Kelvin Contactors for Wafer-Scale Test - Semiconductor Wafer Test ...

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Need for Finer-Pitch Kelvin 0.4 mm Pitch June 7 to 10, 2009 IEEE SW Test Workshop 18
Fine-Pitch Gemini Kelvin in Development • New, Finer-Pitch Probe has Capability to Accommodate Finer- Pitch BGAs – GMK is a scalable technology – Full BGA arrays at 0.4 mm pitch – Can be used in-line down to 0.3 mm pitch – DUT-side tips 0.08 mm spacing – Board-side tips 0.27 mm spacing June 7 to 10, 2009 Fine-Pitch Gemini Kelvin IEEE SW Test Workshop 19
Page 1 and 2: June 7-10, 2009 San Diego, CA Kelvi
Page 3 and 4: Two Growing Test Trends Wafer-Scale
Page 5 and 6: WST a Contacting Challenge • Cont
Page 7 and 8: Kelvin: Very Useful in Final Test
Page 9 and 10: Kelvin Test at Wafer-Scale A Growin
Page 11 and 12: ECT’s Gemini Kelvin • Gemini Ke
Page 13 and 14: Example: Gemini Kelvin Contactor
Page 15 and 16: Example: Gemini Kelvin Contactor Re
Page 17: Need for Finer-Pitch Kelvin 0.5 mm
Page 21 and 22: GMK030 in Wafer Scale Test June 7 t
Page 23 and 24: Issues to Overcome at Fine Pitch

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