Korean-American Scientists and Engineers Association
Korean-American Scientists and Engineers Association
Korean-American Scientists and Engineers Association
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9:30am <br />
9:45am EPS-1.3 Recent Advances in Pb-free Solder Technology <strong>and</strong> Science; Sung-Kwon Kang; IBM<br />
10:15am EPS-1.4 Recent Advances in Drop-Impact Reliability of Electronic Packaging Components;<br />
Yi-Shao Lai; ASE<br />
10:45am EPS-1.5 Reliability Challenges of High Performance Game Consoles; Krishna Darbha;<br />
Microsoft<br />
11:30am <br />
Friday (8/15/2008) Afternoon Session: Packaging Technologies<br />
Session Chairs: Sung-Kwon Kang (IBM) <strong>and</strong> Young-Ho Kim (Hanyang Univ.)<br />
2:15pm EPS-2.1 A Novel Approach to Assess Solder Joint Reliability of Wafer-Level Fabricated<br />
Package; Jongho Lee, Youngryong Kim, Namseog Kim, Euncheol-Ahn, Taegyung Jung <strong>and</strong><br />
Seyong Oh; Samsung<br />
2:35pm EPS-2.2 Reliability Assessment of Lead-Free Solder Joints in Electronics Packaging; Soon-<br />
Bok Lee; KAIST<br />
2:55pm EPS-2.3 Rapid Prototyping of Microsystems Packaging by Data-driven Chip-first Approach<br />
using Nano-Particle Silver Interconnects; Sung Chul Joo; Wayne State Univ.<br />
3:15pm EPS-2.4 Review on Interconnect Process for TSV 3D Integrated Package; DongHee Lee,<br />
MinJae Lee, KiWook Lee, JiHee Cho, Min Yoo <strong>and</strong> JaeDong Kim; Amkor<br />
3:45pm <br />
4:00pm EPS-2.5 Wafer Level Packages using Anisotropic Conductive Adhesives (ACAs) <strong>and</strong> NCAs<br />
For Display, Embedded ICs, <strong>and</strong> 3-D stack Applications; Kyung-Wook Paik; KAIST<br />
4:20pm EPS-2.6 Investigation of Moisture-induced Package Failures of Semiconductor Package<br />
Product; Hak Sung Kim <strong>and</strong> H. Thomas Hahn; UCLA<br />
4:40pm EPS-2.7 The Highly Reliable <strong>and</strong> Fine Pitch Chip on Glass (COG) Joints Fabricated using<br />
Sn/Cu Bumps <strong>and</strong> Non-conductive Adhesives; Byeung-Gee Kim, Sang-Mok Lee <strong>and</strong> Young-Ho<br />
Kim; Hanyang Univwersity<br />
5:00pm EPS-2.8 Effect of Silicon Carbide(SiC) as Die Attach Adhesive Filler on Thermal<br />
Performance of Semiconductor Package; Jaekyu Song*, Bongchan Kim, Kyeongsool Seong,<br />
Seokbong Kim, Yoonjoo Khim <strong>and</strong> Chanha Hwang; Amkor<br />
5:20pm EPS-2.9 Introduction on through Mold via Technology Applied to PoP; Jinseong Kim, Dongjoo<br />
Park <strong>and</strong> Kwangho Kim; Amkor<br />
5:45pm <br />
Saturday (8/16/2008) Packaging Materials <strong>and</strong> Science<br />
Session Chairs: Soon-Bok Lee (KAIST) <strong>and</strong> Gene Kim (Cookson Electronics)<br />
8:00am EPS-3.1 Board Level Interfacial Mechanical Reliability of Ball Grid Array Package for<br />
H<strong>and</strong>held Products; Soon-Wan Chung, Mi-Jin Kim, Soon-Min Hong <strong>and</strong> Young-Joon Moon;<br />
Samsung<br />
8:20am EPS-3.2 Pattern Projection for 3D Deformation Measurement with DIC; Jae Kwak, Dong Gun<br />
Lee <strong>and</strong> SB Park; SUNY Binghamton<br />
8:40am EPS-3.3 Characterization of Hygroscopic Properties of Advanced Polymers at High<br />
Temperatures ; Changsoo Jang, Bongtae Han <strong>and</strong> Samson Yoon; Univ. of Maryl<strong>and</strong><br />
9:00am EPS-3.4 Free-Drop Test on Cellular Phone PCBs with Different Boundary Conditions; Dong<br />
Gun Lee, Jae Kwak, SB Park <strong>and</strong> Da Yu; SUNY Binghamton<br />
9:30am <br />
9:45am EPS-3.5 Comparison of Electromigration Characteristics between Flip Chip Interconnect <strong>and</strong><br />
Pure Solder; Hyo Jeong Jeon <strong>and</strong>SB Park; SUNY Binghamton<br />
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