteristics in locked condition<br />

Constant frequency is generated over PVT<br />

corners.<br />

✙ Constant frequency means that the delay time is<br />

constant in each delay stage of VCO over PVT<br />

variation.<br />

The replica of VCO’s delay stage is used in<br />

output driver’s slew rate control block.<br />

24 September 2002 -8/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin


TRI-STATE<br />

DATA<br />

FIN<br />

Simplified Block Diagram<br />

Ph<strong>as</strong>e<br />

Frequency<br />

Detector<br />

Tri-state<br />

Control<br />

Logic<br />

UP<br />

DOWN<br />

PC<br />

NC<br />

<strong>Slew</strong> <strong>Rate</strong><br />

Control Block<br />

Divider<br />

(1/N)<br />

Voltage<br />

<strong>Controlled</strong><br />

Oscillator<br />

24 September 2002 -9/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin<br />

VCON<br />

PG<br />

NG<br />

FOUT<br />

Tolerant & Failsafe<br />

pMOS <strong>Driver</strong><br />

Tolerant & Failsafe<br />

nMOS <strong>Driver</strong><br />

VPBIAS<br />

VNBIAS<br />

PAD


PC<br />

NC<br />

Control of Gate Voltage<br />

First<br />

pull down<br />

First<br />

pull up<br />

Constant Delay Stage<br />

Constant Delay Stage<br />

Second<br />

pull down<br />

Second<br />

pull up<br />

24 September 2002 - 10/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin<br />

PG<br />

NG<br />

PAD


VPBIAS<br />

PC<br />

NC<br />

VNBIAS<br />

Replica of<br />

VCO<br />

<strong>Slew</strong> <strong>Rate</strong> Control Circuit<br />

Icontrol<br />

N3 N4<br />

N1 N2<br />

P1 P2<br />

P3 P4<br />

Icontrol<br />

PG<br />

NG<br />

VBIAS<br />

N1, P1 have the same length and different<br />

width of VCO’s bi<strong>as</strong>ing MOS.<br />

Therefore, they act like current mirrors.<br />

PAD<br />

I I<br />

K K N<br />

= × =<br />

control d<br />

CV<br />

f<br />

tot DD<br />

Icontrol : sinking and sourcing current to the<br />

gate of driver MOS.<br />

K : the ratio factor of current mirror<br />

Fosc : oscillation frequency of VCO<br />

N : the number of delay stage<br />

Ctot : total capacitance of each stage<br />

Vdd : the supply voltage<br />

Id : the bi<strong>as</strong> current of VCO<br />

24 September 2002 - 11/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin<br />

osc


<strong>Slew</strong> <strong>Rate</strong> Control<br />

✙ Constant delay is generated and used in slew rate<br />

control circuit for load variation.<br />

The replica of VCO’s delay stage is used in<br />

output driver’s slew rate control block.<br />

✙ Current source is used to reduce slew rate<br />

variation over PVT variations.<br />

The same length of MOS in VCO’s delay<br />

stage is used in output driver’s slew rate<br />

control block.<br />

24 September 2002 - 12/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin


Simulation Results(3/3)<br />

✙ Simulation results of slew rate<br />

<strong>Slew</strong> <strong>Rate</strong> Simulation Results [V/ns]<br />

Specification 0.4 ~ 1.0<br />

Conventional output driver 0.305 ~ 1.216<br />

Proposed output driver 0.403 ~ 0.986<br />

24 September 2002 - 15/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin


Layout of Test Chip<br />

<strong>PLL</strong><br />

✙ Process : 0.18um 1-poly, 6-metal CMOS technology<br />

✙ <strong>Output</strong> driver : 70[um] X 401[um]<br />

Bi<strong>as</strong> Voltage<br />

<strong>Slew</strong> <strong>Rate</strong> <strong>Controlled</strong> <strong>Output</strong> <strong>Driver</strong>s<br />

✙ <strong>PLL</strong> : 421[um] X 317[um]<br />

24 September 2002 - 16/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin


15pF<br />

Me<strong>as</strong>ured Results<br />

40pF<br />

24 September 2002 - 17/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin


Conclusions<br />

✙ Compensation current is used to reduce the slew rate<br />

variation over PVT corners.<br />

✙ A constant delay time is generated to reduce the slew<br />

rate variation over load variation using replica of VCO<br />

in <strong>PLL</strong>.<br />

✙ Implemented in 0.18um CMOS and satisfied the<br />

UDMA100 specifications.<br />

✙ Simulation results and test waveforms were shown.<br />

✙ The slew rate variation over PVT and load variation is<br />

reduced using <strong>PLL</strong> <strong>as</strong> compensation circuit.<br />

24 September 2002 - 18/18 -<br />

ESSCIRC 2002 , Soon-Kyun Shin

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