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Brittle Fracture of Ceramics - Semiconductor Wafer Test Workshop

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Distribution <strong>of</strong> <strong>Fracture</strong> Strength<br />

Cumulative Probability F( sf)<br />

1.00<br />

0.90<br />

0.80<br />

0.70<br />

0.60<br />

0.50<br />

0.40<br />

0.30<br />

0.20<br />

0.10<br />

MACOR<br />

Max 275.80<br />

Min 183.97<br />

Range 91.83<br />

Mean 224.10<br />

Std Dev 37.18<br />

ALUMINA<br />

Max 656.27<br />

Min 528.76<br />

Range 127.51<br />

Mean 590.00<br />

Std Dev 49.61<br />

ZIRCON<br />

Max 721.04<br />

Min 648.93<br />

Range 72.10<br />

Mean 682.10<br />

Std Dev 27.15<br />

SILICON NITRIDE<br />

Max 1598.73<br />

Min 1047.22<br />

Range 551.51<br />

Mean 1253.41<br />

Std Dev 205.23<br />

Macor<br />

Alumina<br />

Zircon<br />

SN<br />

Linear (Macor)<br />

Linear (Alumina)<br />

Linear (Zircon)<br />

Linear (SN)<br />

0.00<br />

0 100 200 300 400 500 600 700 800 900 1000 1100 1200 1300 1400 1500 1600 1700<br />

<strong>Fracture</strong> Strength sf [ MPa]<br />

June 7 to 10, 2009<br />

IEEE SW <strong>Test</strong> <strong>Workshop</strong> 13

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