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Kelvin Contactors for Wafer-Scale Test - Semiconductor Wafer Test ...

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Summary<br />

Gemini <strong>Kelvin</strong><br />

Gemini <strong>Kelvin</strong> <strong>for</strong> BGA<br />

Fine-Pitch<br />

Gemini <strong>Kelvin</strong><br />

• <strong>Kelvin</strong> <strong>Test</strong> at <strong>Wafer</strong>-<strong>Scale</strong><br />

is a Growing Requirement<br />

• <strong>Kelvin</strong> at <strong>Wafer</strong>-<strong>Scale</strong><br />

Presents Contacting<br />

Challenges<br />

• Spring Probes are Available<br />

to Meet the Current Need<br />

• Further Spring Probe<br />

Development is Focused on<br />

Full <strong>Kelvin</strong> <strong>for</strong> Fine-Pitch<br />

<strong>Wafer</strong>-<strong>Scale</strong> <strong>Test</strong><br />

June 7 to 10, 2009<br />

IEEE SW <strong>Test</strong> Workshop 24

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