MICRO AREA X-RAY DIFFRACTION TECHNIQUES - Rigaku

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$The New Standard of X-ray Diffractometer: MultiFlex - Rigaku$

The gradient of a straight line obtained by plotting βcosθ/λ and sinθ/λ on the Y-axis and X-axis respectively, is 2η. The point of intersection with the Y-axis is 1/ε. From this, calculation can be made by separating the ununiform distortion η and the crystallite size from each other. 3.6 Texture When the crystal orientation of matter that composes a solid is random, the resultant Debye rings will be uniform, as shown in Fig. 11 (a), (b), (c). If, on the other hand, the crystal orientation is in a particular direction, an arc shape will result instead of a ring, as shown in Fig. 11 (d). Such a state is referred to as preferred orientation. Sometimes there are cases in which preferred orientation is specifically given to utilize texture in order to improve the characteristics of solid materials. The device to measure the state of this texture is a pole figure diffractometer attachment. Fig. 9 Example of residual stress calculation result. RESULTS OF STRESS ANALYSIS PEAK POSITION : CENTER OF FWHM STRESS = -0.36 kg/mm/mm SIGMA RELIABILITY = +-0.04 kg/mm/mm 4. Assessment of Materials by X-Ray Diffraction Techniques The aforementioned items 3.1 through 3.6 serve as basic assessment methods to examine the state and quality of solid matter. By way of example, one of the methods used for analysis of the mechanical behaviors of materials is shown in Fig. 13. 5. Other X-ray Diffraction Techniques for Material Assessment The above descriptions have been made centered on bulk analysis. In general X-ray diffraction techniques there are certain systems in which the X- Fig. 10 Particle size and crystallite size. Fig. 11 Observation of Debye rings in polycrystals: α-Fe (211). Vol. 6 No. 2 1989 39
Fig. 12 Measurement example with a pole figure attachment. Fig. 13 Relations of material information and X-ray diffraction techniques. ray optics, detector and X-ray source are specifically deisgned for particular applications, such as: • Thin film X-ray diffraction method [1] • X-ray surface diffraction method [7] • Cone scanning type microdiffractometer • Curved PSPC type microdiffractometer (PSPC/ MDG) • Small angle scattering measurement method etc. These methods are aimed at surface analysis, micro area analysis and the like. In any case the existence of preferred orientation must be taken into account. Because the number of crystallites that contribute to diffraction in lessened in the case of micro area X- ray diffraction techniques, this may cause discontinuous Debye rings. For the purpose of getting a measurement result with high reproducibility by eliminating this drawback, rotation or oscillation is applied to the sample during measurement. Three axes ω, χ and θ are available as the axis of these movements, and they can be run independently or simultaneously to perform the desired rotation or oscillation. The small angle scattering measurement method deals with diffuse scattering caused in the vicinity of 40 The <strong>Rigaku</strong> Journal
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MICRO AREA X-RAY DIFFRACTION TECHNIQUES - Rigaku

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