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Kelvin Contactors for Wafer-Scale Test - Semiconductor Wafer Test ...

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Gemini <strong>Kelvin</strong> Probes Used<br />

<strong>for</strong> <strong>Wafer</strong>-<strong>Scale</strong> Contact<br />

• Actively Being Used in High-Volume<br />

Production <strong>Test</strong> Environments<br />

• Capable of Partial<br />

Arrays at 0.5 mm<br />

Pitch<br />

• Partial Arrays<br />

Around Perimeter<br />

at 0.4 mm Pitch<br />

0.4 mm pitch BGA with <strong>Kelvin</strong><br />

probe marks on two solder balls<br />

June 7 to 10, 2009<br />

IEEE SW <strong>Test</strong> Workshop 12

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