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SVX4 User's Manual

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FERMILAB-TM-2317-E<br />

Test Results for the <strong>SVX4</strong> Version A/B Chip D∅ Note 4251<br />

Effective Gain (D0 mode)<br />

Effective Gain [e/ADC]<br />

1800<br />

1700<br />

1600<br />

1500<br />

1400<br />

1300<br />

1200<br />

1100<br />

1000<br />

900<br />

800<br />

0 10 20 30 40 50<br />

Capacitance(pF)<br />

BW=0<br />

BW=5<br />

BW=10<br />

BW=15<br />

Figure 5 Effective gain as a function of external capacitance in D∅ mode for a front end clock period<br />

of 132 ns. The curves begin to rise for larger capacitances because the amplifier does not have<br />

enough time to integrate the total charge injected. The ramp range was set to 1 and the digitization<br />

frequency is 50 MHz.<br />

BW \ C 10 pF 20 pF 30 pF 40 pF<br />

0 1024.1 1059.6 1087.5 1131.2<br />

5 1027.0 1084.1 1192.0 1289.0<br />

10 1048.5 1157.3 1296.1 1456.0<br />

15 1118.6 1281.9 1492.6 1709.2<br />

Table 3 Effective gain as a function of the external capacitance in D∅ mode for a front end clock<br />

period of 132 ns. All gain values are given in electrons per ADC count.<br />

2.2.2 Operation at 396 ns<br />

In Figure 6 and Figure 7 we show the charge injection timing used in the gain and noise<br />

studies using a front end clock with a period of 396 ns. The clock used to generate the<br />

396 ns interval is the original 132 ns clock with two clock pulses removed. We also<br />

adjusted the pipeline depth accordingly in order to see the external and internal charge<br />

injection.<br />

D∅ RunIIb Group Page 7 6/20/2005

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