Brittle Fracture of Ceramics - Semiconductor Wafer Test Workshop
Brittle Fracture of Ceramics - Semiconductor Wafer Test Workshop
Brittle Fracture of Ceramics - Semiconductor Wafer Test Workshop
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Zircon Fractographic Observation<br />
Flaw size = 25 m; KI= 4.6 MPa em<br />
June 7 to 10, 2009<br />
IEEE SW <strong>Test</strong> <strong>Workshop</strong> 17
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